Accumulators composed of adders and registers are commonly used building blocks in general-purpose computing structures based on data-path architecture. The authors introduce a new accumulator-based compaction scheme for parallel compaction of test responses. The proposed scheme is compatible with the width of the data path, the hardware overhead is minimal, it does not introduce any performance degradation, and the compaction quality is the same as that offered by linear feedback shift registers.<>
{"title":"Accumulator-based compaction for built-in self test of data-path architectures","authors":"M. Kassab, J. Rajski, J. Tyszer","doi":"10.1109/ATS.1992.224401","DOIUrl":"https://doi.org/10.1109/ATS.1992.224401","url":null,"abstract":"Accumulators composed of adders and registers are commonly used building blocks in general-purpose computing structures based on data-path architecture. The authors introduce a new accumulator-based compaction scheme for parallel compaction of test responses. The proposed scheme is compatible with the width of the data path, the hardware overhead is minimal, it does not introduce any performance degradation, and the compaction quality is the same as that offered by linear feedback shift registers.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131316126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Yamazoe, M. Hashizume, E. Tasaka, T. Tamesada, T. Kayahara
A functional test method is proposed for production tests of microprocessor based sequence controllers. The method is based on process flowcharts, in which the operation sequences of sequence controlled machines are defined. The method is applied to a fault detection problem of a commercialized boiler control circuit and the effectiveness is checked.<>
{"title":"Functional testing with process flowcharts of microprocessor based sequence controllers","authors":"T. Yamazoe, M. Hashizume, E. Tasaka, T. Tamesada, T. Kayahara","doi":"10.1109/ATS.1992.224445","DOIUrl":"https://doi.org/10.1109/ATS.1992.224445","url":null,"abstract":"A functional test method is proposed for production tests of microprocessor based sequence controllers. The method is based on process flowcharts, in which the operation sequences of sequence controlled machines are defined. The method is applied to a fault detection problem of a commercialized boiler control circuit and the effectiveness is checked.<<ETX>>","PeriodicalId":208029,"journal":{"name":"Proceedings First Asian Test Symposium (ATS `92)","volume":"58 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1992-11-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133097459","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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