Quality Technology and Quantitative Management最新文献

{"title":"An integrated optimal-GICP design for the SPRT control chart with estimated process parameters based on the average number of observations to signal","authors":"J.W. Teoh, W.L. Teoh, Michael B.C. Khoo, K.P. Tran, M.H. Lee","doi":"10.1080/16843703.2024.2312010","DOIUrl":"https://doi.org/10.1080/16843703.2024.2312010","url":null,"abstract":"As a variable-sample-size control scheme, the sequential probability ratio test (SPRT) chart is favoured due to its sensitivity and high sampling efficiency. It is frequently documented that the SP...","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"15 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-02-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139763666","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Determining optimal process means in a multi-stage production system with inspection errors in 100% inspection","authors":"Ahmet Kolus, Salih Duffuaa","doi":"10.1080/16843703.2024.2312016","DOIUrl":"https://doi.org/10.1080/16843703.2024.2312016","url":null,"abstract":"The problem of determining optimal process parameters for multiple processes has not been widely addressed in the literature. Another important consideration that is frequently overlooked is the pr...","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"1 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-02-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139764046","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Change-point design-based charting schemes for monitoring process variability","authors":"Mengjie Tang, Dan Wang","doi":"10.1080/16843703.2024.2311980","DOIUrl":"https://doi.org/10.1080/16843703.2024.2311980","url":null,"abstract":"Most of the recommended nonparametric control charts apply to monitor location parameter. In this paper, we propose a nonparametric exponentially weighted moving average (EWMA) control chart for mo...","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"24 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139763202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"An adaptive EWMA chart for Poisson process","authors":"Zakia Batool, Abdul Haq","doi":"10.1080/16843703.2024.2304958","DOIUrl":"https://doi.org/10.1080/16843703.2024.2304958","url":null,"abstract":"This paper introduces an adaptive EWMA (AEWMA) chart designed for monitoring Poisson processes. This chart offers a streamlined implementation process, eliminating the need for additional parameter...","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"35 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2024-01-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139561543","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Inference for a general family of exponentiated distributions under ranked set sampling with partially observed complementary competing risks data","authors":"Liang Wang, Yuhlong Lio, Yogesh Mani Tripathi, Tzong-Ru Tsai","doi":"10.1080/16843703.2023.2297126","DOIUrl":"https://doi.org/10.1080/16843703.2023.2297126","url":null,"abstract":"Ranked set sampling (RSS) acts as an efficient way for collecting failure information due to its ability of saving testing time and cost, and this paper discusses statistical inference for compleme...","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"18 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2023-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139070023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Binary decision diagram-based reliability modeling of phased-mission manufacturing system processing multi-type products","authors":"Yongwei Ke, Xin Wang, Zhenggeng Ye, Shuai Zhang, Zhiqiang Cai","doi":"10.1080/16843703.2023.2286410","DOIUrl":"https://doi.org/10.1080/16843703.2023.2286410","url":null,"abstract":"The development of science and technology drives phased-mission manufacturing systems to be increasingly complex, which poses significant challenges to system reliability analysis. Although it has ...","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"77 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2023-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138531520","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"A lamp location problem based on system reliability","authors":"Zilong Feng, Ruiyou Zhang, Won Young Yun","doi":"10.1080/16843703.2023.2283982","DOIUrl":"https://doi.org/10.1080/16843703.2023.2283982","url":null,"abstract":"This paper studies one- and two-dimensional lamp location problems considering system reliability. Within the system, several identical lamps are used to cover the system service area, and each lam...","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"1 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2023-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138531519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Reliability evaluation for time-based stochastic manufacturing networks with time-dependent reliability","authors":"Ping-Chen Chang, Cheng-Fu Huang, Lance Fiondella","doi":"10.1080/16843703.2023.2283980","DOIUrl":"https://doi.org/10.1080/16843703.2023.2283980","url":null,"abstract":"This study aims to evaluate the system reliability for a time-based stochastic manufacturing network (TSMN). The architecture of a TSMN includes arcs and nodes where each node is an inspection stat...","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"9 1","pages":""},"PeriodicalIF":2.8,"publicationDate":"2023-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138542101","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Simultaneous monitoring of multivariate time between events and their magnitude using multivariate marked Hawkes point process","authors":"Mohammadreza Mirzaei Novin, Amirhossein Amiri","doi":"10.1080/16843703.2023.2278968","DOIUrl":"https://doi.org/10.1080/16843703.2023.2278968","url":null,"abstract":"ABSTRACTIn this paper, monitoring the time between events is discussed. The control chart of the time between events in multivariate mode discusses the conditions under which the Hawkes point process generates the time data. It is also necessary to consider that monitoring time data individually and regardless of the magnitude of an event is not very important. Therefore, in addition to monitoring time data, it is also essential to monitor the magnitude of an event. Because of that, the magnitude of each event is considered along with monitoring the time between multivariate events through data generation with the multivariate marked Hawkes point process. Three statistics are presented for simultaneous monitoring of the time between events and the magnitude. A Max-EWMA, two single EWMA that each of which are used to monitor TBE and magnitude (TSEWMA), and the third statistic, derived from existing literature, is a Shewhart statistic that has been integrated into an EWMA statistic framework (EWMA-Z). These charts have been used for a case study and compared according to different shifts.KEYWORDS: High quality processStatistical Process Monitoring (SPM)multivariate time between eventstime between events and magnitudeHawkes point processAverage Run Length (ARL) Disclosure statementNo potential conflict of interest was reported by the author(s).Additional informationNotes on contributorsMohammadreza Mirzaei NovinMohammadreza Mirzaei Novin is a graduated M.Sc. in Industrial Engineering from Shahed University. His research interest is statistical process monitoring.Amirhossein AmiriAmirhossein Amiri is a Full Professor at Shahed University in Iran. He holds a BS, MS, and PhD in Industrial Engineering from Khajeh Nasir University of Technology, Iran University of Science and Technology, and Tarbiat Modares University in Iran, respectively. He is currently serving as the Vice Chancellor of Education in the Faculty of Engineering at Shahed University in Iran and is a member of the Iranian Statistical Association. His research interests encompass statistical process monitoring, profile monitoring, and change point estimation. He has published many papers in the field of statistical process control in esteemed international journals such as European Journal of Operational Research, Quality and Reliability Engineering International, Communications in Statistics, Computers & Industrial Engineering, Journal of Statistical Computation and Simulation, Soft Computing and more. In 2011, he co-authored a book titled ”Statistical Analysis of Profile Monitoring” published by John Wiley and Sons.","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":" 19","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-11-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"135243018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}

{"title":"Optimum test condition setting and sample allocation for accelerated degradation tests under the last-exit-time failure mode","authors":"Junchao Dong, Xiaobing Ma, Han Wang, Yujie Liu, Yu Zhao","doi":"10.1080/16843703.2023.2269733","DOIUrl":"https://doi.org/10.1080/16843703.2023.2269733","url":null,"abstract":"ABSTRACTAccelerated degradation tests (ADTs) have been widely adopted for products whose failure is defined as the first-passage-time (FPT) when the degradation path crosses a given threshold. However, for products whose failure is defined as the last-exit-time (LET), few studies related to ADT have been investigated. In this paper, we focus on designing an optimum test condition setting and sample allocation scheme for ADTs under the LET failure mode. In particular, the widely adopted Wiener process model and the generalized exponential acceleration model are used to describe the fluctuating degradation behaviors of products. By minimizing the asymptotic variance of mean-time-to-failure under the normal use condition, we design a two-level optimum test plan and a three-level compromise plan under the constraints of total sample size and stress region. The optimum plans are given in analytical forms, and we prove that the optimum plans under the FPT failure mode and LET failure mode are equivalent under some situations. Finally, a renewed selection method for the upper limit of the stress level in ADTs is proposed based on the prior ADT information from the perspective of accelerated mechanism equivalence. The proposed method is illustrated using a real-world application to rubber rings.KEYWORDS: Accelerated degradation testoptimization schemefirst-passage-timelast-exit-timedegradation mechanism equivalence AcknowledgementsThe authors are grateful to the editor, associate editor, and anonymous referees for many insightful suggestions that significantly improved the quality of this article.Disclosure statementNo potential conflict of interest was reported by the author(s).Additional informationFundingThis work was supported by the Ammunition & Missile Support Techniques Laboratory [2022SYSJ02]; Reliability and Environmental Engineering Science & Technology Laboratory [6142004210105].Notes on contributorsJunchao DongJunchao Dong is currently a PhD student with the School of Reliability of Systems Engineering, Beihang University, China. He received the BE degree from Beihang University in 2014. His research interests include accelerated life tests and reliability assessment.Xiaobing MaXiaobing Ma received a PhD degree in engineering mechanics from Beihang University, Beijing, China, in 2006. He is currently a professor with the School of Reliability and Systems Engineering, Beihang University. His current research interests include reliability data analysis, durability design, and system life modeling.Han WangHan Wang received a PhD degree in systems engineering from Beihang University, Beijing, China, in 2020. He is currently an associate professor with the School of Reliability and Systems Engineering, Beihang University. His research interests include accelerated tests, stochastic degradation modeling, and remaining useful life prediction.Yujie LiuYujie Liu is currently a PhD student with the School of Reliability of Systems Engineering, Beihang ","PeriodicalId":49133,"journal":{"name":"Quality Technology and Quantitative Management","volume":"58 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2023-10-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136034226","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":2,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}