Image contrast is the difference between the brightness and colors of a part of an image compared to its objects around. The contrast enhancement means increasing the original input brightness values. Images captured in low-light environments suffer from inferior visibility caused by low contrast. It is said that Histogram equalization is the foundation of image contrast enhancement and is used even in new contrast enhancement methods. Even though Histogram Equalization (HE) is primitive, it is effective. HE increases the brightness of the output image significantly, which is often undesirable. There are various enhanced versions of histogram equalization methods to improve image contrast are proposed to overcome the brightness preservation and image details preservation challenge. This paper focuses on studying different popular and approved HE methods and experimental studies based on the image, PSNR - peak signal to noise ratio, BRISQUE - Blind / Reference less Image Spatial Quality Evaluator, and Entropy. Results from the above study direct the goal towards the Image fusion of the two selected methods, which gives improved results on the preservation of brightness and contrast enhancement of the original image.
{"title":"Low Light Image Contrast Enhancement using Blending of Histogram Equalization Based Methods BBHE and BPHEME","authors":"Sudeep D. Thepade, Mallikarjun Ople, Vaibhav Mahindra, Vrushabh Kulye, Sudarshan Jamdar","doi":"10.1109/CENTCON52345.2021.9687862","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9687862","url":null,"abstract":"Image contrast is the difference between the brightness and colors of a part of an image compared to its objects around. The contrast enhancement means increasing the original input brightness values. Images captured in low-light environments suffer from inferior visibility caused by low contrast. It is said that Histogram equalization is the foundation of image contrast enhancement and is used even in new contrast enhancement methods. Even though Histogram Equalization (HE) is primitive, it is effective. HE increases the brightness of the output image significantly, which is often undesirable. There are various enhanced versions of histogram equalization methods to improve image contrast are proposed to overcome the brightness preservation and image details preservation challenge. This paper focuses on studying different popular and approved HE methods and experimental studies based on the image, PSNR - peak signal to noise ratio, BRISQUE - Blind / Reference less Image Spatial Quality Evaluator, and Entropy. Results from the above study direct the goal towards the Image fusion of the two selected methods, which gives improved results on the preservation of brightness and contrast enhancement of the original image.","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128392164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9687916
Venkatesham Maddela, S. K. Sinha, Parvathi Muddapu
As technology advances from micron to submicron, then submicron to deep submicron, the device density increases and the device becomes more complex, resulting in unwanted interconnections or disjunctions. Many existing fault models does not consider the parasitic effects, which causes undetectable faults. In this paper, we propose a new fault model that takes parasitic effects into account in order to detect and locate faults. In the proposed method, we consider node to node open defect, few multi node open defects for 45nm technology. Test results observed with few existing faults like No Access Faults, Undefined Read Faults, Undefined Write Faults and transition Faults, in addition these fault we observe few new faults named as Undefined Write Fault-1 (UWF1), Undefined Write Fault-0(UWF0) and Undefined Read Fault-1(URF1).
{"title":"Analysis of Open Defect Faults in Single 6T SRAM Cell Using R and C Parasitic Extraction Method","authors":"Venkatesham Maddela, S. K. Sinha, Parvathi Muddapu","doi":"10.1109/CENTCON52345.2021.9687916","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9687916","url":null,"abstract":"As technology advances from micron to submicron, then submicron to deep submicron, the device density increases and the device becomes more complex, resulting in unwanted interconnections or disjunctions. Many existing fault models does not consider the parasitic effects, which causes undetectable faults. In this paper, we propose a new fault model that takes parasitic effects into account in order to detect and locate faults. In the proposed method, we consider node to node open defect, few multi node open defects for 45nm technology. Test results observed with few existing faults like No Access Faults, Undefined Read Faults, Undefined Write Faults and transition Faults, in addition these fault we observe few new faults named as Undefined Write Fault-1 (UWF1), Undefined Write Fault-0(UWF0) and Undefined Read Fault-1(URF1).","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"136 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113982913","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9688059
Sapparapu Rahul, ChinmayeeSai Vajrala, B. Thangaraju
In todays world, there are billions of applications on the internet holding a lot of user data which automatically increases the threat of being attacked by hackers. Often User privacy and data are Susceptible to being compromised. To prevent this situation, Web Application Firewalls (WAF) would play an important role. In this research work, we will be exploring on preventing SQL Injection and Cross-Site Scripting (XSS) with a few machine learning models. We will also be suggesting a method to improvise security by introducing a honeypot in the Network architecture. This unique approach will notify the owner of the application to take necessary actions while giving a fake response to the attackers.
{"title":"A Novel Method of Honeypot Inclusive WAF to Protect from SQL Injection and XSS","authors":"Sapparapu Rahul, ChinmayeeSai Vajrala, B. Thangaraju","doi":"10.1109/CENTCON52345.2021.9688059","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9688059","url":null,"abstract":"In todays world, there are billions of applications on the internet holding a lot of user data which automatically increases the threat of being attacked by hackers. Often User privacy and data are Susceptible to being compromised. To prevent this situation, Web Application Firewalls (WAF) would play an important role. In this research work, we will be exploring on preventing SQL Injection and Cross-Site Scripting (XSS) with a few machine learning models. We will also be suggesting a method to improvise security by introducing a honeypot in the Network architecture. This unique approach will notify the owner of the application to take necessary actions while giving a fake response to the attackers.","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123092729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9687995
Lakshmi Anil, Riboy Cherian, S. K.
Wearable antennas for wireless communication have recently received much interest because of its unique characteristics and capabilities. These antennas possess distinctive properties such as flexibility, low profile, conformability, light weight, user friendliness, affordability, compactness, and ease of integration with the human body. This literature investigates the performance of wearable CPW antenna using various substrate material for ISM band applications. Furthermore, the antenna operates at frequencies that are suitable for WBAN applications in measuring certain human body parameters.
{"title":"Investigation and survey of a wearable multiband antenna for ISM band applications","authors":"Lakshmi Anil, Riboy Cherian, S. K.","doi":"10.1109/CENTCON52345.2021.9687995","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9687995","url":null,"abstract":"Wearable antennas for wireless communication have recently received much interest because of its unique characteristics and capabilities. These antennas possess distinctive properties such as flexibility, low profile, conformability, light weight, user friendliness, affordability, compactness, and ease of integration with the human body. This literature investigates the performance of wearable CPW antenna using various substrate material for ISM band applications. Furthermore, the antenna operates at frequencies that are suitable for WBAN applications in measuring certain human body parameters.","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121378647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9688292
Suman De
Software availability on the cloud is an essential aspect in every domain of software development. The growing demand for zero downtime of websites is a requirement for any successful development organization. Organizations like Netflix, Amazon, Flipkart, etc., have the challenge of serving their websites to millions of users at the same time. In peak hours of sale, like in a Big Billion Day sale, the load balancing capabilities are at risk of server failure, leading to growing dissatisfaction among customers. Platform-as-a-Service (PaaS) vendors provide various solutions to ensure that websites are scalable and have a higher uptime but still require comprehensive testing by all development organizations. This paper introduces a concept called Chaos Engineering, which looks at breaking a system or website in possible ways to test each resource and tool available to the end-user. We explore various scenarios where Chaos Engineering has been used to ensure higher uptime and fulfill the requirements of cloud products. This paper also highlights the usage and advantages of using various Chaos Engineering tools available in the market.
{"title":"A Study on Chaos Engineering for improving Cloud Software Quality and Reliability","authors":"Suman De","doi":"10.1109/CENTCON52345.2021.9688292","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9688292","url":null,"abstract":"Software availability on the cloud is an essential aspect in every domain of software development. The growing demand for zero downtime of websites is a requirement for any successful development organization. Organizations like Netflix, Amazon, Flipkart, etc., have the challenge of serving their websites to millions of users at the same time. In peak hours of sale, like in a Big Billion Day sale, the load balancing capabilities are at risk of server failure, leading to growing dissatisfaction among customers. Platform-as-a-Service (PaaS) vendors provide various solutions to ensure that websites are scalable and have a higher uptime but still require comprehensive testing by all development organizations. This paper introduces a concept called Chaos Engineering, which looks at breaking a system or website in possible ways to test each resource and tool available to the end-user. We explore various scenarios where Chaos Engineering has been used to ensure higher uptime and fulfill the requirements of cloud products. This paper also highlights the usage and advantages of using various Chaos Engineering tools available in the market.","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122255510","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9688223
A. Bhardwaj, P. Kumar, B. Raj, S. Anand
In this paper, Triple Metal Gate technique based Vertical Nanowire TFET (TMG-VNWTFET) is proposed and its performance characteristics are analyzed. The proposed device is analyzed by the variation in the work function of all three gate metals one by one and keeping other two fixed. After that the analysis was done by the variation in the length of gate metals. The performances like drain current, energy band diagram, transconductance, total gate capacitance, cut-off frequency, electric field, potential of proposed device are compared with Single Metal Gate Vertical Nanowire TFET (SMG-VNWTFET). Also the proposed device is compared with the existing device TMG-DL-TFET. The proposed device is exhibiting the performance parameters like ON current as 2.76 µA/µm, OFF current as 4.26×10−20 A/µm, the ratio of ON current and OFF current as 6.48×10+13, the Subthreshold Slope of 6.59 mV/Dec and very low threshold voltage VT as 0.172V.
{"title":"Design and Performance Enhancement of Vertical Nanowire TFET using Triple Metal Gate Technique","authors":"A. Bhardwaj, P. Kumar, B. Raj, S. Anand","doi":"10.1109/CENTCON52345.2021.9688223","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9688223","url":null,"abstract":"In this paper, Triple Metal Gate technique based Vertical Nanowire TFET (TMG-VNWTFET) is proposed and its performance characteristics are analyzed. The proposed device is analyzed by the variation in the work function of all three gate metals one by one and keeping other two fixed. After that the analysis was done by the variation in the length of gate metals. The performances like drain current, energy band diagram, transconductance, total gate capacitance, cut-off frequency, electric field, potential of proposed device are compared with Single Metal Gate Vertical Nanowire TFET (SMG-VNWTFET). Also the proposed device is compared with the existing device TMG-DL-TFET. The proposed device is exhibiting the performance parameters like ON current as 2.76 µA/µm, OFF current as 4.26×10−20 A/µm, the ratio of ON current and OFF current as 6.48×10+13, the Subthreshold Slope of 6.59 mV/Dec and very low threshold voltage VT as 0.172V.","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132929821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9688025
M. Rajesh, S. Narayana
The present Indian garment industry is highly labor intensive and most of the operations are still manually performed. The quality and productivity of the garment industry is greatly influenced by the availability of proficient tailor. The preliminary study indicate that, a tailor had to constantly monitor and control the machine speed and guide the fabric under needle. Also, often had to perform activities such as piece count, check empty spool, identify skip or loose stitch, broken thread and so on to produce a good quality garment. The paper thus aims to develop Industrial Internet of Things (IIoT) system which will help in monitoring sewing process parameters in real time and enabling the tailor to take the corrective action as and when required.
{"title":"Application of IIoT system in the Sewing Section of a Garment Industry","authors":"M. Rajesh, S. Narayana","doi":"10.1109/CENTCON52345.2021.9688025","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9688025","url":null,"abstract":"The present Indian garment industry is highly labor intensive and most of the operations are still manually performed. The quality and productivity of the garment industry is greatly influenced by the availability of proficient tailor. The preliminary study indicate that, a tailor had to constantly monitor and control the machine speed and guide the fabric under needle. Also, often had to perform activities such as piece count, check empty spool, identify skip or loose stitch, broken thread and so on to produce a good quality garment. The paper thus aims to develop Industrial Internet of Things (IIoT) system which will help in monitoring sewing process parameters in real time and enabling the tailor to take the corrective action as and when required.","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"46 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132896923","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9687927
Amit R, Nagaraj G Cholli
Lean Methodology was introduced to the world in the early 20th century by Toyota Motor company and has been present, adopted in the workflows of many other automotive and heavy industries from a very long time. It is only in the recent times that the importance of this principle has been realized globally and is being incorporated into the world of software engineering and software development lifecycle processes. In this paper we shall take a look into the basics of lean methodology and understand how the principles of lean in accordance with six sigma principles can be utilized in modern software development practices to achieve highly efficient workflows and performance results. We shall also compare and contrast the advantages of using lean methodology in software production.
{"title":"Application of Lean Principles in Software Development Processes","authors":"Amit R, Nagaraj G Cholli","doi":"10.1109/CENTCON52345.2021.9687927","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9687927","url":null,"abstract":"Lean Methodology was introduced to the world in the early 20th century by Toyota Motor company and has been present, adopted in the workflows of many other automotive and heavy industries from a very long time. It is only in the recent times that the importance of this principle has been realized globally and is being incorporated into the world of software engineering and software development lifecycle processes. In this paper we shall take a look into the basics of lean methodology and understand how the principles of lean in accordance with six sigma principles can be utilized in modern software development practices to achieve highly efficient workflows and performance results. We shall also compare and contrast the advantages of using lean methodology in software production.","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"1210 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131353317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9688188
Amrita Verma Pargaien, Saurabh Pargaien, T. Kumar, N. Pargaien, M. S. Kedar, Himanshu Joshi
Education can be coined as one of the indispensable domains that got colossally effected due to this persisting timeframe of the COVID-19 pandemic. Via this paper the author wishes to enlighten you on the ill-effects brought down by these tough times on our education and predominantly, to categorize the various legitimate resources which are currently in use by the learners in order to pace-up with the traditional learning methods. For this various platform were instigated by the government, which are hereby analyzed. It's really upsetting to learn that these platforms often get unobtrusive of the students and the target users as the exigency of each learner quarrels with that of the others. The virtual modus-operandi of studying and learning even comes up with numerous hassles, which are later examined in the paper. The significance of virtual learning or e-learning is accentuated along with the anticipated conceivability
{"title":"A study on the availability and utilization of e-educational portals during Covid-19 pandemic","authors":"Amrita Verma Pargaien, Saurabh Pargaien, T. Kumar, N. Pargaien, M. S. Kedar, Himanshu Joshi","doi":"10.1109/CENTCON52345.2021.9688188","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9688188","url":null,"abstract":"Education can be coined as one of the indispensable domains that got colossally effected due to this persisting timeframe of the COVID-19 pandemic. Via this paper the author wishes to enlighten you on the ill-effects brought down by these tough times on our education and predominantly, to categorize the various legitimate resources which are currently in use by the learners in order to pace-up with the traditional learning methods. For this various platform were instigated by the government, which are hereby analyzed. It's really upsetting to learn that these platforms often get unobtrusive of the students and the target users as the exigency of each learner quarrels with that of the others. The virtual modus-operandi of studying and learning even comes up with numerous hassles, which are later examined in the paper. The significance of virtual learning or e-learning is accentuated along with the anticipated conceivability","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129368576","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1109/CENTCON52345.2021.9687929
D. Jhala, A. Pathak, S. Ghosh, Deepti Barhate
The number of couples pursuing In-Vitro Fertilization (IVF) continues to grow worldwide, making infertility a global health problem. An approach to enhance traditional IVF is to find the success rate at the early phase of IVF considering both the patient characteristics and embryo formation as well. Taking this approach into account, we propose a paper that uses a novel method to determine the likelihood of live birth. This is the first research that we are aware of that predicts live birth outcome based on both intrinsic and extrinsic factors. The proposed method is to analyze the embryo image and the patient characteristics, two different algorithms have been developed to achieve this. Initially, by considering patient characteristics, a prediction is obtained using Multiple Linear Regression, and thereafter Hough Transform is applied over day 3 cleavage stage embryo to get prediction based on number of cells. At the end the results are averaged and a final outcome is presented. According to our test results, we found high prediction chances up to 42.89% and 32.27% for the patients with positive live birth and 12.27%, 23.34%, and 17.8% for the patients with negative live birth.
{"title":"Predicting Chances of Live Birth in IVF procedure based on Day 3 Embryo Analysis and Patient Characteristics","authors":"D. Jhala, A. Pathak, S. Ghosh, Deepti Barhate","doi":"10.1109/CENTCON52345.2021.9687929","DOIUrl":"https://doi.org/10.1109/CENTCON52345.2021.9687929","url":null,"abstract":"The number of couples pursuing In-Vitro Fertilization (IVF) continues to grow worldwide, making infertility a global health problem. An approach to enhance traditional IVF is to find the success rate at the early phase of IVF considering both the patient characteristics and embryo formation as well. Taking this approach into account, we propose a paper that uses a novel method to determine the likelihood of live birth. This is the first research that we are aware of that predicts live birth outcome based on both intrinsic and extrinsic factors. The proposed method is to analyze the embryo image and the patient characteristics, two different algorithms have been developed to achieve this. Initially, by considering patient characteristics, a prediction is obtained using Multiple Linear Regression, and thereafter Hough Transform is applied over day 3 cleavage stage embryo to get prediction based on number of cells. At the end the results are averaged and a final outcome is presented. According to our test results, we found high prediction chances up to 42.89% and 32.27% for the patients with positive live birth and 12.27%, 23.34%, and 17.8% for the patients with negative live birth.","PeriodicalId":103865,"journal":{"name":"2021 International Conference on Disruptive Technologies for Multi-Disciplinary Research and Applications (CENTCON)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126063770","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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