Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270131
S. Gustafson, G. Little, J. Rattray
Neural network technology is considered that may significantly reduce the time required to obtain steady-state compressor maps. This reduction would be accomplished using neural networks trained to learn correlations between transient and steady-state compressor performance. Neural networks that generalize with guaranteed bounds on computational effort, smoothness, and stability are particularly appropriate for this application. The learned correlation could make important contributions to the solution of stall recovery and surge anticipation problems.<>
{"title":"Correlation of transient and steady-state compressor performance using neural networks","authors":"S. Gustafson, G. Little, J. Rattray","doi":"10.1109/AUTEST.1992.270131","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270131","url":null,"abstract":"Neural network technology is considered that may significantly reduce the time required to obtain steady-state compressor maps. This reduction would be accomplished using neural networks trained to learn correlations between transient and steady-state compressor performance. Neural networks that generalize with guaranteed bounds on computational effort, smoothness, and stability are particularly appropriate for this application. The learned correlation could make important contributions to the solution of stall recovery and surge anticipation problems.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116582740","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270082
P. Bursch, J. Meisner
Current flight line maintenance troubleshooting uses static fault isolation trees contained in paper based technical manuals. Future troubleshooting trends will automate the flight line diagnosis of system failures using portable maintenance aides (PMAs). The authors compare and contrast the future automated diagnostic approach to the paper based methodology of today. Field experiment results are also presented that quantify the differences between these two troubleshooting approaches. These field experiments conducted at Luke Air Force Base showed that enhanced maintenance performance was achieved when a diverse work force was equipped with PMAs.<>
{"title":"Comparison of paper and automated fault isolation techniques","authors":"P. Bursch, J. Meisner","doi":"10.1109/AUTEST.1992.270082","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270082","url":null,"abstract":"Current flight line maintenance troubleshooting uses static fault isolation trees contained in paper based technical manuals. Future troubleshooting trends will automate the flight line diagnosis of system failures using portable maintenance aides (PMAs). The authors compare and contrast the future automated diagnostic approach to the paper based methodology of today. Field experiment results are also presented that quantify the differences between these two troubleshooting approaches. These field experiments conducted at Luke Air Force Base showed that enhanced maintenance performance was achieved when a diverse work force was equipped with PMAs.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122387512","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270127
J. Heiser, G.L. Hinkle
For the past two years, the Ada Based Environment for Test (ABET) Technical Advisory Group (ATAG) has been working to expedite development of the IEEE ABET standards. J.E. Heiser and K. Schoonover (1991) discussed the formation, structure, and early results of the USAF ATAG initiative. The authors provide more background on ABET standardization and describe recent ATAG accomplishments and current plans. The drafts and reports produced by the ATAG during this second year have significantly aided evolution of the ABET family of standards. Proposed tasks will develop needed draft standards, and provide data needed to address some significant open areas in the current drafts.<>
{"title":"An update on the ATAG initiative","authors":"J. Heiser, G.L. Hinkle","doi":"10.1109/AUTEST.1992.270127","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270127","url":null,"abstract":"For the past two years, the Ada Based Environment for Test (ABET) Technical Advisory Group (ATAG) has been working to expedite development of the IEEE ABET standards. J.E. Heiser and K. Schoonover (1991) discussed the formation, structure, and early results of the USAF ATAG initiative. The authors provide more background on ABET standardization and describe recent ATAG accomplishments and current plans. The drafts and reports produced by the ATAG during this second year have significantly aided evolution of the ABET family of standards. Proposed tasks will develop needed draft standards, and provide data needed to address some significant open areas in the current drafts.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"73 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134338247","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270084
P. Rodgers
The US Navy's 2M/ATE (miniature/microminiature/automatic test equipment) program is intended to provide the fleet with high reliability electronic module test, diagnostic, and miniature/microminiature (2M) repair capabilities. The author covers the program's current status and future directions and plans. The goal is to increase fleet self-sufficiency, readiness, and cost reduction. The 2M/ATE program's repair capabilities and automatic digital/analog testers provide for organizational (O) and intermediate (I) level fault isolation and repair of electronic assemblies. The 2M portion of the program strives to provide the repair capabilities and electronic documentation needed for electronic circuit card assemblies and equipment at the O and I levels. The 2M push is for progressive maintenance which yields self-sufficiency and, thereby, readiness.<>
{"title":"US Navy 2M/ATE program: fleet self-sufficiency, readiness and progressive maintenance","authors":"P. Rodgers","doi":"10.1109/AUTEST.1992.270084","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270084","url":null,"abstract":"The US Navy's 2M/ATE (miniature/microminiature/automatic test equipment) program is intended to provide the fleet with high reliability electronic module test, diagnostic, and miniature/microminiature (2M) repair capabilities. The author covers the program's current status and future directions and plans. The goal is to increase fleet self-sufficiency, readiness, and cost reduction. The 2M/ATE program's repair capabilities and automatic digital/analog testers provide for organizational (O) and intermediate (I) level fault isolation and repair of electronic assemblies. The 2M portion of the program strives to provide the repair capabilities and electronic documentation needed for electronic circuit card assemblies and equipment at the O and I levels. The 2M push is for progressive maintenance which yields self-sufficiency and, thereby, readiness.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121954891","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270140
W. Ross, J.L. Hernandez
The authors discuss the results of a proof-of-concept effort aimed at defining an automatic test equipment (ATE) architecture that incorporates both built-in-test (BIT) data and functional testing techniques. The concept, called BENeFITS (BIT-Enhanced Functional Test System), uses fault guided analysis techniques to process BIT failure data retrieved from the unit under test and perform functional testing only on the sections indicated by BIT. Other features include the use of software algorithms and artificial intelligence (AI) principles to improve fault callout accuracies over time.<>
作者讨论了概念验证工作的结果，旨在定义一个自动测试设备(ATE)架构，该架构结合了内置测试(BIT)数据和功能测试技术。这个概念被称为BENeFITS (BIT- enhanced Functional Test System)，它使用故障引导分析技术来处理从被测单元检索到的BIT故障数据，并仅在BIT指示的部分执行功能测试。其他功能包括使用软件算法和人工智能(AI)原理来提高故障标注的准确性。
{"title":"BENeFITS - A step to ATE of the future","authors":"W. Ross, J.L. Hernandez","doi":"10.1109/AUTEST.1992.270140","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270140","url":null,"abstract":"The authors discuss the results of a proof-of-concept effort aimed at defining an automatic test equipment (ATE) architecture that incorporates both built-in-test (BIT) data and functional testing techniques. The concept, called BENeFITS (BIT-Enhanced Functional Test System), uses fault guided analysis techniques to process BIT failure data retrieved from the unit under test and perform functional testing only on the sections indicated by BIT. Other features include the use of software algorithms and artificial intelligence (AI) principles to improve fault callout accuracies over time.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"343 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124312514","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270111
D. C. Doskocil
Emerging built-in test requirements for electronic warfare systems on platforms such as the F22 advanced tactical fighter necessitate advanced techniques to cost-effectively detect, isolate, and report RF faults. The author describes integrated system architectures and the requirements imposed on an RF system for an advanced platform and explains the evolution of an architecture which can meet those requirements. Diagnostic false alarm reduction is discussed, with analogies to false alarm reduction in the target detection domain. The problem of aperture testing is discussed, and a description of how these RF assets can interact with Depot test equipment is given.<>
{"title":"Advanced RF built in test","authors":"D. C. Doskocil","doi":"10.1109/AUTEST.1992.270111","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270111","url":null,"abstract":"Emerging built-in test requirements for electronic warfare systems on platforms such as the F22 advanced tactical fighter necessitate advanced techniques to cost-effectively detect, isolate, and report RF faults. The author describes integrated system architectures and the requirements imposed on an RF system for an advanced platform and explains the evolution of an architecture which can meet those requirements. Diagnostic false alarm reduction is discussed, with analogies to false alarm reduction in the target detection domain. The problem of aperture testing is discussed, and a description of how these RF assets can interact with Depot test equipment is given.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":" 17","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114060711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270126
M. Bennett, D. Gannon, R. Haas, M.J. Halinski
The authors focus on the use of computer aided software engineering (CASE) tools to reduce risk in the software design phase and to provide a validation mechanism that can be used throughout the software development process. An automatic test equipment (ATE) software engineering project was selected as the testbed for two CASE tools to be used in rapid prototype development. The internal system software translates common language instrument commands into native instrument commands sent over the IEEE-488 bus. The software process follows the waterfall model and MIL-STD-2167A with requirements definition, software design, implementation, and test. The high-level design phase made use of data flow diagrams, state machines, and mini-specifications under the management of a widely used CASE tool. The diagrams and specifications were then used as input to a rapid prototyping CASE tool to simulate the system, providing a validation mechanism. A discussion of the software design is included, as is a technique for determining when to convert the design from one CASE design representation to another. The advantages and disadvantages of each tool are also discussed.<>
{"title":"Rapid prototyping ATE software with CASE","authors":"M. Bennett, D. Gannon, R. Haas, M.J. Halinski","doi":"10.1109/AUTEST.1992.270126","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270126","url":null,"abstract":"The authors focus on the use of computer aided software engineering (CASE) tools to reduce risk in the software design phase and to provide a validation mechanism that can be used throughout the software development process. An automatic test equipment (ATE) software engineering project was selected as the testbed for two CASE tools to be used in rapid prototype development. The internal system software translates common language instrument commands into native instrument commands sent over the IEEE-488 bus. The software process follows the waterfall model and MIL-STD-2167A with requirements definition, software design, implementation, and test. The high-level design phase made use of data flow diagrams, state machines, and mini-specifications under the management of a widely used CASE tool. The diagrams and specifications were then used as input to a rapid prototyping CASE tool to simulate the system, providing a validation mechanism. A discussion of the software design is included, as is a technique for determining when to convert the design from one CASE design representation to another. The advantages and disadvantages of each tool are also discussed.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124054025","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270081
R.E. Hartwell
Battle damage assessment (BDA) of US Navy aircraft on an aircraft carrier requires quick response, the coordination of multiple skill groups, and effective interchange of complex information. A realistic working demonstration of this capability is described. The BDA demonstration combines concepts for electronic technical manual presentation, data structuring for search and retrieval, computer processing for damage evaluation, and a user interface suited to maintenance and BDA field operations. The demonstration encompasses an innovative approach to aircraft carrier BDA, using electronic data presentation to avoid the use of paper on the aircraft carrier and to provide BDA features not possible in a manual system.<>
{"title":"A portable maintenance aid applied to battle damage assessment","authors":"R.E. Hartwell","doi":"10.1109/AUTEST.1992.270081","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270081","url":null,"abstract":"Battle damage assessment (BDA) of US Navy aircraft on an aircraft carrier requires quick response, the coordination of multiple skill groups, and effective interchange of complex information. A realistic working demonstration of this capability is described. The BDA demonstration combines concepts for electronic technical manual presentation, data structuring for search and retrieval, computer processing for damage evaluation, and a user interface suited to maintenance and BDA field operations. The demonstration encompasses an innovative approach to aircraft carrier BDA, using electronic data presentation to avoid the use of paper on the aircraft carrier and to provide BDA features not possible in a manual system.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129011477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270092
L. Kirkland
The author discusses artificial intelligence (AI) applications for the human interface of the test/diagnosis environment. The human interface can contain speech recognition, understanding, and response and visual perception of the test environment. The areas of focus for the human interface are described. The intelligent diagnostic functions available at the human interface provide complete automated test/diagnostic data entry and evaluation to the human. The human interface of the AI system is a multimedia environment. The integrated AI system promises to facilitate ease in long term support. This is accomplished by moving the information domain into a user-oriented configuration. What specifically happened to a unit when it failed will determine the repair action. Expert know-how will reside in a usable knowledge sharing domain. Arbitrary testing-diagnosing philosophies will no longer exist. Only the part(s) which is defective will be tested and repaired.<>
{"title":"An artificially intelligent-human interface for test/diagnosis","authors":"L. Kirkland","doi":"10.1109/AUTEST.1992.270092","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270092","url":null,"abstract":"The author discusses artificial intelligence (AI) applications for the human interface of the test/diagnosis environment. The human interface can contain speech recognition, understanding, and response and visual perception of the test environment. The areas of focus for the human interface are described. The intelligent diagnostic functions available at the human interface provide complete automated test/diagnostic data entry and evaluation to the human. The human interface of the AI system is a multimedia environment. The integrated AI system promises to facilitate ease in long term support. This is accomplished by moving the information domain into a user-oriented configuration. What specifically happened to a unit when it failed will determine the repair action. Expert know-how will reside in a usable knowledge sharing domain. Arbitrary testing-diagnosing philosophies will no longer exist. Only the part(s) which is defective will be tested and repaired.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"223 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115182363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-09-21DOI: 10.1109/AUTEST.1992.270135
S. Fortier, A. Wilmot
The Product Data Exchange using the Standard for the Exchange of Product Model Data (PDES/STEP) Application Protocols for Electronics program will develop application protocols for communicating information between activities within the electronic life cycle. The program, abbreviated as PAP-E, will develop application protocols (APs) in accordance with the PDES/STEP development philosophy. Information modeling during the application protocol development process is an integral part of this philosophy. The project will include a demonstration of a selected portion of the developed APs representing test and integrated diagnostics information. A pilot AP development activity being conducted is described.<>
{"title":"Test and diagnostics product data representation","authors":"S. Fortier, A. Wilmot","doi":"10.1109/AUTEST.1992.270135","DOIUrl":"https://doi.org/10.1109/AUTEST.1992.270135","url":null,"abstract":"The Product Data Exchange using the Standard for the Exchange of Product Model Data (PDES/STEP) Application Protocols for Electronics program will develop application protocols for communicating information between activities within the electronic life cycle. The program, abbreviated as PAP-E, will develop application protocols (APs) in accordance with the PDES/STEP development philosophy. Information modeling during the application protocol development process is an integral part of this philosophy. The project will include a demonstration of a selected portion of the developed APs representing test and integrated diagnostics information. A pilot AP development activity being conducted is described.<<ETX>>","PeriodicalId":273287,"journal":{"name":"Conference Record AUTOTESTCON '92: The IEEE Systems Readiness Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-09-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121960480","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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