[This retracts the article DOI: 10.1155/2022/4987782.].
[This retracts the article DOI: 10.1155/2022/4987782.].
[This retracts the article DOI: 10.1155/2022/4105169.].
ZrNx films were deposited by DC magnetron sputtering with pure Zr target in different nitrogen partial pressure atmospheres (r = N2/[Ar + N2]). The structure and composition of the thin films were characterized as a function of r using scanning electron microscope, glancing angle X-ray diffraction, and X-ray photoelectron spectroscopy. The hardness, adhesive strength, and corrosion behavior of the coatings were measured by nanoindentation, microscratch, and potentiodynamic measurements in 3.5 wt% NaCl solution. The results show that the structure of the ZrNx films changes from a nearly stoichiometric ZrN with a typical columnar structure to mixed phases composited of ZrN and α-ZrNx with a dense glass structure as r increases from 12% to 50%. The mechanical properties including hardness, elastic modulus, and adhesion decrease with increasing r due to nonstoichiometric compound and glass phase structure of the coatings, while the dense glass structure significantly improves the corrosion inhibition.
[This retracts the article DOI: 10.1155/2022/6994017.].
[This retracts the article DOI: 10.1155/2022/2931686.].
[This retracts the article DOI: 10.1155/2022/8319082.].
[This retracts the article DOI: 10.1155/2022/2158181.].
[This retracts the article DOI: 10.1155/2022/4870548.].
This study describes important techniques for production of a series of video signals for use in fine focusing operations and near-perfect astigmatism correction in the general-purpose scanning electron microscopy (SEM) field. These techniques can enhance the stability of the signal greatly when used for focusing. As two particularly important fundamental techniques, SEM image acquisition with priority given to the signal-to-noise ratio and signal reinforcement based on the active image processing concept were utilized fully. The performance improvement was evaluated using the case of a previously reported support system for fine focusing and astigmatism correction based on image covariance. The method is almost completely robust against noise within practical limits and allows for focusing and astigmatism correction for even extremely noisy SEM images. The results of this study may be useful not only in the SEM field but also in many fields that use weak signals.
[This retracts the article DOI: 10.1155/2022/2663604.].
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