Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763734
L. Lundgaard, B. Skyberg
Acoustic methods are proven sufficiently sensitive to detect discharges on live parts in GIS. This paper discusses how the sensitivity depends on the material properties of the SFr, gas and the enclosure, as well geometry of the GIS. In particular, the effect of dispersive wave propagation in the enclosure and the very significant frequency dependent absorption in the gas are discussed. The analyses are based on measurements of the sound absorption in SF/sub 6/ and frequency of signals from discharges in a GIS.
{"title":"Acoustic signals from corona discharges in gis","authors":"L. Lundgaard, B. Skyberg","doi":"10.1109/CEIDP.1991.763734","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763734","url":null,"abstract":"Acoustic methods are proven sufficiently sensitive to detect discharges on live parts in GIS. This paper discusses how the sensitivity depends on the material properties of the SFr, gas and the enclosure, as well geometry of the GIS. In particular, the effect of dispersive wave propagation in the enclosure and the very significant frequency dependent absorption in the gas are discussed. The analyses are based on measurements of the sound absorption in SF/sub 6/ and frequency of signals from discharges in a GIS.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116334245","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763731
Y. Miyashita, Y. Makishi, H. Kato
As the most important problem for crosslinked polyethylene (XLPE) insulated power cable, the nature of water treeing has been studied with great efforts. And recently, some insulating materials to be watertree resistive have been proposed. However, the substantial mechanism of water treeing has been left still unclarified in spite of the importance of complete suppression of water treeing. In this paper, the nature and morphology of XLPE with o r without water tree were examined by means of analytical instruments tnd the influence of contack with certain fluids on water treeing without water was investigated. A theoretical mechanism on water treeing will also be discussed.
{"title":"A new chemical approach to water treeing in xlpe insulation","authors":"Y. Miyashita, Y. Makishi, H. Kato","doi":"10.1109/CEIDP.1991.763731","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763731","url":null,"abstract":"As the most important problem for crosslinked polyethylene (XLPE) insulated power cable, the nature of water treeing has been studied with great efforts. And recently, some insulating materials to be watertree resistive have been proposed. However, the substantial mechanism of water treeing has been left still unclarified in spite of the importance of complete suppression of water treeing. In this paper, the nature and morphology of XLPE with o r without water tree were examined by means of analytical instruments tnd the influence of contack with certain fluids on water treeing without water was investigated. A theoretical mechanism on water treeing will also be discussed.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"59 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133974966","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763961
R. Fouracre, L. Huimin, S. Mcgregor
{"title":"A Novel Application Of Fast Pulse Measurements Of Aged Induced Changes In Dielectric Samples","authors":"R. Fouracre, L. Huimin, S. Mcgregor","doi":"10.1109/CEIDP.1991.763961","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763961","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"92 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134300385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763378
T. Heizmarm, W.S. ZaengI
Depolarization currents in a larger number of virgin and aged polymer-insulated medium-voltage cables have been measured as a function of the magnitude of the applied electric field. In comparison with new cables some service-aged cables revealed unusual dielectric properties. As expected, unaged cables show a lineal relation between the depolarization current and the polarizing field at moderate electric field strengths. In contrast, for many service-aged cables a more than proportional increase of the depolarization current with the applied electric field was observed (indicating some nonlinearity). Visual inspection of the cables showed a very high density of bow-tie trees in the 'non-linear' cables. Furthermore, it was observed that the nonlinearity vanished when the cable was dried and reappeared again after wetting the cable. As a conclusion from these observations, it is believed that the non-linear dielectric behaviour is a consequence of the presence of bow-tie trees in the cables. In our opinion it may be worthwhile considering the measurement of depolarization currents as a diagnostic measurement technique to detect water trees in buried cables.
{"title":"Influence of ageing on depolarization currents in polymer-insulated medium-voltage cables","authors":"T. Heizmarm, W.S. ZaengI","doi":"10.1109/CEIDP.1991.763378","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763378","url":null,"abstract":"Depolarization currents in a larger number of virgin and aged polymer-insulated medium-voltage cables have been measured as a function of the magnitude of the applied electric field. In comparison with new cables some service-aged cables revealed unusual dielectric properties. As expected, unaged cables show a lineal relation between the depolarization current and the polarizing field at moderate electric field strengths. In contrast, for many service-aged cables a more than proportional increase of the depolarization current with the applied electric field was observed (indicating some nonlinearity). Visual inspection of the cables showed a very high density of bow-tie trees in the 'non-linear' cables. Furthermore, it was observed that the nonlinearity vanished when the cable was dried and reappeared again after wetting the cable. As a conclusion from these observations, it is believed that the non-linear dielectric behaviour is a consequence of the presence of bow-tie trees in the cables. In our opinion it may be worthwhile considering the measurement of depolarization currents as a diagnostic measurement technique to detect water trees in buried cables.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130226253","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763955
T. Kawasaki, Y. Arai, T. Takada
In order to design the insulation of high-voltage equipment, it is necessary to develop a measurement method for understanding the time dependence of AC (50 Hz) surface discharge on an insulating material. The authors have developed a method by which one can obtain the surface charge pattern and density by means of an electrooptic Pockels effect in BSO (Bi/sub 12/SiO/sub 20/) crystal. They have improved the optical system to obtain the time dependence of the AC (50 Hz) surface discharge pattern and density on an insulating film. The observed AC charge distribution on a PET film surface is reported. The relationship between needle-film gap size and residual surface charge pattern is discussed. >
{"title":"Observation Of Ac Surface Discharge On Opaque Insulating Film By Pockels Effect","authors":"T. Kawasaki, Y. Arai, T. Takada","doi":"10.1109/CEIDP.1991.763955","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763955","url":null,"abstract":"In order to design the insulation of high-voltage equipment, it is necessary to develop a measurement method for understanding the time dependence of AC (50 Hz) surface discharge on an insulating material. The authors have developed a method by which one can obtain the surface charge pattern and density by means of an electrooptic Pockels effect in BSO (Bi/sub 12/SiO/sub 20/) crystal. They have improved the optical system to obtain the time dependence of the AC (50 Hz) surface discharge pattern and density on an insulating film. The observed AC charge distribution on a PET film surface is reported. The relationship between needle-film gap size and residual surface charge pattern is discussed. >","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130029192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763366
G. Fantozzi, C. Olagnon, C. Lecuir, K. Liang, K. Gu
It is known that: (1) an analogy exists between the electrical and mechanical properties of dielectric materials, (2) the polarization energy can be dissipated via phase transitions, and (3) phase transformation produced in ceramics under mechanical stress or at the time of crack propagation, increases fracture toughness. The influence of an electric field on the structure of an alumina (AI/sub 2/O/sub 3/) ceramic, with ZrO/sub 2/ (20%) is reported. It is shown that: (a) the percentage of ZrO/sub 2/ undergoing phase transformation from tetragonal to monolithic (t-->m) depends on the amplitude and duration of the applied electric field, (b) the phase transformation plays a dominant role on the conditionning of the insulator, (c) the sintering method influences the (t-->m) rate. The results presented will provide original insights into the conditioning mechanism, partial discharge mechanism, flashover, and on the role of internal stresses on voltage withstand of dielecrics.
{"title":"Electric field Induced phase transformation In ceramics","authors":"G. Fantozzi, C. Olagnon, C. Lecuir, K. Liang, K. Gu","doi":"10.1109/CEIDP.1991.763366","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763366","url":null,"abstract":"It is known that: (1) an analogy exists between the electrical and mechanical properties of dielectric materials, (2) the polarization energy can be dissipated via phase transitions, and (3) phase transformation produced in ceramics under mechanical stress or at the time of crack propagation, increases fracture toughness. The influence of an electric field on the structure of an alumina (AI/sub 2/O/sub 3/) ceramic, with ZrO/sub 2/ (20%) is reported. It is shown that: (a) the percentage of ZrO/sub 2/ undergoing phase transformation from tetragonal to monolithic (t-->m) depends on the amplitude and duration of the applied electric field, (b) the phase transformation plays a dominant role on the conditionning of the insulator, (c) the sintering method influences the (t-->m) rate. The results presented will provide original insights into the conditioning mechanism, partial discharge mechanism, flashover, and on the role of internal stresses on voltage withstand of dielecrics.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129029480","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763359
B. Fujii, T. Ooishi, H. Muto, K. Nakanishi, S. Ikeda
Wafer charging during Ion Implantation was studied using two measurement methods: (1) the capacitive probe measurement of the surface potential on the Si wafer covered with 1 /spl mu/m thick photoresist and (2) the C-V (capacitance-voltage) measurement to evaluate the degradation of the thin oxide of MOS structure fabricated on the wafer. The wafers loaded on rotating disc were implanted with 35keV As+ at the beam currents of 1 to 10mA. The probe measurement showed that the charge-up phenomenon was to a large extent governed by the behavior of the secondary electrons. From the C-V measurement, the effects of ion beam density and of the photoresist coverage were discussed. It was shown that the four charge sources contributed to the degradation of the oxides: the irradiated ions, the secondary electrons emitted from a gate electrode, the charges accumulated on the photoresist around the gate electrode and the secondary electrons emitted from the disc.
{"title":"Wafer charging during ion implantation and its effect on the degradation of thin oxide of mos device","authors":"B. Fujii, T. Ooishi, H. Muto, K. Nakanishi, S. Ikeda","doi":"10.1109/CEIDP.1991.763359","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763359","url":null,"abstract":"Wafer charging during Ion Implantation was studied using two measurement methods: (1) the capacitive probe measurement of the surface potential on the Si wafer covered with 1 /spl mu/m thick photoresist and (2) the C-V (capacitance-voltage) measurement to evaluate the degradation of the thin oxide of MOS structure fabricated on the wafer. The wafers loaded on rotating disc were implanted with 35keV As+ at the beam currents of 1 to 10mA. The probe measurement showed that the charge-up phenomenon was to a large extent governed by the behavior of the secondary electrons. From the C-V measurement, the effects of ion beam density and of the photoresist coverage were discussed. It was shown that the four charge sources contributed to the degradation of the oxides: the irradiated ions, the secondary electrons emitted from a gate electrode, the charges accumulated on the photoresist around the gate electrode and the secondary electrons emitted from the disc.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127659996","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763947
S. Itahashi, Y. Nagaki, M. Sone, H. Mitsui
{"title":"Study Of Agglomeration Of Water Molecules In Vapor-mist","authors":"S. Itahashi, Y. Nagaki, M. Sone, H. Mitsui","doi":"10.1109/CEIDP.1991.763947","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763947","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121115258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763352
Min-Sheng, E. Wang, Zhang Hui, Rong-sheng Liu, Xie Henqkun
The effects of electronic structures on conduction of polymers were studied in present paper. Our conclusions suggested the conventional Band Theory is not satisfactory enough in the interpretation of conduction processes in saturated polymers. A novel prebreakdown conduction model was developed on the basis of electronic structures of polymers. And it was revealed that the prebreakdown currents resulted from the movements, inside the microvoids in materials, of electrons which were emitted from traps to the vacuum level by thermal activation and/or tunnelling. The theoretically calculated V-I plots by using present model agreed quite well with the experimental results of polypropylene.
{"title":"A Novel-Model of Prebreakdown Currents (Up to Breakdown) of Polypropylene","authors":"Min-Sheng, E. Wang, Zhang Hui, Rong-sheng Liu, Xie Henqkun","doi":"10.1109/CEIDP.1991.763352","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763352","url":null,"abstract":"The effects of electronic structures on conduction of polymers were studied in present paper. Our conclusions suggested the conventional Band Theory is not satisfactory enough in the interpretation of conduction processes in saturated polymers. A novel prebreakdown conduction model was developed on the basis of electronic structures of polymers. And it was revealed that the prebreakdown currents resulted from the movements, inside the microvoids in materials, of electrons which were emitted from traps to the vacuum level by thermal activation and/or tunnelling. The theoretically calculated V-I plots by using present model agreed quite well with the experimental results of polypropylene.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"169 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114187469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763964
M. Matsudo, T. Saito, Y. Ehara, H. Kishida, T. Ito
{"title":"Diagnosis Of Partial Discharge Deterioration By Discharge Magnitude And Discharge Luminescence","authors":"M. Matsudo, T. Saito, Y. Ehara, H. Kishida, T. Ito","doi":"10.1109/CEIDP.1991.763964","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763964","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126244080","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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