Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710116
C. Schuhmacher, P. Johnson
The Department of Defense is promulgating the use of commercial standards and open system principles with regard to ATE acquisitions. This paper describes a strategy being used to adopt commercial standards into a test system architecture based on open system principles. Technology specific ATS can be derived from this general ATS architecture and retain the benefits expressed at the general level. The architecture will promote costs savings in three areas: component interchangeability, Test Program Set (TPS) transportability, and test data exchange.
{"title":"Adoption of commercial standards in an open system architecture for test system design","authors":"C. Schuhmacher, P. Johnson","doi":"10.1109/NAECON.1998.710116","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710116","url":null,"abstract":"The Department of Defense is promulgating the use of commercial standards and open system principles with regard to ATE acquisitions. This paper describes a strategy being used to adopt commercial standards into a test system architecture based on open system principles. Technology specific ATS can be derived from this general ATS architecture and retain the benefits expressed at the general level. The architecture will promote costs savings in three areas: component interchangeability, Test Program Set (TPS) transportability, and test data exchange.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123120439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710199
P. Wilsey, D.E. Martin, H. Hirsch
The SAVANT project is a joint program between the Air Force, MTL Systems, Inc. and the University of Cincinnati to develop a VHDL analyzer that is freely redistributable for noncommercial use. The goal is to facilitate the insertion of VHDL technology into the government, industrial, and university research and development programs. The analyzer validates the correctness of the input VHDL and builds an intermediate representation in memory for manipulation by backend analysis tools (e.g., behavioral synthesis, fault modeling, and simulation code generators). The intermediate (called AIRE/CE) is well-documented, in review for standardization, and in use by other commercial vendors. The SAVANT technology is freely available in source code form and, under separate programs, the University of Cincinnati is also developing a backend code generator and simulation kernel so that complete front-to-back analysis and simulation activities can be performed with nearly free software.
{"title":"The SAVANT project","authors":"P. Wilsey, D.E. Martin, H. Hirsch","doi":"10.1109/NAECON.1998.710199","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710199","url":null,"abstract":"The SAVANT project is a joint program between the Air Force, MTL Systems, Inc. and the University of Cincinnati to develop a VHDL analyzer that is freely redistributable for noncommercial use. The goal is to facilitate the insertion of VHDL technology into the government, industrial, and university research and development programs. The analyzer validates the correctness of the input VHDL and builds an intermediate representation in memory for manipulation by backend analysis tools (e.g., behavioral synthesis, fault modeling, and simulation code generators). The intermediate (called AIRE/CE) is well-documented, in review for standardization, and in use by other commercial vendors. The SAVANT technology is freely available in source code form and, under separate programs, the University of Cincinnati is also developing a backend code generator and simulation kernel so that complete front-to-back analysis and simulation activities can be performed with nearly free software.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131642669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710165
A. Pinsky
We have applied techniques, developed previously (1997), to samples of track measurements and have obtained decision rule that are asymptotically close to decision rule characteristics (probability of false objects generation is not greater than any given significance level, and possibility to omit existing objects decreases with increase of observation time). The recursive computation algorithm that implements the above decision rule is developed, and objects location estimates are also obtained at every time step.
{"title":"Statistical approach to track-to-track association problem","authors":"A. Pinsky","doi":"10.1109/NAECON.1998.710165","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710165","url":null,"abstract":"We have applied techniques, developed previously (1997), to samples of track measurements and have obtained decision rule that are asymptotically close to decision rule characteristics (probability of false objects generation is not greater than any given significance level, and possibility to omit existing objects decreases with increase of observation time). The recursive computation algorithm that implements the above decision rule is developed, and objects location estimates are also obtained at every time step.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128884351","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-13DOI: 10.1109/NAECON.1998.710187
A. Cherri, N.I. Khachab
A simple one-step fully-parallel high-radix signed-digit arithmetic is proposed for parallel optical computing based on new joint spatial encodings. The high-radix signed-digit arithmetic operations are based on classifying the neighboring input digit pairs into various groups in order to reduce the computation rules. A new joint spatial encoding technique is developed to present both the operands and the computation rules. This technique increases the spatial bandwidth product (SBWP) of the spatial light modulators (SLM) of the system. It will be shown that our one-step TSD and QSD arithmetic units are much simpler and better than all previously reported high-radix signed-digit techniques.
{"title":"One-step high-radix signed-digit arithmetic units based on classified joint spatial encoding","authors":"A. Cherri, N.I. Khachab","doi":"10.1109/NAECON.1998.710187","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710187","url":null,"abstract":"A simple one-step fully-parallel high-radix signed-digit arithmetic is proposed for parallel optical computing based on new joint spatial encodings. The high-radix signed-digit arithmetic operations are based on classifying the neighboring input digit pairs into various groups in order to reduce the computation rules. A new joint spatial encoding technique is developed to present both the operands and the computation rules. This technique increases the spatial bandwidth product (SBWP) of the spatial light modulators (SLM) of the system. It will be shown that our one-step TSD and QSD arithmetic units are much simpler and better than all previously reported high-radix signed-digit techniques.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"1055 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113994900","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-07-01DOI: 10.1109/NAECON.1998.710126
B. Tsao, S. F. Carr, J. Weimer
Thin PZT film is being developed for use in microelectronics, electromechanical and optoelectronic applications. Thin Pb(ZrTi)O/sub 3/ film capacitor devices were fabricated using RF sputtering techniques. The multiple-layer configuration of Si/SiO/sub 2//Ti/Pd or Pt was used as the substrate and bottom electrode. The top electrode was either Pd or Pt. At room temperature, the typical dissipation factor of this PZT film capacitor was 0.083 at 1 kHz. These PZT film capacitors had a parallel resistance of 1.15 mega-ohm. The film capacitor has an energy storage density of 0.023 /spl mu/F/cm/sup 2/. With the thickness of the film being 12,000 /spl Aring/, the dielectric constant was calculated to be 32. The insulation resistance was 138 giga-ohm. The resistivity was calculated to be 8.1/spl times/10/sup 10/ ohm-cm. These film capacitors were tested at 50 volts and the corresponding leakage current was at 1/spl times/x10/sup -5/ amp/cm/sup 2/. The breakdown strength at this stage was 4.2/spl times/10/sup 5/ V/cm. Annealing at 400/spl deg/C increased the value of the dielectric constant about 38%. The dissipation factor was decreased to 0.023 at 1 kHz. The parallel resistance increased from 1.15 to 3.01 mega-ohm. The insulation resistance after annealing was increased to 2180 giga-ohm. The resistivity was increased to 1.28/spl times/10/sup 13/ ohm-cm. The energy storage density of this film capacitor was increased from 0.023 to 0.031 /spl mu/F/cm/sup 2/. These film capacitors produced to-date had little dependence on frequency from 400 Hz to 100 kHz. The PZT sample with a thickness of 4.2 /spl mu/m exhibited a dielectric constant of 107 before annealing and 354 after annealed at 600/spl deg/C. The dissipation factor was reduced from 0.12 to 0.015 before and after annealing at 600/spl deg/C.
{"title":"Lead zirconate titanate (PZT) film capacitor with a multilayer construction","authors":"B. Tsao, S. F. Carr, J. Weimer","doi":"10.1109/NAECON.1998.710126","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710126","url":null,"abstract":"Thin PZT film is being developed for use in microelectronics, electromechanical and optoelectronic applications. Thin Pb(ZrTi)O/sub 3/ film capacitor devices were fabricated using RF sputtering techniques. The multiple-layer configuration of Si/SiO/sub 2//Ti/Pd or Pt was used as the substrate and bottom electrode. The top electrode was either Pd or Pt. At room temperature, the typical dissipation factor of this PZT film capacitor was 0.083 at 1 kHz. These PZT film capacitors had a parallel resistance of 1.15 mega-ohm. The film capacitor has an energy storage density of 0.023 /spl mu/F/cm/sup 2/. With the thickness of the film being 12,000 /spl Aring/, the dielectric constant was calculated to be 32. The insulation resistance was 138 giga-ohm. The resistivity was calculated to be 8.1/spl times/10/sup 10/ ohm-cm. These film capacitors were tested at 50 volts and the corresponding leakage current was at 1/spl times/x10/sup -5/ amp/cm/sup 2/. The breakdown strength at this stage was 4.2/spl times/10/sup 5/ V/cm. Annealing at 400/spl deg/C increased the value of the dielectric constant about 38%. The dissipation factor was decreased to 0.023 at 1 kHz. The parallel resistance increased from 1.15 to 3.01 mega-ohm. The insulation resistance after annealing was increased to 2180 giga-ohm. The resistivity was increased to 1.28/spl times/10/sup 13/ ohm-cm. The energy storage density of this film capacitor was increased from 0.023 to 0.031 /spl mu/F/cm/sup 2/. These film capacitors produced to-date had little dependence on frequency from 400 Hz to 100 kHz. The PZT sample with a thickness of 4.2 /spl mu/m exhibited a dielectric constant of 107 before annealing and 354 after annealed at 600/spl deg/C. The dissipation factor was reduced from 0.12 to 0.015 before and after annealing at 600/spl deg/C.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1998-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122931707","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/NAECON.1998.710141
M.S. Pellazar
{"title":"Vehicle Route Planning With Constraints Using Genetic Algorithms","authors":"M.S. Pellazar","doi":"10.1109/NAECON.1998.710141","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710141","url":null,"abstract":"","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126114276","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/NAECON.1998.710101
J. A. Petersen
{"title":"A High Speed Digital Translating-Recording System","authors":"J. A. Petersen","doi":"10.1109/NAECON.1998.710101","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710101","url":null,"abstract":"","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"204 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126034669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/NAECON.1998.710103
L. Setzer
{"title":"Pictorial Computers for Air Navigation","authors":"L. Setzer","doi":"10.1109/NAECON.1998.710103","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710103","url":null,"abstract":"","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131281688","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/NAECON.1998.710114
W. Athas
{"title":"Design Considerations for Airborne Low Light Level Weapon Delivery System","authors":"W. Athas","doi":"10.1109/NAECON.1998.710114","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710114","url":null,"abstract":"","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128275846","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/NAECON.1998.710134
J. Langenderfer, R.A. Ehret
Common RF environment components are needed to reduce duplicative efforts, provide consistent results as well as provide the legacy for the next generation of RF modeling systems. The components are based on algorithms which have been proven formally and informally over many years by the professional judgement of skilled analysts. The algorithms have provided the core environment modeling and simulation support to many acquisition and operational programs DOD wide through their use in the Advanced Low Altitude Radar Model (ALARM), the Enhanced Surface-to-Air Missile Simulation (ESAMS), and the Radar Guided Guns Simulation (RADGUNS). Algorithms ape grouped into the following components based on their functionality: antenna, clutter, propagation (atmospheric attenuation, diffraction, refraction, and multipath), and terrain.
{"title":"Common RF environment algorithms for radar analysis: joint bottom up development based on legacy models","authors":"J. Langenderfer, R.A. Ehret","doi":"10.1109/NAECON.1998.710134","DOIUrl":"https://doi.org/10.1109/NAECON.1998.710134","url":null,"abstract":"Common RF environment components are needed to reduce duplicative efforts, provide consistent results as well as provide the legacy for the next generation of RF modeling systems. The components are based on algorithms which have been proven formally and informally over many years by the professional judgement of skilled analysts. The algorithms have provided the core environment modeling and simulation support to many acquisition and operational programs DOD wide through their use in the Advanced Low Altitude Radar Model (ALARM), the Enhanced Surface-to-Air Missile Simulation (ESAMS), and the Radar Guided Guns Simulation (RADGUNS). Algorithms ape grouped into the following components based on their functionality: antenna, clutter, propagation (atmospheric attenuation, diffraction, refraction, and multipath), and terrain.","PeriodicalId":202280,"journal":{"name":"Proceedings of the IEEE 1998 National Aerospace and Electronics Conference. NAECON 1998. Celebrating 50 Years (Cat. No.98CH36185)","volume":"224 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114157675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：