Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889798
Akitoshi Wada, M. Hayashi
We propose a new approach to executing differential calculus using simple 2 by 2 matrices and demonstrate an important application to the reliability engineering field. This matrix approach prevents an exponential increase in computation time of the post-expression obtained by differential calculus and shows instead a linear increase. This approach is a breakthrough for solving computation problems not only in the reliability engineering field but also in almost all science and engineering fields because differential calculus is essential to and commonly used in almost all of them.
{"title":"A new approach for executing differential calculus and application to failure rate analysis","authors":"Akitoshi Wada, M. Hayashi","doi":"10.1109/RAM.2017.7889798","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889798","url":null,"abstract":"We propose a new approach to executing differential calculus using simple 2 by 2 matrices and demonstrate an important application to the reliability engineering field. This matrix approach prevents an exponential increase in computation time of the post-expression obtained by differential calculus and shows instead a linear increase. This approach is a breakthrough for solving computation problems not only in the reliability engineering field but also in almost all science and engineering fields because differential calculus is essential to and commonly used in almost all of them.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121113987","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889654
C. Tan, Udit Narula, D. Kapoor
Automotive Electronics is growing ever since the technological advancement has brought about a revolution in the Automotive Semiconductor and Telematics industry, especially in the past decade. Utilization of microelectronics and hence circuits' complexity is increasing continuously in automotive industry. Advancement in electronic technology increases the dominance of electronics in automotive markets, and reliability requirements for Automobile Electronics have grown over the past many years. However, the faults and rate of defects is also increasing as indicated by proportion of number of recalls made by large automobile companies, and this poses a difficult ‘Paradox’ to understand and curb. One of the reasons is that the increase in technological advancements makes the vehicles' system more complex and difficult to test for reliability. Also, operating parameters such as temperature, humidity, etc. are increasingly stringent with the continuous development of the electronic systems in vehicles. Short time to market and ineffective design for reliability methodology employed, including various misconceptions on reliability testing, have rendered a lag in providing components and systems that match the increasing reliability requirements for vehicles. Therefore, a call for greater effort in reliability understanding and systematic design for reliability methodology is essential if continuous engagement of advanced electronic technologies is to be continued. The transition from Mechanical Automotive system to Electronics Automotive system and its effect on the Automotive industry is discussed in this work. The fact that technological benefits are not helping in improving reliability of the Automotive Electronics system is explained by studying the worldwide automotive recalls and the Paradox of Automotive Electronics Reliability is presented and explained.
{"title":"Reliability paradox for worldwide automotive electronics","authors":"C. Tan, Udit Narula, D. Kapoor","doi":"10.1109/RAM.2017.7889654","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889654","url":null,"abstract":"Automotive Electronics is growing ever since the technological advancement has brought about a revolution in the Automotive Semiconductor and Telematics industry, especially in the past decade. Utilization of microelectronics and hence circuits' complexity is increasing continuously in automotive industry. Advancement in electronic technology increases the dominance of electronics in automotive markets, and reliability requirements for Automobile Electronics have grown over the past many years. However, the faults and rate of defects is also increasing as indicated by proportion of number of recalls made by large automobile companies, and this poses a difficult ‘Paradox’ to understand and curb. One of the reasons is that the increase in technological advancements makes the vehicles' system more complex and difficult to test for reliability. Also, operating parameters such as temperature, humidity, etc. are increasingly stringent with the continuous development of the electronic systems in vehicles. Short time to market and ineffective design for reliability methodology employed, including various misconceptions on reliability testing, have rendered a lag in providing components and systems that match the increasing reliability requirements for vehicles. Therefore, a call for greater effort in reliability understanding and systematic design for reliability methodology is essential if continuous engagement of advanced electronic technologies is to be continued. The transition from Mechanical Automotive system to Electronics Automotive system and its effect on the Automotive industry is discussed in this work. The fact that technological benefits are not helping in improving reliability of the Automotive Electronics system is explained by studying the worldwide automotive recalls and the Paradox of Automotive Electronics Reliability is presented and explained.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121164340","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889740
M. Werme, T. Eriksson, Thord Righard
The traditional Level of Repair Analysis (LORA) concept was developed to provide decision support when choosing where, in a support organization structure, to perform repairs. The analysis determines at what level in a hierarchical support organization it will be most cost effective to repair each component in a technical system, considering the investment in maintenance resources, e.g. personnel and test equipment. The traditional LORA, however, does not consider the large impact the repair level decision has on the spares investment nor the strong dependency between different items for the system effectiveness. Furthermore, it cannot handle asymmetric organizations, i.e. organizations where the operation of systems differs a lot between bases not sharing the same supporting station. Since both technical systems and their support solutions are becoming more and more complex the requirements for decision support in this field has changed, and traditional LORA has become obsolete. In this paper a new approach to LORA and Maintenance Concept Optimization is presented. This approach is more relevant and up to date with current requirements and it is also a lot more powerful than the traditional item-by-item approach for LORA. The new approach offers a simultaneous optimization of maintenance locations, maintenance resources, spare parts and repair/discard decisions. The approach offers a fast and effective methodology for reaching cost-effective logistic support solutions with the objective of achieving high system effectiveness.
{"title":"Maintenance concept optimization — A new approach to LORA","authors":"M. Werme, T. Eriksson, Thord Righard","doi":"10.1109/RAM.2017.7889740","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889740","url":null,"abstract":"The traditional Level of Repair Analysis (LORA) concept was developed to provide decision support when choosing where, in a support organization structure, to perform repairs. The analysis determines at what level in a hierarchical support organization it will be most cost effective to repair each component in a technical system, considering the investment in maintenance resources, e.g. personnel and test equipment. The traditional LORA, however, does not consider the large impact the repair level decision has on the spares investment nor the strong dependency between different items for the system effectiveness. Furthermore, it cannot handle asymmetric organizations, i.e. organizations where the operation of systems differs a lot between bases not sharing the same supporting station. Since both technical systems and their support solutions are becoming more and more complex the requirements for decision support in this field has changed, and traditional LORA has become obsolete. In this paper a new approach to LORA and Maintenance Concept Optimization is presented. This approach is more relevant and up to date with current requirements and it is also a lot more powerful than the traditional item-by-item approach for LORA. The new approach offers a simultaneous optimization of maintenance locations, maintenance resources, spare parts and repair/discard decisions. The approach offers a fast and effective methodology for reaching cost-effective logistic support solutions with the objective of achieving high system effectiveness.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117206482","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889736
JenHao Wu, Adam Butler, M. Mueller, Kaswar Mostafa
A novel Bayesian Hierarchical Modelling framework combining fatigue analysis and reliability analysis is proposed and applied to predict time-to-failure distribution for a small wind turbine. Machine frame of the small wind turbine is studied in this paper. The result is a comparison of the quantified reliability predictions between the original and modified machine frame designs of the small wind turbine.
{"title":"Combining fatigue analysis information into reliability analysis using Bayesian hierarchical modelling method","authors":"JenHao Wu, Adam Butler, M. Mueller, Kaswar Mostafa","doi":"10.1109/RAM.2017.7889736","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889736","url":null,"abstract":"A novel Bayesian Hierarchical Modelling framework combining fatigue analysis and reliability analysis is proposed and applied to predict time-to-failure distribution for a small wind turbine. Machine frame of the small wind turbine is studied in this paper. The result is a comparison of the quantified reliability predictions between the original and modified machine frame designs of the small wind turbine.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115963127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889680
Guilin Zhao, L. Xing
This paper models and evaluates reliability of a smart home system considering phased-mission, functional dependence and standby behavior in its physical layer, and probabilistic competing failure behavior with random propagated time in its communication layer. The proposed methodology encompasses a multi-valued decision diagram based method for the physical layer, and a combinatorial procedure based on total probability law for the communication layer. A detailed case study of an example smart home system is provided. The method is applicable to arbitrary types of component time-to-failure distributions.
{"title":"Layered reliability modeling of smart home system","authors":"Guilin Zhao, L. Xing","doi":"10.1109/RAM.2017.7889680","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889680","url":null,"abstract":"This paper models and evaluates reliability of a smart home system considering phased-mission, functional dependence and standby behavior in its physical layer, and probabilistic competing failure behavior with random propagated time in its communication layer. The proposed methodology encompasses a multi-valued decision diagram based method for the physical layer, and a combinatorial procedure based on total probability law for the communication layer. A detailed case study of an example smart home system is provided. The method is applicable to arbitrary types of component time-to-failure distributions.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"109 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124157061","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889777
Rafael B. Fricks, Henry Tseng, M. Pajic, Kishor S. Trivedi
High volume outpatient clinics such as eye care centers cannot afford excessive delays, especially when due to limited resources, time, or overhead. Modeling tools from reliability & maintainability practice may provide the means to better assess where improvements may be possible. The models developed in this demonstration build on previous efforts to address challenges in quantifiable performance evaluation in health care. Discrete event simulation solutions of non-Markovian Stochastic Reward Nets provide insight into operations from data collected at an academic medical center. The produced model of patient flow at a glaucoma practice reflects clinic process flow diagrams and electronic health record data collected from January to March 2016. In this report we describe the parameterization process, as well as how the collected data and direct observation of a clinic influenced model formation. We then employ maximum likelihood estimation to fit the distribution of times spent at different treatment phases to parametric models, distinguishing between groups in data where appropriate. Combining data fitting in a Stochastic Reward Net, we solve the resulting non-Markovian model using discrete event simulation. The model is then simulated to predict transient high patient load periods experienced by the clinic. These interim results indicate that for the moderately sized clinic presented here, patient volume is manageable even with minimal resource support. Finally, future directions in clinic model validation and operations optimization are presented.
{"title":"Transient performance & availability modeling in high volume outpatient clinics","authors":"Rafael B. Fricks, Henry Tseng, M. Pajic, Kishor S. Trivedi","doi":"10.1109/RAM.2017.7889777","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889777","url":null,"abstract":"High volume outpatient clinics such as eye care centers cannot afford excessive delays, especially when due to limited resources, time, or overhead. Modeling tools from reliability & maintainability practice may provide the means to better assess where improvements may be possible. The models developed in this demonstration build on previous efforts to address challenges in quantifiable performance evaluation in health care. Discrete event simulation solutions of non-Markovian Stochastic Reward Nets provide insight into operations from data collected at an academic medical center. The produced model of patient flow at a glaucoma practice reflects clinic process flow diagrams and electronic health record data collected from January to March 2016. In this report we describe the parameterization process, as well as how the collected data and direct observation of a clinic influenced model formation. We then employ maximum likelihood estimation to fit the distribution of times spent at different treatment phases to parametric models, distinguishing between groups in data where appropriate. Combining data fitting in a Stochastic Reward Net, we solve the resulting non-Markovian model using discrete event simulation. The model is then simulated to predict transient high patient load periods experienced by the clinic. These interim results indicate that for the moderately sized clinic presented here, patient volume is manageable even with minimal resource support. Finally, future directions in clinic model validation and operations optimization are presented.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126519719","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889741
Chao Peng, Xiaogang Li, Qingyang Yuan
Because of the field degradation data in the life evaluation of products, the method of carrying out accelerated degradation test to obtain data for the supplement of field degradation data has been widely used. In the current design of accelerated degradation test (ADT), the main issue is how to fully simulate the field working stress in laboratory in account of the limitation on hardware devices and financial factors. This will give rise to the evident deviation between predicted performance and field data, which may also lead to the waste of manpower, material and financial resources. Therefore, a life evaluation method which took the laboratory and field degradation data into consideration was proposed. In this method, both laboratory and field degradation data were collected and analyzed; the Bayesian statistical methodology was applied for the estimation and correction of the accelerated life model and the life distribution of products with the ADT data and field degradation data to get a more accurate life evaluation. At the end of the article, an example is given to illuminate the application and computational process of the method, as well as the analysis of the accuracy of evaluation method.
{"title":"Life evaluation methods based on laboratory and field degradation data","authors":"Chao Peng, Xiaogang Li, Qingyang Yuan","doi":"10.1109/RAM.2017.7889741","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889741","url":null,"abstract":"Because of the field degradation data in the life evaluation of products, the method of carrying out accelerated degradation test to obtain data for the supplement of field degradation data has been widely used. In the current design of accelerated degradation test (ADT), the main issue is how to fully simulate the field working stress in laboratory in account of the limitation on hardware devices and financial factors. This will give rise to the evident deviation between predicted performance and field data, which may also lead to the waste of manpower, material and financial resources. Therefore, a life evaluation method which took the laboratory and field degradation data into consideration was proposed. In this method, both laboratory and field degradation data were collected and analyzed; the Bayesian statistical methodology was applied for the estimation and correction of the accelerated life model and the life distribution of products with the ADT data and field degradation data to get a more accurate life evaluation. At the end of the article, an example is given to illuminate the application and computational process of the method, as well as the analysis of the accuracy of evaluation method.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130468169","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889775
M. Hinz, F. Hienzsch, S. Bracke
The main aim of this paper is the analysis of a fleet behavior and comparison of damaged and non-damaged vehicles using different machine learning algorithms to identify the main distinctions in a car fleet. For this purpose OBD (On Board Diagnostics) signals are recorded in three various car types (BMW X3, Peugeot 208, Seat Leon) and several hundred drives. Furthermore, thousands of drives are simulated based on the Discrete Fourier Transformation (DTF) and Monte Carlo simulation (MC) to provide a huge training data for the rule learning algorithms. The simulated data represents the car fleet with given (or assumed) testing conditions. For example it is assumed, that all the cars of the fleet don't exceed the maximum speed of 170 km/hour due to the specs of the product. All made assumptions are variable and can be changed after the analysis process. All signals (simulated and recorded) are analyzed in order to provide information about every single drive (e.g. out of the speed signal: max speed, max acceleration, duration of the drive are determined and stored in a data base).
{"title":"Detection of distinctions in car fleets based on measured and simulated data","authors":"M. Hinz, F. Hienzsch, S. Bracke","doi":"10.1109/RAM.2017.7889775","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889775","url":null,"abstract":"The main aim of this paper is the analysis of a fleet behavior and comparison of damaged and non-damaged vehicles using different machine learning algorithms to identify the main distinctions in a car fleet. For this purpose OBD (On Board Diagnostics) signals are recorded in three various car types (BMW X3, Peugeot 208, Seat Leon) and several hundred drives. Furthermore, thousands of drives are simulated based on the Discrete Fourier Transformation (DTF) and Monte Carlo simulation (MC) to provide a huge training data for the rule learning algorithms. The simulated data represents the car fleet with given (or assumed) testing conditions. For example it is assumed, that all the cars of the fleet don't exceed the maximum speed of 170 km/hour due to the specs of the product. All made assumptions are variable and can be changed after the analysis process. All signals (simulated and recorded) are analyzed in order to provide information about every single drive (e.g. out of the speed signal: max speed, max acceleration, duration of the drive are determined and stored in a data base).","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"26 6","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132089398","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889667
Gang Dai, Yijia Du, Lifang Liu, Jian Zhang
In previous work, a four piezoelectric crab-leg suspensions micro vibratory stage, which could provide up to 280o/s transient angular rate, was used for in-situ self-calibration of generic MEMS gyroscopes [1]. In this paper, the prognostic of high-g response of generic MEMS accelerometers or acceleration switches is taking into consideration to improve the integrity of in-situ health prognostic method for MEMS inertial sensors. Firstly, the dynamic behavior of the mass-spring system under forced vibration is analyzed to acquire the equations between the micro vibrator's characteristics and the accelerometer's high-g response. Then, the parameters of the four crab-leg micro vibrator are calculated with the acquired relation equations and simulated to meet the prognostic requirement of both high-g and high angular rate responses. Finally, an experiment, using the commercial MEMS accelerometer AD22281 mounted on a z-axis vibrator, demonstrates up to 11g response of acceleration with the 250Hz vibration rate and 50μm vibration amplitude, and proves the feasibility of prognostic both high g and angular rate characteristics of generic MEMS inertial sensors with micro vibrator.
{"title":"In-situ MEMS inertial sensor health prognostic method based on micro vibrator","authors":"Gang Dai, Yijia Du, Lifang Liu, Jian Zhang","doi":"10.1109/RAM.2017.7889667","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889667","url":null,"abstract":"In previous work, a four piezoelectric crab-leg suspensions micro vibratory stage, which could provide up to 280o/s transient angular rate, was used for in-situ self-calibration of generic MEMS gyroscopes [1]. In this paper, the prognostic of high-g response of generic MEMS accelerometers or acceleration switches is taking into consideration to improve the integrity of in-situ health prognostic method for MEMS inertial sensors. Firstly, the dynamic behavior of the mass-spring system under forced vibration is analyzed to acquire the equations between the micro vibrator's characteristics and the accelerometer's high-g response. Then, the parameters of the four crab-leg micro vibrator are calculated with the acquired relation equations and simulated to meet the prognostic requirement of both high-g and high angular rate responses. Finally, an experiment, using the commercial MEMS accelerometer AD22281 mounted on a z-axis vibrator, demonstrates up to 11g response of acceleration with the 250Hz vibration rate and 50μm vibration amplitude, and proves the feasibility of prognostic both high g and angular rate characteristics of generic MEMS inertial sensors with micro vibrator.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131182602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/RAM.2017.7889675
Christopher C. Zanotti, Andrew J. Kaylor, Kristine Davidsen
In today's competitive market place the need to reduce cost and increase speed in development require exploring a different approach than the traditional waterfall method of hardware development. The Waterfall method consists of a series of stages that are completed sequentially, once a stage has been completed, developers can't go back to the previous stage — not without scratching the project and starting over. In order to remain competitive, companies developing hardware are using Agile methodologies to help keep up with the accelerating rate of change. Scrum is a simple and flexible Agile methodology that provides the ability to respond to changing requirements, increase productivity, and enables rapid and flexible development cycles, with greater collaboration and reduced costs & defects. Integrating a Reliability And Maintainability (RAM) Scrum Team as part of the Agile product development can help deliver reliable and maintainable hardware quicker, and at lower costs providing a competitive advantage. In summary help enable transformational change. Be open to process change and work your RAM agile process model. Don't impose current waterfall processes on Scrum, they will not help. Be supportive and review the team's work products during the Sprint timeline in which they are being developed. Don't expect to see a lot of charts for reviews and table tops and don't direct the team to do additional work or direct how it should be done. Look at the team Scrum boards to understand what is going on and help remove impediments. Staff the team's needs with permanent solutions and take Scrum training to understand, enable and support the changes. Finally don't see failing as bad, especially if we fail early and learn from it.
{"title":"Multi-discipline agile development and reliability and maintainability","authors":"Christopher C. Zanotti, Andrew J. Kaylor, Kristine Davidsen","doi":"10.1109/RAM.2017.7889675","DOIUrl":"https://doi.org/10.1109/RAM.2017.7889675","url":null,"abstract":"In today's competitive market place the need to reduce cost and increase speed in development require exploring a different approach than the traditional waterfall method of hardware development. The Waterfall method consists of a series of stages that are completed sequentially, once a stage has been completed, developers can't go back to the previous stage — not without scratching the project and starting over. In order to remain competitive, companies developing hardware are using Agile methodologies to help keep up with the accelerating rate of change. Scrum is a simple and flexible Agile methodology that provides the ability to respond to changing requirements, increase productivity, and enables rapid and flexible development cycles, with greater collaboration and reduced costs & defects. Integrating a Reliability And Maintainability (RAM) Scrum Team as part of the Agile product development can help deliver reliable and maintainable hardware quicker, and at lower costs providing a competitive advantage. In summary help enable transformational change. Be open to process change and work your RAM agile process model. Don't impose current waterfall processes on Scrum, they will not help. Be supportive and review the team's work products during the Sprint timeline in which they are being developed. Don't expect to see a lot of charts for reviews and table tops and don't direct the team to do additional work or direct how it should be done. Look at the team Scrum boards to understand what is going on and help remove impediments. Staff the team's needs with permanent solutions and take Scrum training to understand, enable and support the changes. Finally don't see failing as bad, especially if we fail early and learn from it.","PeriodicalId":138871,"journal":{"name":"2017 Annual Reliability and Maintainability Symposium (RAMS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134125447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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