Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323642
Y. Anand, R.P. Hoft
The thermal resistance test station provides a complete characterization of a GUNN diodes parameters. The output power, efficiency, frequency, power swept response, and thermal resistance measurements are made fast and accurately. The accuracy of present thermal resistance measurements of Ka-band GUNN diodes is ± 15%, better results are expected with the revised heating test. Measurement times of 2-3 minutes rather than 2-3 hours are required making it a production suitable method. The system expandability becomes apparent at the wafer level. The current versus voltage characteristics at ambient temperature may be able in distinguish between good and bad processed GaAs wafers. This will provide an obvious cost savings because inadequate wafers are withheld during processing or before packaging.
{"title":"Gunn Diode Pulse Thermal Resistance and Characterization Test System","authors":"Y. Anand, R.P. Hoft","doi":"10.1109/ARFTG.1985.323642","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323642","url":null,"abstract":"The thermal resistance test station provides a complete characterization of a GUNN diodes parameters. The output power, efficiency, frequency, power swept response, and thermal resistance measurements are made fast and accurately. The accuracy of present thermal resistance measurements of Ka-band GUNN diodes is ± 15%, better results are expected with the revised heating test. Measurement times of 2-3 minutes rather than 2-3 hours are required making it a production suitable method. The system expandability becomes apparent at the wafer level. The current versus voltage characteristics at ambient temperature may be able in distinguish between good and bad processed GaAs wafers. This will provide an obvious cost savings because inadequate wafers are withheld during processing or before packaging.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121594986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-12-01DOI: 10.1109/ARFTG.1985.323658
J. Schepps, S. Perlow, Joseph E. Brown
{"title":"Programmable Microwave Toner System","authors":"J. Schepps, S. Perlow, Joseph E. Brown","doi":"10.1109/ARFTG.1985.323658","DOIUrl":"https://doi.org/10.1109/ARFTG.1985.323658","url":null,"abstract":"","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122627321","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/arftg.1985.323645
A series of measurements were made on the coaxial connector interface using test fixtures which allow each element to be examined separately. The measurements were made in the time domain in a way that eliminated calibration subtraction of seams and other reflection causing mechanisms. Data is given on seams, slots, chamfers and pin gaps. The contribution of various sized internal chamfers of the female contact is plotted and found to cause a significant reflection as the pin gap becomes very small.
{"title":"Reflection Residuals of Coaxial Connectors","authors":"","doi":"10.1109/arftg.1985.323645","DOIUrl":"https://doi.org/10.1109/arftg.1985.323645","url":null,"abstract":"A series of measurements were made on the coaxial connector interface using test fixtures which allow each element to be examined separately. The measurements were made in the time domain in a way that eliminated calibration subtraction of seams and other reflection causing mechanisms. Data is given on seams, slots, chamfers and pin gaps. The contribution of various sized internal chamfers of the female contact is plotted and found to cause a significant reflection as the pin gap becomes very small.","PeriodicalId":371039,"journal":{"name":"26th ARFTG Conference Digest","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115678769","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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