Pub Date : 2010-06-25DOI: 10.1109/STYSW.2010.5714159
J. Domaradzki, D. Wojcieszak, K. Sieradzka, Jolanta Huk, B. Adamiak, D. Kaczmarek, D. Stoga
Examples of ARCs designed for ophthalmic lenses and solar cells applications are presented. It have been shown, that for a conventional silicon solar cell a single TiO2 thin film allows to reduce the silicon surface reflection to less than 3%. In case of optical lenses, fabricated from a crown glass, few examples of single and multilayer systems with different layers arrangement have been presented and discussed.
{"title":"Designing of antireflection coatings for optical lenses and solar cells","authors":"J. Domaradzki, D. Wojcieszak, K. Sieradzka, Jolanta Huk, B. Adamiak, D. Kaczmarek, D. Stoga","doi":"10.1109/STYSW.2010.5714159","DOIUrl":"https://doi.org/10.1109/STYSW.2010.5714159","url":null,"abstract":"Examples of ARCs designed for ophthalmic lenses and solar cells applications are presented. It have been shown, that for a conventional silicon solar cell a single TiO2 thin film allows to reduce the silicon surface reflection to less than 3%. In case of optical lenses, fabricated from a crown glass, few examples of single and multilayer systems with different layers arrangement have been presented and discussed.","PeriodicalId":160376,"journal":{"name":"2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131305408","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-06-25DOI: 10.1109/STYSW.2010.5714173
B. Gornicka, K. Sieradzka
The nanocomposite has been prepared on the basis of the siliconized polyester impregnating varnish added with nanosilica by using the own patented method. The properties of the nanocomposited and standard varnishes were determined and compared. A clear increase of bond strength and thermal endurance was found although the most improved property have appeared the resistance to partial discharges under pulse voltage 20 kHz/1.1 kV. While the pure varnish lifetime was only 5 minutes, after adding of nanosilica no failure appeared even after 100 hours. Other polyester varnishes modified earlier by us with nanosilica have also shoved improved durability but the lifetimes reached only about 100 minutes. It is to be supposed that the kind of a base polymer is the matter. The siliconized polyester varnish with nanosilica shows much better resistance to partial discharges than unsiliconized one.
{"title":"Characterization of impregnating varnish with silica nanofiller","authors":"B. Gornicka, K. Sieradzka","doi":"10.1109/STYSW.2010.5714173","DOIUrl":"https://doi.org/10.1109/STYSW.2010.5714173","url":null,"abstract":"The nanocomposite has been prepared on the basis of the siliconized polyester impregnating varnish added with nanosilica by using the own patented method. The properties of the nanocomposited and standard varnishes were determined and compared. A clear increase of bond strength and thermal endurance was found although the most improved property have appeared the resistance to partial discharges under pulse voltage 20 kHz/1.1 kV. While the pure varnish lifetime was only 5 minutes, after adding of nanosilica no failure appeared even after 100 hours. Other polyester varnishes modified earlier by us with nanosilica have also shoved improved durability but the lifetimes reached only about 100 minutes. It is to be supposed that the kind of a base polymer is the matter. The siliconized polyester varnish with nanosilica shows much better resistance to partial discharges than unsiliconized one.","PeriodicalId":160376,"journal":{"name":"2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"82 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128234108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-06-25DOI: 10.1109/STYSW.2010.5714161
G. Halek, I. Baikie, H. Teterycz
In this paper we present the relative work function measurements of Platinum (Pt), Molybdenum (Mo), Lead (Pb), and Graphite (C) by using Kelvin Probe. The obtained results have shown that the work function measurements made in air are affected by the adsorption of oxygen. To measure the “true” metal work function the oxide layer has to be removed. Moreover in the experiments we measured the work function changes of a platinum sample after mechanically cleaning of the surface and exposure to air. The decrease in the work function leads to the conclusion that a positive outwards dipole layer on the surface is created.
{"title":"Surface investigation by using a Scanning Kelvin Probe","authors":"G. Halek, I. Baikie, H. Teterycz","doi":"10.1109/STYSW.2010.5714161","DOIUrl":"https://doi.org/10.1109/STYSW.2010.5714161","url":null,"abstract":"In this paper we present the relative work function measurements of Platinum (Pt), Molybdenum (Mo), Lead (Pb), and Graphite (C) by using Kelvin Probe. The obtained results have shown that the work function measurements made in air are affected by the adsorption of oxygen. To measure the “true” metal work function the oxide layer has to be removed. Moreover in the experiments we measured the work function changes of a platinum sample after mechanically cleaning of the surface and exposure to air. The decrease in the work function leads to the conclusion that a positive outwards dipole layer on the surface is created.","PeriodicalId":160376,"journal":{"name":"2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127302818","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2010-06-01DOI: 10.1109/STYSW.2010.5714174
K. Sieradzka, D. Wojcieszak, D. Kaczmarek, J. Domaradzki, E. Prociów, M. Mazur, T. Berlicki
In this work optical and structural properties of vanadium (V) oxides in comparison with their structure have been presented. Thin films were deposited on silica substrates by plasma enhanced reactive magnetron sputtering process. After deposition manufactured films were annealed at 400 °C in order to form V2O5 structure. Optical transmission measurements have shown that as-deposited film was not transparent in visible light range and transparency was increasing in longer wavelength (in NIR range). Additional annealing at 400 °C results in increase of transparency range in VIS and in NIR range. Annealing also shifted absorption edge λcut off in to the shorter wavelength from about 750 nm to 500 nm. Investigation of the structure performed with the aid of Raman spectroscopy have revealed that as-deposited film was amorphous, while annealing results in recrystalization of the structure and forming V2O5 phase.
{"title":"Optical and structural properties of V2O5 thin films","authors":"K. Sieradzka, D. Wojcieszak, D. Kaczmarek, J. Domaradzki, E. Prociów, M. Mazur, T. Berlicki","doi":"10.1109/STYSW.2010.5714174","DOIUrl":"https://doi.org/10.1109/STYSW.2010.5714174","url":null,"abstract":"In this work optical and structural properties of vanadium (V) oxides in comparison with their structure have been presented. Thin films were deposited on silica substrates by plasma enhanced reactive magnetron sputtering process. After deposition manufactured films were annealed at 400 °C in order to form V2O5 structure. Optical transmission measurements have shown that as-deposited film was not transparent in visible light range and transparency was increasing in longer wavelength (in NIR range). Additional annealing at 400 °C results in increase of transparency range in VIS and in NIR range. Annealing also shifted absorption edge λcut off in to the shorter wavelength from about 750 nm to 500 nm. Investigation of the structure performed with the aid of Raman spectroscopy have revealed that as-deposited film was amorphous, while annealing results in recrystalization of the structure and forming V2O5 phase.","PeriodicalId":160376,"journal":{"name":"2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2010-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116037586","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/aem2c.2010.5578800
{"title":"Covers page","authors":"","doi":"10.1109/aem2c.2010.5578800","DOIUrl":"https://doi.org/10.1109/aem2c.2010.5578800","url":null,"abstract":"","PeriodicalId":160376,"journal":{"name":"2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116688284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICME.2007.4284559
S. Swarup
Conference Chair: Johanna Rothman ‐ Rothman Consulting Group Inc, USA Program Chair: Ahmed Sidky ‐ TenPearls, USA/Middle East Publication Chair: Philippe Kruchten ‐ University of British Columbia, Canada In these proceedings: Telling Our Stories ‐ Experience Report Producer: Steve Adolph, WSA Consulting, Canada Assistant Producer: Geoff Hewson, Software Productivity Center, Canada Research Producer: Yael Dubinsky, IBM Haifa Research Lab, Israel Assistant Producer: Tore Dybå, SINTEF, Norway and Philippe Kruchten, University of British Columbia, Canada Research Program Committee Pekka Abrahamsson, University of Helsinki, Finland Steve Adolph, WSA Consulting Inc., Canada Pär Ågerfalk, Uppsala Univ., Sweden Scott Ambler, IBM Rational, Canada James Arthur, Virginia Tech., USA David Avison, ESSEC Business School, France Hubert Baumeister, Technical University of Denmark, Denmark Robert Biddle, Carleton University, Canada Stefan Biffl, Technische Universität Wien, Austria Anna Borjesson, Ericsson, Sweden Joseph Chao, Bowling Green State University, USA Jim Coplien, Nordija A/S, Denmark Daniela Cruzes, Fraunhofer CESE, USA Ernesto Damiani, University of Milan, Italy Alain Desilets, National Research Council, Canada Torgeir Dingsøyr, SINTEF ICT, Norway
{"title":"Organizing committee","authors":"S. Swarup","doi":"10.1109/ICME.2007.4284559","DOIUrl":"https://doi.org/10.1109/ICME.2007.4284559","url":null,"abstract":"Conference Chair: Johanna Rothman ‐ Rothman Consulting Group Inc, USA Program Chair: Ahmed Sidky ‐ TenPearls, USA/Middle East Publication Chair: Philippe Kruchten ‐ University of British Columbia, Canada In these proceedings: Telling Our Stories ‐ Experience Report Producer: Steve Adolph, WSA Consulting, Canada Assistant Producer: Geoff Hewson, Software Productivity Center, Canada Research Producer: Yael Dubinsky, IBM Haifa Research Lab, Israel Assistant Producer: Tore Dybå, SINTEF, Norway and Philippe Kruchten, University of British Columbia, Canada Research Program Committee Pekka Abrahamsson, University of Helsinki, Finland Steve Adolph, WSA Consulting Inc., Canada Pär Ågerfalk, Uppsala Univ., Sweden Scott Ambler, IBM Rational, Canada James Arthur, Virginia Tech., USA David Avison, ESSEC Business School, France Hubert Baumeister, Technical University of Denmark, Denmark Robert Biddle, Carleton University, Canada Stefan Biffl, Technische Universität Wien, Austria Anna Borjesson, Ericsson, Sweden Joseph Chao, Bowling Green State University, USA Jim Coplien, Nordija A/S, Denmark Daniela Cruzes, Fraunhofer CESE, USA Ernesto Damiani, University of Milan, Italy Alain Desilets, National Research Council, Canada Torgeir Dingsøyr, SINTEF ICT, Norway","PeriodicalId":160376,"journal":{"name":"2010 International Students and Young Scientists Workshop \"Photonics and Microsystems\"","volume":"71 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133007084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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