Pub Date : 2023-12-04DOI: 10.1134/S0020441223040176
K. E. Voronov, I. V. Piyakov, M. P. Kalaev, A. M. Telegin
The paper considers various designs of detectors for the passage of charged microparticles, which can be installed on mass spectrometers in order to record the moment of passage of a microparticle and initiate the measurement process. The largest range of recorded masses and velocities was shown by the detector design, made on the basis of a dielectric base (PLA plastic) using a 3D printer and a nichrome filament.
本文探讨了带电微粒子通过探测器的各种设计,这些探测器可安装在质谱仪上,以记录微粒子通过的瞬间并启动测量过程。使用 3D 打印机和镍铬丝在介质基底(聚乳酸塑料)上制作的探测器设计显示了最大的记录质量和速度范围。
{"title":"Investigation of the Operation of the Flight Detector of High-Speed Charged Microparticles for a Time-of-Flight Mass Spectrometer","authors":"K. E. Voronov, I. V. Piyakov, M. P. Kalaev, A. M. Telegin","doi":"10.1134/S0020441223040176","DOIUrl":"10.1134/S0020441223040176","url":null,"abstract":"<p>The paper considers various designs of detectors for the passage of charged microparticles, which can be installed on mass spectrometers in order to record the moment of passage of a microparticle and initiate the measurement process. The largest range of recorded masses and velocities was shown by the detector design, made on the basis of a dielectric base (PLA plastic) using a 3D printer and a nichrome filament.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"1018 - 1024"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223060052
E. D. Minaeva, S. E. Minaev, N. S. Nikitin, A. S. Gulyashko, I. A. Larionov, V. A. Tyrtyshnyy, V. I. Yusupov, N. V. Minaev
An apparatus for studying the processes of laser action on various materials, including biological tissue, is described. The system makes it possible to obtain thermograms of the sample surface, conduct high-speed video recording, and record acoustic signals in a wide frequency range during experiments. The system was tested using a pulsed nanosecond high-frequency laser source with a wavelength of 3.03 μm. The samples were exposed to pulses with a duration of 1.5 ns and a frequency of 8 MHz. It is shown that it is possible to use a laser system to obtain incisions on biological tissues of various types without carbonization. The obtained experimental data made it possible to clarify the mechanism of the action of laser radiation on the surface of water-saturated biological tissues.
{"title":"An Apparatus for Studying the Laser Radiation Effects on Biotissue","authors":"E. D. Minaeva, S. E. Minaev, N. S. Nikitin, A. S. Gulyashko, I. A. Larionov, V. A. Tyrtyshnyy, V. I. Yusupov, N. V. Minaev","doi":"10.1134/S0020441223060052","DOIUrl":"10.1134/S0020441223060052","url":null,"abstract":"<p>An apparatus for studying the processes of laser action on various materials, including biological tissue, is described. The system makes it possible to obtain thermograms of the sample surface, conduct high-speed video recording, and record acoustic signals in a wide frequency range during experiments. The system was tested using a pulsed nanosecond high-frequency laser source with a wavelength of 3.03 μm. The samples were exposed to pulses with a duration of 1.5 ns and a frequency of 8 MHz. It is shown that it is possible to use a laser system to obtain incisions on biological tissues of various types without carbonization. The obtained experimental data made it possible to clarify the mechanism of the action of laser radiation on the surface of water-saturated biological tissues.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"1054 - 1057"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223060088
B. B. Baldanov
An independent volumetric glow discharge was experimentally obtained at atmospheric pressure in an argon atmosphere. A volumetric glow discharge is realized in an electrode system consisting of a thin metal wire and a metal grid with a dielectric barrier and is ignited using an auxiliary discharge, a low-current surface discharge initiated at the end of a glass tube along the dielectric surface between the pointed cathode and a cylindrical metal anode.
{"title":"Initiation of a Volume Glow Discharge of Atmospheric Pressure in a Cylindrical Tube Using a Low-Current Surface Discharge in Argon","authors":"B. B. Baldanov","doi":"10.1134/S0020441223060088","DOIUrl":"10.1134/S0020441223060088","url":null,"abstract":"<p>An independent volumetric glow discharge was experimentally obtained at atmospheric pressure in an argon atmosphere. A volumetric glow discharge is realized in an electrode system consisting of a thin metal wire and a metal grid with a dielectric barrier and is ignited using an auxiliary discharge, a low-current surface discharge initiated at the end of a glass tube along the dielectric surface between the pointed cathode and a cylindrical metal anode.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"945 - 947"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491300","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223050329
L. M. Lavrov, E. V. Pozdnyakov, E. A. Ul’mov, V. M. Yamshchikov, M. A. Yamshchikova
A method for recording the spatial distribution of radiation scattered from laser plasma in a wide angular range, up to 4π, using preexposed and developed photographic paper is proposed. This method makes it possible to obtain a radiation pattern of scattered radiation with a sufficiently high spatial and angular resolution. By calibrating the sensitivity of photographic paper, one can quantify the energy of scattered radiation in various directions and determine the integral value of the energy loss due to scattering in a wide spectral range from UV to IR.
{"title":"A Method for Measuring the Directional Pattern of Scattered Radiation from Laser Plasma Using Exposed Photographic Paper","authors":"L. M. Lavrov, E. V. Pozdnyakov, E. A. Ul’mov, V. M. Yamshchikov, M. A. Yamshchikova","doi":"10.1134/S0020441223050329","DOIUrl":"10.1134/S0020441223050329","url":null,"abstract":"<p>A method for recording the spatial distribution of radiation scattered from laser plasma in a wide angular range, up to 4π, using preexposed and developed photographic paper is proposed. This method makes it possible to obtain a radiation pattern of scattered radiation with a sufficiently high spatial and angular resolution. By calibrating the sensitivity of photographic paper, one can quantify the energy of scattered radiation in various directions and determine the integral value of the energy loss due to scattering in a wide spectral range from UV to IR.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"926 - 935"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223050305
A. V. Kostanovskiy, M. G. Zeodinov, A. A. Pronkin, M. E. Kostanovskaya
Abstract—A setup for determining the contact electrical resistance measured using two surface point potential probes installed at the same distance from the contact surface is described. The total number of paired probes located at different distances from the contact surface is four. The reference temperature range is 380–1500 K. Measurements can be performed in vacuum and in air. The setup allows one to investigate the contact resistance at a direct current, which may vary from 20 to 120 A. The first test experiments have shown that changing the current polarity does not affect the current–voltage characteristic measured on a monolithic sample or on a sample with one fixed contact surface.
{"title":"Installation for Determining the Contact Electrical Resistance of High-Temperature Materials","authors":"A. V. Kostanovskiy, M. G. Zeodinov, A. A. Pronkin, M. E. Kostanovskaya","doi":"10.1134/S0020441223050305","DOIUrl":"10.1134/S0020441223050305","url":null,"abstract":"<div><div><p><b>Abstract</b>—A setup for determining the contact electrical resistance measured using two surface point potential probes installed at the same distance from the contact surface is described. The total number of paired probes located at different distances from the contact surface is four. The reference temperature range is 380–1500 K. Measurements can be performed in vacuum and in air. The setup allows one to investigate the contact resistance at a direct current, which may vary from 20 to 120 A. The first test experiments have shown that changing the current polarity does not affect the current–voltage characteristic measured on a monolithic sample or on a sample with one fixed contact surface.</p></div></div>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"1071 - 1077"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223040061
P. V. Volkov, A. V. Goryunov, A. Yu. Luk’yanov, D. A. Semikov, A. D. Tertyshnik
A method for detecting changes in the length of an optical cavity is proposed for fiber-optic sensors based on the Fabry–Perot interferometer scheme. The possibility of detecting oscillations of the resonator length at the subnanometer level in the frequency band 1.5–300 kHz is shown. The sensitivity was 0.3 nm in standard deviation. The proposed scheme makes it possible to reliably distinguish high-frequency oscillations against the background of slow drifts of the sensor length caused by temperature fluctuations or deformations.
{"title":"A Method for Detecting Nanometer Length Oscillations in Fiber-Optic Sensors Using a Tracking Tandem Low-Coherent Interferometer","authors":"P. V. Volkov, A. V. Goryunov, A. Yu. Luk’yanov, D. A. Semikov, A. D. Tertyshnik","doi":"10.1134/S0020441223040061","DOIUrl":"10.1134/S0020441223040061","url":null,"abstract":"<p>A method for detecting changes in the length of an optical cavity is proposed for fiber-optic sensors based on the Fabry–Perot interferometer scheme. The possibility of detecting oscillations of the resonator length at the subnanometer level in the frequency band 1.5–300 kHz is shown. The sensitivity was 0.3 nm in standard deviation. The proposed scheme makes it possible to reliably distinguish high-frequency oscillations against the background of slow drifts of the sensor length caused by temperature fluctuations or deformations.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"957 - 960"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223060118
V. A. Milyushenko, B. Pinter, S. B. Bibikov
A simple and effective technique for express diagnostics of materials, which allows for the most efficient preparation of samples, the actual measurements, and obtaining data on material parameters, in particular, on the dispersion of the permittivity, is proposed. An express method for impedance spectroscopy of small samples at frequencies from 20 kHz to 1 GHz has been developed on the basis of a vector network analyzer using a conical coaxial measuring cell and adapters for connecting two-pole objects to the coaxial input of the device. The measuring cell is designed for disk samples with a diameter of up to 6 mm with a maximum volume of up to 0.1 cm3 as well as for samples in the form of rectangular plates that can be inscribed in a circle of the same diameter. Adapters also make it possible to connect two-terminal networks in the form of concentrated hinged or surface-mounted elements. In contrast to measurements in a coaxial path, the proposed technique does not require an accurate connecting transverse dimension, which allows for prompt sample preparation. The issues of determining the frequency range in which the measurement error does not exceed the allowable value are considered. A method is proposed for increasing the upper limit of the operating frequency of the measuring cell with the test sample using additional calibration. The developed program for controlling the processes of standard and additional calibration and the process of measurements in a certain frequency range, at which the measurement error does not exceed the permissible value, makes it possible to obtain the values of resistance, capacitance, inductance, and other electrical characteristics of the measuring cell with the sample under study within a few seconds.
{"title":"Express Method for Impedance Spectroscopy of Small Solid-State Samples at Frequencies of 20 kHz–1 GHz","authors":"V. A. Milyushenko, B. Pinter, S. B. Bibikov","doi":"10.1134/S0020441223060118","DOIUrl":"10.1134/S0020441223060118","url":null,"abstract":"<p>A simple and effective technique for express diagnostics of materials, which allows for the most efficient preparation of samples, the actual measurements, and obtaining data on material parameters, in particular, on the dispersion of the permittivity, is proposed. An express method for impedance spectroscopy of small samples at frequencies from 20 kHz to 1 GHz has been developed on the basis of a vector network analyzer using a conical coaxial measuring cell and adapters for connecting two-pole objects to the coaxial input of the device. The measuring cell is designed for disk samples with a diameter of up to 6 mm with a maximum volume of up to 0.1 cm<sup>3</sup> as well as for samples in the form of rectangular plates that can be inscribed in a circle of the same diameter. Adapters also make it possible to connect two-terminal networks in the form of concentrated hinged or surface-mounted elements. In contrast to measurements in a coaxial path, the proposed technique does not require an accurate connecting transverse dimension, which allows for prompt sample preparation. The issues of determining the frequency range in which the measurement error does not exceed the allowable value are considered. A method is proposed for increasing the upper limit of the operating frequency of the measuring cell with the test sample using additional calibration. The developed program for controlling the processes of standard and additional calibration and the process of measurements in a certain frequency range, at which the measurement error does not exceed the permissible value, makes it possible to obtain the values of resistance, capacitance, inductance, and other electrical characteristics of the measuring cell with the sample under study within a few seconds.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"1078 - 1084"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223040097
S. V. Zaitsev, E. Yu. Zykova, E. I. Rau, A. A. Tatarintsev, V. A. Kiselevskii
New possibilities for the mode of detecting backscattered electrons in a scanning electron microscope (SEM) are presented. The technique for determining the chemical composition of the probed area of the sample using the precalibrated scale of the SEM’s gray screen has been further developed. Simple relationships are presented for practical application in finding the thicknesses of thin films on a massive substrate. The parameters of the double layer of the film nanostructure on the substrate are determined, that is, depth and thickness of subsurface fragments of the microobject. A technique is proposed for measuring the surface potential of negatively charged dielectric samples upon irradiation with medium-energy electrons.
{"title":"Expanding the Analytical Capabilities of Scanning Electron Microscopy in the Detection of Backscattered Electrons","authors":"S. V. Zaitsev, E. Yu. Zykova, E. I. Rau, A. A. Tatarintsev, V. A. Kiselevskii","doi":"10.1134/S0020441223040097","DOIUrl":"10.1134/S0020441223040097","url":null,"abstract":"<p>New possibilities for the mode of detecting backscattered electrons in a scanning electron microscope (SEM) are presented. The technique for determining the chemical composition of the probed area of the sample using the precalibrated scale of the SEM’s gray screen has been further developed. Simple relationships are presented for practical application in finding the thicknesses of thin films on a massive substrate. The parameters of the double layer of the film nanostructure on the substrate are determined, that is, depth and thickness of subsurface fragments of the microobject. A technique is proposed for measuring the surface potential of negatively charged dielectric samples upon irradiation with medium-energy electrons.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"1058 - 1065"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491301","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223050317
S. Yu. Ksenofontov, P. A. Shilyagin, D. A. Terpelov, D. V. Shabanov, V. M. Gelikonov, G. V. Gelikonov
A new method for processing spectral-domain optical coherence tomography signals, which is designed to effectively suppress motion artifacts under conditions of large probing depths, is described. The features of this method made it possible to use it as part of an otoscopic system of spectral-domain optical coherence tomography, which ensured high quality of real-time imaging.
{"title":"A New Method for Motion Artifact Suppression in Spectral-Domain Optical Coherence Tomography","authors":"S. Yu. Ksenofontov, P. A. Shilyagin, D. A. Terpelov, D. V. Shabanov, V. M. Gelikonov, G. V. Gelikonov","doi":"10.1134/S0020441223050317","DOIUrl":"10.1134/S0020441223050317","url":null,"abstract":"<p>A new method for processing spectral-domain optical coherence tomography signals, which is designed to effectively suppress motion artifacts under conditions of large probing depths, is described. The features of this method made it possible to use it as part of an otoscopic system of spectral-domain optical coherence tomography, which ensured high quality of real-time imaging.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"1037 - 1043"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-12-04DOI: 10.1134/S0020441223040115
A. V. Avrorin, A. D. Avrorin, V. M. Aynutdinov, V. A. Allakhverdyan, Z. Bardaćhová, I. A. Belolaptikov, I. V. Borina, N. M. Budnev, A. R. Gafarov, K. V. Golubkov, N. S. Gorshkov, T. I. Gress, R. Dvornicky, Zh.-A. M. Dzhilkibaev, V. Y. Dik, G. V. Domogatsky, A. A. Doroshenko, A. N. Dyachok, T. V. Elzhov, D. N. Zaborov, V. K. Kebkal, K. G. Kebkal, V. A. Kozhin, M. M. Kolbin, K. V. Konischev, A. V. Korobchenko, A. P. Koshechkin, M. V. Kruglov, M. K. Kryukov, V. F. Kulepov, Y. M. Malyshkin, M. B. Milenin, R. R. Mirgazov, V. Nazari, D. V. Naumov, D. P. Petukhov, E. N. Pliskovsky, M. I. Rozanov, V. D. Rushay, E. V. Ryabov, G. B. Safronov, D. Seitova, A. E. Sirenko, A. V. Skurikhin, A. G. Solovje, M. N. Sorokovikov, A. P. Stromakov, O. V. Suvorov, V. A. Tabolenko, B. A. Taraschansky, L. Fajt, A. Khatun, E. V. Khramov, B. A. Shaybonov, M. D. Shelepov, F. Simkovic, I. Šteckl, E. Eckerová, Y. V. Yablokova
Deployment of the deep-sea neutrino telescope Baikal-GVD continues in Lake Baikal. By April 2022, ten telescope clusters, which include 2880 optical modules, were put into operation. One of the urgent tasks of the Baikal project is to study the possibility of increasing the detection efficiency of the detector based on the experience of its operation and the results obtained with other neutrino telescopes in recent years. In this paper, the authors consider a variant of optimizing the telescope configuration by installing an additional string of optical modules between the detector clusters (external string). An experimental version of the external garland was installed in Lake Baikal in April 2022. The paper presents the results from calculations of the efficiency of registration of neutrino events for a new setup configuration, the technical implementation of the system for recording and collecting data from the external garland, and the first results of its full-scale tests in Lake Baikal.
{"title":"Increasing the Sensitivity of the Baikal-GVD Neutrino Telescope Using External Strings of Optical Modules","authors":"A. V. Avrorin, A. D. Avrorin, V. M. Aynutdinov, V. A. Allakhverdyan, Z. Bardaćhová, I. A. Belolaptikov, I. V. Borina, N. M. Budnev, A. R. Gafarov, K. V. Golubkov, N. S. Gorshkov, T. I. Gress, R. Dvornicky, Zh.-A. M. Dzhilkibaev, V. Y. Dik, G. V. Domogatsky, A. A. Doroshenko, A. N. Dyachok, T. V. Elzhov, D. N. Zaborov, V. K. Kebkal, K. G. Kebkal, V. A. Kozhin, M. M. Kolbin, K. V. Konischev, A. V. Korobchenko, A. P. Koshechkin, M. V. Kruglov, M. K. Kryukov, V. F. Kulepov, Y. M. Malyshkin, M. B. Milenin, R. R. Mirgazov, V. Nazari, D. V. Naumov, D. P. Petukhov, E. N. Pliskovsky, M. I. Rozanov, V. D. Rushay, E. V. Ryabov, G. B. Safronov, D. Seitova, A. E. Sirenko, A. V. Skurikhin, A. G. Solovje, M. N. Sorokovikov, A. P. Stromakov, O. V. Suvorov, V. A. Tabolenko, B. A. Taraschansky, L. Fajt, A. Khatun, E. V. Khramov, B. A. Shaybonov, M. D. Shelepov, F. Simkovic, I. Šteckl, E. Eckerová, Y. V. Yablokova","doi":"10.1134/S0020441223040115","DOIUrl":"10.1134/S0020441223040115","url":null,"abstract":"<p>Deployment of the deep-sea neutrino telescope Baikal-GVD continues in Lake Baikal. By April 2022, ten telescope clusters, which include 2880 optical modules, were put into operation. One of the urgent tasks of the Baikal project is to study the possibility of increasing the detection efficiency of the detector based on the experience of its operation and the results obtained with other neutrino telescopes in recent years. In this paper, the authors consider a variant of optimizing the telescope configuration by installing an additional string of optical modules between the detector clusters (external string). An experimental version of the external garland was installed in Lake Baikal in April 2022. The paper presents the results from calculations of the efficiency of registration of neutrino events for a new setup configuration, the technical implementation of the system for recording and collecting data from the external garland, and the first results of its full-scale tests in Lake Baikal.</p>","PeriodicalId":587,"journal":{"name":"Instruments and Experimental Techniques","volume":"66 6","pages":"1009 - 1017"},"PeriodicalIF":0.6,"publicationDate":"2023-12-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138491265","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}