Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270076
L. G. Allred, G. E. Kelly
In many instances, the electronic state of an electronic circuit card contains insufficient information for correct fault diagnosis. Infrared thermal images, captured during the initial warmup of an electronic circuit card, are employed to enhance the available information and to assist the technician in performing the fault diagnosis. This system has proven beneficial for radar and microwave technologies where probing changes the electronic response of the circuit and signal levels can be extremely small. The development of this system has required the integration of technologies from a diversity of fields including image capture, image compression, image enhancement, neural networks, genetic algorithms, thermodynamics, and automatic test equipment (ATE) software. These technologies and preliminary system performance are discussed.<>
{"title":"A system for fault diagnosis in electronic circuits using thermal imaging","authors":"L. G. Allred, G. E. Kelly","doi":"10.1109/AUTEST.1992.270076","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270076","url":null,"abstract":"In many instances, the electronic state of an electronic circuit card contains insufficient information for correct fault diagnosis. Infrared thermal images, captured during the initial warmup of an electronic circuit card, are employed to enhance the available information and to assist the technician in performing the fault diagnosis. This system has proven beneficial for radar and microwave technologies where probing changes the electronic response of the circuit and signal levels can be extremely small. The development of this system has required the integration of technologies from a diversity of fields including image capture, image compression, image enhancement, neural networks, genetic algorithms, thermodynamics, and automatic test equipment (ATE) software. These technologies and preliminary system performance are discussed.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131415619","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270138
K. Scott
The vehicle manufacturer is searching for cost-effective ways to improve design, increase manufacturing efficiency and effectiveness, and support the dealerships in their efforts to improve customer satisfaction and maintain marque loyalty. Modern automotive diagnostic systems, supported by efficient software applications development, are able to deliver the variety of tools required to meet these needs with a right-first-time approach able to deliver improved manufacturing and workshop productivity. Together with an emphasis towards concurrent engineering techniques, continuous improvements in design and repair quality can be maintained. The topics discussed are dealer parts and service operations; automotive electronic technology development; automotive diagnostic system development; and concurrent engineering.<>
{"title":"The importance of automotive diagnostics in the search of excellence","authors":"K. Scott","doi":"10.1109/AUTEST.1992.270138","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270138","url":null,"abstract":"The vehicle manufacturer is searching for cost-effective ways to improve design, increase manufacturing efficiency and effectiveness, and support the dealerships in their efforts to improve customer satisfaction and maintain marque loyalty. Modern automotive diagnostic systems, supported by efficient software applications development, are able to deliver the variety of tools required to meet these needs with a right-first-time approach able to deliver improved manufacturing and workshop productivity. Together with an emphasis towards concurrent engineering techniques, continuous improvements in design and repair quality can be maintained. The topics discussed are dealer parts and service operations; automotive electronic technology development; automotive diagnostic system development; and concurrent engineering.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"119 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124605603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270113
L. Gude
Testing of modern airborne radar systems requires the automated test equipment (ATE) to interface with complex microprocessor based data and memory intensive line replaceable units (LRUs). Bendix Guidance and Control Systems has, for over twenty years, been testing fire control radars. Bendix recognized that a flexible/reconfigurable test set was required to minimize the development of new interfaces. The authors discuss the development of a test set based on existing, non-proprietary architecture using the VXI bus. The computational power of newly developed array processors produces substantial performance improvements over general purpose computers when performing floating point calculations on arrays of data. Digital signal processing (DSP) techniques, coupled with high performance digital interfaces, provide a highly flexible test set that can verify the performance of digital radar LRUs with minimum equipment. Implementing these techniques into a test set results in a downsized, highly mobile ATE which significantly reduces LRU test times.<>
{"title":"High speed digital interface for radar applications","authors":"L. Gude","doi":"10.1109/AUTEST.1992.270113","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270113","url":null,"abstract":"Testing of modern airborne radar systems requires the automated test equipment (ATE) to interface with complex microprocessor based data and memory intensive line replaceable units (LRUs). Bendix Guidance and Control Systems has, for over twenty years, been testing fire control radars. Bendix recognized that a flexible/reconfigurable test set was required to minimize the development of new interfaces. The authors discuss the development of a test set based on existing, non-proprietary architecture using the VXI bus. The computational power of newly developed array processors produces substantial performance improvements over general purpose computers when performing floating point calculations on arrays of data. Digital signal processing (DSP) techniques, coupled with high performance digital interfaces, provide a highly flexible test set that can verify the performance of digital radar LRUs with minimum equipment. Implementing these techniques into a test set results in a downsized, highly mobile ATE which significantly reduces LRU test times.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129656839","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270090
J.D. Milgram
The author presents a cohesive set of heuristic algorithms that can be used with boundary-scan logic to diagnose interconnect faults. The terms that are used, a brief overview of the boundary-scan architecture, and the boundary-scan test generator requirements are given. The interconnect diagnostics and the heuristic algorithms that are used during the processing are discussed. A well-thought-out test generator which meets the outlined requirements is essential. The diagnostic program performs best when it acquires as much information as it can during initialization.<>
{"title":"Automated boundary-scan diagnostics: adding value to interconnect testing","authors":"J.D. Milgram","doi":"10.1109/AUTEST.1992.270090","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270090","url":null,"abstract":"The author presents a cohesive set of heuristic algorithms that can be used with boundary-scan logic to diagnose interconnect faults. The terms that are used, a brief overview of the boundary-scan architecture, and the boundary-scan test generator requirements are given. The interconnect diagnostics and the heuristic algorithms that are used during the processing are discussed. A well-thought-out test generator which meets the outlined requirements is essential. The diagnostic program performs best when it acquires as much information as it can during initialization.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"44 Suppl 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134050958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270133
J. Hanna
The author discusses the design to test data representations that are being developed by Rome Laboratory in concert with representatives of the computer aided design/test (CAD/CAT) industry and various US Department of Defense and government agencies under the auspices of the IEEE. Few standard representations of engineering, design, and test information exist to foster exchange and reuse in any reasonable fashion during the process of developing and fielding electronic systems. One problem is that the data generated by one vendor's tool cannot be readily used by the tools of another vendor. Another problem is that no integrated solution exists to address the complete spectrum of engineering, design, and test activities. Three industry standard data representations that are in various stages of development are presented, and their potential impact on the problem domain is examined.<>
{"title":"Data standards: the link between design and test","authors":"J. Hanna","doi":"10.1109/AUTEST.1992.270133","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270133","url":null,"abstract":"The author discusses the design to test data representations that are being developed by Rome Laboratory in concert with representatives of the computer aided design/test (CAD/CAT) industry and various US Department of Defense and government agencies under the auspices of the IEEE. Few standard representations of engineering, design, and test information exist to foster exchange and reuse in any reasonable fashion during the process of developing and fielding electronic systems. One problem is that the data generated by one vendor's tool cannot be readily used by the tools of another vendor. Another problem is that no integrated solution exists to address the complete spectrum of engineering, design, and test activities. Three industry standard data representations that are in various stages of development are presented, and their potential impact on the problem domain is examined.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129150705","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270080
C.A. Miller, R. Larson, P. Bursch
The authors develop an approach to organizing the presentation of large amounts of model-based data in an interactive format patterned after a model of human-human explanatory and argumentative discourse. Portions of this interface were implemented for Honeywell and the Air Force's model-based flight control maintenance and diagnostic system (FCMDS). It is concluded that sufficient information exists in a model-based system to provide a wide range of explanation types, and that, at least in FCMDS, this information is readily accessible though in a format difficult for the user to use. It is also concluded that the discourse approach is a convenient, powerful, and broadly applicable method of representing and controlling information exchange in human-machine, as well as human-human, interactions.<>
{"title":"Winning the explanation game; providing user explanations for a model-based expert system","authors":"C.A. Miller, R. Larson, P. Bursch","doi":"10.1109/AUTEST.1992.270080","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270080","url":null,"abstract":"The authors develop an approach to organizing the presentation of large amounts of model-based data in an interactive format patterned after a model of human-human explanatory and argumentative discourse. Portions of this interface were implemented for Honeywell and the Air Force's model-based flight control maintenance and diagnostic system (FCMDS). It is concluded that sufficient information exists in a model-based system to provide a wide range of explanation types, and that, at least in FCMDS, this information is readily accessible though in a format difficult for the user to use. It is also concluded that the discourse approach is a convenient, powerful, and broadly applicable method of representing and controlling information exchange in human-machine, as well as human-human, interactions.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126467877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270134
L. Haynes, S. Goodall, F. Philips, W. Simpson, J. Sheppard
The authors describe work being carried out under the auspices of the artificial intelligence, expert system tie to automatic test equipment (AI-ESTATE) committee of the IEEE standards coordinating committee 20 (SCC-20). The goal is to develop a formal data model for dependency related information called an information flow model (IFM). The most important entities in the model are discussed, and a brief description of the model is given. The study attempts to place the IFM in the larger context of the Ada-based environment for test, and other related efforts are briefly described. The IFM standard will allow portability of dependency models between tools. The larger goal is to allow reasoners which use the IFM model to be plug compatible, in the true sense of the concept of an open architecture.<>
{"title":"Test strategy component of an open architecture for electronics design and support tools","authors":"L. Haynes, S. Goodall, F. Philips, W. Simpson, J. Sheppard","doi":"10.1109/AUTEST.1992.270134","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270134","url":null,"abstract":"The authors describe work being carried out under the auspices of the artificial intelligence, expert system tie to automatic test equipment (AI-ESTATE) committee of the IEEE standards coordinating committee 20 (SCC-20). The goal is to develop a formal data model for dependency related information called an information flow model (IFM). The most important entities in the model are discussed, and a brief description of the model is given. The study attempts to place the IFM in the larger context of the Ada-based environment for test, and other related efforts are briefly described. The IFM standard will allow portability of dependency models between tools. The larger goal is to allow reasoners which use the IFM model to be plug compatible, in the true sense of the concept of an open architecture.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117221891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270137
M. D. Brazet
With the recent addition of vehicle electronics, there are many analogies between fleet maintenance in the heavy duty vehicle industry and maintenance of military systems. These similarities allow integrated diagnostics tools, practices and techniques developed for weapon systems to be applied to heavy duty vehicles. The author defines the integrated diagnostics process, provides a brief discussion of the evolution of electronic applications in the heavy duty vehicle industry, and applies the principles of integrated diagnostics to optimizing a diagnostic implementation.<>
{"title":"The application of integrated diagnostics techniques to heavy duty vehicle testing","authors":"M. D. Brazet","doi":"10.1109/AUTEST.1992.270137","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270137","url":null,"abstract":"With the recent addition of vehicle electronics, there are many analogies between fleet maintenance in the heavy duty vehicle industry and maintenance of military systems. These similarities allow integrated diagnostics tools, practices and techniques developed for weapon systems to be applied to heavy duty vehicles. The author defines the integrated diagnostics process, provides a brief discussion of the evolution of electronic applications in the heavy duty vehicle industry, and applies the principles of integrated diagnostics to optimizing a diagnostic implementation.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117118536","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270106
J. Lyke, E. Kolesar
The electrical performance of wafer-scale integration interconnections was studied, with an emphasis on the characteristic impedance. The study was based on closed-form expressions, finite difference method models, commercially available microwave circuit analysis software, and a numerical evaluation of the Telegrapher equations. Measurements were conducted on 5-in-diameter test wafers which contained numerous interconnection structures. The results revealed interesting information concerning the driving-point impedances of the structures, the inadequacy of closed-form models for accurate estimation, and the need for more accurate modeling techniques.<>
{"title":"Computational analysis and performance evaluation of representative wafer scale integration interconnections","authors":"J. Lyke, E. Kolesar","doi":"10.1109/AUTEST.1992.270106","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270106","url":null,"abstract":"The electrical performance of wafer-scale integration interconnections was studied, with an emphasis on the characteristic impedance. The study was based on closed-form expressions, finite difference method models, commercially available microwave circuit analysis software, and a numerical evaluation of the Telegrapher equations. Measurements were conducted on 5-in-diameter test wafers which contained numerous interconnection structures. The results revealed interesting information concerning the driving-point impedances of the structures, the inadequacy of closed-form models for accurate estimation, and the need for more accurate modeling techniques.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131310088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270120
L. Kirkland, J. Sheppard, W. Simpson
Recent work by the IEEE Standards Coordinating Committee 20 (SCC-20) has included the specification of standards for artificially intelligent automatic test equipment (ATE). The SCC-20 established a subcommittee known as AI-ESTATE (artificial intelligence expert system tie to automatic test equipment). The authors propose a new approach to evaluating AI based ATE systems under AI-ESTATE using a weighted evaluation function based upon the functional capabilities of the AI system called the functional intelligence ratio (FIR). They describe the problems associated with evaluating AI systems, describe the role of AI-ESTATE as part of SCC-20, and present the FIR with a sample list of base requirements.<>
{"title":"Evaluating AI-ESTATE standards compliance using a functional intelligence ratio","authors":"L. Kirkland, J. Sheppard, W. Simpson","doi":"10.1109/AUTEST.1992.270120","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270120","url":null,"abstract":"Recent work by the IEEE Standards Coordinating Committee 20 (SCC-20) has included the specification of standards for artificially intelligent automatic test equipment (ATE). The SCC-20 established a subcommittee known as AI-ESTATE (artificial intelligence expert system tie to automatic test equipment). The authors propose a new approach to evaluating AI based ATE systems under AI-ESTATE using a weighted evaluation function based upon the functional capabilities of the AI system called the functional intelligence ratio (FIR). They describe the problems associated with evaluating AI systems, describe the role of AI-ESTATE as part of SCC-20, and present the FIR with a sample list of base requirements.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126558482","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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