Pub Date : 2021-10-31DOI: 10.31399/asm.cp.istfa2021tpi1
I. De Wolf, K. Jacobs
Presentation slides from the ISTFA 2021 tutorial, “[Failure Analysis Techniques for 3D Technology].”
来自ISTFA 2021教程的演示幻灯片，“[3D技术的故障分析技术]。”
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Pub Date : 2021-10-31DOI: 10.31399/asm.cp.istfa2021tpm1
N. Asadi
Presentation slides from the ISTFA 2021 tutorial, “[Failure Analysis for Hardware Security].”
来自ISTFA 2021教程“[硬件安全故障分析]”的演示幻灯片。
{"title":"Failure Analysis for Hardware Security","authors":"N. Asadi","doi":"10.31399/asm.cp.istfa2021tpm1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tpm1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[Failure Analysis for Hardware Security].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116958549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Machine Learning Based Data and Signal Analysis Methods for the Application in Failure Analysis","authors":"M. Kögel, S. Brand, F. Altmann","doi":"10.31399/asm.cp.istfa2021tpb1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tpb1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[Machine Learning Based Data and Signal Analysis Methods for the Application in Failure Analysis].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133982280","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-10-31DOI: 10.31399/asm.cp.istfa2021tpk1
H. Stegmann
Presentation slides from the ISTFA 2021 tutorial, “[Basics and Current Aspects of Scanning Electron Microscopy].”
来自ISTFA 2021教程的演示幻灯片，“[扫描电子显微镜的基础和当前方面]。”
{"title":"Basics and Current Aspects of Scanning Electron Microscopy","authors":"H. Stegmann","doi":"10.31399/asm.cp.istfa2021tpk1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tpk1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[Basics and Current Aspects of Scanning Electron Microscopy].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"76 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124814363","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-10-31DOI: 10.31399/asm.cp.istfa2021tpn1
E. Principe
Presentation slides from the ISTFA 2021 tutorial, “[Charged Particle Systems: Fundamentals and Opportunities].”
来自ISTFA 2021教程的演示幻灯片，“[带电粒子系统:基础和机会]。”
{"title":"Charged Particle Systems: Fundamentals and Opportunities","authors":"E. Principe","doi":"10.31399/asm.cp.istfa2021tpn1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tpn1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[Charged Particle Systems: Fundamentals and Opportunities].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-10-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132181932","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2018-10-30DOI: 10.31399/asm.cp.istfa2021tph1
Steven B. Herschbein
Presentation slides from the ISTFA 2021 tutorial, “[Focused Ion Beam for Chip Circuit Edit and Fault Isolation].”
来自ISTFA 2021教程的演示幻灯片，“[用于芯片电路编辑和故障隔离的聚焦离子束]。”
{"title":"Focused Ion Beam (FIB) for Chip Circuit Edit and Fault Isolation","authors":"Steven B. Herschbein","doi":"10.31399/asm.cp.istfa2021tph1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tph1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[Focused Ion Beam for Chip Circuit Edit and Fault Isolation].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115076280","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"STEM-in-SEM: From Basic Imaging to Rigorous Quantitative Analysis","authors":"Jason Holm","doi":"10.31399/asm.cp.istfa2021tpj1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tpj1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[STEM-in-SEM: From Basic Imaging to Rigorous Quantitative Analysis].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2018-10-28","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114328215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-11-06DOI: 10.31399/asm.cp.istfa2021tpf1
Gregory M. Johnson
Presentation slides from the ISTFA 2021 tutorial, “[Technique Selection for Front End of Line Defect Localization in Bulk Semiconductor Failure Analysis].”
来自ISTFA 2021教程的演示幻灯片，“[体半导体故障分析中线前端缺陷定位的技术选择]。”
{"title":"Technique Selection for Front End of Line Defect Localization in Bulk Si FA","authors":"Gregory M. Johnson","doi":"10.31399/asm.cp.istfa2021tpf1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tpf1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[Technique Selection for Front End of Line Defect Localization in Bulk Semiconductor Failure Analysis].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"478 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-11-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133712562","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-11-01DOI: 10.31399/asm.cp.istfa2021tpd1
C. Boit
Presentation slides from the ISTFA 2021 tutorial, “[Photonic Localization Techniques].”
来自ISTFA 2021教程的演示幻灯片，“[光子定位技术]。”
{"title":"Photonic Localization Techniques","authors":"C. Boit","doi":"10.31399/asm.cp.istfa2021tpd1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tpd1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[Photonic Localization Techniques].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127177850","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-11-03DOI: 10.31399/asm.cp.istfa2021tpc1
D. Albert
Presentation slides from the ISTFA 2021 tutorial, “[Yield Basics for Failure Analysis].”
来自ISTFA 2021教程的演示幻灯片，“[失效分析的良率基础]。”
{"title":"Yield Basics for Failure Analysts","authors":"D. Albert","doi":"10.31399/asm.cp.istfa2021tpc1","DOIUrl":"https://doi.org/10.31399/asm.cp.istfa2021tpc1","url":null,"abstract":"\u0000 Presentation slides from the ISTFA 2021 tutorial, “[Yield Basics for Failure Analysis].”","PeriodicalId":390794,"journal":{"name":"ISTFA 2021: Tutorial Presentations from the 47th International Symposium for Testing and Failure Analysis","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-11-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122195552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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