Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396823
O. Spathmann, M. Clemens, T. Fiedler, V. Hansen, U. Pfeiffer, M. Saviz, K. Statnikov, J. Streckert, M. Zang
In order to develop computational methods for determining the reaction of biological systems exposed to THz radiation, conventional approaches of numerical dosimetry have to be extended. The penetration depth of electromagnetic fields at THz frequencies is less than 1 mm and thus substantially smaller than for radio frequencies. In addition, the short wavelengths in this frequency range cause the necessity of high resolution models. Here, a selection of simulation models of the human skin and of the eye as well as of the excitation field are presented together with a proposal to assess the appropriate dielectric tissue parameters.
{"title":"Attempts for exposure assessment in the THz-frequency range using numerical computations","authors":"O. Spathmann, M. Clemens, T. Fiedler, V. Hansen, U. Pfeiffer, M. Saviz, K. Statnikov, J. Streckert, M. Zang","doi":"10.1109/EMCEUROPE.2012.6396823","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396823","url":null,"abstract":"In order to develop computational methods for determining the reaction of biological systems exposed to THz radiation, conventional approaches of numerical dosimetry have to be extended. The penetration depth of electromagnetic fields at THz frequencies is less than 1 mm and thus substantially smaller than for radio frequencies. In addition, the short wavelengths in this frequency range cause the necessity of high resolution models. Here, a selection of simulation models of the human skin and of the eye as well as of the excitation field are presented together with a proposal to assess the appropriate dielectric tissue parameters.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"97 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132737579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396678
D. Thomas, C. Obiekezie, S. Greedy, A. Nothofer, P. Sewell
A method for characterising and modelling the noisy electromagnetic fields from complex circuit boards using a simplified representation of correlated dipoles is investigated. It is shown how the equivalent dipole model can be constructed from the time domain measurements of the near fields. This equivalent model can then be used to accurately reproduce the emissions from the circuit board in both the near and far field. However, it is found that there are many challenges to such an approach as such a technique will require a large measurement data set to be acquired which may be very time consuming and the solution can be ill conditioned.
{"title":"Characterisation of noisy electromagnetic fields from Circuits using the Correlation of equivalent sources","authors":"D. Thomas, C. Obiekezie, S. Greedy, A. Nothofer, P. Sewell","doi":"10.1109/EMCEUROPE.2012.6396678","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396678","url":null,"abstract":"A method for characterising and modelling the noisy electromagnetic fields from complex circuit boards using a simplified representation of correlated dipoles is investigated. It is shown how the equivalent dipole model can be constructed from the time domain measurements of the near fields. This equivalent model can then be used to accurately reproduce the emissions from the circuit board in both the near and far field. However, it is found that there are many challenges to such an approach as such a technique will require a large measurement data set to be acquired which may be very time consuming and the solution can be ill conditioned.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"125 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131661484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396928
T. Schellenberg, Guang Xu, M. El-Arabied, M. Schneider
Methods for accelerating the computation of internal inductances of rectangular conductors for uniform discretization are presented and discussed. Significant improvements in both the speed of computation and in memory requirements are achieved by applying algorithms that take advantage of the symmetric Toeplitz block Toeplitz structure of the matrices involved in these calculations. The computational expense for the costliest operation is improved from near O(N3) to roughly O(N) and memory requirements are reduced from an order of N2 elements to N elements.
{"title":"Accelerated methods for computing internal inductances of rectangular conductors","authors":"T. Schellenberg, Guang Xu, M. El-Arabied, M. Schneider","doi":"10.1109/EMCEUROPE.2012.6396928","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396928","url":null,"abstract":"Methods for accelerating the computation of internal inductances of rectangular conductors for uniform discretization are presented and discussed. Significant improvements in both the speed of computation and in memory requirements are achieved by applying algorithms that take advantage of the symmetric Toeplitz block Toeplitz structure of the matrices involved in these calculations. The computational expense for the costliest operation is improved from near O(N3) to roughly O(N) and memory requirements are reduced from an order of N2 elements to N elements.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115511223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396749
T. Kisielewicz, C. Mazzetti, G. Piparo, B. Kuca, Z. Flisowski
The paper intends to give a contribution to the investigation on the expected surge current, peak value and shape, due to lightning electromagnetic impulse (LEMP) by flashes to the structure for the surge protective device (SPD) proper selection in order to assure electronic apparatus operation. The obtained results are discussed with the SPD requirements of international standard [1].
{"title":"Electronic apparatus protection against LEMP: Surge threat for the SPD selection","authors":"T. Kisielewicz, C. Mazzetti, G. Piparo, B. Kuca, Z. Flisowski","doi":"10.1109/EMCEUROPE.2012.6396749","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396749","url":null,"abstract":"The paper intends to give a contribution to the investigation on the expected surge current, peak value and shape, due to lightning electromagnetic impulse (LEMP) by flashes to the structure for the surge protective device (SPD) proper selection in order to assure electronic apparatus operation. The obtained results are discussed with the SPD requirements of international standard [1].","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"232 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123478639","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396756
F. Ruan, Yang Meng, Y. You, Feng Zhou, Ziyi You, Ning Zhuang
Experiment with electrostatic discharge(ESD) generator was implemented in two situations of gap state. All discussion in previous literatures on approach speed effect in electrostatic discharge is really the combination of contact mode discharge and air mode discharge because of final collision of electrode with the target. Three kinds of discharge current waveforms are analysed for experiment test results in electrostatic discharge. Approach speed, i.e., moving electrode velocity to the target, only alter charge state on electrode before ESD taking place. The parameters of ESD are affected by special contact electrostatic discharge combination with air discharge.
{"title":"Experiment research of moving electrode impact on discharge parameters in narrow gap ESD","authors":"F. Ruan, Yang Meng, Y. You, Feng Zhou, Ziyi You, Ning Zhuang","doi":"10.1109/EMCEUROPE.2012.6396756","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396756","url":null,"abstract":"Experiment with electrostatic discharge(ESD) generator was implemented in two situations of gap state. All discussion in previous literatures on approach speed effect in electrostatic discharge is really the combination of contact mode discharge and air mode discharge because of final collision of electrode with the target. Three kinds of discharge current waveforms are analysed for experiment test results in electrostatic discharge. Approach speed, i.e., moving electrode velocity to the target, only alter charge state on electrode before ESD taking place. The parameters of ESD are affected by special contact electrostatic discharge combination with air discharge.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116804127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396768
T. De Oliveira, J. Schanen, J. Guichon, J. Roudet
This paper presents the results of an automatic optimization of the layout of a conventional EMC filter. PEEC models of the components and the tracks are used in an optimization process developed specifically for this purpose. After validation of the models, the optimization results are investigated regarding the impact of the well known Common Mode and Differential Mode disturbances.
{"title":"Optimized layout for an EMC filter: Analysis and validations","authors":"T. De Oliveira, J. Schanen, J. Guichon, J. Roudet","doi":"10.1109/EMCEUROPE.2012.6396768","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396768","url":null,"abstract":"This paper presents the results of an automatic optimization of the layout of a conventional EMC filter. PEEC models of the components and the tracks are used in an optimization process developed specifically for this purpose. After validation of the models, the optimization results are investigated regarding the impact of the well known Common Mode and Differential Mode disturbances.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"40 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125744818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396737
P. Horský, P. Kamenický
This paper describes an analog output stage of a combined high side - low side driver suitable for automotive environment. Design of the driver was dictated by the environment - high electromagnetic compatibility (EMC) requirements, low susceptibility, robustness of the driver to transient overvoltage pulses and mis-wiring. The driver has also to fulfill safety requirements. In case of failure conditions like a missing ground or supply connection the output of the driver goes into diagnostic position.
{"title":"EMC robust analog output driver for automotive applications","authors":"P. Horský, P. Kamenický","doi":"10.1109/EMCEUROPE.2012.6396737","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396737","url":null,"abstract":"This paper describes an analog output stage of a combined high side - low side driver suitable for automotive environment. Design of the driver was dictated by the environment - high electromagnetic compatibility (EMC) requirements, low susceptibility, robustness of the driver to transient overvoltage pulses and mis-wiring. The driver has also to fulfill safety requirements. In case of failure conditions like a missing ground or supply connection the output of the driver goes into diagnostic position.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"48 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124751647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396917
Hongsik Keum, Won-seo Cho, Jungyu Yang, H. Ryu, Sangho Choi
Using a variety of digital modulation schemes for mobile communication technology, and despite the fact that these are serviced, the radiated immunity test based on IEC 61000-4-3 only has been performed using AM signal. In this study, we had performed the radiated immunity test using the digital modulation signals and an AM signal, and had investigated the impact of digitally modulated signals. The results show that the devices were influenced by digital modulation signal or PM signal more than by AM signal. This result shows that we need to investigate the depth research on radiated immunity testing for the environment of modern communication technology.
{"title":"Analysis upon the effect of the immunity of electronic devices by the emitted digital modulated signals","authors":"Hongsik Keum, Won-seo Cho, Jungyu Yang, H. Ryu, Sangho Choi","doi":"10.1109/EMCEUROPE.2012.6396917","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396917","url":null,"abstract":"Using a variety of digital modulation schemes for mobile communication technology, and despite the fact that these are serviced, the radiated immunity test based on IEC 61000-4-3 only has been performed using AM signal. In this study, we had performed the radiated immunity test using the digital modulation signals and an AM signal, and had investigated the impact of digitally modulated signals. The results show that the devices were influenced by digital modulation signal or PM signal more than by AM signal. This result shows that we need to investigate the depth research on radiated immunity testing for the environment of modern communication technology.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128515570","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396700
Yang Liu, B. Ravelo, A. Jastrzebski
A calculation method of the E-field components Ex, y, z(t) from Hx, y(t) in time-domain is presented. The H-field radiation is generated by considering an ultra-short excitation current. The proposed method is based on the combination of the Fourier and plane wave spectrum (PWS) transforms associated with the Maxwell-Ampere relation. The relevance of the method was confirmed by considering a set of dipoles placed arbitrarily in the horizontal plane and excited by a pulse current of 0.6 ns width at half-height. Magnetic field components Hx, y(t) were calculated in the rectangular plane above the dipoles at different heights in the near-field range. It was demonstrated that extracted Ex, y, z(t) fields were in good agreement with the analytical results.
提出了一种在时域上由Hx, y(t)计算电磁场分量Ex, y, z(t)的方法。h场辐射是通过考虑超短激励电流产生的。该方法是基于傅立叶变换与麦克斯韦-安培关系相结合的平面波谱(PWS)变换。通过考虑在水平面上任意放置一组偶极子，并在半高处由0.6 ns宽的脉冲电流激发，证实了该方法的相关性。计算了近场范围内不同高度偶极子上方矩形平面上的磁场分量Hx、y(t)。结果表明，提取的Ex、y、z(t)场与分析结果吻合较好。
{"title":"Calculation of time-domain near-field Ex, y, z(t) from Hx, y(t) with PWS and FFT transforms","authors":"Yang Liu, B. Ravelo, A. Jastrzebski","doi":"10.1109/EMCEUROPE.2012.6396700","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396700","url":null,"abstract":"A calculation method of the E-field components Ex, y, z(t) from Hx, y(t) in time-domain is presented. The H-field radiation is generated by considering an ultra-short excitation current. The proposed method is based on the combination of the Fourier and plane wave spectrum (PWS) transforms associated with the Maxwell-Ampere relation. The relevance of the method was confirmed by considering a set of dipoles placed arbitrarily in the horizontal plane and excited by a pulse current of 0.6 ns width at half-height. Magnetic field components Hx, y(t) were calculated in the rectangular plane above the dipoles at different heights in the near-field range. It was demonstrated that extracted Ex, y, z(t) fields were in good agreement with the analytical results.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128168695","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-12-31DOI: 10.1109/EMCEUROPE.2012.6396858
S. Ishigami, I. Wu, K. Gotoh, Y. Matsumoto
Recently, energy-conservation equipment such as an LED lamp becomes used gradually. However, such equipment has possibilities to radiate unintentional electromagnetic noises. The unintended noises often interfere in wireless communications such as multimedia broadcastings or digital television broadcastings. Especially, the emission of LED lamps has wide frequency range up several hundred megahertz. In this report, the electromagnetic-field attenuations of some kind of buildings in very-high frequency band are numerically analyzed by using the finite-integration (FI) method.
{"title":"Numerical analysis on effect of building materials on electromagnetic fields in VHF band","authors":"S. Ishigami, I. Wu, K. Gotoh, Y. Matsumoto","doi":"10.1109/EMCEUROPE.2012.6396858","DOIUrl":"https://doi.org/10.1109/EMCEUROPE.2012.6396858","url":null,"abstract":"Recently, energy-conservation equipment such as an LED lamp becomes used gradually. However, such equipment has possibilities to radiate unintentional electromagnetic noises. The unintended noises often interfere in wireless communications such as multimedia broadcastings or digital television broadcastings. Especially, the emission of LED lamps has wide frequency range up several hundred megahertz. In this report, the electromagnetic-field attenuations of some kind of buildings in very-high frequency band are numerically analyzed by using the finite-integration (FI) method.","PeriodicalId":377100,"journal":{"name":"International Symposium on Electromagnetic Compatibility - EMC EUROPE","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129790909","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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