Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1
U. Celano
{"title":"Electrical Atomic Force Microscopy for Nanoelectronics","authors":"U. Celano","doi":"10.1007/978-3-030-15612-1","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116190482","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1007/978-3-030-15612-1_12
K. Rubin, Yongliang Yang, O. Amster, D. Scrymgeour, S. Misra
{"title":"Scanning Microwave Impedance Microscopy (sMIM) in Electronic and Quantum Materials","authors":"K. Rubin, Yongliang Yang, O. Amster, D. Scrymgeour, S. Misra","doi":"10.1007/978-3-030-15612-1_12","DOIUrl":"https://doi.org/10.1007/978-3-030-15612-1_12","url":null,"abstract":"","PeriodicalId":377915,"journal":{"name":"Electrical Atomic Force Microscopy for Nanoelectronics","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133441202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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