首页 > 最新文献

International Workshop on Power and Timing Modeling, Optimization and Simulation最新文献

英文 中文
Practical and Theoretical Considerations on Low-Power Probability-Codes for Networks-on-Chip 片上网络低功耗概率码的实践与理论思考
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_16
A. Ortiz, L. Indrusiak
{"title":"Practical and Theoretical Considerations on Low-Power Probability-Codes for Networks-on-Chip","authors":"A. Ortiz, L. Indrusiak","doi":"10.1007/978-3-642-17752-1_16","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_16","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"124 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124960650","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
Statistical Leakage Power Optimization of Asynchronous Circuits Considering Process Variations 考虑工艺变化的异步电路统计泄漏功率优化
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_13
Mohsen Raji, A. Tajary, B. Ghavami, H. Pedram, H. Zarandi
{"title":"Statistical Leakage Power Optimization of Asynchronous Circuits Considering Process Variations","authors":"Mohsen Raji, A. Tajary, B. Ghavami, H. Pedram, H. Zarandi","doi":"10.1007/978-3-642-17752-1_13","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_13","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124603074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
An Automated Framework for Power-Critical Code Region Detection and Power Peak Optimization of Embedded Software 嵌入式软件关键功率码域检测与功率峰值优化的自动化框架
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_2
Christian Bachmann, Andreas Genser, C. Steger, R. Weiss, J. Haid
{"title":"An Automated Framework for Power-Critical Code Region Detection and Power Peak Optimization of Embedded Software","authors":"Christian Bachmann, Andreas Genser, C. Steger, R. Weiss, J. Haid","doi":"10.1007/978-3-642-17752-1_2","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_2","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133315370","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 4
An Efficient Low Power Multiple-Value Look-Up Table Targeting Quaternary FPGAs 针对第四代fpga的高效低功耗多值查找表
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_9
C. Lazzari, J. Fernandes, P. Flores, J. Monteiro
{"title":"An Efficient Low Power Multiple-Value Look-Up Table Targeting Quaternary FPGAs","authors":"C. Lazzari, J. Fernandes, P. Flores, J. Monteiro","doi":"10.1007/978-3-642-17752-1_9","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_9","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"113 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124122715","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 14
Early Power Estimation in Heterogeneous Designs Using SoCLib and SystemC-AMS 基于SoCLib和SystemC-AMS的异构设计早期功率估计
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_27
F. Pêcheux, Khouloud Zine el Abidine, A. Greiner
{"title":"Early Power Estimation in Heterogeneous Designs Using SoCLib and SystemC-AMS","authors":"F. Pêcheux, Khouloud Zine el Abidine, A. Greiner","doi":"10.1007/978-3-642-17752-1_27","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_27","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"383 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127589534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 3
Impact of Process Variations on Pulsed Flip-Flops: Yield Improving Circuit-Level Techniques and Comparative Analysis 工艺变化对脉冲触发器的影响:良率提高电路级技术和比较分析
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_18
M. Lanuzza, R. Rose, F. Frustaci, S. Perri, P. Corsonello
{"title":"Impact of Process Variations on Pulsed Flip-Flops: Yield Improving Circuit-Level Techniques and Comparative Analysis","authors":"M. Lanuzza, R. Rose, F. Frustaci, S. Perri, P. Corsonello","doi":"10.1007/978-3-642-17752-1_18","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_18","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"245 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115854610","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 13
3D Integration for Digital and Imagers Circuits: Opportunities and Challenges 数字和成像电路的3D集成:机遇与挑战
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_31
M. Belleville
{"title":"3D Integration for Digital and Imagers Circuits: Opportunities and Challenges","authors":"M. Belleville","doi":"10.1007/978-3-642-17752-1_31","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_31","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128002223","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Logic Architecture and VDD Selection for Reducing the Impact of Intra-die Random VT Variations on Timing 减少模内随机VT变化对时序影响的逻辑结构和VDD选择
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_17
B. K. Boroujeni, C. Piguet, Y. Leblebici
{"title":"Logic Architecture and VDD Selection for Reducing the Impact of Intra-die Random VT Variations on Timing","authors":"B. K. Boroujeni, C. Piguet, Y. Leblebici","doi":"10.1007/978-3-642-17752-1_17","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_17","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130706831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 2
White-Box Current Source Modeling Including Parameter Variation and Its Application in Timing Simulation 含参数变化的白盒电流源建模及其在时序仿真中的应用
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_20
Christoph Knoth, I. Eichwald, P. Nordholz, Ulf Schlichtmann
{"title":"White-Box Current Source Modeling Including Parameter Variation and Its Application in Timing Simulation","authors":"Christoph Knoth, I. Eichwald, P. Nordholz, Ulf Schlichtmann","doi":"10.1007/978-3-642-17752-1_20","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_20","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"9 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134352416","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 5
Variability-Conscious Circuit Designs for Low-Voltage Memory-Rich Nano-Scale CMOS LSIs 低电压富存储纳米级CMOS lsi的可变性意识电路设计
Pub Date : 2010-09-07 DOI: 10.1007/978-3-642-17752-1_30
K. Itoh
{"title":"Variability-Conscious Circuit Designs for Low-Voltage Memory-Rich Nano-Scale CMOS LSIs","authors":"K. Itoh","doi":"10.1007/978-3-642-17752-1_30","DOIUrl":"https://doi.org/10.1007/978-3-642-17752-1_30","url":null,"abstract":"","PeriodicalId":428747,"journal":{"name":"International Workshop on Power and Timing Modeling, Optimization and Simulation","volume":"112 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-09-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114115319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
International Workshop on Power and Timing Modeling, Optimization and Simulation
全部 Acc. Chem. Res. ACS Applied Bio Materials ACS Appl. Electron. Mater. ACS Appl. Energy Mater. ACS Appl. Mater. Interfaces ACS Appl. Nano Mater. ACS Appl. Polym. Mater. ACS BIOMATER-SCI ENG ACS Catal. ACS Cent. Sci. ACS Chem. Biol. ACS Chemical Health & Safety ACS Chem. Neurosci. ACS Comb. Sci. ACS Earth Space Chem. ACS Energy Lett. ACS Infect. Dis. ACS Macro Lett. ACS Mater. Lett. ACS Med. Chem. Lett. ACS Nano ACS Omega ACS Photonics ACS Sens. ACS Sustainable Chem. Eng. ACS Synth. Biol. Anal. Chem. BIOCHEMISTRY-US Bioconjugate Chem. BIOMACROMOLECULES Chem. Res. Toxicol. Chem. Rev. Chem. Mater. CRYST GROWTH DES ENERG FUEL Environ. Sci. Technol. Environ. Sci. Technol. Lett. Eur. J. Inorg. Chem. IND ENG CHEM RES Inorg. Chem. J. Agric. Food. Chem. J. Chem. Eng. Data J. Chem. Educ. J. Chem. Inf. Model. J. Chem. Theory Comput. J. Med. Chem. J. Nat. Prod. J PROTEOME RES J. Am. Chem. Soc. LANGMUIR MACROMOLECULES Mol. Pharmaceutics Nano Lett. Org. Lett. ORG PROCESS RES DEV ORGANOMETALLICS J. Org. Chem. J. Phys. Chem. J. Phys. Chem. A J. Phys. Chem. B J. Phys. Chem. C J. Phys. Chem. Lett. Analyst Anal. Methods Biomater. Sci. Catal. Sci. Technol. Chem. Commun. Chem. Soc. Rev. CHEM EDUC RES PRACT CRYSTENGCOMM Dalton Trans. Energy Environ. Sci. ENVIRON SCI-NANO ENVIRON SCI-PROC IMP ENVIRON SCI-WAT RES Faraday Discuss. Food Funct. Green Chem. Inorg. Chem. Front. Integr. Biol. J. Anal. At. Spectrom. J. Mater. Chem. A J. Mater. Chem. B J. Mater. Chem. C Lab Chip Mater. Chem. Front. Mater. Horiz. MEDCHEMCOMM Metallomics Mol. Biosyst. Mol. Syst. Des. Eng. Nanoscale Nanoscale Horiz. Nat. Prod. Rep. New J. Chem. Org. Biomol. Chem. Org. Chem. Front. PHOTOCH PHOTOBIO SCI PCCP Polym. Chem.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1