Pub Date : 2020-09-30DOI: 10.1109/HLM49214.2020.9307856
Ziren Wang, G. Flowers, Jinchun Gao, Zekun Wang, Kaixuan Song
Bonding wires are widely used in microwave circuits and chip packaging. Due to the high frequency of signals transmitted by modern communication circuits, any structural discontinuity may cause signal reflection. Bonding wires are one potential source of such effects and their impact on signal transmission performance is examined in this study. In the present work, based on the size and material characteristics of a sample circuit board with bonding wires, a 3D electromagnetic numerical calculation model was developed. The voltage standing wave ratio for various numbers of bonding wires between two connection points was studied. In addition, a corresponding circuit model was developed and the equivalent inductance for different numbers of bonding wires was calculated. Both the electromagnetic field model and the circuit model results were validated using experimental tests. Using these models, the impact of impedance changes resulting from different numbers of bonding wires on the integrity of both analog and digital signals was analyzed.
{"title":"Impact of Impedance Change Caused by Bonding Wire Connection on Signal Transmission","authors":"Ziren Wang, G. Flowers, Jinchun Gao, Zekun Wang, Kaixuan Song","doi":"10.1109/HLM49214.2020.9307856","DOIUrl":"https://doi.org/10.1109/HLM49214.2020.9307856","url":null,"abstract":"Bonding wires are widely used in microwave circuits and chip packaging. Due to the high frequency of signals transmitted by modern communication circuits, any structural discontinuity may cause signal reflection. Bonding wires are one potential source of such effects and their impact on signal transmission performance is examined in this study. In the present work, based on the size and material characteristics of a sample circuit board with bonding wires, a 3D electromagnetic numerical calculation model was developed. The voltage standing wave ratio for various numbers of bonding wires between two connection points was studied. In addition, a corresponding circuit model was developed and the equivalent inductance for different numbers of bonding wires was calculated. Both the electromagnetic field model and the circuit model results were validated using experimental tests. Using these models, the impact of impedance changes resulting from different numbers of bonding wires on the integrity of both analog and digital signals was analyzed.","PeriodicalId":268345,"journal":{"name":"2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM)","volume":"95 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125364518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-30DOI: 10.1109/HLM49214.2020.9307918
Crispin Masahudu Ewuntomah, J. Oberrath
A short circuit situation in an electric vehicle can lead to several undesirable occurrences. One of such is the formation of high temperature electric arcs between the contacts of the high voltage direct current (HVDC) relays in the circuit. These arcs significantly vaporize the contacts within a few milliseconds. As a result, the pressure of the gas within the relay chamber significantly increases. Depending on the magnitude of the short circuit current, the pressure increase may lead to an explosion of the relay. To understand and quantify the pressure increase, a Panasonic AEV14012 relay is investigated. A short circuit experiment is conducted on the relay. The test results are compared with a numerical model established in COMSOL to simulate the electric arcing process. The temperature of the arcs is used to estimate the resulting vaporization. The simulation results show the arcing process and the resulting pressure increase within the relay chamber.
{"title":"3D Simulation of Electric Arcing and Pressure increase in an Automotive HVDC Relay During a Short Circuit Situation","authors":"Crispin Masahudu Ewuntomah, J. Oberrath","doi":"10.1109/HLM49214.2020.9307918","DOIUrl":"https://doi.org/10.1109/HLM49214.2020.9307918","url":null,"abstract":"A short circuit situation in an electric vehicle can lead to several undesirable occurrences. One of such is the formation of high temperature electric arcs between the contacts of the high voltage direct current (HVDC) relays in the circuit. These arcs significantly vaporize the contacts within a few milliseconds. As a result, the pressure of the gas within the relay chamber significantly increases. Depending on the magnitude of the short circuit current, the pressure increase may lead to an explosion of the relay. To understand and quantify the pressure increase, a Panasonic AEV14012 relay is investigated. A short circuit experiment is conducted on the relay. The test results are compared with a numerical model established in COMSOL to simulate the electric arcing process. The temperature of the arcs is used to estimate the resulting vaporization. The simulation results show the arcing process and the resulting pressure increase within the relay chamber.","PeriodicalId":268345,"journal":{"name":"2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117086699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-30DOI: 10.1109/HLM49214.2020.9307878
E. Calderon, Schweitzer Patrick, Weber Serge
The detection of arc faults in domestic networks has been an important subject for industrials and researchers for many years. The challenge for fault detection algorithms is to work efficiently with different circuit configurations where serial arc faults are difficult to identify. In this work, we focus on arc fault situations in the presence of masking loads, while taking into account the transient effect of starting loads. The proposed algorithm is based on a Kalman filter. Both the estimated current at the Kalman filter output and its state X2 are used to generate fault symptoms. Then a detection logic block based on fuzzy logic block confirms the presence of the arcing fault. The algorithm is tested on appliances in single or masked load configurations selected according to the requirements of UL 1699 and IEC 62606. The algorithm is also tested in steady state or at load start-up (transient state). The performance of this method is also studied and discussed. Experimental results show that the method we propose can effectively detect arcing faults, avoiding false tripping.
{"title":"Kalman Filter for Detecting Serial Arc Faults in a Domestic Electrical Network","authors":"E. Calderon, Schweitzer Patrick, Weber Serge","doi":"10.1109/HLM49214.2020.9307878","DOIUrl":"https://doi.org/10.1109/HLM49214.2020.9307878","url":null,"abstract":"The detection of arc faults in domestic networks has been an important subject for industrials and researchers for many years. The challenge for fault detection algorithms is to work efficiently with different circuit configurations where serial arc faults are difficult to identify. In this work, we focus on arc fault situations in the presence of masking loads, while taking into account the transient effect of starting loads. The proposed algorithm is based on a Kalman filter. Both the estimated current at the Kalman filter output and its state X2 are used to generate fault symptoms. Then a detection logic block based on fuzzy logic block confirms the presence of the arcing fault. The algorithm is tested on appliances in single or masked load configurations selected according to the requirements of UL 1699 and IEC 62606. The algorithm is also tested in steady state or at load start-up (transient state). The performance of this method is also studied and discussed. Experimental results show that the method we propose can effectively detect arcing faults, avoiding false tripping.","PeriodicalId":268345,"journal":{"name":"2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM)","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128109217","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-30DOI: 10.1109/HLM49214.2020.9307847
A. Torrealba, S. Noël, A. Brézard‐Oudot, A. Karam, D. Comte, J. Toran
It is well known that good wear performance can be obtained with Au-flashed palladium-nickel sphere on flat contacts simulating various connector applications. It has also been shown that these good wear properties could be recorded for asymmetrical coatings such as a noble metal sphere on Au-flashed palladium-nickel. In this paper we investigate the fretting properties of such asymmetrical coatings particularly of Ag versus Au flashed PdNi. The contacts are submitted to severe fretting wear by applying imposed sine displacements of amplitude similar to the Hertz contact radius. The contact resistance, the friction force and wear evolutions were analyzed and correlated to 3D profilometry measurements allowing wear volumes quantification and EDS elemental identification of the wear tracks.Very different behaviors are observed whether the silver coating is on the sphere or on the plane though in both case the embedding of the oxidized wear debris by silver improves the fretting behavior. The transfer of silver from the sphere contact onto the palladium nickel flat is seen to be beneficial to the electrical stability of the interface for a long time, leading to more stable results than even silver/silver contacts. Nevertheless an unusual phenomenon of the galling type is observed for which more investigations are needed.
{"title":"Analysis of Fretting Behavior of Silver and Gold Flashed Palladium-nickel Dissimilar Coatings for Connectors","authors":"A. Torrealba, S. Noël, A. Brézard‐Oudot, A. Karam, D. Comte, J. Toran","doi":"10.1109/HLM49214.2020.9307847","DOIUrl":"https://doi.org/10.1109/HLM49214.2020.9307847","url":null,"abstract":"It is well known that good wear performance can be obtained with Au-flashed palladium-nickel sphere on flat contacts simulating various connector applications. It has also been shown that these good wear properties could be recorded for asymmetrical coatings such as a noble metal sphere on Au-flashed palladium-nickel. In this paper we investigate the fretting properties of such asymmetrical coatings particularly of Ag versus Au flashed PdNi. The contacts are submitted to severe fretting wear by applying imposed sine displacements of amplitude similar to the Hertz contact radius. The contact resistance, the friction force and wear evolutions were analyzed and correlated to 3D profilometry measurements allowing wear volumes quantification and EDS elemental identification of the wear tracks.Very different behaviors are observed whether the silver coating is on the sphere or on the plane though in both case the embedding of the oxidized wear debris by silver improves the fretting behavior. The transfer of silver from the sphere contact onto the palladium nickel flat is seen to be beneficial to the electrical stability of the interface for a long time, leading to more stable results than even silver/silver contacts. Nevertheless an unusual phenomenon of the galling type is observed for which more investigations are needed.","PeriodicalId":268345,"journal":{"name":"2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133752992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
In order to evaluate the electrical contact performances of contact materials in relays, a new type of electrical contact simulation test system was designed and developed, in which contact materials of dynamic and static contacts can easily be replaced. The electrical contact characteristics of AgSnO2 with regard to the physical phenomenon of material surface adhesion was analyzed. Contact adhesion is divided into cold adhesion and hot adhesion. Cold adhesion occurs under the condition that no current passes the contact pair. This article mainly studies the hot adhesion phenomenon under the condition of resistive load current. The failure process of the contact pair due to dynamic welding of the contact during the experiment was analyzed. Firstly, the experimental process of hot adhesion was researched through the testing system, and then the relationship between the adhesion force and the contact resistance under adhesion condition is analyzed theoretically. Secondly, observing the microscopic morphology of the contact surface, and experimental data of other electrical performance degradation parameters in the experiment, the physical degradation mechanism of the adhesion characteristics was analyzed. Finally, the influencing factors of adhesion characteristics were explored through experiments, and the relationship between contact force, load conditions and adhesion characteristics were discussed.
{"title":"Experimental Study on the Adhesion Characteristics for AgSnO2 Contacts of a Relay","authors":"Zhaobin Wang, Zhen Li, Kangning Chen, Zhan Wang, Shang Shang","doi":"10.1109/HLM49214.2020.9307926","DOIUrl":"https://doi.org/10.1109/HLM49214.2020.9307926","url":null,"abstract":"In order to evaluate the electrical contact performances of contact materials in relays, a new type of electrical contact simulation test system was designed and developed, in which contact materials of dynamic and static contacts can easily be replaced. The electrical contact characteristics of AgSnO2 with regard to the physical phenomenon of material surface adhesion was analyzed. Contact adhesion is divided into cold adhesion and hot adhesion. Cold adhesion occurs under the condition that no current passes the contact pair. This article mainly studies the hot adhesion phenomenon under the condition of resistive load current. The failure process of the contact pair due to dynamic welding of the contact during the experiment was analyzed. Firstly, the experimental process of hot adhesion was researched through the testing system, and then the relationship between the adhesion force and the contact resistance under adhesion condition is analyzed theoretically. Secondly, observing the microscopic morphology of the contact surface, and experimental data of other electrical performance degradation parameters in the experiment, the physical degradation mechanism of the adhesion characteristics was analyzed. Finally, the influencing factors of adhesion characteristics were explored through experiments, and the relationship between contact force, load conditions and adhesion characteristics were discussed.","PeriodicalId":268345,"journal":{"name":"2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130929305","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-30DOI: 10.1109/HLM49214.2020.9307912
Kaixuan Song, Jinchun Gao, G. Flowers, Ziren Wang, Qingya Li, W. Yi
Ball grid arrays (BGA) are widely used in micro assemblies to provide both the mechanical connection between the chip substrate and the circuit board, and the electrical connection between the chip circuit and the peripheral matching circuit. Connection failures of a ball grid array may result in deterioration of signal integrity and low communication quality. In the present work, the impact of a degraded ball grid array connection on high-frequency characteristics was studied. A 3-D electromagnetic field model and an equivalent circuit model of a degraded ball grid array were developed. The electrical performance of the degraded ball grid array was analyzed and simulated. It was found that the 3-D electromagnetic field model results were in good agreements with the predicted behaviors from equivalent circuit model simulations. The characteristics of the ball grid array for different degradation levels were then compared and analyzed. This research serves to provide a better understanding of the effects of ball grid array deterioration on signal performance for application in fault detection strategies for electronic systems.
{"title":"Impact of the Ball Grid Array Connection Failures on Signal Integrity","authors":"Kaixuan Song, Jinchun Gao, G. Flowers, Ziren Wang, Qingya Li, W. Yi","doi":"10.1109/HLM49214.2020.9307912","DOIUrl":"https://doi.org/10.1109/HLM49214.2020.9307912","url":null,"abstract":"Ball grid arrays (BGA) are widely used in micro assemblies to provide both the mechanical connection between the chip substrate and the circuit board, and the electrical connection between the chip circuit and the peripheral matching circuit. Connection failures of a ball grid array may result in deterioration of signal integrity and low communication quality. In the present work, the impact of a degraded ball grid array connection on high-frequency characteristics was studied. A 3-D electromagnetic field model and an equivalent circuit model of a degraded ball grid array were developed. The electrical performance of the degraded ball grid array was analyzed and simulated. It was found that the 3-D electromagnetic field model results were in good agreements with the predicted behaviors from equivalent circuit model simulations. The characteristics of the ball grid array for different degradation levels were then compared and analyzed. This research serves to provide a better understanding of the effects of ball grid array deterioration on signal performance for application in fault detection strategies for electronic systems.","PeriodicalId":268345,"journal":{"name":"2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115323174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-30DOI: 10.1109/HLM49214.2020.9307871
T. Damle, A. Munoz, Chunmeng Xu, L. Graber
Hybrid circuit breakers (HCB) have been proposed as protection devices for multi-terminal DC power systems. The HCB consists of a fast mechanical switch (FMS), which carries the nominal current, in parallel with a semiconductor switch, which breaks the fault current. While most of the proposed FMS prototypes are based on Thomson coil actuators, FMS based on piezoelectric actuators have a faster response time and better stroke control. However, the contact separation and contact forces in piezoelectric FMS are an order of magnitude lower than Thomson coil-based FMS. This paper investigates the design considerations for FMS using piezoelectric actuators, i.e. the trade-offs between the blocked force, stroke, response time, and dimensions of the actuator using finite element model and spring mass damper models. The results are expected to guide the development of future versions of piezoelectrically actuated FMS.
{"title":"Design Considerations for Fast Mechanical Switches Using Piezoelectric Actuators","authors":"T. Damle, A. Munoz, Chunmeng Xu, L. Graber","doi":"10.1109/HLM49214.2020.9307871","DOIUrl":"https://doi.org/10.1109/HLM49214.2020.9307871","url":null,"abstract":"Hybrid circuit breakers (HCB) have been proposed as protection devices for multi-terminal DC power systems. The HCB consists of a fast mechanical switch (FMS), which carries the nominal current, in parallel with a semiconductor switch, which breaks the fault current. While most of the proposed FMS prototypes are based on Thomson coil actuators, FMS based on piezoelectric actuators have a faster response time and better stroke control. However, the contact separation and contact forces in piezoelectric FMS are an order of magnitude lower than Thomson coil-based FMS. This paper investigates the design considerations for FMS using piezoelectric actuators, i.e. the trade-offs between the blocked force, stroke, response time, and dimensions of the actuator using finite element model and spring mass damper models. The results are expected to guide the development of future versions of piezoelectrically actuated FMS.","PeriodicalId":268345,"journal":{"name":"2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM)","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123952857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-09-30DOI: 10.1109/HLM49214.2020.9307855
K. Sawa, T. Ueno, K. Nakano
Many small DC motors are used for anti-lock breaking system (ABS) and other applications. It is well-known that in DC motors the commutation arc causes a high rate of erosion and wear of brush and commutator. Therefore, it is important how the commutation arc influences the erosion and wear of brush in small DC motors.The wear and erosion of brush is caused by both mechanical sliding action and arc discharge. To figure out the wear/erosion mechanism of brush, mechanical wear and arc erosion are needed to be separately evaluated. However, it is usually difficult, because arc dis charge causes not only arc erosion but also the increase of mechanical sliding wear as R. Holm said.In this study, a switching device is newly developed and arc erosion of brush material is investigated. The brush material is Cu-graphite which is generally used in small DC motors. In the test the Cu-graphite as a brush is cathode and Cu is anode as a commutator of DC motors, and fundamental characteristics of arc duration and arc energy are obtained. Furthermore, the effect of a spark quenching circuit with a Zener diode is examined. In both cases, the arc erosion is measured by a laser microscope and the arc erosion per unit energy is obtained. In addition brush wear/erosion obtained by a commutation test could be analyzed, using the above results.
{"title":"Evaluation of Arc Erosion of Cu-graphite Brush Used in Small DC Motors with and without Quenching Device","authors":"K. Sawa, T. Ueno, K. Nakano","doi":"10.1109/HLM49214.2020.9307855","DOIUrl":"https://doi.org/10.1109/HLM49214.2020.9307855","url":null,"abstract":"Many small DC motors are used for anti-lock breaking system (ABS) and other applications. It is well-known that in DC motors the commutation arc causes a high rate of erosion and wear of brush and commutator. Therefore, it is important how the commutation arc influences the erosion and wear of brush in small DC motors.The wear and erosion of brush is caused by both mechanical sliding action and arc discharge. To figure out the wear/erosion mechanism of brush, mechanical wear and arc erosion are needed to be separately evaluated. However, it is usually difficult, because arc dis charge causes not only arc erosion but also the increase of mechanical sliding wear as R. Holm said.In this study, a switching device is newly developed and arc erosion of brush material is investigated. The brush material is Cu-graphite which is generally used in small DC motors. In the test the Cu-graphite as a brush is cathode and Cu is anode as a commutator of DC motors, and fundamental characteristics of arc duration and arc energy are obtained. Furthermore, the effect of a spark quenching circuit with a Zener diode is examined. In both cases, the arc erosion is measured by a laser microscope and the arc erosion per unit energy is obtained. In addition brush wear/erosion obtained by a commutation test could be analyzed, using the above results.","PeriodicalId":268345,"journal":{"name":"2020 IEEE 66th Holm Conference on Electrical Contacts and Intensive Course (HLM)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2020-09-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127512220","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：