Pub Date : 2024-03-26DOI: 10.1107/s160057672400147x
Rahmani, V., Nawaz, S., Pennicard, D., Graafsma, H.
{"title":"Robust image descriptor for machine learning based data reduction in serial crystallography","authors":"Rahmani, V., Nawaz, S., Pennicard, D., Graafsma, H.","doi":"10.1107/s160057672400147x","DOIUrl":"https://doi.org/10.1107/s160057672400147x","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-03-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140315767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-21DOI: 10.1107/s1600576724001614
Tan, X., Bourgeois, L., Nakashima, P.N.H.
{"title":"Observations of specimen morphology effects on near-zone-axis convergent-beam electron diffraction patterns","authors":"Tan, X., Bourgeois, L., Nakashima, P.N.H.","doi":"10.1107/s1600576724001614","DOIUrl":"https://doi.org/10.1107/s1600576724001614","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140198153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-21DOI: 10.1107/s1600576724001390
Roberts, E.J., Chavez, T., Hexemer, A., Zwart, P.H.
{"title":"DLSIA: Deep Learning for Scientific Image Analysis","authors":"Roberts, E.J., Chavez, T., Hexemer, A., Zwart, P.H.","doi":"10.1107/s1600576724001390","DOIUrl":"https://doi.org/10.1107/s1600576724001390","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-03-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140198284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-15DOI: 10.1107/s1600576723008282
Hsieh, B., Wu, L.-C., Grosjean, A.
{"title":"FlɛX: a computer vision program to evaluate strain in flexible crystals","authors":"Hsieh, B., Wu, L.-C., Grosjean, A.","doi":"10.1107/s1600576723008282","DOIUrl":"https://doi.org/10.1107/s1600576723008282","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140153183","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-03-15DOI: 10.1107/s1600576724001171
Schumi-Mareček, D., Bertram, F., Mikulík, P., Varshney, D., Novák, J., Kowarik, S.
{"title":"Millisecond X-ray reflectometry and neural network analysis: unveiling fast processes in spin coating","authors":"Schumi-Mareček, D., Bertram, F., Mikulík, P., Varshney, D., Novák, J., Kowarik, S.","doi":"10.1107/s1600576724001171","DOIUrl":"https://doi.org/10.1107/s1600576724001171","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140153181","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-23DOI: 10.1107/s1600576724000682
Kardoost, A., Schönherr, R., Deiter, C., Redecke, L., Lorenzen, K., Schulz, J., de Diego, I.
{"title":"Convolutional neural network approach for the automated identification of in cellulo crystals","authors":"Kardoost, A., Schönherr, R., Deiter, C., Redecke, L., Lorenzen, K., Schulz, J., de Diego, I.","doi":"10.1107/s1600576724000682","DOIUrl":"https://doi.org/10.1107/s1600576724000682","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139968155","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-23DOI: 10.1107/s160057672400089x
Kaganer, V.M.
{"title":"X-ray diffraction from dislocation half-loops in epitaxial films","authors":"Kaganer, V.M.","doi":"10.1107/s160057672400089x","DOIUrl":"https://doi.org/10.1107/s160057672400089x","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139967821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-02-16DOI: 10.1107/s1600576724000311
Barnett, M.J., Kingston, R.L.
{"title":"A note on the Hendrickson–Lattman phase probability distribution and its equivalence to the generalized von Mises distribution","authors":"Barnett, M.J., Kingston, R.L.","doi":"10.1107/s1600576724000311","DOIUrl":"https://doi.org/10.1107/s1600576724000311","url":null,"abstract":"","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-02-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139921654","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：