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The effect of oxidation degree on the electromagnetic properties of Mn-Zn ferrites 氧化程度对锰锌铁氧体电磁性能的影响
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837749
J. Suh, Y. Han, M. Shin, B. Song
Samples were prepared by a conventional ceramic powder processing and followed by sintering at 1320°C for 3 hours. The equilibrium partial pressure of %.(I) suggested by Morineau was precisely controlled at sintering & cooling region[2]. log Po, = -14540+ A (A: oxygen parameter) (1) V 0 K ) The weight change due to oxidation-reduction was measured in-situ by thermobalance. The electromagneic properties were measured by using 9-H & impedance analyzer.
采用传统的陶瓷粉末工艺制备样品,在1320℃下烧结3小时。Morineau建议的平衡分压%.(I)精确控制在烧结和冷却区[2]。log Po, = -14540+ A (A:氧参数)(1)V 0 K)用热平衡仪原位测量了氧化还原引起的质量变化。采用9-H阻抗分析仪对其电磁特性进行了测量。
{"title":"The effect of oxidation degree on the electromagnetic properties of Mn-Zn ferrites","authors":"J. Suh, Y. Han, M. Shin, B. Song","doi":"10.1109/INTMAG.1999.837749","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837749","url":null,"abstract":"Samples were prepared by a conventional ceramic powder processing and followed by sintering at 1320°C for 3 hours. The equilibrium partial pressure of %.(I) suggested by Morineau was precisely controlled at sintering & cooling region[2]. log Po, = -14540+ A (A: oxygen parameter) (1) V 0 K ) The weight change due to oxidation-reduction was measured in-situ by thermobalance. The electromagneic properties were measured by using 9-H & impedance analyzer.","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"49 8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121199522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Sensitive stress sensor using amorphous magnetostrictive wires on beam with both ends built in and diaphragm 灵敏的应力传感器,采用非晶磁致伸缩线,两端内置在梁和隔膜上
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837360
L. Shen, Y. Naruse, D. Kusumoto, E. Kita, K. Mohri, T. Uchiyama
Introductioq The authors have obtained giant straingauge factors of about 2W0 and 1200 using cold drawn and then tension annealed CoSiB amorphous wires (a-wire, for short) with 20 I UI and 30 p diameters respectively (made by UNlTlKA LID.). The wires are magnetized with a high frequency current or a sharp pulse current to generale the stress-impedance (SI, for short) effect [1][2]. We have also reported stress sensors using a pair of amorphous CoSiB wires fixed to a plastic cantilever beam combined with a CMOS IC multivibrator circuit (31. This type sensor has a high sensitivity and a high linearity in the range of -0.75-1.25 gr with a resolution of 2.5 mgr. However, the cantilever type sensor is not applicable lo detect distributed stresses as gas and liquid, because that two a-wires must be fixed on both sides of the plate. In this paper, new stress sensors with a beam with both ends built in and a diaphragm are presented in which a pair of a-wires are fixed on a single side of the substrates. A blood vessel pulsation is stably detected using the diaphragm type SI sensor with a CMOS IC multivibrator. Exoeriments and discuss ion Fig. 1 illustrates a beam with both ends built in type stress sensor head with induced stress distribution. When a weight (W) is loaded on the center of the beam, the a-wire@ (CoSiB with U) p diameter and 7 mm length) fixed on the central area of the plastic plate ( 45 X 15 X 0.4 mm) receives a compressive stress in longitudinal direction, while the a-wire @ fixed on a edge area receives a tensile stress in longitudinal direction. Fig. 2 shows measured results of SI characteristics of the a-wire @ and @set in a CMOS IC multivibrator sensor circuit as shown in Fig. 3. The rising time of the pulse current applied through @and @is 15 ns which corresponds to a sinusoidal current with about 30 MHz for the magnetization. Fig. 4 shows the output voltage Eout versus weight W characteristics of the SI sensor which shows a resolution of about 10 mgr in a linear range of -1-4 gr. Fig. 5 represents a detection of blood vessel pulsations of wrist artery in (a), and carotid artery in (b) using a flexible diaphragm.
采用UNlTlKA LID公司生产的CoSiB非晶态金属丝(简称a线),分别采用直径为20i / UI和30p的材料进行冷拔后拉伸退火,获得了约为2W0和1200的巨大应变因子。导线用高频电流或尖脉冲电流磁化,产生应力阻抗(SI,简称SI)效应[1][2]。我们也报道了将一对非晶CoSiB导线固定在塑料悬臂梁上并结合CMOS IC多振子电路的应力传感器(31)。这种类型的传感器具有高灵敏度和高线性度,范围为-0.75-1.25 gr,分辨率为2.5 mgr。然而,悬臂式传感器不适用于检测气体和液体等分布应力,因为必须在板的两侧固定两根a线。本文提出了一种新型应力传感器,其两端都是内置梁和膜片,其中一对a线固定在基板的单侧。使用带CMOS IC多谐振荡器的膜片式SI传感器可以稳定地检测血管脉动。实验和讨论图1示出了两端内置应力传感器头的梁,具有诱导应力分布。当在梁的中心处加载重物W时,固定在塑料板中心区域(45 X 15 X 0.4 mm)上的a-钢丝@(直径U) p,长度7mm)在纵向上受到压应力,固定在边缘区域的a-钢丝@在纵向上受到拉应力。图2显示了如图3所示的CMOS IC多振子传感器电路中a线@和@set的SI特性测量结果。通过@和@施加的脉冲电流的上升时间为15 ns,对应于磁化强度约为30 MHz的正弦电流。图4显示了SI传感器的输出电压Eout与重量W的特性,在-1-4 gr的线性范围内显示了约10 mgr的分辨率。图5表示使用柔性隔膜检测腕动脉(a)和颈动脉(b)的血管脉动。
{"title":"Sensitive stress sensor using amorphous magnetostrictive wires on beam with both ends built in and diaphragm","authors":"L. Shen, Y. Naruse, D. Kusumoto, E. Kita, K. Mohri, T. Uchiyama","doi":"10.1109/INTMAG.1999.837360","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837360","url":null,"abstract":"Introductioq The authors have obtained giant straingauge factors of about 2W0 and 1200 using cold drawn and then tension annealed CoSiB amorphous wires (a-wire, for short) with 20 I UI and 30 p diameters respectively (made by UNlTlKA LID.). The wires are magnetized with a high frequency current or a sharp pulse current to generale the stress-impedance (SI, for short) effect [1][2]. We have also reported stress sensors using a pair of amorphous CoSiB wires fixed to a plastic cantilever beam combined with a CMOS IC multivibrator circuit (31. This type sensor has a high sensitivity and a high linearity in the range of -0.75-1.25 gr with a resolution of 2.5 mgr. However, the cantilever type sensor is not applicable lo detect distributed stresses as gas and liquid, because that two a-wires must be fixed on both sides of the plate. In this paper, new stress sensors with a beam with both ends built in and a diaphragm are presented in which a pair of a-wires are fixed on a single side of the substrates. A blood vessel pulsation is stably detected using the diaphragm type SI sensor with a CMOS IC multivibrator. Exoeriments and discuss ion Fig. 1 illustrates a beam with both ends built in type stress sensor head with induced stress distribution. When a weight (W) is loaded on the center of the beam, the a-wire@ (CoSiB with U) p diameter and 7 mm length) fixed on the central area of the plastic plate ( 45 X 15 X 0.4 mm) receives a compressive stress in longitudinal direction, while the a-wire @ fixed on a edge area receives a tensile stress in longitudinal direction. Fig. 2 shows measured results of SI characteristics of the a-wire @ and @set in a CMOS IC multivibrator sensor circuit as shown in Fig. 3. The rising time of the pulse current applied through @and @is 15 ns which corresponds to a sinusoidal current with about 30 MHz for the magnetization. Fig. 4 shows the output voltage Eout versus weight W characteristics of the SI sensor which shows a resolution of about 10 mgr in a linear range of -1-4 gr. Fig. 5 represents a detection of blood vessel pulsations of wrist artery in (a), and carotid artery in (b) using a flexible diaphragm.","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114331341","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
Novel measurement of flying height and attitude using Michelson laser interferrometry 利用迈克尔逊激光干涉测量飞行高度和姿态的新方法
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837387
Y. Mitsuya
Head-medium spacing for magnetic disk storage is the most important parameter, which must be measured accurately down to the nanometer level. Thus far, light interference based on the homodgne technique have been apphed to spacing measurements throuah a glass disk instead of actual disks. This techniquo, however, have nearly reached ita limitation, since the spacing ha.: reduced M B much lesser degree than 1/4 0.. wavelength), the standard spacing used for calibration. To overcome this limitation due to the necessity ofcahbration. novel measurement of flying height and attitude is developed. The major advantagcs of this method are no necessity ofwilibrarion and applicability to in-situ measurement using actual heads and disks.
磁头介质间距是磁盘存储中最重要的参数,必须精确测量到纳米级。到目前为止,基于均匀技术的光干涉已经应用于通过玻璃圆盘而不是实际圆盘的间距测量。然而,由于间距太小,这种技术几乎达到了极限。:减少的程度远小于1/4。波长),用于校准的标准间距。为了克服这一限制,由于必须进行校准。提出了一种新的飞行高度和姿态测量方法。该方法的主要优点是不需要辅助,并且适用于使用实际磁头和磁碟进行原位测量。
{"title":"Novel measurement of flying height and attitude using Michelson laser interferrometry","authors":"Y. Mitsuya","doi":"10.1109/INTMAG.1999.837387","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837387","url":null,"abstract":"Head-medium spacing for magnetic disk storage is the most important parameter, which must be measured accurately down to the nanometer level. Thus far, light interference based on the homodgne technique have been apphed to spacing measurements throuah a glass disk instead of actual disks. This techniquo, however, have nearly reached ita limitation, since the spacing ha.: reduced M B much lesser degree than 1/4 0.. wavelength), the standard spacing used for calibration. To overcome this limitation due to the necessity ofcahbration. novel measurement of flying height and attitude is developed. The major advantagcs of this method are no necessity ofwilibrarion and applicability to in-situ measurement using actual heads and disks.","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114751454","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Exchange coupling effect of nanocrystalline Nd[Dy]FeB/Fe films 纳米晶Nd[Dy]FeB/Fe薄膜的交换耦合效应
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837857
J. Tsai, T. Chin
{"title":"Exchange coupling effect of nanocrystalline Nd[Dy]FeB/Fe films","authors":"J. Tsai, T. Chin","doi":"10.1109/INTMAG.1999.837857","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837857","url":null,"abstract":"","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"187 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127707021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Head disk interface charge and its potentlal applications 磁头磁盘接口充电及其潜在应用
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837982
Zhu Feng, C. Shih, V. Gubbi, F. Poon, Danzhu Lu
The head-disk spacing change has been achieved by applying a low voltage (<5 volts) of DC/AC charge at the head-disk interface. The flying height (FH) cbange was confirmed by both acoustic emission measurements and parametric measurements (amplitude, PW50, SNR). Potential applications of this technique include active slider that control flying height of the head at data and landing zones to meet different requirements, and accelerated head-disk tribology testers with controlled constant low flying height (with DC charge) or intennittent contacts (AC charge).
磁头磁盘间距的改变是通过在磁头磁盘接口施加低电压(<5伏)的DC/AC充电来实现的。通过声发射测量和参数测量(振幅、PW50、信噪比)证实了飞行高度(FH)的变化。该技术的潜在应用包括控制数据区和着陆区磁头飞行高度以满足不同要求的主动滑块,以及控制恒定低飞行高度(直流充电)或集中接触(交流充电)的加速磁头盘摩擦学测试仪。
{"title":"Head disk interface charge and its potentlal applications","authors":"Zhu Feng, C. Shih, V. Gubbi, F. Poon, Danzhu Lu","doi":"10.1109/INTMAG.1999.837982","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837982","url":null,"abstract":"The head-disk spacing change has been achieved by applying a low voltage (<5 volts) of DC/AC charge at the head-disk interface. The flying height (FH) cbange was confirmed by both acoustic emission measurements and parametric measurements (amplitude, PW50, SNR). Potential applications of this technique include active slider that control flying height of the head at data and landing zones to meet different requirements, and accelerated head-disk tribology testers with controlled constant low flying height (with DC charge) or intennittent contacts (AC charge).","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126373221","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 1
Giant magneto-impedance effect in Fe/sub 96-x/Zr/sub x/B/sub 4/ [x=7 and 10] nonacrystalline ribbons Fe/sub - 96-x/Zr/sub -x/ B/sub - 4/ [x=7和10]非晶带中的巨磁阻抗效应
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837452
Z.C. Lu, D.R. Li
{"title":"Giant magneto-impedance effect in Fe/sub 96-x/Zr/sub x/B/sub 4/ [x=7 and 10] nonacrystalline ribbons","authors":"Z.C. Lu, D.R. Li","doi":"10.1109/INTMAG.1999.837452","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837452","url":null,"abstract":"","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"644 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115829164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Magnetic permeability dependence of isothermally annealed 1Cr-1Mo-0.25V steel 等温退火1Cr-1Mo-0.25V钢磁导率的相关性
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837475
K. Ryu, S. Nahm, Y.B. Kim, F. Yu, D. Son
{"title":"Magnetic permeability dependence of isothermally annealed 1Cr-1Mo-0.25V steel","authors":"K. Ryu, S. Nahm, Y.B. Kim, F. Yu, D. Son","doi":"10.1109/INTMAG.1999.837475","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837475","url":null,"abstract":"","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115933752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Noise reducuon by surface oxidization of CoCrZr seed layer for glass media 玻璃介质CoCrZr种子层表面氧化降噪研究
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837258
Y. Matsuda, Y. Yahisa, K. Sakamoto, Y. Takahashi, A. Katou, Y. Hosoe
{"title":"Noise reducuon by surface oxidization of CoCrZr seed layer for glass media","authors":"Y. Matsuda, Y. Yahisa, K. Sakamoto, Y. Takahashi, A. Katou, Y. Hosoe","doi":"10.1109/INTMAG.1999.837258","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837258","url":null,"abstract":"","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"126 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115889662","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Magnetizing angle dependence of pinning field distribution in 2605CO metglas 2605CO元玻璃中钉钉场分布与磁化角的关系
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837789
D.Y. Kim, C. Kim, H.C. Kim
lotrcduction The domain wall pinning plays a significant role on the magnetic properties related to microscopic wall motion, and the Eoacivity has been fitted using a pinning model [l]. However, experimental m d t for the distribution of the pinning field is not obtained yet. In this papa we present the measured pinning field distribution and its angular dependence in asquenched 2605CO Metglas in terms of sicchastic churactaistics and angular distribution of the pinning field strength.
畴壁钉钉对与微观壁运动相关的磁性能起着重要的作用,并使用钉钉模型拟合了其活度[1]。但是,目前还没有得到钉住场分布的实验模型。本文从力学特性和钉扎场强角分布的角度出发,给出了实测的2605CO微晶玻璃钉扎场强分布及其角依赖性。
{"title":"Magnetizing angle dependence of pinning field distribution in 2605CO metglas","authors":"D.Y. Kim, C. Kim, H.C. Kim","doi":"10.1109/INTMAG.1999.837789","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837789","url":null,"abstract":"lotrcduction The domain wall pinning plays a significant role on the magnetic properties related to microscopic wall motion, and the Eoacivity has been fitted using a pinning model [l]. However, experimental m d t for the distribution of the pinning field is not obtained yet. In this papa we present the measured pinning field distribution and its angular dependence in asquenched 2605CO Metglas in terms of sicchastic churactaistics and angular distribution of the pinning field strength.","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"78 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132349607","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Numerical simulation of /spl lambda/ using Neel's relaxation model 利用Neel松弛模型对/spl λ /进行数值模拟
Pub Date : 1999-05-18 DOI: 10.1109/INTMAG.1999.837999
A. Bajpai, A. Banerjee, R. Srinivasan
{"title":"Numerical simulation of /spl lambda/ using Neel's relaxation model","authors":"A. Bajpai, A. Banerjee, R. Srinivasan","doi":"10.1109/INTMAG.1999.837999","DOIUrl":"https://doi.org/10.1109/INTMAG.1999.837999","url":null,"abstract":"","PeriodicalId":425017,"journal":{"name":"IEEE International Magnetics Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1999-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130050312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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