Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361659
T. Ruttan, B. Grossman, E. Fledell
Multi-port vector network analyzers (VNA) have become important measurement tools for the characterization of high frequency/high speed computer system and communications interconnects. These systems utilize many parallel channels of differential transmission lines to carry the high bandwidth data between devices. The need to measure the differential transmission line and crosstalk characteristics of these structures has driven the need for 4, 8, and 12 ports on microwave VNA's. 4-port VNA's have been commercially available for some time to address part of this need. In order to avoid additional complexity and cost these early architectures are unable to utilize the more recent, non-redundant calibration algorithms. These faster, more flexible algorithms can reduce the calibration and measurement time for multi-port devices at some cost to measurement accuracy. Through the evaluation of commercial verification devices after multiple calibrations, this paper illustrates that by comparing algorithms across two 4-port architectures, this compromise in accuracy may not be significant when compared to the savings in time and fewer standard connections.
{"title":"Comparison of multi-port VNA architectures — Measured results","authors":"T. Ruttan, B. Grossman, E. Fledell","doi":"10.1109/ARFTG.2006.8361659","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361659","url":null,"abstract":"Multi-port vector network analyzers (VNA) have become important measurement tools for the characterization of high frequency/high speed computer system and communications interconnects. These systems utilize many parallel channels of differential transmission lines to carry the high bandwidth data between devices. The need to measure the differential transmission line and crosstalk characteristics of these structures has driven the need for 4, 8, and 12 ports on microwave VNA's. 4-port VNA's have been commercially available for some time to address part of this need. In order to avoid additional complexity and cost these early architectures are unable to utilize the more recent, non-redundant calibration algorithms. These faster, more flexible algorithms can reduce the calibration and measurement time for multi-port devices at some cost to measurement accuracy. Through the evaluation of commercial verification devices after multiple calibrations, this paper illustrates that by comparing algorithms across two 4-port architectures, this compromise in accuracy may not be significant when compared to the savings in time and fewer standard connections.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"115 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117152345","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361653
V. Talanov, A. Schwartz
In the past decade near-field microwave microscopy has emerged as a novel approach to non-destructive imaging of materials' electrodynamic properties on sub-wavelength scales. In the near-field approach the spatial resolution is governed by the probe geometry rather than the wavelength of the radiation utilized. Therefore, even at microwave frequencies with wavelengths on the order of centimeters, sub-micron spatial resolution is possible.
{"title":"Scanning near-field microwave microscopy for spatially localized metrology of nano-scale materials and devices","authors":"V. Talanov, A. Schwartz","doi":"10.1109/ARFTG.2006.8361653","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361653","url":null,"abstract":"In the past decade near-field microwave microscopy has emerged as a novel approach to non-destructive imaging of materials' electrodynamic properties on sub-wavelength scales. In the near-field approach the spatial resolution is governed by the probe geometry rather than the wavelength of the radiation utilized. Therefore, even at microwave frequencies with wavelengths on the order of centimeters, sub-micron spatial resolution is possible.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114806558","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361671
J. Coupat, L. Tebaldini, J. Sirois, B. Noori, R. Wallace
In this paper we describe a new method of high power transistor characterization where a pulsed RF measurement system is integrated into a load-pull environment. The pulse synchronization mechanism between the vector network analyzer and, scalar power meter, and the rest of the system will be discussed, with emphasis on integration details and calibration fidelity. It will be shown that the system can characterize transistors with RF powers in excess of 200W under high reflection coefficient conditions.
{"title":"True pulse load-pull measurement setup for high power transistors characterization","authors":"J. Coupat, L. Tebaldini, J. Sirois, B. Noori, R. Wallace","doi":"10.1109/ARFTG.2006.8361671","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361671","url":null,"abstract":"In this paper we describe a new method of high power transistor characterization where a pulsed RF measurement system is integrated into a load-pull environment. The pulse synchronization mechanism between the vector network analyzer and, scalar power meter, and the rest of the system will be discussed, with emphasis on integration details and calibration fidelity. It will be shown that the system can characterize transistors with RF powers in excess of 200W under high reflection coefficient conditions.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115576476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361664
L. Mats, J. T. Cain, M. Mickle
This paper presents a non-destructive, non-invasive method for measuring the input impedance of a Radio Frequency Identification (RFID) transponder (tag) antenna at the operating frequency The derivation of the theoretical basis for determining the antenna impedance is presented along with the experimental measurement method using a Vector Network Analyzer (VNA) in conjunction with a Giga-Hertz Transverse Electromagnetic (GTEM) cell where the tag is located. By providing three different terminations to the antenna, the frequency dependent parameters can be measured in order to define a two-port network and determine the input impedance of the antenna. All measurements were performed using the actual RFID tag that operates in UHF (915 MHz) band. The resulting input impedance of the antenna was validated with the electromagnetic simulation software by constructing a model of the testing system and applying the proposed measurement method. The simulated results were found to be in agreement with the experimental measurements accounting for any discrepancies.
{"title":"An indirect non-invasive method for measuring input impedance and connection effects of an RFID tag antenna","authors":"L. Mats, J. T. Cain, M. Mickle","doi":"10.1109/ARFTG.2006.8361664","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361664","url":null,"abstract":"This paper presents a non-destructive, non-invasive method for measuring the input impedance of a Radio Frequency Identification (RFID) transponder (tag) antenna at the operating frequency The derivation of the theoretical basis for determining the antenna impedance is presented along with the experimental measurement method using a Vector Network Analyzer (VNA) in conjunction with a Giga-Hertz Transverse Electromagnetic (GTEM) cell where the tag is located. By providing three different terminations to the antenna, the frequency dependent parameters can be measured in order to define a two-port network and determine the input impedance of the antenna. All measurements were performed using the actual RFID tag that operates in UHF (915 MHz) band. The resulting input impedance of the antenna was validated with the electromagnetic simulation software by constructing a model of the testing system and applying the proposed measurement method. The simulated results were found to be in agreement with the experimental measurements accounting for any discrepancies.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"697 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134063082","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361658
J. Teyssier, F. de Groote
Based on the standard and free XML format, a new file format is proposed for measurement data. An XML scheme dedicated to RF measurements is established, it ensures small and structured files with a strong grammatical check and the relevant semantic information embedded. The open structure of XML offers an easy upgrade of the file structure to any new type of measurement. In order to handle very large quantities of measurement data, a database structure is designed, this database stores exactly the same information fields as the XML file structure, so the total cross-interoperability between both storage methods allows efficient data management.
{"title":"An XML file format and a database for measurement data storage","authors":"J. Teyssier, F. de Groote","doi":"10.1109/ARFTG.2006.8361658","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361658","url":null,"abstract":"Based on the standard and free XML format, a new file format is proposed for measurement data. An XML scheme dedicated to RF measurements is established, it ensures small and structured files with a strong grammatical check and the relevant semantic information embedded. The open structure of XML offers an easy upgrade of the file structure to any new type of measurement. In order to handle very large quantities of measurement data, a database structure is designed, this database stores exactly the same information fields as the XML file structure, so the total cross-interoperability between both storage methods allows efficient data management.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133579315","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361654
H. Tanbakuchi, M. Richter, M. Whitener
The design and manufacture of a scanning capacitance microscope (SCM) which is compatible with an atomic force microscope (AFM) for imaging of embedded nanostructure is discussed. The goals of the design are to use commercially available conductive AFM tips, and to incorporate it into an existing AFM system developed system.
{"title":"Design of scanning capacitance microscope","authors":"H. Tanbakuchi, M. Richter, M. Whitener","doi":"10.1109/ARFTG.2006.8361654","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361654","url":null,"abstract":"The design and manufacture of a scanning capacitance microscope (SCM) which is compatible with an atomic force microscope (AFM) for imaging of embedded nanostructure is discussed. The goals of the design are to use commercially available conductive AFM tips, and to incorporate it into an existing AFM system developed system.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122385706","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361674
L. Hayden
This paper details the first commercial implementation [1] of a hybrid multiport vector network analyzer (VNA) calibration method suited to a probing environment. The new calibration method implements the enhanced Line-Reflect-Reflect-Match with automatic determination of load inductance [2]-[5] for a number of straight thru paths to fully determine all directivity, reflection tracking, and source and load match terms as well as the associated transmission tracking terms. The remaining transmission tracking terms are found from the use of an unknown but reciprocal thru structure using a process similar to that of the SOLR [6]-[7] calibration algorithm. Combining the LRRM and SOLR algorithms creates a robust, hybrid calibration method that is insensitive to the normal variation in one-port standard behavior associated with normal probe-placement variability [8]-[9]. The hybrid calibration is also insensitive to the inherently non-ideal thru behavior of coplanar waveguide bends or loop-back structures [10].
{"title":"A hybrid probe-tip calibration for multiport vector network analyzers","authors":"L. Hayden","doi":"10.1109/ARFTG.2006.8361674","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361674","url":null,"abstract":"This paper details the first commercial implementation [1] of a hybrid multiport vector network analyzer (VNA) calibration method suited to a probing environment. The new calibration method implements the enhanced Line-Reflect-Reflect-Match with automatic determination of load inductance [2]-[5] for a number of straight thru paths to fully determine all directivity, reflection tracking, and source and load match terms as well as the associated transmission tracking terms. The remaining transmission tracking terms are found from the use of an unknown but reciprocal thru structure using a process similar to that of the SOLR [6]-[7] calibration algorithm. Combining the LRRM and SOLR algorithms creates a robust, hybrid calibration method that is insensitive to the normal variation in one-port standard behavior associated with normal probe-placement variability [8]-[9]. The hybrid calibration is also insensitive to the inherently non-ideal thru behavior of coplanar waveguide bends or loop-back structures [10].","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131622058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-11-01DOI: 10.1109/ARFTG.2006.8361669
F. de Groote, J. Verspecht, J. Teyssier, R. Quéré
This paper presents a measurement-based way of forecasting some transistor's nonlinear effects. For some particular output impedances of the passive load-pull setup, a strange behavior of the Pout/Pin slopes can be obtained. Thanks to the LSNA, the non linear input impedance can be measured, it is useful to explain this phenomenon. The time domain slopes of a GaN HEMT up to 3.5 W/mm are proposed at these particular loci.
{"title":"Load-pull measurement of transistor negative input impedance","authors":"F. de Groote, J. Verspecht, J. Teyssier, R. Quéré","doi":"10.1109/ARFTG.2006.8361669","DOIUrl":"https://doi.org/10.1109/ARFTG.2006.8361669","url":null,"abstract":"This paper presents a measurement-based way of forecasting some transistor's nonlinear effects. For some particular output impedances of the passive load-pull setup, a strange behavior of the Pout/Pin slopes can be obtained. Thanks to the LSNA, the non linear input impedance can be measured, it is useful to explain this phenomenon. The time domain slopes of a GaN HEMT up to 3.5 W/mm are proposed at these particular loci.","PeriodicalId":302468,"journal":{"name":"2006 68th ARFTG Conference: Microwave Measurement","volume":"154 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125806692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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