Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342882
A. Al zaman, M.S.A. Khan, S. Sultana, S. M. Taohidul Islam
This paper primarily deals with the error correction for the error correcting code, convolutional code. Viterbi decoding algorithm is the well known algorithm to decode convolutional code. Some of its limitations are overcome by the proposed algorithm in (Saifullah and Al-Mamun, 2004). This paper shows the improvement made by maximum likelihood (ML) decoding in simple form over the Viterbi algorithm and the proposed algorithm in (Saifullah and Al-Mamun, 2004) for short codeword and constraint length because of its low complexity. With this ML decoding, alternate use of block and convolutional code saves receiver's decoding power as well as computational complexity.
本文主要研究纠错码——卷积码的纠错问题。Viterbi译码算法是卷积码译码的常用算法。在(Saifullah and Al-Mamun, 2004)中提出的算法克服了它的一些局限性。本文展示了简单形式的最大似然(ML)解码相对于Viterbi算法和(Saifullah and Al-Mamun, 2004)中提出的算法在短码字和约束长度方面的改进，因为它的复杂度较低。使用这种ML解码，块和卷积代码的交替使用节省了接收器的解码能力以及计算复杂性。
{"title":"ML decoding for convolutional code for short codeword of short constraint length and alternate use of block code","authors":"A. Al zaman, M.S.A. Khan, S. Sultana, S. M. Taohidul Islam","doi":"10.1109/SECON.2007.342882","DOIUrl":"https://doi.org/10.1109/SECON.2007.342882","url":null,"abstract":"This paper primarily deals with the error correction for the error correcting code, convolutional code. Viterbi decoding algorithm is the well known algorithm to decode convolutional code. Some of its limitations are overcome by the proposed algorithm in (Saifullah and Al-Mamun, 2004). This paper shows the improvement made by maximum likelihood (ML) decoding in simple form over the Viterbi algorithm and the proposed algorithm in (Saifullah and Al-Mamun, 2004) for short codeword and constraint length because of its low complexity. With this ML decoding, alternate use of block and convolutional code saves receiver's decoding power as well as computational complexity.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"138 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126867083","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342971
Daniel Cepeda, Cleon Davis, Gary May
Variable frequency microwave (VFM) curing of polymer dielectrics can reduce process time compared to conventional thermal methods drastically without compromising intrinsic material properties. However, the interactions that occur during VFM curing are not well understood. This paper presents a statistical experimental design to determine the significance of VFM processing parameters. A D-optimal experiment is performed on samples of polyimide spin-cast on silicon wafers cured in a VFM furnace. During VFM processing, the temperature of the polyimide samples is ramped to a specific temperature and held for a selected amount of time. Temperature calibration is conducted to guarantee accurate temperature exposure. The input variables analyzed are cure time, ramp rate, hold temperature, center frequency, bandwidth, and sweep rate. The output variables of interest are the in-plane and through-plane indices of refraction, birefringence, and the percent of imidization of polyimide. The percent imidization is measured using attenuated total reflection Fourier transform infrared (ATR-FTIR) spectroscopy. Birefringence is derived from the in-plane and through-plane indices of refraction, both of which are measured with a metricon prism coupler. Analysis of variance (ANOVA) is used to determine the input variables with the greatest effect. Cure time is found to be the only significant parameter.
{"title":"Identification of significant process parameters in variable frequency microwave curing","authors":"Daniel Cepeda, Cleon Davis, Gary May","doi":"10.1109/SECON.2007.342971","DOIUrl":"https://doi.org/10.1109/SECON.2007.342971","url":null,"abstract":"Variable frequency microwave (VFM) curing of polymer dielectrics can reduce process time compared to conventional thermal methods drastically without compromising intrinsic material properties. However, the interactions that occur during VFM curing are not well understood. This paper presents a statistical experimental design to determine the significance of VFM processing parameters. A D-optimal experiment is performed on samples of polyimide spin-cast on silicon wafers cured in a VFM furnace. During VFM processing, the temperature of the polyimide samples is ramped to a specific temperature and held for a selected amount of time. Temperature calibration is conducted to guarantee accurate temperature exposure. The input variables analyzed are cure time, ramp rate, hold temperature, center frequency, bandwidth, and sweep rate. The output variables of interest are the in-plane and through-plane indices of refraction, birefringence, and the percent of imidization of polyimide. The percent imidization is measured using attenuated total reflection Fourier transform infrared (ATR-FTIR) spectroscopy. Birefringence is derived from the in-plane and through-plane indices of refraction, both of which are measured with a metricon prism coupler. Analysis of variance (ANOVA) is used to determine the input variables with the greatest effect. Cure time is found to be the only significant parameter.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126868792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342935
N. Korivi, Li Jiang
This paper reports on the development of a polymeric microfluidic multiplexer, which can be applied to perform a variety of functions involving liquid manipulation and control in microfluidics devices/systems, portable biosensors, and other miniaturized systems. The developed device was applied for 1times8 multiplexing of a test liquid, i.e., the test liquid was injected into the device through one inlet and injected out through eight similar outlets. It was also applied for the formation of micro-arrays of liquid drops on a surface. The device can be designed to deliver either a single or several different liquids.
{"title":"A polymer microfluidic multiplexer","authors":"N. Korivi, Li Jiang","doi":"10.1109/SECON.2007.342935","DOIUrl":"https://doi.org/10.1109/SECON.2007.342935","url":null,"abstract":"This paper reports on the development of a polymeric microfluidic multiplexer, which can be applied to perform a variety of functions involving liquid manipulation and control in microfluidics devices/systems, portable biosensors, and other miniaturized systems. The developed device was applied for 1times8 multiplexing of a test liquid, i.e., the test liquid was injected into the device through one inlet and injected out through eight similar outlets. It was also applied for the formation of micro-arrays of liquid drops on a surface. The device can be designed to deliver either a single or several different liquids.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132819711","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342853
Z. Wang, H. Savci, J. Griggs, N. Dogan, E. Arvas
Ultra-low power analog/RF CMOS circuits are critical for battery-operated electronics. Low-supply voltage and current requirements are met by operating MOS transistors in weak to moderate inversions and very small overdrive voltages. The advantage of this technique comes with the price of complex and aggressive design burdens to be achieved. Therefore designers should have control over the behavior of their circuits such as the process, supply, and temperature variations. This paper presents a technique, which dynamically adjusts the threshold voltage to overcome the process and supply variation. Proposed technique (DTMOS) is used for digital and analog/RF designs. The simulation results show that with the proposed technique the variations in drain current and transconductance due to uncertainty of the process parameters and voltage deviations in the power supplies could be successfully compensated.
{"title":"Coping with process variations in ultra-low power CMOS analog integrated circuits","authors":"Z. Wang, H. Savci, J. Griggs, N. Dogan, E. Arvas","doi":"10.1109/SECON.2007.342853","DOIUrl":"https://doi.org/10.1109/SECON.2007.342853","url":null,"abstract":"Ultra-low power analog/RF CMOS circuits are critical for battery-operated electronics. Low-supply voltage and current requirements are met by operating MOS transistors in weak to moderate inversions and very small overdrive voltages. The advantage of this technique comes with the price of complex and aggressive design burdens to be achieved. Therefore designers should have control over the behavior of their circuits such as the process, supply, and temperature variations. This paper presents a technique, which dynamically adjusts the threshold voltage to overcome the process and supply variation. Proposed technique (DTMOS) is used for digital and analog/RF designs. The simulation results show that with the proposed technique the variations in drain current and transconductance due to uncertainty of the process parameters and voltage deviations in the power supplies could be successfully compensated.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124556170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342878
D. Pal
In this article, Huffman's idea has been extended to higher dimensions and magnitudes with greater redundancy (minimum to maximum) in the development of a new communication code. In this code, both coding and decoding are easier in comparison with Huffman code.
{"title":"A method for the construction of fixed and variable length matrix communication code with variable redundancy: An extension work in the light of Huffman code","authors":"D. Pal","doi":"10.1109/SECON.2007.342878","DOIUrl":"https://doi.org/10.1109/SECON.2007.342878","url":null,"abstract":"In this article, Huffman's idea has been extended to higher dimensions and magnitudes with greater redundancy (minimum to maximum) in the development of a new communication code. In this code, both coding and decoding are easier in comparison with Huffman code.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121458898","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342988
Todd R. Andel, Alec Yasinsac
Route security is vital to MANET operation and reliability. If a malicious host can inject itself into the routing path or alter the routing path, route security has failed. In this paper we focus on the invisible node attack (INA), an important, unsolved wireless network attack. We provide an INA formal definition and show why proposed solutions throughout the literature have not eliminated this critical attack. Since there is no existing INA solution, we provide a discussion on its potential impacts on ad hoc routing protocols.
{"title":"The invisible node attack revisited","authors":"Todd R. Andel, Alec Yasinsac","doi":"10.1109/SECON.2007.342988","DOIUrl":"https://doi.org/10.1109/SECON.2007.342988","url":null,"abstract":"Route security is vital to MANET operation and reliability. If a malicious host can inject itself into the routing path or alter the routing path, route security has failed. In this paper we focus on the invisible node attack (INA), an important, unsolved wireless network attack. We provide an INA formal definition and show why proposed solutions throughout the literature have not eliminated this critical attack. Since there is no existing INA solution, we provide a discussion on its potential impacts on ad hoc routing protocols.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128910116","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342944
D.I. Eromon, P. Kuale
Procedures and methods for fitting equations to represent design data used in routing designs of electrical machines are presented in this paper. The equations with the appropriate constants are computed using the numerical data which are accurately taken from the various design curves. It was found that the B-H curves, the ampere-conductor ratings, as well as the core path shortening factors can easily be fitted using the least square method as well as using the computer for carrying out the routine calculations. The equations obtained very satisfactorily represent the origin design data; and in this way considerable computer time and storage space were saved in subsequent design calculations when a new design needing the data is embarked upon.
{"title":"Interpolation approach in fitting equations into design data (POINTS)","authors":"D.I. Eromon, P. Kuale","doi":"10.1109/SECON.2007.342944","DOIUrl":"https://doi.org/10.1109/SECON.2007.342944","url":null,"abstract":"Procedures and methods for fitting equations to represent design data used in routing designs of electrical machines are presented in this paper. The equations with the appropriate constants are computed using the numerical data which are accurately taken from the various design curves. It was found that the B-H curves, the ampere-conductor ratings, as well as the core path shortening factors can easily be fitted using the least square method as well as using the computer for carrying out the routine calculations. The equations obtained very satisfactorily represent the origin design data; and in this way considerable computer time and storage space were saved in subsequent design calculations when a new design needing the data is embarked upon.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129168585","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.343001
G. Weistroffer, J. A. Cooper, J. Tucker
An algorithm is developed for converting binary integers to decibels (dB). Compared to known alternative methods the algorithm is not only faster, but requires less memory. It also has the advantage of being easy to implement. The presented technique is useful for applications such as converting the output of an analog to digital converter to discrete dB values. The speed of the algorithm is due to the fact that no floating-point operations are required. In fact, the only real time arithmetic employed is one integer subtraction. The algorithm can easily be implemented in a microcontroller or FPGA.
{"title":"Quick and easy binary to dB conversion","authors":"G. Weistroffer, J. A. Cooper, J. Tucker","doi":"10.1109/SECON.2007.343001","DOIUrl":"https://doi.org/10.1109/SECON.2007.343001","url":null,"abstract":"An algorithm is developed for converting binary integers to decibels (dB). Compared to known alternative methods the algorithm is not only faster, but requires less memory. It also has the advantage of being easy to implement. The presented technique is useful for applications such as converting the output of an analog to digital converter to discrete dB values. The speed of the algorithm is due to the fact that no floating-point operations are required. In fact, the only real time arithmetic employed is one integer subtraction. The algorithm can easily be implemented in a microcontroller or FPGA.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129222992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342956
Chris Mack, Vishali Mogallapu, Andrew Willis, T. Weldon
We present a method for extracting outer bone surfaces from a 3D CT (computer tomography) image sequence using a novel segmentation scheme on each image. A 3D mesh of the bone surface is then generated using the marching cubes algorithm. The new segmentation algorithm makes use of several imaging constraints which greatly simplify the problem including : (i) the cross-sectional size of a bone is approximately known and (ii) the geometric shape of a cross-section is approximately known. In clinical practice using commercial CT scanners, these quantities are typically known and serve to greatly simplify the segmentation problem. By segmenting the image data, the algorithm is capable of uniquely extracting the bone outer surface in contrast to other methods which often include extra surfaces or surfaces with holes. This paper presents the segmentation method and shows results for extracting tibia bone outer surfaces.
{"title":"Exploiting typical clinical imaging constraints for 3D outer bone surface segmentation","authors":"Chris Mack, Vishali Mogallapu, Andrew Willis, T. Weldon","doi":"10.1109/SECON.2007.342956","DOIUrl":"https://doi.org/10.1109/SECON.2007.342956","url":null,"abstract":"We present a method for extracting outer bone surfaces from a 3D CT (computer tomography) image sequence using a novel segmentation scheme on each image. A 3D mesh of the bone surface is then generated using the marching cubes algorithm. The new segmentation algorithm makes use of several imaging constraints which greatly simplify the problem including : (i) the cross-sectional size of a bone is approximately known and (ii) the geometric shape of a cross-section is approximately known. In clinical practice using commercial CT scanners, these quantities are typically known and serve to greatly simplify the segmentation problem. By segmenting the image data, the algorithm is capable of uniquely extracting the bone outer surface in contrast to other methods which often include extra surfaces or surfaces with holes. This paper presents the segmentation method and shows results for extracting tibia bone outer surfaces.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"192 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129254870","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2007-03-22DOI: 10.1109/SECON.2007.342877
P. Suri, S. Rani
Summary form only given. Bluetooth is being envisioned simply as a wire replacement technology. Its most commonly described application is that of a "cordless computer" consisting of several devices including a personal computer, possibly a laptop, keyboard, mouse, joystick, printer, scanner, etc., each equipped with a Bluetooth card. There are no cable connections between these devices, and Bluetooth is to enable seamless communication between all them, essentially replacing what is today achieved through a combination of serial and parallel cables, and infrared links. However, Bluetooth has the potential for being much more than a wire replacement technology, and the Bluetooth standard was indeed drafted with such a more ambitious goal in mind. Bluetooth holds the promise of becoming the technology of choice for ad hoc networks of the future. This paper introduces a number of problems faced by the Bluetooth technology when attempting to use it for building ad hoc networks. The paper provides a brief overview of Bluetooth and describes some of the major issues that need to be addressed, if it is to be successful as a networking technology.
{"title":"Use of fixed device address during connection establishment","authors":"P. Suri, S. Rani","doi":"10.1109/SECON.2007.342877","DOIUrl":"https://doi.org/10.1109/SECON.2007.342877","url":null,"abstract":"Summary form only given. Bluetooth is being envisioned simply as a wire replacement technology. Its most commonly described application is that of a \"cordless computer\" consisting of several devices including a personal computer, possibly a laptop, keyboard, mouse, joystick, printer, scanner, etc., each equipped with a Bluetooth card. There are no cable connections between these devices, and Bluetooth is to enable seamless communication between all them, essentially replacing what is today achieved through a combination of serial and parallel cables, and infrared links. However, Bluetooth has the potential for being much more than a wire replacement technology, and the Bluetooth standard was indeed drafted with such a more ambitious goal in mind. Bluetooth holds the promise of becoming the technology of choice for ad hoc networks of the future. This paper introduces a number of problems faced by the Bluetooth technology when attempting to use it for building ad hoc networks. The paper provides a brief overview of Bluetooth and describes some of the major issues that need to be addressed, if it is to be successful as a networking technology.","PeriodicalId":423683,"journal":{"name":"Proceedings 2007 IEEE SoutheastCon","volume":"200 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2007-03-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115962911","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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