Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361656
H. Geissler, A. Rumiantsev, S. Schott, P. Sakalas, M. Schroter
A novel automated wafer-level RF measurement system is presented. It includes a wafer prober and dedicated on-wafer probe tips and calibration standards. Probe station related design issues are discussed leading to a system for automated testing of wafers up to 300mm by using a programmable positioning stage. Using on-wafer SiGe HBT measurements, noise characterization and VNA calibration verification, the long-term stability and reliability of the setup is illustrated. Tests are carried out both with liquid nitrogen as well as liquid helium as coolant, equal to temperature range from 400K down to 4K.
{"title":"A novel probe station for helium temperature measurements","authors":"H. Geissler, A. Rumiantsev, S. Schott, P. Sakalas, M. Schroter","doi":"10.1109/ARFTG.2006.8361656","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361656","url":null,"abstract":"A novel automated wafer-level RF measurement system is presented. It includes a wafer prober and dedicated on-wafer probe tips and calibration standards. Probe station related design issues are discussed leading to a system for automated testing of wafers up to 300mm by using a programmable positioning stage. Using on-wafer SiGe HBT measurements, noise characterization and VNA calibration verification, the long-term stability and reliability of the setup is illustrated. Tests are carried out both with liquid nitrogen as well as liquid helium as coolant, equal to temperature range from 400K down to 4K.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134511366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361668
J. Vancl, V. Sokol, K. Hoffmann, Z. Škvor
Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error model is affected especially with a variation of the manufacturing process and also with a reproducibility of an assembly. In this paper, we propose error minimization using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measurement. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz.
{"title":"Improved evaluation of planar calibration standards using TDR preselection method","authors":"J. Vancl, V. Sokol, K. Hoffmann, Z. Škvor","doi":"10.1109/ARFTG.2006.8361668","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361668","url":null,"abstract":"Calibration and correction methods for Vector Network Analyzer (VNA) are based on the fundamental assumption of constant error model, which is independent of connected calibration standards and/or devices under test (DUT). Unfortunately, this assumption is not satisfied well for planar calibration standards fabricated by etching technology on soft substrates. An evaluation of the error model is affected especially with a variation of the manufacturing process and also with a reproducibility of an assembly. In this paper, we propose error minimization using selection of the best combination of available calibration standards based on time-domain reflection (TDR) measurement. The proposed method was verified experimentally using short, open, load and thru (SOLT) standards fabricated on FR4 laminate substrate getting essential reduction of the measurement error in frequency range up to 15 GHz.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116981133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361655
Dylan F. Williams, C. M. Wang, U. Arz
We describe the in-phase/quadrature covariance-matrix representation of the uncertainty in complex vectors, and transformations between this representation and the magnitude/phase and real/imaginary uncertainty representations.
{"title":"In-phase/quadrature covariance-matrix representation of the uncertainty of vectors and complex numbers","authors":"Dylan F. Williams, C. M. Wang, U. Arz","doi":"10.1109/ARFTG.2006.8361655","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361655","url":null,"abstract":"We describe the in-phase/quadrature covariance-matrix representation of the uncertainty in complex vectors, and transformations between this representation and the magnitude/phase and real/imaginary uncertainty representations.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123116578","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361661
J. Burns, C. Ward, G. Henry, G. Desalvo
A system to measure the complex S21 at power of a MMIC using a Vector Network Analyzer is described. These measurements have been performed from −50 DBm to +37 DBm with a power span greater than 30 DB in a single sweep. This system can operate over the frequency range of 500 MHz to 50 GHz. This system is used to measure S21 magnitude and phase in addition to bias conditions as a function of input power.
{"title":"Using a VNA to find the ‘sweet spot’ when biasing a MMIC — An application","authors":"J. Burns, C. Ward, G. Henry, G. Desalvo","doi":"10.1109/ARFTG.2006.8361661","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361661","url":null,"abstract":"A system to measure the complex S21 at power of a MMIC using a Vector Network Analyzer is described. These measurements have been performed from −50 DBm to +37 DBm with a power span greater than 30 DB in a single sweep. This system can operate over the frequency range of 500 MHz to 50 GHz. This system is used to measure S21 magnitude and phase in addition to bias conditions as a function of input power.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124857350","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361672
J. Zela, K. Hoffmann, P. Hudec
A new scalar network analyzer system with an antenna matrix for microwave interferometrie measurement was realized on frequency 2.45 GHz. Experimental results are compared with interferometrie measurement using vector network analyzer (VNA) and an antenna x-y positioning system. The new system is supposed to be used in non-contact deformation and non-homogeneity measurements in civil engineering and other similar areas.
{"title":"A new scalar microwave interferometrie measurement system","authors":"J. Zela, K. Hoffmann, P. Hudec","doi":"10.1109/ARFTG.2006.8361672","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361672","url":null,"abstract":"A new scalar network analyzer system with an antenna matrix for microwave interferometrie measurement was realized on frequency 2.45 GHz. Experimental results are compared with interferometrie measurement using vector network analyzer (VNA) and an antenna x-y positioning system. The new system is supposed to be used in non-contact deformation and non-homogeneity measurements in civil engineering and other similar areas.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125532015","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361663
S. Kitamura, T. Araki, T. Nagase, M. Araki, H. Ôno
A particular problem that should be addressed in the radar sensors is how to measure the distances of stationary, slow-moving and fast-moving targets such as vehicles precisely and rapidly. This paper describes a new approach to measure distances between objects using triple-frequency CW (Continuous Waveforms) Radar and based on a K-band Doppler technology. The system's operation is performed using CW triple-frequency to obtain expeditiously and highly accurate measurements for stationary and moving objects. A mathematical presentation of the system's model has been formulated along with computer-based simulations to study the performance and to validate the effectiveness of the proposed model.
{"title":"A triple-frequency CW radar system for mutable-range distance measurements","authors":"S. Kitamura, T. Araki, T. Nagase, M. Araki, H. Ôno","doi":"10.1109/ARFTG.2006.8361663","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361663","url":null,"abstract":"A particular problem that should be addressed in the radar sensors is how to measure the distances of stationary, slow-moving and fast-moving targets such as vehicles precisely and rapidly. This paper describes a new approach to measure distances between objects using triple-frequency CW (Continuous Waveforms) Radar and based on a K-band Doppler technology. The system's operation is performed using CW triple-frequency to obtain expeditiously and highly accurate measurements for stationary and moving objects. A mathematical presentation of the system's model has been formulated along with computer-based simulations to study the performance and to validate the effectiveness of the proposed model.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128742222","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361649
M. Myslinski, K. Remley, D. Schreurs, B. Nauwelaers
This paper presents a simple test bench providing RF vector measurements of typical wireless communication system building blocks under realistic signal conditions. The instruments are synchronized by use of an experimental method based on an estimate of the signal path's time delay. As an example, a complex digitally modulated signal with a carrier frequency of 2.45 GHz was used. The ultimate goal of this test-bench is to deliver accurate measurement data enabling evaluation of the quality of large-signal behavioral models of the measured RF blocks.
{"title":"RF vector measurement test-bench for evaluation of behavioral model accuracy under realistic excitation","authors":"M. Myslinski, K. Remley, D. Schreurs, B. Nauwelaers","doi":"10.1109/ARFTG.2006.8361649","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361649","url":null,"abstract":"This paper presents a simple test bench providing RF vector measurements of typical wireless communication system building blocks under realistic signal conditions. The instruments are synchronized by use of an experimental method based on an estimate of the signal path's time delay. As an example, a complex digitally modulated signal with a carrier frequency of 2.45 GHz was used. The ultimate goal of this test-bench is to deliver accurate measurement data enabling evaluation of the quality of large-signal behavioral models of the measured RF blocks.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"68 12","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120912169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361665
Y. Lee
The type-N coaxial connector was introduced to the market in 1942. The precision type N connector that is in use today emerged in 1965. The repeatability for the type N connectors is a key factor for improved measurement accuracy. There were several studies being reported on this subject for the last few years. They have tried to resolve the repeatability and reproducibility problems by focusing on the following issues: the effect of pin gap, slotted vs. slotless female connectors, connector coupling technique, connector defect modeling and theory, connector orientations, and etc. No conclusive solutions can be made on how to reduce the un-repeatability of type N connectors. During our study, we have come across a better approach of using the power sensor testing system to monitor the mating of connector pair. It is now used to improve the measurement repeatability. The standard deviation of the connector repeatability can be controlled within 0.1% for the whole frequency range.
{"title":"Re-visiting the repeatability issues of the type-N connectors","authors":"Y. Lee","doi":"10.1109/ARFTG.2006.8361665","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361665","url":null,"abstract":"The type-N coaxial connector was introduced to the market in 1942. The precision type N connector that is in use today emerged in 1965. The repeatability for the type N connectors is a key factor for improved measurement accuracy. There were several studies being reported on this subject for the last few years. They have tried to resolve the repeatability and reproducibility problems by focusing on the following issues: the effect of pin gap, slotted vs. slotless female connectors, connector coupling technique, connector defect modeling and theory, connector orientations, and etc. No conclusive solutions can be made on how to reduce the un-repeatability of type N connectors. During our study, we have come across a better approach of using the power sensor testing system to monitor the mating of connector pair. It is now used to improve the measurement repeatability. The standard deviation of the connector repeatability can be controlled within 0.1% for the whole frequency range.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"91 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116328068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361662
M. Pourová, J. Vrba, O. Zak
In this paper we describe our new results dealing with design, modeling and evaluation of microwave industrial applicators used for drying of textile materials. We have designed and evaluated two different types of these applicators: open-resonator-type and waveguide-type one. We describe here basic analytical models of the discussed applicators, results of numerical modeling and experimental evaluation as well. Prototype of microwave drying machine working with microwave power of 17 kW at frequency 2.45 GHz is reported.
{"title":"Microwave system for drying of textile: Design, model and evaluation","authors":"M. Pourová, J. Vrba, O. Zak","doi":"10.1109/ARFTG.2006.8361662","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361662","url":null,"abstract":"In this paper we describe our new results dealing with design, modeling and evaluation of microwave industrial applicators used for drying of textile materials. We have designed and evaluated two different types of these applicators: open-resonator-type and waveguide-type one. We describe here basic analytical models of the discussed applicators, results of numerical modeling and experimental evaluation as well. Prototype of microwave drying machine working with microwave power of 17 kW at frequency 2.45 GHz is reported.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122212110","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361667
Liu Xin-meng, Peng Xi-yuan, Cui Xiao-hai
It is proved that effective efficiency of a thermistor mount changes with its heat transfer condition. A system error is found after a comparison between heat transfer procedure in a microcalorimeter and the one during a power measurement procedure. The error is named thermal equivalent error in this paper. It is analyzed in details and its analytic expression is derived. As a conclusion, a method is suggested to avoid this error at last.
{"title":"Thermal equivalence error of microwave power measurement","authors":"Liu Xin-meng, Peng Xi-yuan, Cui Xiao-hai","doi":"10.1109/ARFTG.2006.8361667","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361667","url":null,"abstract":"It is proved that effective efficiency of a thermistor mount changes with its heat transfer condition. A system error is found after a comparison between heat transfer procedure in a microcalorimeter and the one during a power measurement procedure. The error is named thermal equivalent error in this paper. It is analyzed in details and its analytic expression is derived. As a conclusion, a method is suggested to avoid this error at last.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121262198","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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