Pub Date : 2024-08-30eCollection Date: 2024-10-01DOI: 10.1107/S1600576724006368
Johan Bylin, Vassilios Kapaklis, Gunnar K Pálsson
This article demonstrates the feasibility of obtaining accurate pair distribution functions of thin amorphous films down to 80 nm, using modern laboratory-based X-ray sources. The pair distribution functions are obtained using a single diffraction scan without the requirement of additional scans of the substrate or of the air. By using a crystalline substrate combined with an oblique scattering geometry, most of the Bragg scattering of the substrate is avoided, rendering the substrate Compton scattering the primary contribution. By utilizing a discriminating energy filter, available in the latest generation of modern detectors, it is demonstrated that the Compton intensity can further be reduced to negligible levels at higher wavevector values. Scattering from the sample holder and the air is minimized by the systematic selection of pixels in the detector image based on the projected detection footprint of the sample and the use of a 3D-printed sample holder. Finally, X-ray optical effects in the absorption factors and the ratios between the Compton intensity of the substrate and film are taken into account by using a theoretical tool that simulates the electric field inside the film and the substrate, which aids in planning both the sample design and the measurement protocol.
这篇文章展示了利用现代实验室 X 射线源获取小至 80 纳米非晶薄膜的精确线对分布函数的可行性。利用单次衍射扫描即可获得线对分布函数,无需对基底或空气进行额外扫描。通过使用晶体基底和斜向散射几何形状,避免了基底的大部分布拉格散射,从而使基底康普顿散射成为主要贡献。通过利用最新一代现代探测器中的辨别能量滤波器,可以证明在较高的波矢值下,康普顿强度可以进一步降低到可以忽略不计的水平。根据样品的预测探测足迹系统地选择探测器图像中的像素,并使用三维打印样品支架,可以最大限度地减少来自样品支架和空气的散射。最后,通过使用模拟薄膜和基片内部电场的理论工具,考虑了基片和薄膜的吸收因子和康普顿强度比中的 X 射线光学效应,这有助于规划样品设计和测量方案。
{"title":"Determining pair distribution functions of thin films using laboratory-based X-ray sources.","authors":"Johan Bylin, Vassilios Kapaklis, Gunnar K Pálsson","doi":"10.1107/S1600576724006368","DOIUrl":"10.1107/S1600576724006368","url":null,"abstract":"<p><p>This article demonstrates the feasibility of obtaining accurate pair distribution functions of thin amorphous films down to 80 nm, using modern laboratory-based X-ray sources. The pair distribution functions are obtained using a single diffraction scan without the requirement of additional scans of the substrate or of the air. By using a crystalline substrate combined with an oblique scattering geometry, most of the Bragg scattering of the substrate is avoided, rendering the substrate Compton scattering the primary contribution. By utilizing a discriminating energy filter, available in the latest generation of modern detectors, it is demonstrated that the Compton intensity can further be reduced to negligible levels at higher wavevector values. Scattering from the sample holder and the air is minimized by the systematic selection of pixels in the detector image based on the projected detection footprint of the sample and the use of a 3D-printed sample holder. Finally, X-ray optical effects in the absorption factors and the ratios between the Compton intensity of the substrate and film are taken into account by using a theoretical tool that simulates the electric field inside the film and the substrate, which aids in planning both the sample design and the measurement protocol.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-08-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11460393/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142390697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-27eCollection Date: 2024-10-01DOI: 10.1107/S1600576724007295
Xaver Simon Brems, Sebastian Mühlbauer, Robert Cubitt
Small-angle neutron scattering is a widely used technique to study large-scale structures in bulk samples. The largest accessible length scale in conventional Bragg scattering is determined by the combination of the longest available neutron wavelength and smallest resolvable scattering angle. A method is presented that circumvents this limitation and is able to extract larger length scales from the low-q power-law scattering using a modification of the well known Porod law connecting the scattered intensity of randomly distributed objects to their specific surface area. It is shown that in the special case of a highly aligned domain structure the specific surface area extracted from the modified Porod law can be used to determine specific length scales of the domain structure. The analysis method is applied to study the micrometre-sized domain structure found in the intermediate mixed state of the superconductor niobium. The analysis approach allows the range of accessible length scales to be extended from 1 µm to up to 40 µm using a conventional small-angle neutron scattering setup.
{"title":"Pushing the limits of accessible length scales via a modified Porod analysis in small-angle neutron scattering on ordered systems.","authors":"Xaver Simon Brems, Sebastian Mühlbauer, Robert Cubitt","doi":"10.1107/S1600576724007295","DOIUrl":"10.1107/S1600576724007295","url":null,"abstract":"<p><p>Small-angle neutron scattering is a widely used technique to study large-scale structures in bulk samples. The largest accessible length scale in conventional Bragg scattering is determined by the combination of the longest available neutron wavelength and smallest resolvable scattering angle. A method is presented that circumvents this limitation and is able to extract larger length scales from the low-<i>q</i> power-law scattering using a modification of the well known Porod law connecting the scattered intensity of randomly distributed objects to their specific surface area. It is shown that in the special case of a highly aligned domain structure the specific surface area extracted from the modified Porod law can be used to determine specific length scales of the domain structure. The analysis method is applied to study the micrometre-sized domain structure found in the intermediate mixed state of the superconductor niobium. The analysis approach allows the range of accessible length scales to be extended from 1 µm to up to 40 µm using a conventional small-angle neutron scattering setup.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11460384/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142390734","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-27eCollection Date: 2024-10-01DOI: 10.1107/S1600576724007246
A Magerl, H Lemmel, M Appel, M Weisser, U Kretzer, M Zobel
The Q resolution in Bonse-Hart double-crystal diffractometers is determined for a given Bragg angle by the value of the crystallographic structure factor. To date, the reflections Si 220 or Si 111 have been used exclusively in neutron scattering, which provide resolutions for triple-bounce crystals of about 2 × 10-5 Å-1 (FWHM). The Darwin width of the GaAs 200 reflection is about a factor of 10 smaller, offering the possibility of a Q resolution of 2 × 10-6 Å-1 provided crystals of sufficient quality are available. This article reports a feasibility study with single-bounce GaAs 200, yielding a Q resolution of 4.6 × 10-6 Å-1, six times superior in comparison with a Si 220 setup.
{"title":"The promise of GaAs 200 in small-angle neutron scattering for higher resolution.","authors":"A Magerl, H Lemmel, M Appel, M Weisser, U Kretzer, M Zobel","doi":"10.1107/S1600576724007246","DOIUrl":"10.1107/S1600576724007246","url":null,"abstract":"<p><p>The <i>Q</i> resolution in Bonse-Hart double-crystal diffractometers is determined for a given Bragg angle by the value of the crystallographic structure factor. To date, the reflections Si 220 or Si 111 have been used exclusively in neutron scattering, which provide resolutions for triple-bounce crystals of about 2 × 10<sup>-5</sup> Å<sup>-1</sup> (FWHM). The Darwin width of the GaAs 200 reflection is about a factor of 10 smaller, offering the possibility of a <i>Q</i> resolution of 2 × 10<sup>-6</sup> Å<sup>-1</sup> provided crystals of sufficient quality are available. This article reports a feasibility study with single-bounce GaAs 200, yielding a <i>Q</i> resolution of 4.6 × 10<sup>-6</sup> Å<sup>-1</sup>, six times superior in comparison with a Si 220 setup.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-08-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11460398/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142390737","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-19eCollection Date: 2024-10-01DOI: 10.1107/S1600576724006113
T D Turner, C O'Shaughnessy, X He, M A Levenstein, L Hunter, J Wojciechowski, H Bristowe, R Stone, C C Wilson, A Florence, K Robertson, N Kapur, F C Meldrum
Characterization of crystallization processes in situ is of great importance to furthering knowledge of how nucleation and growth processes direct the assembly of organic and inorganic materials in solution and, critically, understanding the influence that these processes have on the final physico-chemical properties of the resulting solid form. With careful specification and design, as demonstrated here, it is now possible to bring combined X-ray diffraction and Raman spectroscopy, coupled to a range of fully integrated segmented and continuous flow platforms, to the laboratory environment for in situ data acquisition for timescales of the order of seconds. The facility used here (Flow-Xl) houses a diffractometer with a micro-focus Cu Kα rotating anode X-ray source and a 2D hybrid photon-counting detector, together with a Raman spectrometer with 532 and 785 nm lasers. An overview of the diffractometer and spectrometer setup is given, and current sample environments for flow crystallization are described. Commissioning experiments highlight the sensitivity of the two instruments for time-resolved in situ data collection of samples in flow. Finally, an example case study to monitor the batch crystallization of sodium sulfate from aqueous solution, by tracking both the solute and solution phase species as a function of time, highlights the applicability of such measurements in determining the kinetics associated with crystallization processes. This work illustrates that the Flow-Xl facility provides high-resolution time-resolved in situ structural phase information through diffraction data together with molecular-scale solution data through spectroscopy, which allows crystallization mechanisms and their associated kinetics to be analysed in a laboratory setting.
原位结晶过程的表征对于进一步了解成核和生长过程如何指导溶液中有机和无机材料的组装,以及对于了解这些过程对所形成的固体形式的最终物理化学性质的影响至关重要。正如本文所展示的,通过精心的规范和设计,现在可以将 X 射线衍射和拉曼光谱结合到一系列完全集成的分段和连续流动平台上,在实验室环境中以秒为单位进行现场数据采集。这里使用的设备(Flow-Xl)包括一台配有微焦点 Cu Kα 旋转阳极 X 射线源和二维混合光子计数探测器的衍射仪,以及一台配有 532 和 785 纳米激光器的拉曼光谱仪。报告概述了衍射仪和光谱仪的设置,并介绍了当前用于流动结晶的样品环境。调试实验强调了两台仪器在流动样品的时间分辨原位数据收集方面的灵敏度。最后,通过对溶质和溶液相物种随时间变化的跟踪,介绍了监测水溶液中硫酸钠批量结晶的案例研究,强调了此类测量在确定结晶过程相关动力学方面的适用性。这项工作表明,Flow-Xl 设备可通过衍射数据提供高分辨率的时间分辨原位结构相信息,并通过光谱学提供分子尺度的溶液数据,从而可在实验室环境中分析结晶机制及其相关动力学。
{"title":"Flow-Xl: a new facility for the analysis of crystallization in flow systems.","authors":"T D Turner, C O'Shaughnessy, X He, M A Levenstein, L Hunter, J Wojciechowski, H Bristowe, R Stone, C C Wilson, A Florence, K Robertson, N Kapur, F C Meldrum","doi":"10.1107/S1600576724006113","DOIUrl":"10.1107/S1600576724006113","url":null,"abstract":"<p><p>Characterization of crystallization processes <i>in situ</i> is of great importance to furthering knowledge of how nucleation and growth processes direct the assembly of organic and inorganic materials in solution and, critically, understanding the influence that these processes have on the final physico-chemical properties of the resulting solid form. With careful specification and design, as demonstrated here, it is now possible to bring combined X-ray diffraction and Raman spectroscopy, coupled to a range of fully integrated segmented and continuous flow platforms, to the laboratory environment for <i>in situ</i> data acquisition for timescales of the order of seconds. The facility used here (Flow-Xl) houses a diffractometer with a micro-focus Cu <i>K</i>α rotating anode X-ray source and a 2D hybrid photon-counting detector, together with a Raman spectrometer with 532 and 785 nm lasers. An overview of the diffractometer and spectrometer setup is given, and current sample environments for flow crystallization are described. Commissioning experiments highlight the sensitivity of the two instruments for time-resolved <i>in situ</i> data collection of samples in flow. Finally, an example case study to monitor the batch crystallization of sodium sulfate from aqueous solution, by tracking both the solute and solution phase species as a function of time, highlights the applicability of such measurements in determining the kinetics associated with crystallization processes. This work illustrates that the Flow-Xl facility provides high-resolution time-resolved <i>in situ</i> structural phase information through diffraction data together with molecular-scale solution data through spectroscopy, which allows crystallization mechanisms and their associated kinetics to be analysed in a laboratory setting.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11460381/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142390700","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-19eCollection Date: 2024-10-01DOI: 10.1107/S1600576724007179
Ksenia Matveevskii, Konstantin V Nikolaev, Roberto Fallica, Detlef Beckers, Milen Gateshki, Alexander Kharchenko, Bart Spanjer, Alexander Rogachev, Sergey Yakunin, Marcelo Ackermann, Igor A Makhotkin
The increasing structural complexity and downscaling of modern nanodevices require continuous development of structural characterization techniques that support R&D and manufacturing processes. This work explores the capability of laboratory characterization of periodic planar nanostructures using 3D X-ray standing waves as a promising method for reconstructing atomic profiles of planar nanostructures. The non-destructive nature of this metrology technique makes it highly versatile and particularly suitable for studying various types of samples. Moreover, it eliminates the need for additional sample preparation before use and can achieve sub-nanometre reconstruction resolution using widely available laboratory setups, as demonstrated on a diffractometer equipped with a microfocus X-ray tube with a copper anode.
现代纳米器件的结构日益复杂,规模不断缩小,因此需要不断开发结构表征技术,以支持研发和制造过程。这项研究探索了利用三维 X 射线驻波对周期性平面纳米结构进行实验室表征的能力,将其作为重建平面纳米结构原子轮廓的一种有前途的方法。这种计量技术的非破坏性使其用途非常广泛,尤其适合研究各种类型的样品。此外,它无需在使用前进行额外的样品制备,并能利用广泛可用的实验室设备实现亚纳米级的重建分辨率,这一点已在配备了铜阳极微焦 X 射线管的衍射仪上进行了演示。
{"title":"Laboratory-based 3D X-ray standing-wave analysis of nanometre-scale gratings.","authors":"Ksenia Matveevskii, Konstantin V Nikolaev, Roberto Fallica, Detlef Beckers, Milen Gateshki, Alexander Kharchenko, Bart Spanjer, Alexander Rogachev, Sergey Yakunin, Marcelo Ackermann, Igor A Makhotkin","doi":"10.1107/S1600576724007179","DOIUrl":"10.1107/S1600576724007179","url":null,"abstract":"<p><p>The increasing structural complexity and downscaling of modern nanodevices require continuous development of structural characterization techniques that support R&D and manufacturing processes. This work explores the capability of laboratory characterization of periodic planar nanostructures using 3D X-ray standing waves as a promising method for reconstructing atomic profiles of planar nanostructures. The non-destructive nature of this metrology technique makes it highly versatile and particularly suitable for studying various types of samples. Moreover, it eliminates the need for additional sample preparation before use and can achieve sub-nanometre reconstruction resolution using widely available laboratory setups, as demonstrated on a diffractometer equipped with a microfocus X-ray tube with a copper anode.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11460397/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142390701","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-19eCollection Date: 2024-10-01DOI: 10.1107/S1600576724006794
Phung Nhu Hao Vu, Andrzej P Radlinski, Tomasz Blach, Ralf Schweins, Hartmut Lemmel, John Daniels, Klaus Regenauer-Lieb
Geological formations provide a promising environment for the long-term and short-term storage of gases, including carbon dioxide, hydrogen and hydro-carbons, controlled by the rock-specific small-scale pore structure. This study investigates the nanoscale structure and gas uptake in a highly porous silica aerogel (a synthetic proxy for natural rocks) using transmission electron microscopy, X-ray diffraction, and small-angle and ultra-small-angle neutron scattering with a tracer of deuterated methane (CD4) at pressures up to 1000 bar. The results show that the adsorption of CD4 in the porous silica matrix is scale dependent. The pore space of the silica aerogel is fully accessible to the invading gas, which quickly equilibrates with the external pressure and shows no condensation on the sub-nanometre scale. In the 2.5-50 nm pore size region a classical two-phase adsorption behaviour is observed. The structure of the aerogel returns to its original state after the CD4 pressure has been released.
{"title":"Revealing nanoscale sorption mechanisms of gases in a highly porous silica aerogel.","authors":"Phung Nhu Hao Vu, Andrzej P Radlinski, Tomasz Blach, Ralf Schweins, Hartmut Lemmel, John Daniels, Klaus Regenauer-Lieb","doi":"10.1107/S1600576724006794","DOIUrl":"10.1107/S1600576724006794","url":null,"abstract":"<p><p>Geological formations provide a promising environment for the long-term and short-term storage of gases, including carbon dioxide, hydrogen and hydro-carbons, controlled by the rock-specific small-scale pore structure. This study investigates the nanoscale structure and gas uptake in a highly porous silica aerogel (a synthetic proxy for natural rocks) using transmission electron microscopy, X-ray diffraction, and small-angle and ultra-small-angle neutron scattering with a tracer of deuterated methane (CD<sub>4</sub>) at pressures up to 1000 bar. The results show that the adsorption of CD<sub>4</sub> in the porous silica matrix is scale dependent. The pore space of the silica aerogel is fully accessible to the invading gas, which quickly equilibrates with the external pressure and shows no condensation on the sub-nanometre scale. In the 2.5-50 nm pore size region a classical two-phase adsorption behaviour is observed. The structure of the aerogel returns to its original state after the CD<sub>4</sub> pressure has been released.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11460400/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142390735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-08-19eCollection Date: 2024-10-01DOI: 10.1107/S1600576724006897
Koki Yamada, Natsuki Akaishi, Kohei Yatabe, Yuki Takayama
Ptychography is a powerful computational imaging technique with microscopic imaging capability and adaptability to various specimens. To obtain an imaging result, it requires a phase-retrieval algorithm whose performance directly determines the imaging quality. Recently, deep neural network (DNN)-based phase retrieval has been proposed to improve the imaging quality from the ordinary model-based iterative algorithms. However, the DNN-based methods have some limitations because of the sensitivity to changes in experimental conditions and the difficulty of collecting enough measured specimen images for training the DNN. To overcome these limitations, a ptychographic phase-retrieval algorithm that combines model-based and DNN-based approaches is proposed. This method exploits a DNN-based denoiser to assist an iterative algorithm like ePIE in finding better reconstruction images. This combination of DNN and iterative algorithms allows the measurement model to be explicitly incorporated into the DNN-based approach, improving its robustness to changes in experimental conditions. Furthermore, to circumvent the difficulty of collecting the training data, it is proposed that the DNN-based denoiser be trained without using actual measured specimen images but using a formula-driven supervised approach that systemically generates synthetic images. In experiments using simulation based on a hard X-ray ptychographic measurement system, the imaging capability of the proposed method was evaluated by comparing it with ePIE and rPIE. These results demonstrated that the proposed method was able to reconstruct higher-spatial-resolution images with half the number of iterations required by ePIE and rPIE, even for data with low illumination intensity. Also, the proposed method was shown to be robust to its hyperparameters. In addition, the proposed method was applied to ptychographic datasets of a Simens star chart and ink toner particles measured at SPring-8 BL24XU, which confirmed that it can successfully reconstruct images from measurement scans with a lower overlap ratio of the illumination regions than is required by ePIE and rPIE.
{"title":"Ptychographic phase retrieval via a deep-learning-assisted iterative algorithm.","authors":"Koki Yamada, Natsuki Akaishi, Kohei Yatabe, Yuki Takayama","doi":"10.1107/S1600576724006897","DOIUrl":"10.1107/S1600576724006897","url":null,"abstract":"<p><p>Ptychography is a powerful computational imaging technique with microscopic imaging capability and adaptability to various specimens. To obtain an imaging result, it requires a phase-retrieval algorithm whose performance directly determines the imaging quality. Recently, deep neural network (DNN)-based phase retrieval has been proposed to improve the imaging quality from the ordinary model-based iterative algorithms. However, the DNN-based methods have some limitations because of the sensitivity to changes in experimental conditions and the difficulty of collecting enough measured specimen images for training the DNN. To overcome these limitations, a ptychographic phase-retrieval algorithm that combines model-based and DNN-based approaches is proposed. This method exploits a DNN-based denoiser to assist an iterative algorithm like ePIE in finding better reconstruction images. This combination of DNN and iterative algorithms allows the measurement model to be explicitly incorporated into the DNN-based approach, improving its robustness to changes in experimental conditions. Furthermore, to circumvent the difficulty of collecting the training data, it is proposed that the DNN-based denoiser be trained without using actual measured specimen images but using a formula-driven supervised approach that systemically generates synthetic images. In experiments using simulation based on a hard X-ray ptychographic measurement system, the imaging capability of the proposed method was evaluated by comparing it with ePIE and rPIE. These results demonstrated that the proposed method was able to reconstruct higher-spatial-resolution images with half the number of iterations required by ePIE and rPIE, even for data with low illumination intensity. Also, the proposed method was shown to be robust to its hyperparameters. In addition, the proposed method was applied to ptychographic datasets of a Simens star chart and ink toner particles measured at SPring-8 BL24XU, which confirmed that it can successfully reconstruct images from measurement scans with a lower overlap ratio of the illumination regions than is required by ePIE and rPIE.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-08-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11460392/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"142390733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-31eCollection Date: 2024-08-01DOI: 10.1107/S1600576724004175
Wojciech A Sławiński, Christopher J Kerr, Yuanpeng Zhang, Helen Y Playford, Martin T Dove, Anthony E Phillips, Matthew G Tucker
This work introduces a completely rewritten version of the program RMCProfile (version 7), big-box, reverse Monte Carlo modelling software for analysis of total scattering data. The major new feature of RMCProfile7 is the ability to refine multiple phases simultaneously, which is relevant for many current research areas such as energy materials, catalysis and engineering. Other new features include improved support for molecular potentials and rigid-body refinements, as well as multiple different data sets. An empirical resolution correction and calculation of the pair distribution function as a back-Fourier transform are now also available. RMCProfile7 is freely available for download at https://rmcprofile.ornl.gov/.
{"title":"<i>RMCProfile7</i>: reverse Monte Carlo for multiphase systems.","authors":"Wojciech A Sławiński, Christopher J Kerr, Yuanpeng Zhang, Helen Y Playford, Martin T Dove, Anthony E Phillips, Matthew G Tucker","doi":"10.1107/S1600576724004175","DOIUrl":"10.1107/S1600576724004175","url":null,"abstract":"<p><p>This work introduces a completely rewritten version of the program <i>RMCProfile</i> (version 7), big-box, reverse Monte Carlo modelling software for analysis of total scattering data. The major new feature of <i>RMCProfile7</i> is the ability to refine multiple phases simultaneously, which is relevant for many current research areas such as energy materials, catalysis and engineering. Other new features include improved support for molecular potentials and rigid-body refinements, as well as multiple different data sets. An empirical resolution correction and calculation of the pair distribution function as a back-Fourier transform are now also available. <i>RMCProfile7</i> is freely available for download at https://rmcprofile.ornl.gov/.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-07-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11299618/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141897500","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-29eCollection Date: 2024-08-01DOI: 10.1107/S1600576724005028
Krishna Prasad Khakurel, Gabriel Žoldák, Borislav Angelov, Jakob Andreasson
With the emergence of ultrafast X-ray sources, interest in following fast processes in small molecules and macromolecules has increased. Most of the current research into ultrafast structural dynamics of macromolecules uses X-ray free-electron lasers. In parallel, small-scale laboratory-based laser-driven ultrafast X-ray sources are emerging. Continuous development of these sources is underway, and as a result many exciting applications are being reported. However, because of their low flux, such sources are not commonly used to study the structural dynamics of macromolecules. This article examines the feasibility of time-resolved powder diffraction of macromolecular microcrystals using a laboratory-scale laser-driven ultrafast X-ray source.
随着超快 X 射线源的出现,人们对跟踪小分子和大分子中快速过程的兴趣与日俱增。目前对大分子超快结构动力学的研究大多使用 X 射线自由电子激光器。与此同时,基于实验室的小型激光驱动超快 X 射线源也在不断涌现。这些光源正在不断开发中,因此许多令人兴奋的应用也被报道出来。然而,由于其通量较低,这类光源并不常用于研究大分子结构动力学。本文探讨了使用实验室规模的激光驱动超快 X 射线源对大分子微晶体进行时间分辨粉末衍射的可行性。
{"title":"On the feasibility of time-resolved X-ray powder diffraction of macromolecules using laser-driven ultrafast X-ray sources.","authors":"Krishna Prasad Khakurel, Gabriel Žoldák, Borislav Angelov, Jakob Andreasson","doi":"10.1107/S1600576724005028","DOIUrl":"10.1107/S1600576724005028","url":null,"abstract":"<p><p>With the emergence of ultrafast X-ray sources, interest in following fast processes in small molecules and macromolecules has increased. Most of the current research into ultrafast structural dynamics of macromolecules uses X-ray free-electron lasers. In parallel, small-scale laboratory-based laser-driven ultrafast X-ray sources are emerging. Continuous development of these sources is underway, and as a result many exciting applications are being reported. However, because of their low flux, such sources are not commonly used to study the structural dynamics of macromolecules. This article examines the feasibility of time-resolved powder diffraction of macromolecular microcrystals using a laboratory-scale laser-driven ultrafast X-ray source.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11299613/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141897473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-07-29eCollection Date: 2024-08-01DOI: 10.1107/S1600576724005624
Martin A Karlsen, Jonas Billet, Songsheng Tao, Isabel Van Driessche, Simon J L Billinge, Dorthe B Ravnsbæk
Structural modelling of operando pair distribution function (PDF) data of complex functional materials can be highly challenging. To aid the understanding of complex operando PDF data, this article demonstrates a toolbox for PDF analysis. The tools include denoising using principal component analysis together with the structureMining, similarityMapping and nmfMapping apps available through the online service 'PDF in the cloud' (PDFitc, https://pdfitc.org/). The toolbox is used for both ex situ and operando PDF data for 3 nm TiO2-bronze nanocrystals, which function as the active electrode material in a Li-ion battery. The tools enable structural modelling of the ex situ and operando PDF data, revealing two pristine TiO2 phases (bronze and anatase) and two lithiated Li x TiO2 phases (lithiated versions of bronze and anatase), and the phase evolution during galvanostatic cycling is characterized.
对复杂功能材料的操作数对分布函数(PDF)数据进行结构建模极具挑战性。为了帮助理解复杂的操作数对分布函数数据,本文展示了一个 PDF 分析工具箱。工具包括利用主成分分析法进行去噪,以及通过在线服务 "云中的 PDF"(PDFitc,https://pdfitc.org/)提供的 structureMining、similarityMapping 和 nmfMapping 应用程序。该工具箱适用于 3 nm TiO2-青铜纳米晶体的原位和操作 PDF 数据,该晶体是锂离子电池的活性电极材料。该工具可对原位和运行状态下的 PDF 数据进行结构建模,揭示出两种原始 TiO2 相(青铜相和锐钛矿相)和两种锂化 Li x TiO2 相(青铜相和锐钛矿相的锂化版本),并对电静力循环过程中的相演化进行表征。
{"title":"<i>Operando</i> pair distribution function analysis of nanocrystalline functional materials: the case of TiO<sub>2</sub>-bronze nanocrystals in Li-ion battery electrodes.","authors":"Martin A Karlsen, Jonas Billet, Songsheng Tao, Isabel Van Driessche, Simon J L Billinge, Dorthe B Ravnsbæk","doi":"10.1107/S1600576724005624","DOIUrl":"10.1107/S1600576724005624","url":null,"abstract":"<p><p>Structural modelling of <i>operando</i> pair distribution function (PDF) data of complex functional materials can be highly challenging. To aid the understanding of complex <i>operando</i> PDF data, this article demonstrates a toolbox for PDF analysis. The tools include denoising using principal component analysis together with the <i>structureMining</i>, <i>similarityMapping</i> and <i>nmfMapping</i> apps available through the online service 'PDF in the cloud' (<i>PDFitc</i>, https://pdfitc.org/). The toolbox is used for both <i>ex situ</i> and <i>operando</i> PDF data for 3 nm TiO<sub>2</sub>-bronze nanocrystals, which function as the active electrode material in a Li-ion battery. The tools enable structural modelling of the <i>ex situ</i> and <i>operando</i> PDF data, revealing two pristine TiO<sub>2</sub> phases (bronze and anatase) and two lithiated Li <sub><i>x</i></sub> TiO<sub>2</sub> phases (lithiated versions of bronze and anatase), and the phase evolution during galvanostatic cycling is characterized.</p>","PeriodicalId":14950,"journal":{"name":"Journal of Applied Crystallography","volume":null,"pages":null},"PeriodicalIF":6.1,"publicationDate":"2024-07-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC11299615/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141899351","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}