Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236678
M. Gander, A. Ruehli
Large problems can be solved with the ever increasing availability of computing power. However, our ability to solve large circuit and transmission line problems, in the time domain, is still relatively modest. Partitioning into a set of smaller problems is essential for the electrical modeling of very large systems. However, so far the partitioning of strongly coupled circuits like transmission lines has been difficult. We introduce a new approach for coupling partitioned problems in the context of waveform relaxation methods, which leads to the class of optimized waveform relaxation algorithms with greatly enhanced performance. We analyze convergence for the case of a transmission line type circuit and illustrate the method with several quasi TEM mode transmission line problems.
{"title":"Solution of large transmission line type circuits using a new optimized waveform relaxation partitioning","authors":"M. Gander, A. Ruehli","doi":"10.1109/ISEMC.2003.1236678","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236678","url":null,"abstract":"Large problems can be solved with the ever increasing availability of computing power. However, our ability to solve large circuit and transmission line problems, in the time domain, is still relatively modest. Partitioning into a set of smaller problems is essential for the electrical modeling of very large systems. However, so far the partitioning of strongly coupled circuits like transmission lines has been difficult. We introduce a new approach for coupling partitioned problems in the context of waveform relaxation methods, which leads to the class of optimized waveform relaxation algorithms with greatly enhanced performance. We analyze convergence for the case of a transmission line type circuit and illustrate the method with several quasi TEM mode transmission line problems.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"23 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120973643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236594
C. Buccella, M. Feliziani, G. Manzi
A procedure to detect and localize defects in shielded cables is presented. Common defects in cables and shields (short circuit between shield and inner core, crack in the shield, hole in the shield, cross section discontinuities,...) are modeled by equivalent lumped circuit models, which are introduced in a numerical procedure based on the solution of the transmission line (TL) equations. A sensitive analysis is carried out to establish the type of the cable defects that can be detected and localized. The numerical results are then compared by those measured in frequency domain (FD).
{"title":"Identification and localization of defects in shielded cables by a numerical/experimental procedure","authors":"C. Buccella, M. Feliziani, G. Manzi","doi":"10.1109/ISEMC.2003.1236594","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236594","url":null,"abstract":"A procedure to detect and localize defects in shielded cables is presented. Common defects in cables and shields (short circuit between shield and inner core, crack in the shield, hole in the shield, cross section discontinuities,...) are modeled by equivalent lumped circuit models, which are introduced in a numerical procedure based on the solution of the transmission line (TL) equations. A sensitive analysis is carried out to establish the type of the cable defects that can be detected and localized. The numerical results are then compared by those measured in frequency domain (FD).","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122433598","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236664
S. Caniggia, P. Santi
Common-mode current effects on radiated emissions, due to imbalance between rise and fall time of the differential output of line drivers for high-speed digital signals, are investigated by experimental measurements, numerical and SPICE simulations. Three driver families are characterized: LV34 (RS422), LVDS, and LVPECL. Unshielded (UTP) and Shielded Twisted Pair (STP) of Cat. 5 were the cables used in this investigation in order to minimize the contribution due to the imbalance of the wires. The EMC performances of connectors such as 5/spl times/2 pins z-pack, RJ45 and Sub D 9 pins with STP cable are also presented.
{"title":"Common-mode radiated emissions from UTP/STP cables with differential high-speed drivers/receivers","authors":"S. Caniggia, P. Santi","doi":"10.1109/ISEMC.2003.1236664","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236664","url":null,"abstract":"Common-mode current effects on radiated emissions, due to imbalance between rise and fall time of the differential output of line drivers for high-speed digital signals, are investigated by experimental measurements, numerical and SPICE simulations. Three driver families are characterized: LV34 (RS422), LVDS, and LVPECL. Unshielded (UTP) and Shielded Twisted Pair (STP) of Cat. 5 were the cables used in this investigation in order to minimize the contribution due to the imbalance of the wires. The EMC performances of connectors such as 5/spl times/2 pins z-pack, RJ45 and Sub D 9 pins with STP cable are also presented.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122806053","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236632
M. Hatfield, W.P. Pluim, W. Price
This paper reviews a research effort to identify, develop, validate, and document an approach for conducting in situ electromagnetic shielding effectiveness testing of commercial aircraft. The goal was to measure transfer functions over as wide a spectrum as possible with the range from 100 MHz to 10 GHz being considered a minimum for success. The method developed decreased the cost of such testing with respect to current test methods and does not require special facilities, unusual test equipment, remote sites, or alteration of the aircraft. In addition, the method is applicable to aircraft in production, maintenance or deployment.
{"title":"Investigation into in-situ shielding effectiveness testing of transport aircraft","authors":"M. Hatfield, W.P. Pluim, W. Price","doi":"10.1109/ISEMC.2003.1236632","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236632","url":null,"abstract":"This paper reviews a research effort to identify, develop, validate, and document an approach for conducting in situ electromagnetic shielding effectiveness testing of commercial aircraft. The goal was to measure transfer functions over as wide a spectrum as possible with the range from 100 MHz to 10 GHz being considered a minimum for success. The method developed decreased the cost of such testing with respect to current test methods and does not require special facilities, unusual test equipment, remote sites, or alteration of the aircraft. In addition, the method is applicable to aircraft in production, maintenance or deployment.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122853680","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236693
V. Kocharyan, D. Tolman
The management of ESD simulators and standardized ESD test stations to assure quality test results continues to be a major concern for test houses. Early detection of malfunctioning ESD equipment is possible if a day-to-day check is performed. The standard system for verification of ESD simulators is large, expensive and not practical for an everyday check. This paper describes the express diagnostic method aimed to locate the problems with either the ESD simulator or the test station. A 100MHz....500MHz bandwidth oscilloscope can be used to measure the quasi-electrostatic field of the horizontal coupling plane after the package of discharges has been applied. The malfunction of an ESD simulator and/or test station is discovered as a deviation from the baseline measurements, which are taken immediately after calibration. This method exposes any changes of the indicated discharge voltage or the horizontal coupling plane bleeder resistor impedance as well as changes in the discharge networks of ESD simulators. The oscillograms and the statistical analysis of data are presented in this paper, which support the claims that this method can assists in detection of potential problems of ESD equipment.
{"title":"An express diagnostic method for ESD simulators and standardized ESD test stations","authors":"V. Kocharyan, D. Tolman","doi":"10.1109/ISEMC.2003.1236693","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236693","url":null,"abstract":"The management of ESD simulators and standardized ESD test stations to assure quality test results continues to be a major concern for test houses. Early detection of malfunctioning ESD equipment is possible if a day-to-day check is performed. The standard system for verification of ESD simulators is large, expensive and not practical for an everyday check. This paper describes the express diagnostic method aimed to locate the problems with either the ESD simulator or the test station. A 100MHz....500MHz bandwidth oscilloscope can be used to measure the quasi-electrostatic field of the horizontal coupling plane after the package of discharges has been applied. The malfunction of an ESD simulator and/or test station is discovered as a deviation from the baseline measurements, which are taken immediately after calibration. This method exposes any changes of the indicated discharge voltage or the horizontal coupling plane bleeder resistor impedance as well as changes in the discharge networks of ESD simulators. The oscillograms and the statistical analysis of data are presented in this paper, which support the claims that this method can assists in detection of potential problems of ESD equipment.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131489423","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236606
D.M. Zhang, E. Li, T.K.D. Yeo, W.S. Chow, J. Quek
This paper studies in detail the loading effect on the performances, especially independent sampling points in a reverberation chamber. Different amounts of absorbers have used to load the chamber and the average power over one revolution of tuner sweeping has been used to quantify the improvement of performances versus sacrifice of average electric field. The influence of locations of absorbers relative to transmitting antenna and stirrers on performance has also been studied. It is found a suitable amount of absorbers placed at appropriate positions may increase the performance of a chamber better than more absorbers placed improbably.
{"title":"Influences of loading absorber on the performances of a reverberation chamber","authors":"D.M. Zhang, E. Li, T.K.D. Yeo, W.S. Chow, J. Quek","doi":"10.1109/ISEMC.2003.1236606","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236606","url":null,"abstract":"This paper studies in detail the loading effect on the performances, especially independent sampling points in a reverberation chamber. Different amounts of absorbers have used to load the chamber and the average power over one revolution of tuner sweeping has been used to quantify the improvement of performances versus sacrifice of average electric field. The influence of locations of absorbers relative to transmitting antenna and stirrers on performance has also been studied. It is found a suitable amount of absorbers placed at appropriate positions may increase the performance of a chamber better than more absorbers placed improbably.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127924800","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236699
S. K. Nayak, M. Thomas
This paper presents a novel technique for the computation of radiated electromagnetic interference levels due to corona on HV transmission lines. The EMI levels due to corona computed for different lines from around the world matches well with the experimentally measured values, thus validating the present technique. Using the technique developed, it has been shown that the radiated field a an observation point close to the transmission line increases with the line length and reaches almost a constant value for line lengths above 1500 m. The influence of increased spacing between phase conductors is to reduce the radiated field where as the type of phase configuration does not have any influence on the radiated field.
{"title":"A novel technique for the computation of radiated EMI due to corona on HV transmission lines","authors":"S. K. Nayak, M. Thomas","doi":"10.1109/ISEMC.2003.1236699","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236699","url":null,"abstract":"This paper presents a novel technique for the computation of radiated electromagnetic interference levels due to corona on HV transmission lines. The EMI levels due to corona computed for different lines from around the world matches well with the experimentally measured values, thus validating the present technique. Using the technique developed, it has been shown that the radiated field a an observation point close to the transmission line increases with the line length and reaches almost a constant value for line lengths above 1500 m. The influence of increased spacing between phase conductors is to reduce the radiated field where as the type of phase configuration does not have any influence on the radiated field.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"11 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132548579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236722
Chen Wang, J. Drewniak
Imbalances in differential signaling can introduce common-mode components, resulting in signal integrity (SI) problems as well as EMI problems. Three-port mixed-mode S-parameters are employed to quantify the impacts on EMI. The EMI problems caused by delay skew and slew rate skew are investigated.
{"title":"Quantifying the effects on EMI and SI of source imbalances in differential signaling","authors":"Chen Wang, J. Drewniak","doi":"10.1109/ISEMC.2003.1236722","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236722","url":null,"abstract":"Imbalances in differential signaling can introduce common-mode components, resulting in signal integrity (SI) problems as well as EMI problems. Three-port mixed-mode S-parameters are employed to quantify the impacts on EMI. The EMI problems caused by delay skew and slew rate skew are investigated.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133737202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236582
Shih-Pin Yu, C. Bunting
The revisit of the ideal 2 dimensional structure of reverberation chamber which was reported to have good field uniformity (standard derivation less than 1 dB) in previous work is performed. The statistical behavior of the electric field is examined. The simulation result of an ideal 3 dimensional structure for frequency stirring reverberation chamber is also shown.
{"title":"Statistical investigation of frequency-stirred reverberation chambers","authors":"Shih-Pin Yu, C. Bunting","doi":"10.1109/ISEMC.2003.1236582","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236582","url":null,"abstract":"The revisit of the ideal 2 dimensional structure of reverberation chamber which was reported to have good field uniformity (standard derivation less than 1 dB) in previous work is performed. The statistical behavior of the electric field is examined. The simulation result of an ideal 3 dimensional structure for frequency stirring reverberation chamber is also shown.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"132 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133177532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2003-10-14DOI: 10.1109/ISEMC.2003.1236610
A. Pretelli, A. Richelli, L. Colalongo, Z. Kovács-Vajna
This paper addresses an approach to design bandgap voltage references which provides a good trade-off between overall performances and strong immunity to electromagnetic interferences. We investigated two classical topologies of bandgap references. The first circuit exhibits a 1200mV shift for interfering signals in the frequency range of 1MHz-4GHz, while the shift in the modified version of the same architecture is only 6mV. The second circuit exhibits a 300mV shift in the same frequency range while the shift in its modified version is only 20 mV.
{"title":"Robust design of bandgap voltage references with low EMI susceptibility","authors":"A. Pretelli, A. Richelli, L. Colalongo, Z. Kovács-Vajna","doi":"10.1109/ISEMC.2003.1236610","DOIUrl":"https://doi.org/10.1109/ISEMC.2003.1236610","url":null,"abstract":"This paper addresses an approach to design bandgap voltage references which provides a good trade-off between overall performances and strong immunity to electromagnetic interferences. We investigated two classical topologies of bandgap references. The first circuit exhibits a 1200mV shift for interfering signals in the frequency range of 1MHz-4GHz, while the shift in the modified version of the same architecture is only 6mV. The second circuit exhibits a 300mV shift in the same frequency range while the shift in its modified version is only 20 mV.","PeriodicalId":359422,"journal":{"name":"2003 IEEE Symposium on Electromagnetic Compatibility. Symposium Record (Cat. No.03CH37446)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2003-10-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115055346","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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