Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312099
H. El-kishky, R. Hebner, M. Abdel-Salam, F. Brown
In this paper, an approach to the design of nonlinear stress-grading systems of high voltage rotating machines at different frequencies is presented. The parameters of stress-grading systems are selected to minimize the local electric field enhancement at a set of discrete operating frequencies. The nonlinear stress-grading resistances are updated in response to the dynamic change of the local surface field compared to the desired average field. This development allowed fast and accurate design and analysis of nonlinear stress-grading systems with the deviation of the highest local field from the desired average field kept very low over a frequency range of up to 300 Hz. Simulation examples and several optimal stress-grading system characteristics are also presented.
{"title":"Minimization of local field enhancement along stress-grading systems of HV large rotating machines","authors":"H. El-kishky, R. Hebner, M. Abdel-Salam, F. Brown","doi":"10.1109/CEIDP.2006.312099","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312099","url":null,"abstract":"In this paper, an approach to the design of nonlinear stress-grading systems of high voltage rotating machines at different frequencies is presented. The parameters of stress-grading systems are selected to minimize the local electric field enhancement at a set of discrete operating frequencies. The nonlinear stress-grading resistances are updated in response to the dynamic change of the local surface field compared to the desired average field. This development allowed fast and accurate design and analysis of nonlinear stress-grading systems with the deviation of the highest local field from the desired average field kept very low over a frequency range of up to 300 Hz. Simulation examples and several optimal stress-grading system characteristics are also presented.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"449 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127658453","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312079
Y. Sekii, A. Taya, T. Maeno
To study the effects of antioxidants on space charge generation in XLPE and EPR, charge profiles in XLPE and EPR containing phenolic and sulfur type antioxidants were examined. Different charge profiles were detected in both materials containing different kinds of antioxidants. The authors discovered that a negative heterocharge is created near the positive electrode in the acetophenone-soaked XLPE containing sulfur type, or sulfur-containing phenolic, antioxidant. These results demonstrate that the heterocharge is created by the combined effect of acetophenone and a sulfur-containing antioxidant. This heterocharge creation is inferred to be caused by the combined effect of acetophenone and the species produced from antioxidants containing sulfur.
{"title":"Effect of Antioxidants on Space Charge Generation in Cross-linked Polyethylene and EPR","authors":"Y. Sekii, A. Taya, T. Maeno","doi":"10.1109/CEIDP.2006.312079","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312079","url":null,"abstract":"To study the effects of antioxidants on space charge generation in XLPE and EPR, charge profiles in XLPE and EPR containing phenolic and sulfur type antioxidants were examined. Different charge profiles were detected in both materials containing different kinds of antioxidants. The authors discovered that a negative heterocharge is created near the positive electrode in the acetophenone-soaked XLPE containing sulfur type, or sulfur-containing phenolic, antioxidant. These results demonstrate that the heterocharge is created by the combined effect of acetophenone and a sulfur-containing antioxidant. This heterocharge creation is inferred to be caused by the combined effect of acetophenone and the species produced from antioxidants containing sulfur.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127690649","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312063
M. Uttamlal, S. Falcoz, A. S. Holmes-Smith, D. Hepburn, B. Stewart, R. Fouracre
High voltage insulation failure can arise because of the physical and chemical properties of the material and intrinsic changes through use, aging and weathering. Overall aging is believed to produce localised defects and structural points which eventually fail under electrical stressing. This paper will present FT-IR and AFM evidence to show some of the chemical and physical changes in the insulating polymer, poly(oxy-1,4 phenylsulfonyl-1,4 phenylene) (PES) when subjected to short duration high voltage electric discharge activity in the air above the surface of the polymer film.
{"title":"Chemical and physical changes observed in poly(oxy-1,4 phenylsulfonyl-1,4 phenylene) following electrical stressing","authors":"M. Uttamlal, S. Falcoz, A. S. Holmes-Smith, D. Hepburn, B. Stewart, R. Fouracre","doi":"10.1109/CEIDP.2006.312063","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312063","url":null,"abstract":"High voltage insulation failure can arise because of the physical and chemical properties of the material and intrinsic changes through use, aging and weathering. Overall aging is believed to produce localised defects and structural points which eventually fail under electrical stressing. This paper will present FT-IR and AFM evidence to show some of the chemical and physical changes in the insulating polymer, poly(oxy-1,4 phenylsulfonyl-1,4 phenylene) (PES) when subjected to short duration high voltage electric discharge activity in the air above the surface of the polymer film.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121138626","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312101
S. S. Tezcan, M. Dincer, H. Hiziroglu
This study proposes artificial neural networks (ANN) to predict the breakdown voltages in N2 + SF6 gas mixtures. The proposed ANN consists of one input layer, two hidden layers and one output layer, which is essentially the predicted breakdown voltage. In order to train the ANN, the experimental data available in literature for N2 + SF6 have been used. When compared with the experimental data the average relative errors on predicted breakdown voltages are found to be less than plusmn5% for training as well as for testing in all cases using the proposed ANNs. Since the average errors are less than 5%, it is recommended to use the proposed ANNs to predict the breakdown voltages.
{"title":"Prediction of breakdown voltages in N2 + SF6 gas mixtures","authors":"S. S. Tezcan, M. Dincer, H. Hiziroglu","doi":"10.1109/CEIDP.2006.312101","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312101","url":null,"abstract":"This study proposes artificial neural networks (ANN) to predict the breakdown voltages in N2 + SF6 gas mixtures. The proposed ANN consists of one input layer, two hidden layers and one output layer, which is essentially the predicted breakdown voltage. In order to train the ANN, the experimental data available in literature for N2 + SF6 have been used. When compared with the experimental data the average relative errors on predicted breakdown voltages are found to be less than plusmn5% for training as well as for testing in all cases using the proposed ANNs. Since the average errors are less than 5%, it is recommended to use the proposed ANNs to predict the breakdown voltages.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121212515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312055
Yujie Hu, R.C. Smith, J. K. Nelson, L. Schadler
Improvements in the dielectric properties of composite dielectrics have been previously documented when the filler material used is reduced to nanometric dimensions. While the reasons for this have been traced to the physics and chemistry taking place at the interface, and dramatic changes in the magnitude and dynamics of the internal charge are also known to occur, a clear picture of the exact mechanisms taking place has not emerged. This contribution seeks to compare the direct voltage breakdown of composites formed from biphenyl epoxy resin and titanium dioxide in both nanometric and conventional micron-scale forms with that obtained under impulse voltage conditions. The same materials are subjected to an internal charge analysis using the pulsed electroacoustic technique which shows that, in the case of the nanomaterials, a marked homocharge is formed in front of the cathode which would suggest that the dramatic improvements in voltage endurance seen for these materials may be due to the shielding effect of this negative charge. The finding also suggests that the negative charge is formed as the result of scattering occurring in the nanodielectric which is not present to the same extent in the conventional counterpart.
{"title":"Some mechanistic understanding of the impulse strength of nanocomposites","authors":"Yujie Hu, R.C. Smith, J. K. Nelson, L. Schadler","doi":"10.1109/CEIDP.2006.312055","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312055","url":null,"abstract":"Improvements in the dielectric properties of composite dielectrics have been previously documented when the filler material used is reduced to nanometric dimensions. While the reasons for this have been traced to the physics and chemistry taking place at the interface, and dramatic changes in the magnitude and dynamics of the internal charge are also known to occur, a clear picture of the exact mechanisms taking place has not emerged. This contribution seeks to compare the direct voltage breakdown of composites formed from biphenyl epoxy resin and titanium dioxide in both nanometric and conventional micron-scale forms with that obtained under impulse voltage conditions. The same materials are subjected to an internal charge analysis using the pulsed electroacoustic technique which shows that, in the case of the nanomaterials, a marked homocharge is formed in front of the cathode which would suggest that the dramatic improvements in voltage endurance seen for these materials may be due to the shielding effect of this negative charge. The finding also suggests that the negative charge is formed as the result of scattering occurring in the nanodielectric which is not present to the same extent in the conventional counterpart.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126741054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312093
Jicai Hu, Z. Song, Jian-guo Ma, Shijing Wu
Mechanical galloping of overhead power transmission lines may cause flashover between lines and damage of insulator and tower. Existing models of galloping are not complete to simulate the galloping of three dimensional vibration coupling. In this paper, a three-degree of freedom model is suggested to account for the influences of environmental conditions, geometrical configurations and movement coupling properties. It can be deduced from the model that the power line galloping, with change of environmental conditions, may transit between activities of inertia coupling, vertical exciting and twisting inspiring, and the galloping amplitude is governed by the aerodynamic factors and coupling properties. The simulation results indicate that the galloping of transmission line can be limited by using air-flow-spoilers. The proposed model, simulation results and anti-galloping measures may be helpful for utilities to assess transmission line galloping performance and design of mitigating strategies.
{"title":"Model for comprehensive simulation of overhead high voltage power transmission line galloping and protection","authors":"Jicai Hu, Z. Song, Jian-guo Ma, Shijing Wu","doi":"10.1109/CEIDP.2006.312093","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312093","url":null,"abstract":"Mechanical galloping of overhead power transmission lines may cause flashover between lines and damage of insulator and tower. Existing models of galloping are not complete to simulate the galloping of three dimensional vibration coupling. In this paper, a three-degree of freedom model is suggested to account for the influences of environmental conditions, geometrical configurations and movement coupling properties. It can be deduced from the model that the power line galloping, with change of environmental conditions, may transit between activities of inertia coupling, vertical exciting and twisting inspiring, and the galloping amplitude is governed by the aerodynamic factors and coupling properties. The simulation results indicate that the galloping of transmission line can be limited by using air-flow-spoilers. The proposed model, simulation results and anti-galloping measures may be helpful for utilities to assess transmission line galloping performance and design of mitigating strategies.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127478286","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312112
F. Pontiga, A. Castellanos
The formation of nitrogen oxides and ozone by means of negative DC corona discharge have been experimentally investigated. The electrode discharge reactor consisted in a coaxial wire-to-cylinder electrode system and the species concentration were determined by using UV/VIS spectrophotometry. The measurements have shown that nitrous oxide (N2O) is the principal nitrogen oxide generated by the corona discharge.
{"title":"Nitrogen oxides generation induced by negative corona discharge in N2 + 02 mixtures","authors":"F. Pontiga, A. Castellanos","doi":"10.1109/CEIDP.2006.312112","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312112","url":null,"abstract":"The formation of nitrogen oxides and ozone by means of negative DC corona discharge have been experimentally investigated. The electrode discharge reactor consisted in a coaxial wire-to-cylinder electrode system and the species concentration were determined by using UV/VIS spectrophotometry. The measurements have shown that nitrous oxide (N2O) is the principal nitrogen oxide generated by the corona discharge.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125483984","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312030
J. Manceau, S. Bruyère, S. Jeannot, A. Sylvestre, P. Gonon
In this paper MIM (Metal-Insulator-Metal) Ta2O5 capacitor has been studied in term of dielectric relaxation over several thicknesses with a low frequency dielectric spectroscopy and current versus time measurement. A Maxwell-Wagner mechanism and resistance degradation has been identified. The resistance degradation follows the Space-Charge-Limited (SCL) theory. These two behaviours have the same activation energy and have been attributed to electrode polarisation mechanism created by mobile charges in the dielectric. Finally according to physical characterization the origin of these defects has been attributed to oxygen vacancies.
{"title":"Dielectric relaxation study in Tantalum Pentoxide capacitors","authors":"J. Manceau, S. Bruyère, S. Jeannot, A. Sylvestre, P. Gonon","doi":"10.1109/CEIDP.2006.312030","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312030","url":null,"abstract":"In this paper MIM (Metal-Insulator-Metal) Ta2O5 capacitor has been studied in term of dielectric relaxation over several thicknesses with a low frequency dielectric spectroscopy and current versus time measurement. A Maxwell-Wagner mechanism and resistance degradation has been identified. The resistance degradation follows the Space-Charge-Limited (SCL) theory. These two behaviours have the same activation energy and have been attributed to electrode polarisation mechanism created by mobile charges in the dielectric. Finally according to physical characterization the origin of these defects has been attributed to oxygen vacancies.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131898099","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.311924
Dong Limin, W. Peng
Nonthermal plasma techniques caused by high-voltage discharge have been a subject of investigation for pollution control and gas cleaning operations for the past decade. The ability to generate electrons with high energy levels at normal gas temperatures allows for the decomposition of background gas molecules and creates a reactive atmosphere and subsequent chemical processing. Modeling is playing an increasing vital role in process optimization and understanding of governing physical and chemical process. In this paper, chemical kinetics of the plasma-induced reactions is elucidated by chemical kinetics calculations. A reduced plasma chemistry model, in which radical reactions are selectively involved, is validated with experimental data. A qualitative model is resented which can explain the characteristic kinetics of the reactions in the plasma. The calculations indicate that the removal rate of NO increased with increasing water vapor and oxygen content in the flue gas indicating that OH radical is important for NO removal.
{"title":"Analysis on plasma chemistry in corona discharge process for NO removal using numerical simulations method","authors":"Dong Limin, W. Peng","doi":"10.1109/CEIDP.2006.311924","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.311924","url":null,"abstract":"Nonthermal plasma techniques caused by high-voltage discharge have been a subject of investigation for pollution control and gas cleaning operations for the past decade. The ability to generate electrons with high energy levels at normal gas temperatures allows for the decomposition of background gas molecules and creates a reactive atmosphere and subsequent chemical processing. Modeling is playing an increasing vital role in process optimization and understanding of governing physical and chemical process. In this paper, chemical kinetics of the plasma-induced reactions is elucidated by chemical kinetics calculations. A reduced plasma chemistry model, in which radical reactions are selectively involved, is validated with experimental data. A qualitative model is resented which can explain the characteristic kinetics of the reactions in the plasma. The calculations indicate that the removal rate of NO increased with increasing water vapor and oxygen content in the flue gas indicating that OH radical is important for NO removal.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132023569","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2006-10-01DOI: 10.1109/CEIDP.2006.312036
R. Bodega, P. Morshuis, G. Montanari, D. Fabiani, J. Smit
Through the years, space charge measurements have shown to be instrumental for the development of extruded-type DC cable systems. However, since performing space charge measurements on full-size components presents major technical difficulties, tests are often done on models of the cable system. This paper assesses the validity of using models of cable systems for the evaluation of space charge in the full-size objects. For this purpose, space charge measurements were performed on specimens of increasing complexity, i.e. mini-cables, dual-dielectric mini-cables, MV-size cables and MV-size models of cable joints. Space charge patterns of the different types of specimens were compared and discussed. In this way the effect that the size and the type of test object have on space charge behaviour was investigated. It was observed that, in some cases, the space charge accumulation is very sensitive to a variation of the specimen complexity, in particular at interfaces between two different dielectrics.
{"title":"The Use of Cable System Models for the Assessment of Space Charge Behaviour in Full-size DC Cable Systems","authors":"R. Bodega, P. Morshuis, G. Montanari, D. Fabiani, J. Smit","doi":"10.1109/CEIDP.2006.312036","DOIUrl":"https://doi.org/10.1109/CEIDP.2006.312036","url":null,"abstract":"Through the years, space charge measurements have shown to be instrumental for the development of extruded-type DC cable systems. However, since performing space charge measurements on full-size components presents major technical difficulties, tests are often done on models of the cable system. This paper assesses the validity of using models of cable systems for the evaluation of space charge in the full-size objects. For this purpose, space charge measurements were performed on specimens of increasing complexity, i.e. mini-cables, dual-dielectric mini-cables, MV-size cables and MV-size models of cable joints. Space charge patterns of the different types of specimens were compared and discussed. In this way the effect that the size and the type of test object have on space charge behaviour was investigated. It was observed that, in some cases, the space charge accumulation is very sensitive to a variation of the specimen complexity, in particular at interfaces between two different dielectrics.","PeriodicalId":219099,"journal":{"name":"2006 IEEE Conference on Electrical Insulation and Dielectric Phenomena","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2006-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128009756","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：