首页 > 最新文献

2011 International Students and Young Scientists Workshop "Photonics and Microsystems"最新文献

英文 中文
45° micromirrors fabricated by silicon anisotropic etching in KOH solutions saturated with alcohols 用硅各向异性刻蚀法在饱和醇的KOH溶液中制备45°微镜
K. Rola, I. Zubel
Fabrication of micromirrors inclined at 45° towards substrate is studied in this paper. The micromirrors are fabricated by anisotropic etching of monocrystalline silicon in KOH aqueous solutions saturated with different alcohols. The micromirror is formed by {110} sidewall inclined at 45° towards {100} substrate. The influence of propyl and butyl alcohols on etching anisotropy and surface morphology of micromirror structures is investigated. The impact of KOH concentration on micromirrors' parameters is also examined. The results show that the best etching anisotropy is achieved in the solutions with isopropanol and tert-butanol, and at the low concentration of KOH. Although the {110} mirror planes are patterned with stripes in the case of all considered etching solutions, the surface morphology of the {100} substrate is different for different alcohol additives. Contrary to propyl alcohols, the {100} surfaces etched in the solutions with butyl alcohols are densely covered with pyramidal structures (called hillocks). The angle of the micromirror inclination towards the substrate is evaluated by microscopic measurements and compared with the results reported in the literature.
本文研究了向衬底倾斜45°的微反射镜的制备方法。采用各向异性刻蚀法在不同醇饱和的KOH水溶液中制备单晶硅微镜。微镜由向{100}基材倾斜45°的{110}侧壁构成。研究了丙醇和丁醇对微镜结构蚀刻各向异性和表面形貌的影响。考察了KOH浓度对微镜参数的影响。结果表明,在低KOH浓度的异丙醇和叔丁醇溶液中,各向异性刻蚀效果最好。虽然在所有考虑的蚀刻溶液中,{110}镜面都有条纹图案,但对于不同的酒精添加剂,{100}基材的表面形貌是不同的。与丙醇相反,在溶液中蚀刻的{100}表面被丁醇密集地覆盖着金字塔结构(称为丘)。微镜对基底的倾斜角通过显微测量进行评估,并与文献中报道的结果进行比较。
{"title":"45° micromirrors fabricated by silicon anisotropic etching in KOH solutions saturated with alcohols","authors":"K. Rola, I. Zubel","doi":"10.1109/STYSW.2011.6155856","DOIUrl":"https://doi.org/10.1109/STYSW.2011.6155856","url":null,"abstract":"Fabrication of micromirrors inclined at 45° towards substrate is studied in this paper. The micromirrors are fabricated by anisotropic etching of monocrystalline silicon in KOH aqueous solutions saturated with different alcohols. The micromirror is formed by {110} sidewall inclined at 45° towards {100} substrate. The influence of propyl and butyl alcohols on etching anisotropy and surface morphology of micromirror structures is investigated. The impact of KOH concentration on micromirrors' parameters is also examined. The results show that the best etching anisotropy is achieved in the solutions with isopropanol and tert-butanol, and at the low concentration of KOH. Although the {110} mirror planes are patterned with stripes in the case of all considered etching solutions, the surface morphology of the {100} substrate is different for different alcohol additives. Contrary to propyl alcohols, the {100} surfaces etched in the solutions with butyl alcohols are densely covered with pyramidal structures (called hillocks). The angle of the micromirror inclination towards the substrate is evaluated by microscopic measurements and compared with the results reported in the literature.","PeriodicalId":261643,"journal":{"name":"2011 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128590137","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 9
Stability of thin-film resistors embedded in printed circuit boards 嵌入印刷电路板的薄膜电阻器的稳定性
P. Winiarski, A. Dziedzic
Long-term stability of embedded passives is very important issue. To determine this matter an aging process can be used, where test samples are exposed to environmental conditions. Objective of this research was analyzing reliability of thin-film resistors based on Ohmega-Ply® technology. Resistive material was a nickel-phosphorus (Ni-P) alloy (with sheet resistance 25 ¿/sq or 100 ¿/sq) on FR-4 substrate. A number of variables were considered in this study (sheet resistance, geometry of resistor, type of cladding, laser trimming, pulse stress and environmental conditions). Two different accelerated ageing processes ¿ Ex-Situ (samples exposed to elevated temperature and/or relative humidity but resistance measurements made at room temperature) and In-Situ (resistance of test samples performed directly at the ageing conditions) were carried out to perform long-term behavior analysis. The results revealed a significant influence of thickness of resistor, type of cladding and temperature on stability of investigated structures. Signification of other factors was negligible.
嵌入式被动器件的长期稳定性是一个非常重要的问题。为了确定这个问题,可以使用老化过程,将测试样品暴露在环境条件下。本研究的目的是分析基于Ohmega-Ply®技术的薄膜电阻器的可靠性。电阻材料是在FR-4衬底上的镍磷(Ni-P)合金(片电阻为25¿/sq或100¿/sq)。本研究考虑了许多变量(薄片电阻、电阻几何形状、包层类型、激光切边、脉冲应力和环境条件)。两种不同的加速老化过程:非原位(样品暴露在高温和/或相对湿度下,但在室温下进行电阻测量)和原位(在老化条件下直接进行测试样品的电阻)进行长期行为分析。结果表明,电阻厚度、包层类型和温度对结构稳定性有显著影响。其他因素的影响可以忽略不计。
{"title":"Stability of thin-film resistors embedded in printed circuit boards","authors":"P. Winiarski, A. Dziedzic","doi":"10.1109/STYSW.2011.6155861","DOIUrl":"https://doi.org/10.1109/STYSW.2011.6155861","url":null,"abstract":"Long-term stability of embedded passives is very important issue. To determine this matter an aging process can be used, where test samples are exposed to environmental conditions. Objective of this research was analyzing reliability of thin-film resistors based on Ohmega-Ply® technology. Resistive material was a nickel-phosphorus (Ni-P) alloy (with sheet resistance 25 ¿/sq or 100 ¿/sq) on FR-4 substrate. A number of variables were considered in this study (sheet resistance, geometry of resistor, type of cladding, laser trimming, pulse stress and environmental conditions). Two different accelerated ageing processes ¿ Ex-Situ (samples exposed to elevated temperature and/or relative humidity but resistance measurements made at room temperature) and In-Situ (resistance of test samples performed directly at the ageing conditions) were carried out to perform long-term behavior analysis. The results revealed a significant influence of thickness of resistor, type of cladding and temperature on stability of investigated structures. Signification of other factors was negligible.","PeriodicalId":261643,"journal":{"name":"2011 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"30 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131937441","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 6
The selection of gas chemistry in reactive ion etching of AlGaN/GaN heterostructures 反应离子蚀刻AlGaN/GaN异质结构时气体化学的选择
J. Gryglewicz, W. Oleszkiewicz, R. Paszkiewicz
In this study, we discuss a scope of different gas mixtures intended for reactive ion etching of AlxGa1¿xN/GaN heterostructures in relation to percentage composition of aluminum. The results of etching process are strongly dependent on the process parameters and gas mixture applied. The selected mixture of BCl3/Cl2/Ar provides a good stability of plasma and quality of etched heterostructure mesas. The test structures of AlGaN/GaN for the RIE process were grown on a c-plane sapphire in a vertical flow LP-MOVPE (low pressure Metalorganic Vapour Phase Epitaxy) system. The surface morphology and topography of mesa structures were studied using atomic force microscope working in tapping mode and scanning electron microscope. The results of etching process for intended process parameters as well as the correlation between the gas mixture, parameters and obtained mesa structures are discussed in this article.
在这项研究中,我们讨论了用于反应离子蚀刻AlxGa1¿xN/GaN异质结构的不同气体混合物的范围与铝的百分比组成。蚀刻过程的结果很大程度上取决于所使用的工艺参数和气体混合物。所选择的BCl3/Cl2/Ar混合物具有良好的等离子体稳定性和蚀刻异质结构台面的质量。在垂直流动LP-MOVPE(低压金属有机气相外延)体系中,在c面蓝宝石上生长了用于RIE工艺的AlGaN/GaN测试结构。利用原子力显微镜和扫描电镜对表面形貌和形貌进行了研究。本文讨论了蚀刻工艺对预期工艺参数的影响,以及气体混合物、参数与得到的台面结构之间的关系。
{"title":"The selection of gas chemistry in reactive ion etching of AlGaN/GaN heterostructures","authors":"J. Gryglewicz, W. Oleszkiewicz, R. Paszkiewicz","doi":"10.1109/STYSW.2011.6155839","DOIUrl":"https://doi.org/10.1109/STYSW.2011.6155839","url":null,"abstract":"In this study, we discuss a scope of different gas mixtures intended for reactive ion etching of AlxGa1¿xN/GaN heterostructures in relation to percentage composition of aluminum. The results of etching process are strongly dependent on the process parameters and gas mixture applied. The selected mixture of BCl3/Cl2/Ar provides a good stability of plasma and quality of etched heterostructure mesas. The test structures of AlGaN/GaN for the RIE process were grown on a c-plane sapphire in a vertical flow LP-MOVPE (low pressure Metalorganic Vapour Phase Epitaxy) system. The surface morphology and topography of mesa structures were studied using atomic force microscope working in tapping mode and scanning electron microscope. The results of etching process for intended process parameters as well as the correlation between the gas mixture, parameters and obtained mesa structures are discussed in this article.","PeriodicalId":261643,"journal":{"name":"2011 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2011-07-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116598651","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Organizing committee 组织委员会
Pub Date : 1900-01-01 DOI: 10.1109/haptics.2016.7463139
Kelcy Allwein
Kelcy Allwein, Defense Intelligence Agency, Kelcy.Allwein@dia.mil Elisabeth Andre, University of Augsburg, andre@informatik.uni-augsburg.de Thom Blum, Muscle Fish, a division of Audible Magic thom@musclefish.com Shih-Fu Chang, Columbia University, sfchang@ee.columbia.edu Bruce Croft, University of Massachusetts, croft@cs.umass.edu Alex Hauptmann, Carnegie Mellon University, alex+@cs.cmu.edu Mark Maybury (chair) The MITRE Corporation, maybury@mitre.org Andy Merlino, Pixel Forensics, amerlino@pixelforensics.com Ram Nevatia, University of Southern California, nevatia@iris.usc.edu Prem Natarajan, BBN, prem@bbn.com Kirby Plessas, Open Source Works, kirbyp@open-source-works.org David Palmer, Virage, dpalmer@virage.com Mubarak Shah, University of Central Florida, shah@cs.ucf.edu Rohini K. Shrihari, SUNY Buffalo, rohini@cedar.buffalo.edu Oliviero Stock, Istituto per la Ricerca Scientifica e Tecnologica, stock@fbk.eu John Smith, IBM T. J. Watson Research Center, jsmith@us.ibm.com Rick Steinheiser, DNI/Open Source Center, RickS@rccb.osis.gov Sharon Walter (co-chair) AFRL, Rome NY, Sharon.Walter@rl.af.mil
Kelcy Allwein,国防情报局,Kelcy.Allwein@dia.mil Elisabeth Andre,奥格斯堡大学,andre@informatik.uni-augsburg.de Thom Blum, Muscle Fish, Audible Magic的一个部门thom@musclefish.com哥伦比亚大学,sfchang@ee.columbia.edu Bruce Croft,马萨诸塞大学,croft@cs.umass.edu Alex Hauptmann,卡内基梅隆大学,Alex +@cs.cmu.edu Mark Maybury(主席)MITRE Corporation, maybury@mitre.org Andy Merlino, Pixel Forensics,amerlino@pixelforensics.com Ram Nevatia,南加州大学,nevatia@iris.usc.edu Prem Natarajan, BBN, prem@bbn.com Kirby Plessas,开源作品,kirbyp@open-source-works.org David Palmer, Virage, dpalmer@virage.com Mubarak Shah,中佛罗里达大学,shah@cs.ucf.edu Rohini K. Shrihari,纽约州立大学布法罗分校,rohini@cedar.buffalo.edu Oliviero Stock,墨西哥科学技术研究所,stock@fbk.eu John Smith, IBM t.j. Watson研究中心,jsmith@us.ibm.com Rick Steinheiser, DNI/开源中心,RickS@rccb.osis.gov Sharon Walter(联合主席)AFRL, Rome NY, Sharon.Walter@rl.af.mil
{"title":"Organizing committee","authors":"Kelcy Allwein","doi":"10.1109/haptics.2016.7463139","DOIUrl":"https://doi.org/10.1109/haptics.2016.7463139","url":null,"abstract":"Kelcy Allwein, Defense Intelligence Agency, Kelcy.Allwein@dia.mil Elisabeth Andre, University of Augsburg, andre@informatik.uni-augsburg.de Thom Blum, Muscle Fish, a division of Audible Magic thom@musclefish.com Shih-Fu Chang, Columbia University, sfchang@ee.columbia.edu Bruce Croft, University of Massachusetts, croft@cs.umass.edu Alex Hauptmann, Carnegie Mellon University, alex+@cs.cmu.edu Mark Maybury (chair) The MITRE Corporation, maybury@mitre.org Andy Merlino, Pixel Forensics, amerlino@pixelforensics.com Ram Nevatia, University of Southern California, nevatia@iris.usc.edu Prem Natarajan, BBN, prem@bbn.com Kirby Plessas, Open Source Works, kirbyp@open-source-works.org David Palmer, Virage, dpalmer@virage.com Mubarak Shah, University of Central Florida, shah@cs.ucf.edu Rohini K. Shrihari, SUNY Buffalo, rohini@cedar.buffalo.edu Oliviero Stock, Istituto per la Ricerca Scientifica e Tecnologica, stock@fbk.eu John Smith, IBM T. J. Watson Research Center, jsmith@us.ibm.com Rick Steinheiser, DNI/Open Source Center, RickS@rccb.osis.gov Sharon Walter (co-chair) AFRL, Rome NY, Sharon.Walter@rl.af.mil","PeriodicalId":261643,"journal":{"name":"2011 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127104522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
2011 International Students and Young Scientists Workshop "Photonics and Microsystems"
全部 Acc. Chem. Res. ACS Applied Bio Materials ACS Appl. Electron. Mater. ACS Appl. Energy Mater. ACS Appl. Mater. Interfaces ACS Appl. Nano Mater. ACS Appl. Polym. Mater. ACS BIOMATER-SCI ENG ACS Catal. ACS Cent. Sci. ACS Chem. Biol. ACS Chemical Health & Safety ACS Chem. Neurosci. ACS Comb. Sci. ACS Earth Space Chem. ACS Energy Lett. ACS Infect. Dis. ACS Macro Lett. ACS Mater. Lett. ACS Med. Chem. Lett. ACS Nano ACS Omega ACS Photonics ACS Sens. ACS Sustainable Chem. Eng. ACS Synth. Biol. Anal. Chem. BIOCHEMISTRY-US Bioconjugate Chem. BIOMACROMOLECULES Chem. Res. Toxicol. Chem. Rev. Chem. Mater. CRYST GROWTH DES ENERG FUEL Environ. Sci. Technol. Environ. Sci. Technol. Lett. Eur. J. Inorg. Chem. IND ENG CHEM RES Inorg. Chem. J. Agric. Food. Chem. J. Chem. Eng. Data J. Chem. Educ. J. Chem. Inf. Model. J. Chem. Theory Comput. J. Med. Chem. J. Nat. Prod. J PROTEOME RES J. Am. Chem. Soc. LANGMUIR MACROMOLECULES Mol. Pharmaceutics Nano Lett. Org. Lett. ORG PROCESS RES DEV ORGANOMETALLICS J. Org. Chem. J. Phys. Chem. J. Phys. Chem. A J. Phys. Chem. B J. Phys. Chem. C J. Phys. Chem. Lett. Analyst Anal. Methods Biomater. Sci. Catal. Sci. Technol. Chem. Commun. Chem. Soc. Rev. CHEM EDUC RES PRACT CRYSTENGCOMM Dalton Trans. Energy Environ. Sci. ENVIRON SCI-NANO ENVIRON SCI-PROC IMP ENVIRON SCI-WAT RES Faraday Discuss. Food Funct. Green Chem. Inorg. Chem. Front. Integr. Biol. J. Anal. At. Spectrom. J. Mater. Chem. A J. Mater. Chem. B J. Mater. Chem. C Lab Chip Mater. Chem. Front. Mater. Horiz. MEDCHEMCOMM Metallomics Mol. Biosyst. Mol. Syst. Des. Eng. Nanoscale Nanoscale Horiz. Nat. Prod. Rep. New J. Chem. Org. Biomol. Chem. Org. Chem. Front. PHOTOCH PHOTOBIO SCI PCCP Polym. Chem.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1