Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547746
K. Zhou, Kangle Li, Mingliang Yang, Ming Huang, Yusong He
In this paper, the effect of mechanical orientation is presented to understand abnormal water tree shapes. For the XLPE samples, the possible mechanical orientation of XLPE insulation was simulated by inserting a heated metal needle into the samples. After that, one XLPE sample (comparison sample) was selected to be observed for stress strips (the macroscopic morphologies of oriented XLPE materials) using a polarizing microscope, and the other samples were subjected to accelerated water tree aging experiment for water tree analysis. The results show that there are abnormal water tree shapes in the XLPE samples, which are very similar to the morphologies of stress strips observed in the comparison sample. Because of the anisotropy in oriented XLPE materials, in orientation direction, the propagation of water trees is promoted, while in the perpendicular direction, the propagation of water trees is inhibited As a result, abnormal water tree shapes were observed. The results indicate that the mechanical orientation of XLPE materials plays a leading role in the propagation direction of water trees to a large extent.
{"title":"Insight into the influence of mechanical orientation on water tree propagation according to abnormal water tree shapes","authors":"K. Zhou, Kangle Li, Mingliang Yang, Ming Huang, Yusong He","doi":"10.1109/ICD.2016.7547746","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547746","url":null,"abstract":"In this paper, the effect of mechanical orientation is presented to understand abnormal water tree shapes. For the XLPE samples, the possible mechanical orientation of XLPE insulation was simulated by inserting a heated metal needle into the samples. After that, one XLPE sample (comparison sample) was selected to be observed for stress strips (the macroscopic morphologies of oriented XLPE materials) using a polarizing microscope, and the other samples were subjected to accelerated water tree aging experiment for water tree analysis. The results show that there are abnormal water tree shapes in the XLPE samples, which are very similar to the morphologies of stress strips observed in the comparison sample. Because of the anisotropy in oriented XLPE materials, in orientation direction, the propagation of water trees is promoted, while in the perpendicular direction, the propagation of water trees is inhibited As a result, abnormal water tree shapes were observed. The results indicate that the mechanical orientation of XLPE materials plays a leading role in the propagation direction of water trees to a large extent.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"794 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121218045","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547760
O. Emelyanov, A. Plotnikov
Modern multilayer ceramic capacitors (MLCCs) with X7R and Y5V dielectrics have been investigated in charging and discharging pulsed modes. The mathematical model that takes into account the capacitance dependence on applied voltage has been proposed. Analytical calculations of the voltage, current, and stored electrical energy in MLCCs have been carried out. The model adequacy has been confirmed by experimental investigations.
{"title":"Ferroelectric capacitors in pulsed modes: Experimental study and analytical calculations","authors":"O. Emelyanov, A. Plotnikov","doi":"10.1109/ICD.2016.7547760","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547760","url":null,"abstract":"Modern multilayer ceramic capacitors (MLCCs) with X7R and Y5V dielectrics have been investigated in charging and discharging pulsed modes. The mathematical model that takes into account the capacitance dependence on applied voltage has been proposed. Analytical calculations of the voltage, current, and stored electrical energy in MLCCs have been carried out. The model adequacy has been confirmed by experimental investigations.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131128784","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547526
H. Yahyaoui, P. Notingher, S. Agnel, C. Perrier, Y. Kieffel
The dc breakdown strength of an epoxy resin and of polytetrafluorethylene containing mineral fillers is investigated in order to consider their use in high voltage dc applications. Results obtained at temperatures between 25°C and 85°C with voltage rates from 0.2 kV/s to 8 kV/s are presented and analyzed. The performance and the behavior of the materials are discussed.
{"title":"Electrical breakdown of epoxy and PTFE under dc conditions","authors":"H. Yahyaoui, P. Notingher, S. Agnel, C. Perrier, Y. Kieffel","doi":"10.1109/ICD.2016.7547526","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547526","url":null,"abstract":"The dc breakdown strength of an epoxy resin and of polytetrafluorethylene containing mineral fillers is investigated in order to consider their use in high voltage dc applications. Results obtained at temperatures between 25°C and 85°C with voltage rates from 0.2 kV/s to 8 kV/s are presented and analyzed. The performance and the behavior of the materials are discussed.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114433928","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547818
C. Dong, Yonghong Cheng, C. Men, Lei Chen, Bowen Zhu, G. Meng
As electronic and electro-mechanical devices with high integration density have been universally employed in many fields of science and engineering, the insulation failure under high electric field become one of the major factors limiting the performance of micro/nano systems. Herein, the pre-breakdown and breakdown characteristics of tungsten (W) and molybdenum (Mo) needle electrodes across a 100-nm vacuum gap were investigated. In the pre-breakdown process, the current linearly increased with the applied voltage. The field emission played a dominated role in the vicinity of the breakdown threshold. Furthermore, the breakdown threshold of W needle electrode was 19.5% higher than that of Mo needle electrode owing to a similar work function and a higher melting point of W needle electrode compared with Mo needle electrode. The study would be beneficial to the choice of materials and the reliability analysis of micro/nano devices.
{"title":"Effect of electrode materials on the vacuum breakdown behaviors at nanoscale","authors":"C. Dong, Yonghong Cheng, C. Men, Lei Chen, Bowen Zhu, G. Meng","doi":"10.1109/ICD.2016.7547818","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547818","url":null,"abstract":"As electronic and electro-mechanical devices with high integration density have been universally employed in many fields of science and engineering, the insulation failure under high electric field become one of the major factors limiting the performance of micro/nano systems. Herein, the pre-breakdown and breakdown characteristics of tungsten (W) and molybdenum (Mo) needle electrodes across a 100-nm vacuum gap were investigated. In the pre-breakdown process, the current linearly increased with the applied voltage. The field emission played a dominated role in the vicinity of the breakdown threshold. Furthermore, the breakdown threshold of W needle electrode was 19.5% higher than that of Mo needle electrode owing to a similar work function and a higher melting point of W needle electrode compared with Mo needle electrode. The study would be beneficial to the choice of materials and the reliability analysis of micro/nano devices.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"63 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124370972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547707
M. Nazir, B. T. Phung
Silicone rubber (SR) insulating surfaces are often subjected to corona partial discharges (PD) during outdoor operation which can change the surface chemistry significantly and result in considerable surface deterioration, hydrophobicity loss, and enhancement of PD activity. In this work, the effect of micro and nano-fillers addition on surface degradation of SR under AC corona discharge is examined by analyzing the PD characteristics, hydrophobicity and surface morphology. Nano precipitated silica and ground silica with particle size of ~20 nm and ~5 μm are adopted and incorporated in RTV silicone rubber by two different mixing techniques. Mechanical stirring followed by ultrasonic water bath are applied to achieve uniform dispersion of fillers in RTV SR matrix. The four different types of the composite, i.e. pristine SR, 30-wt% micro-silica/SR, 27.5-wt% micro with 2.5-wt% nano-silica/SR and 5-wt% nanosilica/SR composites are tested under AC corona discharge. It is found that, at the end of ageing, the nano-silica composite showed the best suppression against PD activity and higher resistance against surface damage as compared to other test samples. It is also found that resistance to hydrophobicity loss is offered by composites during the initial 48 h of corona treatment but it is completely lost at the end of 96 h of ageing.
{"title":"AC corona resistance performance of silicone rubber composites with micro/nano silica fillers","authors":"M. Nazir, B. T. Phung","doi":"10.1109/ICD.2016.7547707","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547707","url":null,"abstract":"Silicone rubber (SR) insulating surfaces are often subjected to corona partial discharges (PD) during outdoor operation which can change the surface chemistry significantly and result in considerable surface deterioration, hydrophobicity loss, and enhancement of PD activity. In this work, the effect of micro and nano-fillers addition on surface degradation of SR under AC corona discharge is examined by analyzing the PD characteristics, hydrophobicity and surface morphology. Nano precipitated silica and ground silica with particle size of ~20 nm and ~5 μm are adopted and incorporated in RTV silicone rubber by two different mixing techniques. Mechanical stirring followed by ultrasonic water bath are applied to achieve uniform dispersion of fillers in RTV SR matrix. The four different types of the composite, i.e. pristine SR, 30-wt% micro-silica/SR, 27.5-wt% micro with 2.5-wt% nano-silica/SR and 5-wt% nanosilica/SR composites are tested under AC corona discharge. It is found that, at the end of ageing, the nano-silica composite showed the best suppression against PD activity and higher resistance against surface damage as compared to other test samples. It is also found that resistance to hydrophobicity loss is offered by composites during the initial 48 h of corona treatment but it is completely lost at the end of 96 h of ageing.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129158521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547810
R. Gremaud, Z. Zhao, M. Baur
Polarization and depolarization measurements of alumina-filled epoxy samples are presented. Discussed are the effects of temperature and electric field, as well as the dependences on sample thickness, contacting method and aging duration on DC currents. Such investigations are crucial to establish reliable generic conduction models usable on real-scale HVDC insulation components.
{"title":"Measurement of DC conduction in alumina-filled epoxy","authors":"R. Gremaud, Z. Zhao, M. Baur","doi":"10.1109/ICD.2016.7547810","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547810","url":null,"abstract":"Polarization and depolarization measurements of alumina-filled epoxy samples are presented. Discussed are the effects of temperature and electric field, as well as the dependences on sample thickness, contacting method and aging duration on DC currents. Such investigations are crucial to establish reliable generic conduction models usable on real-scale HVDC insulation components.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134177944","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547640
H. Mitsudome, Yuuya Akinaga, K. Matsuo, M. Kozako, M. Hikita, Y. Ikeda, K. Taniguchi, Y. Nakamura, K. Okamoto
This paper deals with partial discharge (PD) location in a power module by measuring electromagnetic (EM) wave of PD using four loop sensors. As the distance between the sensor and PD source decreases, the peak to peak magnitude of the first wave of detected EM wave was found to increase using four sensors array. An attempt is made to locate PD source using output electromagnetic waves detected four loop sensors by the time of flight method. As a result, the present method is found to allow PD location with location identification error of 5 mm.
{"title":"Basic study on partial discharge location in power module","authors":"H. Mitsudome, Yuuya Akinaga, K. Matsuo, M. Kozako, M. Hikita, Y. Ikeda, K. Taniguchi, Y. Nakamura, K. Okamoto","doi":"10.1109/ICD.2016.7547640","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547640","url":null,"abstract":"This paper deals with partial discharge (PD) location in a power module by measuring electromagnetic (EM) wave of PD using four loop sensors. As the distance between the sensor and PD source decreases, the peak to peak magnitude of the first wave of detected EM wave was found to increase using four sensors array. An attempt is made to locate PD source using output electromagnetic waves detected four loop sensors by the time of flight method. As a result, the present method is found to allow PD location with location identification error of 5 mm.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134379661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547674
D. Odaka, M. Komatsu, Y. Ohki
Various properties of polyethylene naphthalate (PEN) are affected by its crystallinity. In this paper, the possibility of using terahertz (THz) spectroscopy as a tool to examine the crystallinity of PEN is studied. When THz absorption is measured while the sample temperature is being raised, an absorption peak suddenly appears at around 2.10 THz at 180 °C. By analyzing the THz spectra together with XRD patterns, we found that the 2.10-THz absorption has a close relation with the crystal form α of PEN and its intensity increases with the progress of crystallization. Therefore, THz absorption spectroscopy can be used for monitoring the crystallization of PEN.
{"title":"Observation of crystal growth in polyethylene naphthalate by terahertz spectroscopy","authors":"D. Odaka, M. Komatsu, Y. Ohki","doi":"10.1109/ICD.2016.7547674","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547674","url":null,"abstract":"Various properties of polyethylene naphthalate (PEN) are affected by its crystallinity. In this paper, the possibility of using terahertz (THz) spectroscopy as a tool to examine the crystallinity of PEN is studied. When THz absorption is measured while the sample temperature is being raised, an absorption peak suddenly appears at around 2.10 THz at 180 °C. By analyzing the THz spectra together with XRD patterns, we found that the 2.10-THz absorption has a close relation with the crystal form α of PEN and its intensity increases with the progress of crystallization. Therefore, THz absorption spectroscopy can be used for monitoring the crystallization of PEN.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"197 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132355697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547825
Shengjun Lin, Yin Huang, D. Xie, Zhen Li, D. Min, Yuan Shihu, Shengtao Li
Epoxy resin (EP) is widely used as an insulating material in power equipment. Its dielectric relaxation and carrier transport properties are important factors affecting breakdown and surface flashover performance. The dielectric relaxation and carrier transport properties of EP based alumina (Al2O3) microcomposite were investigated through broadband dielectric spectroscopy. The glass transition temperature was measured by differential scanning calorimetry (DSC), which is about 120 °C. Gold electrodes with a diameter of 30 mm were sputtering on two sides of the samples. A broadband dielectric spectrometer (Concept 80 Novocontrol) was used to measure the dielectric relaxation properties at an ac voltage of 1 Vrms in a frequency range from 10-1 to 107 Hz at various temperatures. Above the glass transition temperature, a relaxation peak occurs at high frequencies due to the motion of molecular chains or segmental chains, and a dc conductivity resulted by the migration of charge carriers appears at low frequencies. In addition, molecular chains with different scales have different relaxation times. It was found that EP microcomposite has a very broad distribution of relaxation time. We calculated the distribution of relaxation time at various temperatures. Furthermore, the temperature dependences of molecular relaxation and dc conductivity satisfy the Vogel-Tammann-Fulcher equation. Fitting the experimental results, we obtained the Vogel temperatures and strength parameters of molecular relaxation and dc conductivity. From the Vogel temperatures, we estimated the glass transition temperature to be 117 °C, which is consistent with the DSC result. It means that free volume increases with increasing temperature, facilitating the motion of molecular chains and the migration of charge carriers.
{"title":"Dielectric relaxation and carrier transport in epoxy resin","authors":"Shengjun Lin, Yin Huang, D. Xie, Zhen Li, D. Min, Yuan Shihu, Shengtao Li","doi":"10.1109/ICD.2016.7547825","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547825","url":null,"abstract":"Epoxy resin (EP) is widely used as an insulating material in power equipment. Its dielectric relaxation and carrier transport properties are important factors affecting breakdown and surface flashover performance. The dielectric relaxation and carrier transport properties of EP based alumina (Al2O3) microcomposite were investigated through broadband dielectric spectroscopy. The glass transition temperature was measured by differential scanning calorimetry (DSC), which is about 120 °C. Gold electrodes with a diameter of 30 mm were sputtering on two sides of the samples. A broadband dielectric spectrometer (Concept 80 Novocontrol) was used to measure the dielectric relaxation properties at an ac voltage of 1 Vrms in a frequency range from 10-1 to 107 Hz at various temperatures. Above the glass transition temperature, a relaxation peak occurs at high frequencies due to the motion of molecular chains or segmental chains, and a dc conductivity resulted by the migration of charge carriers appears at low frequencies. In addition, molecular chains with different scales have different relaxation times. It was found that EP microcomposite has a very broad distribution of relaxation time. We calculated the distribution of relaxation time at various temperatures. Furthermore, the temperature dependences of molecular relaxation and dc conductivity satisfy the Vogel-Tammann-Fulcher equation. Fitting the experimental results, we obtained the Vogel temperatures and strength parameters of molecular relaxation and dc conductivity. From the Vogel temperatures, we estimated the glass transition temperature to be 117 °C, which is consistent with the DSC result. It means that free volume increases with increasing temperature, facilitating the motion of molecular chains and the migration of charge carriers.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121503103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-07-03DOI: 10.1109/ICD.2016.7547652
Cai-jing, N. Zhang, Ma-Zhong, Peng-Min, Xiaoguang Shang, Z. Jia, Linjun Wang
In the process of the operation of 750kV transmission line, the insulator should be detected in time and effectively. As a fast and efficient method to detect the discharge of insulators, the ultraviolet detection technique is very important in the detection of 750kV insulator. In this paper, we analyzed the ultraviolet detection result of the 750kV Porcelain Insulator artificial contamination test, and then defined two indicators, relative fluctuation of photon number and mean value of spot area to evaluate the severity of discharge. The two indicators, UV photon number and UV spot area were studied in this paper. It is found that UV photon number and UV spot area couldn't evaluate the severity of insulator discharge quantitatively, but relative fluctuation of photon number and stage mean value of spot area could quantitatively evaluate the severity of insulator discharge. The results of this paper is of great significance to the application of UV detection technology in the detection of 750kV insulator.
{"title":"The quantitative indicators of 750kV Porcelain Insulator in UV detection based on artificial contamination test","authors":"Cai-jing, N. Zhang, Ma-Zhong, Peng-Min, Xiaoguang Shang, Z. Jia, Linjun Wang","doi":"10.1109/ICD.2016.7547652","DOIUrl":"https://doi.org/10.1109/ICD.2016.7547652","url":null,"abstract":"In the process of the operation of 750kV transmission line, the insulator should be detected in time and effectively. As a fast and efficient method to detect the discharge of insulators, the ultraviolet detection technique is very important in the detection of 750kV insulator. In this paper, we analyzed the ultraviolet detection result of the 750kV Porcelain Insulator artificial contamination test, and then defined two indicators, relative fluctuation of photon number and mean value of spot area to evaluate the severity of discharge. The two indicators, UV photon number and UV spot area were studied in this paper. It is found that UV photon number and UV spot area couldn't evaluate the severity of insulator discharge quantitatively, but relative fluctuation of photon number and stage mean value of spot area could quantitatively evaluate the severity of insulator discharge. The results of this paper is of great significance to the application of UV detection technology in the detection of 750kV insulator.","PeriodicalId":306397,"journal":{"name":"2016 IEEE International Conference on Dielectrics (ICD)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117319109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}