Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763385
S. Hagen, E. Ildstad
Manufacture of Rogowski-type test objects All tests were performed using a lightly modified version of the EFI tt previously developed for watertree testing [3]. In order to simulate the system of a cable, the Rogowski shaped insulation was premoulded from ill tape of superclean XLPE (NCPE4201S) material and the objects were equi semiconducting screens (NCPE-0592) both as high voltage and ground el
{"title":"The Effect of Inclusions on AC Breakdown of XLPE Cable Insulation","authors":"S. Hagen, E. Ildstad","doi":"10.1109/CEIDP.1991.763385","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763385","url":null,"abstract":"Manufacture of Rogowski-type test objects All tests were performed using a lightly modified version of the EFI tt previously developed for watertree testing [3]. In order to simulate the system of a cable, the Rogowski shaped insulation was premoulded from ill tape of superclean XLPE (NCPE4201S) material and the objects were equi semiconducting screens (NCPE-0592) both as high voltage and ground el","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129970372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-10-20DOI: 10.1109/CEIDP.1991.763956
Y. Mizuno, M. Iizuka, H. Furukawa, M. Nagao, M. Kosaki
{"title":"Effect Of Magnetic Field On Electrical Breakdown of polyethylene Film/liquid Nitrogen Composite Insulation System","authors":"Y. Mizuno, M. Iizuka, H. Furukawa, M. Nagao, M. Kosaki","doi":"10.1109/CEIDP.1991.763956","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763956","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-10-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125703442","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/CEIDP.1991.763965
S. Sato, Y. Kuboyama, H. Mitsui, H. Isono, M. Sone
{"title":"Observation Of Electron Emission By Micro-channel-piate With Luminescent Anode","authors":"S. Sato, Y. Kuboyama, H. Mitsui, H. Isono, M. Sone","doi":"10.1109/CEIDP.1991.763965","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763965","url":null,"abstract":"","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128021846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/CEIDP.1991.763370
Zhang Xiaohong, Lei Gingquan, Li Yuqing
The new way in which the electrical strength at the operating temperature was raised and the property of voltage endurance improved is suggested that inorganic additive treated by silicane was blended into low-density polyethylene.The effect of additives is possibly ascribed to relaxe local high electric stress, increase scatter probability of electron, offer deep traps of electron and inhibite inception and propagation of electric tree.
{"title":"Effect Of Inorganic Additives Treated By Silicane On Electrical Character Of Low-density Polyethylene","authors":"Zhang Xiaohong, Lei Gingquan, Li Yuqing","doi":"10.1109/CEIDP.1991.763370","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763370","url":null,"abstract":"The new way in which the electrical strength at the operating temperature was raised and the property of voltage endurance improved is suggested that inorganic additive treated by silicane was blended into low-density polyethylene.The effect of additives is possibly ascribed to relaxe local high electric stress, increase scatter probability of electron, offer deep traps of electron and inhibite inception and propagation of electric tree.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"818 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123289303","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/CEIDP.1991.763859
P. G. Datskos, L. Christophorou, J. Carter
We have measured the gas-density, N, normalized effective ionization coefficient, /spl alpha/ /N, and the electron drift velocity, w, as a function of the density-reduced electric field, E/N, and obtained the limiting, (E/N)/sub lim/, value of E/N for the unitary gases Ar, CO/sub 2/, and CF/sub 4/, the binary gas mixtures CO/sub 2/:Ar (20:80), C02:CH4 (20:80), and CF4:Ar (20:80), and the ternary gas mixtures C02:CF4:Ar (10:10:80) and H/sub 2/O:CF/sub 4/:Ar (2:18:80). Addition of the strongly electron thermalizing gas CO/sub 2/ or H/sub 2/O to the binary mixture CF/sub 4/:Ar (i) "cools" the mixture (i.e., lowers the electron energies), (ii) has only a small effect on the magnitude of w(E/N) in the EN range employed in the particle detectors, and (iii) increases /spl alpha//N for E/N > 50 x 10/sup -17/ V cm/sup 2/. The increase in /spl aplha//N, even though the electron energies are lower in the ternary mixture, is due to the Penning ionization of CO/sub 2/ (or H/sub 2/O) in collisions with excited Ar atoms. The ternary mixtures -- being fast, cool, and efficient -- have potential for advanced gas-filled particle detectors such as those for the SCC muon chambers.
{"title":"Effective Ionization Coefficients, Electron Drift Velocities, and Limiting Breakdown Fields for Gas Mixtures of Possible Interest to Particle Detectors","authors":"P. G. Datskos, L. Christophorou, J. Carter","doi":"10.1109/CEIDP.1991.763859","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763859","url":null,"abstract":"We have measured the gas-density, N, normalized effective ionization coefficient, /spl alpha/ /N, and the electron drift velocity, w, as a function of the density-reduced electric field, E/N, and obtained the limiting, (E/N)/sub lim/, value of E/N for the unitary gases Ar, CO/sub 2/, and CF/sub 4/, the binary gas mixtures CO/sub 2/:Ar (20:80), C02:CH4 (20:80), and CF4:Ar (20:80), and the ternary gas mixtures C02:CF4:Ar (10:10:80) and H/sub 2/O:CF/sub 4/:Ar (2:18:80). Addition of the strongly electron thermalizing gas CO/sub 2/ or H/sub 2/O to the binary mixture CF/sub 4/:Ar (i) \"cools\" the mixture (i.e., lowers the electron energies), (ii) has only a small effect on the magnitude of w(E/N) in the EN range employed in the particle detectors, and (iii) increases /spl alpha//N for E/N > 50 x 10/sup -17/ V cm/sup 2/. The increase in /spl aplha//N, even though the electron energies are lower in the ternary mixture, is due to the Penning ionization of CO/sub 2/ (or H/sub 2/O) in collisions with excited Ar atoms. The ternary mixtures -- being fast, cool, and efficient -- have potential for advanced gas-filled particle detectors such as those for the SCC muon chambers.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"128 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133523847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/CEIDP.1991.763371
A. Hammoud, E. Baumann, I. Myers, E. Overton
Dielectric materials and electrical components and devices employed in radiation fields and space environment are often exposed to elevated temperatures among other things. These systems must, therefore, withstand the high temperature exposure while still providing good electrical and other functional properties. In this work, experiments were carried out to evaluate glass, teflon, and tantalum capacitors for potential use in high temperature applications. The capacitors were characterized in terms of their capacitance and dielectric loss as a function of temperature up to 200/spl deg/C. At a given temperature, these properties were obtained in a frequency range of 50 Hz to 100 kHz. DC leakage current measurements were also performed in a temperature range from 20 to 200 /spl deg/C. The results obtained are discussed and conclusions are made concerning the suitability of the capacitors investigated for high temperature applications.
{"title":"Electrical Characterization Of Glass, Teflon, And Tantalum Capacitors At High Temperatures","authors":"A. Hammoud, E. Baumann, I. Myers, E. Overton","doi":"10.1109/CEIDP.1991.763371","DOIUrl":"https://doi.org/10.1109/CEIDP.1991.763371","url":null,"abstract":"Dielectric materials and electrical components and devices employed in radiation fields and space environment are often exposed to elevated temperatures among other things. These systems must, therefore, withstand the high temperature exposure while still providing good electrical and other functional properties. In this work, experiments were carried out to evaluate glass, teflon, and tantalum capacitors for potential use in high temperature applications. The capacitors were characterized in terms of their capacitance and dielectric loss as a function of temperature up to 200/spl deg/C. At a given temperature, these properties were obtained in a frequency range of 50 Hz to 100 kHz. DC leakage current measurements were also performed in a temperature range from 20 to 200 /spl deg/C. The results obtained are discussed and conclusions are made concerning the suitability of the capacitors investigated for high temperature applications.","PeriodicalId":277387,"journal":{"name":"1991 Annual Report. Conference on Electrical Insulation and Dielectric Phenomena,","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121258086","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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