Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236571
B. Jones
A final draft of the revised European EMC Directive has now been published in the Official Journal of the European Communities. It is expected that the text will be agreed with few, if any, changes. This paper provides a comparison of existing and new requirements, topic by topic. It highlights the differences between the existing directive and this revision, explaining the impact on manufacturers and others placing products on the European market.
{"title":"The European EMC Directive - a comparison of existing and new requirements","authors":"B. Jones","doi":"10.1109/ISEMC.2003.1236571","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236571","url":null,"abstract":"A final draft of the revised European EMC Directive has now been published in the Official Journal of the European Communities. It is expected that the text will be agreed with few, if any, changes. This paper provides a comparison of existing and new requirements, topic by topic. It highlights the differences between the existing directive and this revision, explaining the impact on manufacturers and others placing products on the European market.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129080587","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236616
B. Archambeault
There are a number of different ways to validate EMI/EMC simulation. Measurements can be useful, but care is needed when using measurements, since the limitations of the measurement could affect the results significantly. Other options are available to help engineers increase the confidence is their model results. Engineers should validate their models to ensure the model's correctness, and to help understand the basic physics behind the model. Measurements can be used to validate modeling results, but extreme care must be used to ensure the model correctly simulates the measured situation. Omitting feed cables, shielding or ground reflections, or different measurement scan areas can dramatically change the results. An incorrect model result might be indicated when, in fact, the measured and modeled results are obtained for different situations, and should not be directly compared. Intermediate results can also be used to help increase the confidence in a model. Using the RF current distribution in model, or the animation in a time domain model, can help ensure the overall results are correct by determining the intermediate results are correct. These intermediate results have the added benefit of increasing the engineer's understanding of the underlying causes and effects of the overall problem.
{"title":"Concerns and approaches for accurate EMC simulation validation","authors":"B. Archambeault","doi":"10.1109/ISEMC.2003.1236616","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236616","url":null,"abstract":"There are a number of different ways to validate EMI/EMC simulation. Measurements can be useful, but care is needed when using measurements, since the limitations of the measurement could affect the results significantly. Other options are available to help engineers increase the confidence is their model results. Engineers should validate their models to ensure the model's correctness, and to help understand the basic physics behind the model. Measurements can be used to validate modeling results, but extreme care must be used to ensure the model correctly simulates the measured situation. Omitting feed cables, shielding or ground reflections, or different measurement scan areas can dramatically change the results. An incorrect model result might be indicated when, in fact, the measured and modeled results are obtained for different situations, and should not be directly compared. Intermediate results can also be used to help increase the confidence in a model. Using the RF current distribution in model, or the animation in a time domain model, can help ensure the overall results are correct by determining the intermediate results are correct. These intermediate results have the added benefit of increasing the engineer's understanding of the underlying causes and effects of the overall problem.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134322466","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236696
C. Kinezos, V. Ungvichian
The commonly use of semi-anechoic chambers (SAC) is for electromagnetic interference emission (EMI) measurements. This paper suggests a simple technique to extend the EMI chamber capability to a low-cost fully anechoic chamber (FAC) to characterize the antenna performance. The dimensions of the absorbing cones placed o the reflecting ground surface are based on the Fresnel's zone concept. The receiving antenna operating from 300 MHz to 1 GHz is best located at the corner of the chamber. With the available 2' absorbing cones, the maximum distance between transmitting and receiving antenna of 4.5 meters, and the far-field criteria, the applicable antenna pattern measurement at 300 MHz requires only about 80% of the first Fresnel's zone cone coverage. Within the 0.5/spl times/0.5 m/sup 2/ area, at 60 MHz the worst case field uniformity is about 1.4 dB.
{"title":"A low cost conversion of semi-anechoic chamber to fully-anechoic chamber for RF antenna measurements","authors":"C. Kinezos, V. Ungvichian","doi":"10.1109/ISEMC.2003.1236696","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236696","url":null,"abstract":"The commonly use of semi-anechoic chambers (SAC) is for electromagnetic interference emission (EMI) measurements. This paper suggests a simple technique to extend the EMI chamber capability to a low-cost fully anechoic chamber (FAC) to characterize the antenna performance. The dimensions of the absorbing cones placed o the reflecting ground surface are based on the Fresnel's zone concept. The receiving antenna operating from 300 MHz to 1 GHz is best located at the corner of the chamber. With the available 2' absorbing cones, the maximum distance between transmitting and receiving antenna of 4.5 meters, and the far-field criteria, the applicable antenna pattern measurement at 300 MHz requires only about 80% of the first Fresnel's zone cone coverage. Within the 0.5/spl times/0.5 m/sup 2/ area, at 60 MHz the worst case field uniformity is about 1.4 dB.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131925683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236569
T. Stadtler, L. Eifler, J. ter Haseborg
A double probe near field scanner for measurement in time domain is presented in this paper. The advantages of measurements in time domain compared with measurements in frequency domain are time efficiency and the simplified capture of frequency hopping signals. The double probe set-up allows measurements of the absolute value of the field strength as well as of the phase. It is also possible to measure occasionally appearing transient pulses. This allows not only the representation of field strengths on the measurement plane but also the illustration of wave propagation or radiation in form of an animated picture sequence. Results of various measurements are shown in this paper.
{"title":"Double probe near field scanner, a new device for measurements in time domain","authors":"T. Stadtler, L. Eifler, J. ter Haseborg","doi":"10.1109/ISEMC.2003.1236569","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236569","url":null,"abstract":"A double probe near field scanner for measurement in time domain is presented in this paper. The advantages of measurements in time domain compared with measurements in frequency domain are time efficiency and the simplified capture of frequency hopping signals. The double probe set-up allows measurements of the absolute value of the field strength as well as of the phase. It is also possible to measure occasionally appearing transient pulses. This allows not only the representation of field strengths on the measurement plane but also the illustration of wave propagation or radiation in form of an animated picture sequence. Results of various measurements are shown in this paper.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133238529","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236596
T. Fischer, M. Leone, M. Albach
The electromagnetic radiation of multilayer boards due to power-bus noise is investigated for an idealized rectangular structure. The derivation of the far field is based on the field equivalence principle, using a lossy cavity model for the required boundary electric field distribution. The maximum electric field is studied within the frequency range 30 MHz-1 GHz. A parameter study shows that the distance between the planes is one of the most effective means for lowering radiated emissions.
{"title":"An analytical model for studying the electromagnetic radiation of power-bus structures","authors":"T. Fischer, M. Leone, M. Albach","doi":"10.1109/ISEMC.2003.1236596","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236596","url":null,"abstract":"The electromagnetic radiation of multilayer boards due to power-bus noise is investigated for an idealized rectangular structure. The derivation of the far field is based on the field equivalence principle, using a lossy cavity model for the required boundary electric field distribution. The maximum electric field is studied within the frequency range 30 MHz-1 GHz. A parameter study shows that the distance between the planes is one of the most effective means for lowering radiated emissions.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117007788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236610
A. Pretelli, A. Richelli, L. Colalongo, Z. Kovács-Vajna
This paper addresses an approach to design bandgap voltage references which provides a good trade-off between overall performances and strong immunity to electromagnetic interferences. We investigated two classical topologies of bandgap references. The first circuit exhibits a 1200mV shift for interfering signals in the frequency range of 1MHz-4GHz, while the shift in the modified version of the same architecture is only 6mV. The second circuit exhibits a 300mV shift in the same frequency range while the shift in its modified version is only 20 mV.
{"title":"Robust design of bandgap voltage references with low EMI susceptibility","authors":"A. Pretelli, A. Richelli, L. Colalongo, Z. Kovács-Vajna","doi":"10.1109/ISEMC.2003.1236610","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236610","url":null,"abstract":"This paper addresses an approach to design bandgap voltage references which provides a good trade-off between overall performances and strong immunity to electromagnetic interferences. We investigated two classical topologies of bandgap references. The first circuit exhibits a 1200mV shift for interfering signals in the frequency range of 1MHz-4GHz, while the shift in the modified version of the same architecture is only 6mV. The second circuit exhibits a 300mV shift in the same frequency range while the shift in its modified version is only 20 mV.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115055346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236669
G. Antonini, A. Scogna, A. Orlandi
A method for de-embedding scattering parameters S of via hole in multilayer printed circuit board is presented. By assuming that the via hole is not electromagnetically coupled with the adjacent lines, the scattering parameters are evaluated starting from the calculation of the transfer scattering matrix T obtained by a three dimensional full wave analysis of the test structure. The numerical approach used to obtain S and T parameters has been validated by comparison with results computed by other independent numerical methods and measurements. The proposed methodology allows a computational time saving and gives useful results for a CAD modeling of via hole discontinuities.
{"title":"Characterization of via holes discontinuities by means of numerical de-embedding","authors":"G. Antonini, A. Scogna, A. Orlandi","doi":"10.1109/ISEMC.2003.1236669","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236669","url":null,"abstract":"A method for de-embedding scattering parameters S of via hole in multilayer printed circuit board is presented. By assuming that the via hole is not electromagnetically coupled with the adjacent lines, the scattering parameters are evaluated starting from the calculation of the transfer scattering matrix T obtained by a three dimensional full wave analysis of the test structure. The numerical approach used to obtain S and T parameters has been validated by comparison with results computed by other independent numerical methods and measurements. The proposed methodology allows a computational time saving and gives useful results for a CAD modeling of via hole discontinuities.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116179389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236607
Han-Chang Hsieh, K. Wang
This paper reveals the feasibility of using the GTD method to evaluate the effect of a finite metallic plane of Open Area Test Site on NSA, which is used to measure the performance of an open area test site at frequencies below 1 GHz. The sites typically consist of large ground planes. In fact, an infinite metallic plane is impracticable. Nevertheless, it is worthwhile probing the deviation of NSA under the finite metallic plane condition due to a close tie between the metallic plane and the construction cost. As a result, it is required to analyze the length and width of a rectangle metallic plane that influence the NSA. We adopt the GTD method to analyze the NSA deviation by calculating the edge diffraction of the finite metallic plane. From the comparison of the numerical and measured results, the key factor affecting NSA is the width of rectangle metallic plane, which should be regarded as a priority to reduce the NSA deviation under the consideration of the finite test site.
{"title":"The use of GTD method to evaluate the effect of finite metallic plane of OATS on NSA in UHF (300 /spl sim/ 1000MHz) region","authors":"Han-Chang Hsieh, K. Wang","doi":"10.1109/ISEMC.2003.1236607","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236607","url":null,"abstract":"This paper reveals the feasibility of using the GTD method to evaluate the effect of a finite metallic plane of Open Area Test Site on NSA, which is used to measure the performance of an open area test site at frequencies below 1 GHz. The sites typically consist of large ground planes. In fact, an infinite metallic plane is impracticable. Nevertheless, it is worthwhile probing the deviation of NSA under the finite metallic plane condition due to a close tie between the metallic plane and the construction cost. As a result, it is required to analyze the length and width of a rectangle metallic plane that influence the NSA. We adopt the GTD method to analyze the NSA deviation by calculating the edge diffraction of the finite metallic plane. From the comparison of the numerical and measured results, the key factor affecting NSA is the width of rectangle metallic plane, which should be regarded as a priority to reduce the NSA deviation under the consideration of the finite test site.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128601666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236603
R. Woods, J. Ely, L. Vahala
The need to detect unauthorized usage of intentionally transmitting portable electronic devices (PEDs) onboard commercial aircraft is growing, while still allowing passengers to use selected unintentionally transmitting devices, such as laptop computers and CD players during non-critical stages of flight. The following paper presents an installed system for detecting PEDs over multiple frequency bands. Additionally, the advantages of a fixed verses mobile system are discussed. While data is presented to cover the frequency range of 20 MHz to 6.5 GHz, special attention was given to the Cellular/PCS bands as well as Bluetooth and the FRS radio bands. Measurement data from both the semi-anechoic and reverberation chambers are then analyzed and correlated with data collected on board a commercial aircraft to determine the dominant mode of coupling inside the passenger cabin of the aircraft versus distance from the source. As a final check of system feasibility, several PEDs' transmission signatures were recorded and compared with the expected levels.
{"title":"Detecting the use of intentionally transmitting personal electronic devices onboard commercial aircraft","authors":"R. Woods, J. Ely, L. Vahala","doi":"10.1109/ISEMC.2003.1236603","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236603","url":null,"abstract":"The need to detect unauthorized usage of intentionally transmitting portable electronic devices (PEDs) onboard commercial aircraft is growing, while still allowing passengers to use selected unintentionally transmitting devices, such as laptop computers and CD players during non-critical stages of flight. The following paper presents an installed system for detecting PEDs over multiple frequency bands. Additionally, the advantages of a fixed verses mobile system are discussed. While data is presented to cover the frequency range of 20 MHz to 6.5 GHz, special attention was given to the Cellular/PCS bands as well as Bluetooth and the FRS radio bands. Measurement data from both the semi-anechoic and reverberation chambers are then analyzed and correlated with data collected on board a commercial aircraft to determine the dominant mode of coupling inside the passenger cabin of the aircraft versus distance from the source. As a final check of system feasibility, several PEDs' transmission signatures were recorded and compared with the expected levels.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129344076","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236701
Yingcai Xiao, E. Li
This paper presents an efficient method, which combine finite element method (FEM) and model order reduction (MOR) algorithm for the simulation and modeling of electromagnetic devices and systems over a broadband. In the application of this method, perfectly matched layer (PML) is applied with finite element method to solve unbounded region problem. A Krylov space based model order reduction method is used to reduce the order of model from FEM-PML. With the reduced model, it is available to achieve a fast frequency sweep result efficiently over broadband. By using the proposed method, the time consumption of simulation of interconnects over broadband can be reduced significantly without too much loss of accuracy.
{"title":"An efficient finite element solution using a congruent transformation based model order reduction for interconnect simulation","authors":"Yingcai Xiao, E. Li","doi":"10.1109/ISEMC.2003.1236701","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236701","url":null,"abstract":"This paper presents an efficient method, which combine finite element method (FEM) and model order reduction (MOR) algorithm for the simulation and modeling of electromagnetic devices and systems over a broadband. In the application of this method, perfectly matched layer (PML) is applied with finite element method to solve unbounded region problem. A Krylov space based model order reduction method is used to reduce the order of model from FEM-PML. With the reduced model, it is available to achieve a fast frequency sweep result efficiently over broadband. By using the proposed method, the time consumption of simulation of interconnects over broadband can be reduced significantly without too much loss of accuracy.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"1999 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128257433","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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