Pub Date : 2024-03-21DOI: 10.1107/s1600576724001390
Roberts, E.J., Chavez, T., Hexemer, A., Zwart, P.H.
{"title":"DLSIA: Deep Learning for Scientific Image Analysis","authors":"Roberts, E.J., Chavez, T., Hexemer, A., Zwart, P.H.","doi":"10.1107/s1600576724001390","DOIUrl":"https://doi.org/10.1107/s1600576724001390","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"34 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140198284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-15DOI: 10.1107/s1600576723008282
Hsieh, B., Wu, L.-C., Grosjean, A.
{"title":"FlɛX: a computer vision program to evaluate strain in flexible crystals","authors":"Hsieh, B., Wu, L.-C., Grosjean, A.","doi":"10.1107/s1600576723008282","DOIUrl":"https://doi.org/10.1107/s1600576723008282","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"23 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140153183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-15DOI: 10.1107/s1600576724001171
Schumi-Mareček, D., Bertram, F., Mikulík, P., Varshney, D., Novák, J., Kowarik, S.
{"title":"Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating","authors":"Schumi-Mareček, D., Bertram, F., Mikulík, P., Varshney, D., Novák, J., Kowarik, S.","doi":"10.1107/s1600576724001171","DOIUrl":"https://doi.org/10.1107/s1600576724001171","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"241 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140153181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-23DOI: 10.1107/s1600576724000682
Kardoost, A., Schönherr, R., Deiter, C., Redecke, L., Lorenzen, K., Schulz, J., de Diego, I.
{"title":"Convolutional neural network approach for the automated identification of in cellulo crystals","authors":"Kardoost, A., Schönherr, R., Deiter, C., Redecke, L., Lorenzen, K., Schulz, J., de Diego, I.","doi":"10.1107/s1600576724000682","DOIUrl":"https://doi.org/10.1107/s1600576724000682","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"2 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139968155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-23DOI: 10.1107/s160057672400089x
Kaganer, V.M.
{"title":"X-ray diffraction from dislocation half-loops in epitaxial films","authors":"Kaganer, V.M.","doi":"10.1107/s160057672400089x","DOIUrl":"https://doi.org/10.1107/s160057672400089x","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"34 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139967821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-16DOI: 10.1107/s1600576724000311
Barnett, M.J., Kingston, R.L.
{"title":"A note on the Hendrickson–Lattman phase probability distribution and its equivalence to the generalized von Mises distribution","authors":"Barnett, M.J., Kingston, R.L.","doi":"10.1107/s1600576724000311","DOIUrl":"https://doi.org/10.1107/s1600576724000311","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"51 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139921654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-16DOI: 10.1107/s1600576724000554
Shtender, V., Cedervall, J., Ek, G., Zlotea, C., Andersson, M.S., Manuel, P., Sahlberg, M., Häussermann, U.
{"title":"Revisiting the hydrogenation behavior of NdGa and its hydride phases","authors":"Shtender, V., Cedervall, J., Ek, G., Zlotea, C., Andersson, M.S., Manuel, P., Sahlberg, M., Häussermann, U.","doi":"10.1107/s1600576724000554","DOIUrl":"https://doi.org/10.1107/s1600576724000554","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"19 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139921846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-16DOI: 10.1107/s1600576724000657
Konovalov, O., Rein, V., Saedi, M., Groot, I.M.N., Renaud, G., Jankowski, M.
{"title":"Tripling of the scattering vector range of X-ray reflectivity on liquid surfaces using a double-crystal deflector","authors":"Konovalov, O., Rein, V., Saedi, M., Groot, I.M.N., Renaud, G., Jankowski, M.","doi":"10.1107/s1600576724000657","DOIUrl":"https://doi.org/10.1107/s1600576724000657","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":"141 1","pages":""},"PeriodicalIF":6.1,"publicationDate":"2024-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139921764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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