Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316265
Yan Lou, G. Wen, Chunyi Chen, Yiwu Zhao, Huilin Jiang, S. Tong
In this paper, According to measurements data from experiment of laser propagation along 0.9Km distance near ground path and 45m ground altitude, the received scintillation fluctuation data and spot size are recorded and analyzed without consider the scale of turbulence. Under the strong turbulence, the structure constant of refractive index Cn2 is computed using scintillation fluctuation and then using models of Cn2 to predict atmospheric coherence length r0 for horizontal paths, later the spot size was computed. Compared with measured data of spot size, there is a certain deviation with 200μm2 from each other under the conditions of r0 <; 0.055m, but the time variation is similar, at last, various errors caused by both theory and experiment are analyzed and discussed.
{"title":"Experimental measurement of atmospheric coherence length of laser propagation in the atmospheric turbulence","authors":"Yan Lou, G. Wen, Chunyi Chen, Yiwu Zhao, Huilin Jiang, S. Tong","doi":"10.1109/ICOOM.2012.6316265","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316265","url":null,"abstract":"In this paper, According to measurements data from experiment of laser propagation along 0.9Km distance near ground path and 45m ground altitude, the received scintillation fluctuation data and spot size are recorded and analyzed without consider the scale of turbulence. Under the strong turbulence, the structure constant of refractive index Cn2 is computed using scintillation fluctuation and then using models of Cn2 to predict atmospheric coherence length r0 for horizontal paths, later the spot size was computed. Compared with measured data of spot size, there is a certain deviation with 200μm2 from each other under the conditions of r0 <; 0.055m, but the time variation is similar, at last, various errors caused by both theory and experiment are analyzed and discussed.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134084927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316247
Yang Lu, Yijun Liang, Hu Deng, Jian Xing
Polarization properties is the nature of light, this paper studied twist-induce birefringence of optic fiber, using the MATLAB simulation to analyze the state of polarization (SOP) evolution on Poincaré sphere; according to theory to derive output light intensity of sagnac single-mode optic fiber interferometer and combined the experimental result to analyze the relationship of fiber torsion angle and output light intensity.
{"title":"Twist-induce polarization properties of sagnac single-mode optic fiber interferometer","authors":"Yang Lu, Yijun Liang, Hu Deng, Jian Xing","doi":"10.1109/ICOOM.2012.6316247","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316247","url":null,"abstract":"Polarization properties is the nature of light, this paper studied twist-induce birefringence of optic fiber, using the MATLAB simulation to analyze the state of polarization (SOP) evolution on Poincaré sphere; according to theory to derive output light intensity of sagnac single-mode optic fiber interferometer and combined the experimental result to analyze the relationship of fiber torsion angle and output light intensity.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132647048","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316275
Xiaoming Li, L. Zhang, Jiaqi Zhang, Chunhui Wang, Jiayun Zhao
A moving-target used for tracking accuracy test of the laser communication terminal was introduced in this paper. The rotary shaft sway of moving-target affected the motion characteristic of the moving-target and the test of tracking accuracy. So it was necessary to analyze the effect of the sway in the shaft of moving-target to its motion characteristic. Firstly, we established a mathematic model of the moving-target that we introduced in the front of paper, then analyzed the effect of the shaft sway of moving-target to moving-target's motion characteristic. The results indicated that the frequency of the sway and maximum value of the sway had a severe effect to the motion characteristic. So it was necessary to control the shaft sway when the moving-target was designed or manufactured.
{"title":"The effect analysis of shaft sway to the motion character of moving target used for laser","authors":"Xiaoming Li, L. Zhang, Jiaqi Zhang, Chunhui Wang, Jiayun Zhao","doi":"10.1109/ICOOM.2012.6316275","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316275","url":null,"abstract":"A moving-target used for tracking accuracy test of the laser communication terminal was introduced in this paper. The rotary shaft sway of moving-target affected the motion characteristic of the moving-target and the test of tracking accuracy. So it was necessary to analyze the effect of the sway in the shaft of moving-target to its motion characteristic. Firstly, we established a mathematic model of the moving-target that we introduced in the front of paper, then analyzed the effect of the shaft sway of moving-target to moving-target's motion characteristic. The results indicated that the frequency of the sway and maximum value of the sway had a severe effect to the motion characteristic. So it was necessary to control the shaft sway when the moving-target was designed or manufactured.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129299317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316232
Yuzhi Wang, Te Li, Rong Chen, Yue Zhang, Guojun Liu, E. Hao
To avoid the catastrophic optical mirror damage (COMD), the value of equivalent transverse spot size has increased to 0.83μm through decreasing optical confinement factor (Γ) for quantum well diode lasers, which further reduces the power density on the facet. The design of asymmetric 980 nm InGaAs/InGaAsP broad-waveguide diode lasers with current blocking layer is designed for high-power, single-transverse-mode operation experimentally, which prevents carrier leakage and increases electro-optical conversion efficiency. According to the calculation result, for the device with uncoated 100-μm-wide stripes, 2-mm-long lasers exhibit a threshold-current density of 290A/cm2, the maximum output power is 1.19W with operating current of 2.0 A. The corresponding internal loss coefficient and differential quantum efficiency are 1.6 cm-1 and 63% respectively.
{"title":"High power asymmetric 980nm broad-waveguide diode lasers with current blocking layer","authors":"Yuzhi Wang, Te Li, Rong Chen, Yue Zhang, Guojun Liu, E. Hao","doi":"10.1109/ICOOM.2012.6316232","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316232","url":null,"abstract":"To avoid the catastrophic optical mirror damage (COMD), the value of equivalent transverse spot size has increased to 0.83μm through decreasing optical confinement factor (Γ) for quantum well diode lasers, which further reduces the power density on the facet. The design of asymmetric 980 nm InGaAs/InGaAsP broad-waveguide diode lasers with current blocking layer is designed for high-power, single-transverse-mode operation experimentally, which prevents carrier leakage and increases electro-optical conversion efficiency. According to the calculation result, for the device with uncoated 100-μm-wide stripes, 2-mm-long lasers exhibit a threshold-current density of 290A/cm2, the maximum output power is 1.19W with operating current of 2.0 A. The corresponding internal loss coefficient and differential quantum efficiency are 1.6 cm-1 and 63% respectively.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130600320","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316255
Zhi-Wei Xia, Qi Li, Qi Wang
Image quality metrics is an important aspect in image processing of ladar. Three quality metrics, including peak signal to noise ratio (PSNR), structural similarity (SSIM) index and speckle index (SI), are utilized to evaluate the intensity images of ladar in this paper, and the influence of quality metrics caused by different carrier to noise ratio (CNR) and different structures of images are analyzed. The results show that SSIM can accurately evaluate the image quality degraded by noise, and it is basically consistent with visual evaluation. PSNR can reflect the degree of image degraded by noise but can not reflect the decrease degree of image quality. SI can evaluate the residual degree of speckle noise which can be the criterion to weigh the uniformity of target gray values.
{"title":"Quality metrics of simulated intensity images of coherent ladar","authors":"Zhi-Wei Xia, Qi Li, Qi Wang","doi":"10.1109/ICOOM.2012.6316255","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316255","url":null,"abstract":"Image quality metrics is an important aspect in image processing of ladar. Three quality metrics, including peak signal to noise ratio (PSNR), structural similarity (SSIM) index and speckle index (SI), are utilized to evaluate the intensity images of ladar in this paper, and the influence of quality metrics caused by different carrier to noise ratio (CNR) and different structures of images are analyzed. The results show that SSIM can accurately evaluate the image quality degraded by noise, and it is basically consistent with visual evaluation. PSNR can reflect the degree of image degraded by noise but can not reflect the decrease degree of image quality. SI can evaluate the residual degree of speckle noise which can be the criterion to weigh the uniformity of target gray values.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123945269","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316339
Shujian Han, Shugui Liu, L. Ji, Shaohui Li, Xiaojie Zhang, Hongwei Zhang
Present a novel method for 3D shape measurement of specular surface based on structured light coding method. Coded fringe pattern are projected onto the high reflected surface of the measured object. The deflection fringe pattern that modulated by the object surface are captured by the CCD camera. Central perturbation phase-shift technology is adopted to fast retrieve the phase distribution on the deflection fringe pattern. Then the slope information can be obtained by analyzing the relationship between the phase deflection and the slope of the object surface. By combining the character of the phase-shifting fringe pattern and digital image processing technologies the boundary of the measured object can be picked up from the background before reconstruction, which can reduce the quantities of data to be processed and advance the reconstruction precision at the boundary. The improved wave-front reconstruction method is used to reconstruct the surface. With the application of this technology the 3D shape of specular surface can be precisely reconstructed.
{"title":"3D shape measurement of specular surface based on structured light coding method","authors":"Shujian Han, Shugui Liu, L. Ji, Shaohui Li, Xiaojie Zhang, Hongwei Zhang","doi":"10.1109/ICOOM.2012.6316339","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316339","url":null,"abstract":"Present a novel method for 3D shape measurement of specular surface based on structured light coding method. Coded fringe pattern are projected onto the high reflected surface of the measured object. The deflection fringe pattern that modulated by the object surface are captured by the CCD camera. Central perturbation phase-shift technology is adopted to fast retrieve the phase distribution on the deflection fringe pattern. Then the slope information can be obtained by analyzing the relationship between the phase deflection and the slope of the object surface. By combining the character of the phase-shifting fringe pattern and digital image processing technologies the boundary of the measured object can be picked up from the background before reconstruction, which can reduce the quantities of data to be processed and advance the reconstruction precision at the boundary. The improved wave-front reconstruction method is used to reconstruct the surface. With the application of this technology the 3D shape of specular surface can be precisely reconstructed.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124440928","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316256
Qi Wang, Jingsong Wei, Jianfeng Sun, Jian Gao
Imaging laser Lidar process is analyzed in this paper, and a large FOV non-scanning imaging laser Lidar equation suitable for received energy calculation is proposed. Every parameters in this equation have distinct physical meaning. These parameters can be obtained by experiments, without experience estimate, or by exist literature material. By Lidar equation analyses, a conclusion that three parameters, atmospheric transmittance, diameter of receiving lens and minimum detectable energy of detector, are important for imaging result. Some parameter measurement experiments are simply introduced in this paper.
{"title":"Non-scanning imaging laser Lidar equation","authors":"Qi Wang, Jingsong Wei, Jianfeng Sun, Jian Gao","doi":"10.1109/ICOOM.2012.6316256","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316256","url":null,"abstract":"Imaging laser Lidar process is analyzed in this paper, and a large FOV non-scanning imaging laser Lidar equation suitable for received energy calculation is proposed. Every parameters in this equation have distinct physical meaning. These parameters can be obtained by experiments, without experience estimate, or by exist literature material. By Lidar equation analyses, a conclusion that three parameters, atmospheric transmittance, diameter of receiving lens and minimum detectable energy of detector, are important for imaging result. Some parameter measurement experiments are simply introduced in this paper.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122910155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316203
Baoshan Jia, Yuhua Wang, Lu Zhou, Duanyuan Bai, Z. Qiao, Xin Gao, B. Bo
Amorphous GaAsN (a-GaAsN) films have been deposited at room temperature by reactive magnetron sputtering on glass substrates at different sputtering pressure. The deposition rate decreased as the sputtering pressure increased. Transmittance and reflectance of the as-deposited films were obtained by spectrophotometric measurement. The sputtering pressure influence on the optical band gap (Eg), refractive index (n), the dispersion parameters (Eo, Ed) have been investigated. An analysis of the absorption coefficient revealed a direct optical transition characterizing the as-deposited films. The refraction index dispersion of the as-deposited a-GaAsN films fitted well to the Cauchy dispersion relation and Wemple's model.
{"title":"Dependence of optical constants of a-GaAsN thin films on sputtering pressure","authors":"Baoshan Jia, Yuhua Wang, Lu Zhou, Duanyuan Bai, Z. Qiao, Xin Gao, B. Bo","doi":"10.1109/ICOOM.2012.6316203","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316203","url":null,"abstract":"Amorphous GaAsN (a-GaAsN) films have been deposited at room temperature by reactive magnetron sputtering on glass substrates at different sputtering pressure. The deposition rate decreased as the sputtering pressure increased. Transmittance and reflectance of the as-deposited films were obtained by spectrophotometric measurement. The sputtering pressure influence on the optical band gap (Eg), refractive index (n), the dispersion parameters (Eo, Ed) have been investigated. An analysis of the absorption coefficient revealed a direct optical transition characterizing the as-deposited films. The refraction index dispersion of the as-deposited a-GaAsN films fitted well to the Cauchy dispersion relation and Wemple's model.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"191 2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122069867","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316310
Songyuan Li, P. Hu
A new type coordinate measuring system based on 3-PSS parallel mechanism was proposed in this paper, which could realize 3D measurement with only one linear grating and one precision guideway. Firstly, 6-bar forward kinematic model was achieved as CMM measurement model. Then, the workspace of the parallel CMM was discussed in detail. As parallel structure, the workspace was worked out by the limit boundary searching method. Theory and experiment has verified that different point in workspace carries different measuring accuracy in the CMM, so, the paper explored measuring space based on the workspace with an of 0.02mm measurement accuracy as target. Finally, structural parameters of the parallel CMM was researched and optimized, which keeps balance between measurement accuracy and big measuring space. Compared to the manufactured prototype parallel CMM, the new design can generally enlarge 130% the cross-sectional area of measuring space.
{"title":"Analysis and optimization of measuring space for the 3-PSS parallel CMM","authors":"Songyuan Li, P. Hu","doi":"10.1109/ICOOM.2012.6316310","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316310","url":null,"abstract":"A new type coordinate measuring system based on 3-PSS parallel mechanism was proposed in this paper, which could realize 3D measurement with only one linear grating and one precision guideway. Firstly, 6-bar forward kinematic model was achieved as CMM measurement model. Then, the workspace of the parallel CMM was discussed in detail. As parallel structure, the workspace was worked out by the limit boundary searching method. Theory and experiment has verified that different point in workspace carries different measuring accuracy in the CMM, so, the paper explored measuring space based on the workspace with an of 0.02mm measurement accuracy as target. Finally, structural parameters of the parallel CMM was researched and optimized, which keeps balance between measurement accuracy and big measuring space. Compared to the manufactured prototype parallel CMM, the new design can generally enlarge 130% the cross-sectional area of measuring space.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129774179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2012-10-02DOI: 10.1109/ICOOM.2012.6316279
Jianing Wang, Jingyi He, Yue Yang, Xiao Yu, Xiaolong Ni
Laser communication with its large capacity communication, strong confidentiality, structure of light and other advantages is becoming research focus. Space laser communications networking technology is communicated network of bi-directional and multi-directional network, which is made of satellites, ground station, near the space vehicle and so on. This paper uses the STK (Satellite Tool Kit) on a visibility analysis of the laser communication in satellite network between different bits. Simulation results demonstrate the two-dimensional or three-dimensional chart.
{"title":"STK and application in simulation of the space laser communication network","authors":"Jianing Wang, Jingyi He, Yue Yang, Xiao Yu, Xiaolong Ni","doi":"10.1109/ICOOM.2012.6316279","DOIUrl":"https://doi.org/10.1109/ICOOM.2012.6316279","url":null,"abstract":"Laser communication with its large capacity communication, strong confidentiality, structure of light and other advantages is becoming research focus. Space laser communications networking technology is communicated network of bi-directional and multi-directional network, which is made of satellites, ground station, near the space vehicle and so on. This paper uses the STK (Satellite Tool Kit) on a visibility analysis of the laser communication in satellite network between different bits. Simulation results demonstrate the two-dimensional or three-dimensional chart.","PeriodicalId":129625,"journal":{"name":"2012 International Conference on Optoelectronics and Microelectronics","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2012-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134529922","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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