Pub Date : 2024-03-01DOI: 10.23919/cje.2022.00.397
Ruiming Xu;Zhongjie Guo;Suiyang Liu;Ningmei Yu;Yunfei Liu
Aiming at the problem of the non-uniformity of the ramp signal in the super-large array CMOS (complementary metal-oxide semiconductor) image sensors, a ramp uniformity correction method for CMOS image sensors is proposed in this paper. Based on the error storage technique, the ramp non-uniformity error is stored. And the input ramp signal of each column is shifted by level-shifting technique to eliminate the ramp non-uniformity error. Based on the 55 nm-1P4M CMOS process, this paper has completed the detailed circuit design and comprehensive simulation verification of the proposed method. Under the design conditions that the voltage range of the ramp signal is 1.4 V, the slope of the ramp signal is 71.908 V /ms, the number of pixels is 8192 (H) x 8192 (V), and a single pixel size is 10 µm, the correction method proposed in this paper reduces the ramp non-uniformity error from 7.89 m V to 36 µ V. The differential non-linearity of the ramp signal is +0.0013/-0.004 LSB and the integral non-linearity is +0.045/-0.021 LSB. The ramp uniformity correction method proposed in this paper reduces the ramp non-uniformity error by 99.54% on the basis of ensuring the high linearity of the ramp signal, without significantly increasing the chip area and without introducing additional power consumption. The column fixed-pattern noise is reduced from 1.9% to 0.01%. It provides theoretical support for the design of high-precision CMOS image sensors.
{"title":"Global Ramp Uniformity Correction Method for Super-Large Array CMOS Image Sensors","authors":"Ruiming Xu;Zhongjie Guo;Suiyang Liu;Ningmei Yu;Yunfei Liu","doi":"10.23919/cje.2022.00.397","DOIUrl":"https://doi.org/10.23919/cje.2022.00.397","url":null,"abstract":"Aiming at the problem of the non-uniformity of the ramp signal in the super-large array CMOS (complementary metal-oxide semiconductor) image sensors, a ramp uniformity correction method for CMOS image sensors is proposed in this paper. Based on the error storage technique, the ramp non-uniformity error is stored. And the input ramp signal of each column is shifted by level-shifting technique to eliminate the ramp non-uniformity error. Based on the 55 nm-1P4M CMOS process, this paper has completed the detailed circuit design and comprehensive simulation verification of the proposed method. Under the design conditions that the voltage range of the ramp signal is 1.4 V, the slope of the ramp signal is 71.908 V /ms, the number of pixels is 8192 (H) x 8192 (V), and a single pixel size is 10 µm, the correction method proposed in this paper reduces the ramp non-uniformity error from 7.89 m V to 36 µ V. The differential non-linearity of the ramp signal is +0.0013/-0.004 LSB and the integral non-linearity is +0.045/-0.021 LSB. The ramp uniformity correction method proposed in this paper reduces the ramp non-uniformity error by 99.54% on the basis of ensuring the high linearity of the ramp signal, without significantly increasing the chip area and without introducing additional power consumption. The column fixed-pattern noise is reduced from 1.9% to 0.01%. It provides theoretical support for the design of high-precision CMOS image sensors.","PeriodicalId":50701,"journal":{"name":"Chinese Journal of Electronics","volume":"33 2","pages":"415-422"},"PeriodicalIF":1.2,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10488066","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140342781","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-01DOI: 10.23919/cje.2023.00.094
Xi Wang;Yuandan Dong;Yikai Chen
A high-efficiency polarization-rotating transmit array antenna (T A) using wideband elements is proposed for millimeter-wave applications. The polarization-rotating element consists of three metallic layers and two substrates. Orthogonal polarizers are employed on the top and bottom of the element. And the split ring with a parasitic stub on the middle layer is symmetric about the diagonal, performing the polarization rotation and phase compensation simultaneously. A parasitic stub is designed to decrease transmission loss and broaden the bandwidth. The periodicity of the element is only 1/4 wavelength at 30 GHz. A prototype TA with 28 × 28 elements is designed, fabricated, and measured. The measured peak gain reaches 27.5 dBi at 37.8 GHz. The 1-dB gain drop bandwidth is 30.8-40 GHz (26.0%). The aperture efficiency reaches as high as 71% at 31.5 GHz. Within the bandwidth of 26.5-38.8 GHz (37.7%), the aperture efficiency is higher than 50%. The proposed polarization-rotating TA features wide bandwidth and high efficiency, demonstrating great application potential for 5G millimeter-wave communication.
{"title":"High-Efficiency Wideband Transmitarray Antenna Using Polarization-Rotating Elements with Parasitic Stubs","authors":"Xi Wang;Yuandan Dong;Yikai Chen","doi":"10.23919/cje.2023.00.094","DOIUrl":"https://doi.org/10.23919/cje.2023.00.094","url":null,"abstract":"A high-efficiency polarization-rotating transmit array antenna (T A) using wideband elements is proposed for millimeter-wave applications. The polarization-rotating element consists of three metallic layers and two substrates. Orthogonal polarizers are employed on the top and bottom of the element. And the split ring with a parasitic stub on the middle layer is symmetric about the diagonal, performing the polarization rotation and phase compensation simultaneously. A parasitic stub is designed to decrease transmission loss and broaden the bandwidth. The periodicity of the element is only 1/4 wavelength at 30 GHz. A prototype TA with 28 × 28 elements is designed, fabricated, and measured. The measured peak gain reaches 27.5 dBi at 37.8 GHz. The 1-dB gain drop bandwidth is 30.8-40 GHz (26.0%). The aperture efficiency reaches as high as 71% at 31.5 GHz. Within the bandwidth of 26.5-38.8 GHz (37.7%), the aperture efficiency is higher than 50%. The proposed polarization-rotating TA features wide bandwidth and high efficiency, demonstrating great application potential for 5G millimeter-wave communication.","PeriodicalId":50701,"journal":{"name":"Chinese Journal of Electronics","volume":"33 2","pages":"496-503"},"PeriodicalIF":1.2,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10488061","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140342807","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
To solve the problems of redundant logic resources and poor scalability in protocol controller circuits among communication networks, we propose a traffic-driven software defined interconnection (TSDI) mechanism. The unified software defined interconnection interface standards and the normalized interconnection topology are designed to implement the architecture of TSDI-based protocol controller. The key indicators of power, performance and area (PPA) can be realized while resolving the flexible interconnection of the controller. We designed a TSDI-based RapidIO controller as an example. Compared to traditional designs, the design could achieve more protocol scalability, and RapidIO protocol standards of Gen4 could be supported directly. The key PPA indicators, such as a lower delay of 56.1 ns and more than twice throughput of 98.1 Gbps, were achieved at the cost of a 23.4% area increase.
{"title":"Architecture Design of Protocol Controller Based on Traffic-Driven Software Defined Interconnection","authors":"Peijie Li;Jianliang Shen;Ping Lyu;Chunlei Dong;Ting Chen;Shaojun Wei","doi":"10.23919/cje.2022.00.094","DOIUrl":"https://doi.org/10.23919/cje.2022.00.094","url":null,"abstract":"To solve the problems of redundant logic resources and poor scalability in protocol controller circuits among communication networks, we propose a traffic-driven software defined interconnection (TSDI) mechanism. The unified software defined interconnection interface standards and the normalized interconnection topology are designed to implement the architecture of TSDI-based protocol controller. The key indicators of power, performance and area (PPA) can be realized while resolving the flexible interconnection of the controller. We designed a TSDI-based RapidIO controller as an example. Compared to traditional designs, the design could achieve more protocol scalability, and RapidIO protocol standards of Gen4 could be supported directly. The key PPA indicators, such as a lower delay of 56.1 ns and more than twice throughput of 98.1 Gbps, were achieved at the cost of a 23.4% area increase.","PeriodicalId":50701,"journal":{"name":"Chinese Journal of Electronics","volume":"33 2","pages":"362-370"},"PeriodicalIF":1.2,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10488074","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140342811","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-01DOI: 10.23919/cje.2022.00.125
Xiaojuan Lian;Yuelin Shi;Xinyi Shen;Xiang Wan;Zhikuang Cai;Lei Wang;Yuchao Yang
Recent popularity to realize image recognition by memristor-based neural network hardware systems has been witnessed owing to their similarities to neurons and synapses. However, the stochastic formation of conductive filaments inside the oxide memristor devices inevitably makes them face some drawbacks, represented by relatively higher power consumption and severer resistance switching variability. In this work, we design and fabricate the Ag/MXene (Ti 3