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بررسي اثر ضخامت زيرلايه بر جذب تك لايه هاي TMDC در ناحيه طول موج مرئي
Pub Date : 2018-11-06 DOI: 10.30473/JPHYS.2018.5562
Ensiyeh Mohebbi, Narges Ansari, F. Ghorbani
با (TMDC) لایه هاي دوبعدي ديکالکوجنایدهاي فلزات واسطه گافهاي نواري مستقیم، افق جدیدي در کاربري این مواد در فوتونیک و الکترواپتیک ایجاد کرده است. وجود گاف نواري باعث جذب اپتیکی چشمگیر این لایه ها در دستگاههاي فوتوولتاییک میشود. قرارگیري این لایه ها روي زیرلایه به علت بازتابهاي متوالی، بر طیف جذب اثر و یا ترکیب آنها به عنوان Si یا SiO میگذارد. به طور متداول، از 2 زیرلایه براي این تک لایه ها استفاده میشود. در این مقاله با استفاده از شامل TMDC روش ماتریس انتقال، طیف جذب تک لایههاي و یا Si یا SiO با حضور زیرلایۀ 2 WS و 2 MoS2،WSe2 ،MoSe2 بررسی شد. SiO با ضخامتهاي مختلف لایۀ 2 SiO2/Si دوتایی در زیرلایۀ دوتایی به عنوان ضخامت SiO ضخامت 90 نانومتر لایۀ 2 بهینه انتخاب شد؛ چرا که روند کلی جذب را تغییر نمیدهد و باعث افزایش جذب در بعضی نواحی طول موجی میشود.
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引用次数: 0
Inhibition of the transport of a Bose-Einstein condensate in a 1D random potential 一维随机势中玻色-爱因斯坦凝聚体输运的抑制
Pub Date : 2005-09-23 DOI: 10.1142/9789812701473_0025
J. Retter, A. Varon, D. Cl'ement, M. Hugbart, P. Bouyer, L. Sanchez-Palencia, D. Gangardt, G. Shlyapnikov, A. Aspect
J. A. RETTER, A. F. VARON, D. CLEMENT, M. HUGBART, P. BOUYER, L. SANCHEZ-PALENCIA, D. GANGARDT, G. V. SHLYAPNIKOV, AND A. ASPECT Laboratoire Charles Fabry de l’Institut d’Optique, Universite Paris-Sud XI, 91403 Orsay cedex, France. Laboratoire de Physique Theorique et Modeles Statistiques, Universite Paris-Sud XI, 91405 Orsay cedex, France. Van der Waals-Zeeman Institute, University of Amsterdam, Valckenierstraat 65/67, 1018 XE Amsterdam, The Netherlands.
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引用次数: 0
SCANNING TRANSMISSION X-RAY MICROSCOPY WITH A SEGMENTED DETECTOR 带分段检测器的扫描透射x射线显微镜
Pub Date : 2003-03-01 DOI: 10.1051/jp4:20030138
M. Feser, C. Jacobsen, P. Řehák, G. Degeronimo
A segmented silicon detector has been developed for the Stony Brook soft x-ray scanning transmission x-ray microscope. The detector combines good detective quantum efficiency (90% at 520 e' and low noise (5 photons/ channel/ integration at 520 eV) with the ability of having up to 10 independent sensitive regions that are matched to the microscope geometry. In addition to the usual bright field images, differential phase contrast images and dark field images are recorded simultaneously in one scan. A Fourier filtering method has been employed to recover an estimate of the sample absorption and phase shift from the partially coherent images collected on the detector segments. 'A reconstruction of a Germanium test pattern exhibits good agreement between the predictions from the tabulated x-ray optical constants and the experiment.
为石溪软x射线扫描透射x射线显微镜研制了一种分段式硅探测器。该探测器结合了良好的探测量子效率(在520e '时达到90%)和低噪声(在520ev时达到5个光子/通道/集成),并具有多达10个与显微镜几何形状匹配的独立敏感区域的能力。除了通常的明场图像外,差相对比图像和暗场图像在一次扫描中同时记录。采用傅里叶滤波方法从检测器段上收集的部分相干图像中恢复样品吸收和相移的估计值。锗测试图的重建显示了x射线光学常数和实验预测之间的良好一致性。
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引用次数: 39
STXM imaging with a configured detector STXM成像与配置检测器
Pub Date : 2003-03-01 DOI: 10.1051/JP4:20030141
G. Morrison, W. Eaton, R. Barrett, P. Charalambous
The use of a segmented, transmitted-x-ray detector in the scanning transmission x-ray microscope (STXM) allows a number of different image modes to be realised simultaneously, from a single scan of the specimen. A software-configurable detector system that is based on an 80x80-element CCD array has been tested using the STXM on ID21 at the ESRF. The whole CCD sub-system is controlled by software running on a PC, which handles the synchronisation of image data collection with the raster scan of the STXM, and returns a real-time image signal to the STXM control system, while storing a 3-D set of image data locally on the detector control PC. The readout electronics allow full CCD frames to be recorded in under 10ms for each pixel in the STXM image, so there is no significant time penalty associated with the collection of such a large volume of image data, when compared to STXM imaging with a single-element detector. Subsequent processing allows any appropriate image signals to be synthesised, and the user can quickly be presented with absorption, phase contrast, and darkfield images, all in perfect registration, to facilitate a rapid quantitative interpretation of the sample structure.
在扫描透射x射线显微镜(STXM)中使用分段,透射x射线检测器允许同时实现许多不同的图像模式,从单个标本扫描。一种基于80x80元CCD阵列的软件可配置探测器系统已经在ESRF的ID21上使用STXM进行了测试。整个CCD子系统由运行在PC机上的软件控制,该软件处理图像数据采集与STXM光栅扫描的同步,并将实时图像信号返回到STXM控制系统,同时将一组三维图像数据本地存储在探测器控制PC机上。读出电子器件允许在不到10ms的时间内记录STXM图像中的每个像素的完整CCD帧,因此与使用单元件检测器的STXM成像相比,收集如此大量的图像数据没有明显的时间损失。后续处理允许合成任何适当的图像信号,并且用户可以快速呈现吸收,相衬和暗场图像,所有这些都是完美配准的,以促进样品结构的快速定量解释。
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引用次数: 29
Twinmic: A European twin microscope station combining full-field imaging and scanning microscopy Twinmic:欧洲双显微镜站,结合了全视野成像和扫描显微镜
Pub Date : 2003-03-01 DOI: 10.1051/JP4:200300039
B. Kaulich, D. Bacescu, D. Cocco, J. Susini, M. Salomé, O. Dhez, C. David, T. Weitkamp, E. Fabrizio, S. Cabrini, G. Morrison, P. Charalambous, J. Thieme, T. Wilhein, J. Kovac, M. Podnar, M. Kiskinova
The two types of X-ray microscopes, scanning and full-field imaging, have different but complementary capabilities in term of image acquisition and spectroscopies. The novel approach used for the first time in the EU RT&D project Twinmic (HPRI-CT-2001-50024) aims at building of a multipurpose end-station combining scanning and full-field imaging microscopes with easy switch between the two modes. The twin microscope is expected to achieve the state-of-art performance of both microscopy modes in fast imaging, tomography and spectroscopy (μ-XANES/XRF), allowing new class of experiments in exploration of heterogeneous phenomena of the matter at mesoscopic length scales.
扫描和全场成像这两种类型的x射线显微镜在图像采集和光谱方面具有不同但互补的能力。这种新方法首次用于欧盟研发项目Twinmic (hpr - ct -2001-50024),旨在建立一个多用途终端站,结合扫描和全视野成像显微镜,并在两种模式之间轻松切换。双显微镜有望在快速成像、断层扫描和光谱(μ-XANES/XRF)两种显微镜模式中实现最先进的性能,允许在介观长度尺度上探索物质的异质现象的新型实验。
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引用次数: 15
Wavefront shaping optics for laser-generated plasma heating 用于激光等离子体加热的波前整形光学
Pub Date : 2003-03-01 DOI: 10.1051/JP4:200300044
A. K. Powell, Z. Laczik, S. Pfauntsch, D. Chana, A. Michette
The use of pupil plane phase masks provides a useful and efficient method of manipulating focal region light distributions. Such masks have found application in the telecommunication sector, including the use of Fourier plane replicating holograms for weighted beamlet array generation for the addressing of optoelectronic devices. Rather than modifying the focal pattern at the focal plane, the through focus intensity distribution may also be controlled with an appropriately designed phase mask. In a high numerical aperture optical system, as is used for laser generated plasma X-ray sources, such phase mask can extend the depth of focus of the irradiating laser beam, to achieve more uniform plasma heating and consequently, a better shot-to-shot repeatability from the X-ray source.
使用瞳孔平面相位掩模提供了一个有用的和有效的方法来操纵焦点区域的光分布。这种掩模已经在电信领域得到了应用,包括使用傅立叶平面复制全息图来产生加权波束阵列,用于光电器件的寻址。而不是改变焦平面上的焦模式,也可以通过一个适当设计的相位掩模来控制通过聚焦强度分布。在高数值孔径光学系统中,如用于激光产生的等离子体x射线源,这种相位掩模可以延长辐照激光束的聚焦深度,以实现更均匀的等离子体加热,从而获得更好的x射线源的弹间重复性。
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引用次数: 0
Novel microstructured adaptive X-ray optics 新型微结构自适应x射线光学
Pub Date : 2003-03-01 DOI: 10.1051/JP4:200300080
A. Michette, P. Prewett, A. K. Powell, S. Pfauntsch, K. Atkinson, B. Boonliang
Advances in the techniques of micro- and nano-fabrication mean that it is now possible to design and make microstructured optical arrays (MOAs). Due to greater flexibility in the choice of channel geometry and layout, these offer much better performances than current grazing incidence optics, which are limited to circular, square or close-packed hexagonal channels. In addition, MOAs can have built-in adaptivity and controllable focal length - they can therefore act as zoom lenses. Potential applications include x-ray microprobing, EUV lithography and confocal x-ray microscopy.
微纳米制造技术的进步意味着现在可以设计和制造微结构光学阵列(MOAs)。由于通道几何形状和布局的选择更大的灵活性,这些提供了比目前的掠入射光学器件更好的性能,后者仅限于圆形,方形或紧密排列的六边形通道。此外,moa还具有内置的自适应能力和可控制的焦距——因此它们可以充当变焦镜头。潜在的应用包括x射线微探测,EUV光刻和共聚焦x射线显微镜。
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引用次数: 16
Optique non-linéaire et chiralité [Nonlinear optics and chirality] Optique non- lin<s:1> et chiralit<e:1>[非线性光学与手性]
Pub Date : 2002-01-01 DOI: 10.1051/JP420020099
M. Schanne-Klein, H. Weisman, A. Gotzendorfer, F. Hache
Nous etudions les proprietes physiques des molecules chirales en etendant les techniques d'optique non-lineaire aux effets chiroptiques pour ainsi mesurer une "activite optique non-lineaire". La generation de second harmonique en surface est particulierement sensible a la chiralite moleculaire, avec des rotations de polarisation du second harmonique et des differences circulaires et lineaires tres importantes. Pour comprendre l'origine physique de ces effets chiroptiques, nous generalisons les principaux modeles microscopiques de chiralite aux effets non-lineaires d'ordre deux et montrons qu'une chiralite a un electron n'a pas la meme signature a l'ordre deux qu'une chiralite par couplage excitonique. Des experiences avec des molecules test pour ces deux types de chiralite montrent un bon accord avec ces modelisations theoriques.
我们通过将非线性光学技术扩展到手性效应来研究手性分子的物理特性,从而测量“非线性光学活动”。表面二阶谐波的产生对分子手性特别敏感,二阶谐波的极化旋转和非常大的圆形和线性差异。为了理解这些手性效应的物理起源,我们将手性的主要微观模型推广到非线性的二阶效应,并表明具有一个电子的手性与兴奋耦合手性具有不同的二阶特征。用这两种手性石的测试分子进行的实验表明,这些理论模型很好地吻合。
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引用次数: 0
On the Isotropic-Nematic Transition for Polymers in Liquid Crystals 液晶中聚合物的各向同性向列跃迁
Pub Date : 1992-03-01 DOI: 10.1051/JP1:1992142
L. Balents, R. Kamien, P. Doussal, E. Zaslow
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引用次数: 2
Fluctuation effect on the incommensurate transition of quartz 石英不相称转变的波动效应
Pub Date : 1991-07-01 DOI: 10.1051/JP1:1991189
P. Borckmans, G. Dewel
In the mean field description of the incommensurate transition of quartz, the triangular 3-q, the striped I-q and the fl phases meet at the same critical point. It is shown that critical fluctuations lift this degeneracy and transform the second order transition into first order ones. Furthermore, there is a regime of the parameter space where the I-q phase should appear between the fl and 3-q phases, even in the absence of any applied stress, as seen in recent experiments.
在石英不相称相变的平均场描述中,三角形的3-q相、条纹的I-q相和fl相在同一临界点相遇。结果表明,临界波动解除了这种简并并将二阶跃迁转化为一阶跃迁。此外,在参数空间中,即使在没有任何施加应力的情况下,I-q相也应该出现在fl和3-q相之间,如最近的实验所示。
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引用次数: 2
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Journal De Physique
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