{"title":"Efficient Prediction of HEMP Coupling Response to Multilocation Transmission Lines Within a Rectangular Enclosure With Small Aperture","authors":"Haizhe Zhong, Jiantao Liang, Anxue Zhang, Fei Yang, Guoqing Wang, Xihai Li","doi":"10.1109/temc.2025.3634155","DOIUrl":"https://doi.org/10.1109/temc.2025.3634155","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"150 1","pages":"1-4"},"PeriodicalIF":2.1,"publicationDate":"2025-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145599388","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Tortuous Lightning Channel Impact on the Direct Lightning Performance of Distribution Lines","authors":"Akifumi Yamanaka, Kazuyuki Ishimoto, Akiyoshi Tatematsu","doi":"10.1109/temc.2025.3632209","DOIUrl":"https://doi.org/10.1109/temc.2025.3632209","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"171 1","pages":"1-11"},"PeriodicalIF":2.1,"publicationDate":"2025-11-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145599387","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-11-18DOI: 10.1109/temc.2025.3626020
Peng Hu, Fujun Deng, Kai Guo, Shengyan Chen, Ru Wang, Manqi Xu, Liangliang Liu, Zhuo Li
{"title":"Theoretical Estimation on Maximum-to-Maximum Ratio of the Total Electric Field to Its Rectangular Component Within Reverberation Chambers","authors":"Peng Hu, Fujun Deng, Kai Guo, Shengyan Chen, Ru Wang, Manqi Xu, Liangliang Liu, Zhuo Li","doi":"10.1109/temc.2025.3626020","DOIUrl":"https://doi.org/10.1109/temc.2025.3626020","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"185 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145545735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-11-13DOI: 10.1109/temc.2025.3626743
Zhekun Peng, Shubhankar Marathe, Javad Meiguni, Ali Foudazi, Jianchi Zhou, Li Shen, Viswa Pilla, Cheung-Wei Lam, DongHyun Kim, David Pommerenke, Daryl G. Beetner
{"title":"Characterization and Full-Wave Modeling of Corona Discharge Induced Coupling to Touchscreen Displays","authors":"Zhekun Peng, Shubhankar Marathe, Javad Meiguni, Ali Foudazi, Jianchi Zhou, Li Shen, Viswa Pilla, Cheung-Wei Lam, DongHyun Kim, David Pommerenke, Daryl G. Beetner","doi":"10.1109/temc.2025.3626743","DOIUrl":"https://doi.org/10.1109/temc.2025.3626743","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"7 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145509481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-11-13DOI: 10.1109/temc.2025.3626471
Jongsuk Hyun, Wenchang Huang, Chulsoon Hwang
{"title":"Modeling of Slot-Backed Microstrip Line for EMI Applications","authors":"Jongsuk Hyun, Wenchang Huang, Chulsoon Hwang","doi":"10.1109/temc.2025.3626471","DOIUrl":"https://doi.org/10.1109/temc.2025.3626471","url":null,"abstract":"","PeriodicalId":55012,"journal":{"name":"IEEE Transactions on Electromagnetic Compatibility","volume":"11 1","pages":""},"PeriodicalIF":2.1,"publicationDate":"2025-11-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145509476","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}