C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
Copper was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of copper obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Cu 2s, Cu 2p3/2, Cu 3s, Cu 3p, Cu LMM, and Ar 1s.
{"title":"High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk copper","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002781","DOIUrl":"https://doi.org/10.1116/6.0002781","url":null,"abstract":"Copper was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of copper obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Cu 2s, Cu 2p3/2, Cu 3s, Cu 3p, Cu LMM, and Ar 1s.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43714764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina
Pt thin film was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.3 eV) excitation source. Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. The survey spectrum, Pt 3d, Pt 4f, Pt 4d, C 1s, and valence band core levels spectra were acquired.
{"title":"Platinum thin film by Ag Lα, hard x-ray photoelectron spectroscopy","authors":"Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina","doi":"10.1116/6.0002800","DOIUrl":"https://doi.org/10.1116/6.0002800","url":null,"abstract":"Pt thin film was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.3 eV) excitation source. Sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. The survey spectrum, Pt 3d, Pt 4f, Pt 4d, C 1s, and valence band core levels spectra were acquired.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48884323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
Aluminum was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Al obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Al 1s, Al 2s and Al 2p.
{"title":"High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk aluminum","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002696","DOIUrl":"https://doi.org/10.1116/6.0002696","url":null,"abstract":"Aluminum was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Al obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Al 1s, Al 2s and Al 2p.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43076492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
Silver was analyzed using high-resolution high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Ag obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Ag 3d, Ag 3p3/2, Ag 3s; Ag 2p3/2, Ag 2s.
采用高分辨率高能x射线光电子能谱(HAXPES)对银进行分析。5414.8 eV下单色Cr Kα辐射获得Ag的HAXPES光谱，包括Ag 3d、Ag 3p3/2、Ag 3s的测量扫描和高分辨率光谱;Ag 2p3/2, Ag 2s。
{"title":"High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk Ag","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002672","DOIUrl":"https://doi.org/10.1116/6.0002672","url":null,"abstract":"Silver was analyzed using high-resolution high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of Ag obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Ag 3d, Ag 3p3/2, Ag 3s; Ag 2p3/2, Ag 2s.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-09","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47208133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hard X-ray Photoelectron Spectroscopy (HAXPES) with monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered Au and Pt samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of the observed Auger lines are presented herein.
{"title":"HAXPES reference spectra of Au and Pt with Cr Kα excitation","authors":"Dong Zheng, C. N. Young, W. Stickle","doi":"10.1116/6.0002592","DOIUrl":"https://doi.org/10.1116/6.0002592","url":null,"abstract":"Hard X-ray Photoelectron Spectroscopy (HAXPES) with monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered Au and Pt samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of the observed Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46759373","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina
X-ray photoelectron spectroscopy was used to characterize cobalt nitrate. The specimen is a powder purchased from Sigma Aldrich and was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra and Co 2p, N 1s, O 1s, C 1s, and Co 3p core level spectra were acquired. Results evidenced the chemical surface state and interactions of elements that constitute the cobalt nitrate.
{"title":"XPS characterization of cobalt nitrate","authors":"Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina","doi":"10.1116/6.0002667","DOIUrl":"https://doi.org/10.1116/6.0002667","url":null,"abstract":"X-ray photoelectron spectroscopy was used to characterize cobalt nitrate. The specimen is a powder purchased from Sigma Aldrich and was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra and Co 2p, N 1s, O 1s, C 1s, and Co 3p core level spectra were acquired. Results evidenced the chemical surface state and interactions of elements that constitute the cobalt nitrate.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45798483","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on silicon, silicon dioxide, silicon nitride, silicon carbide, and poly(dimethyl siloxane) samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
{"title":"HAXPES reference spectra of Si, SiO2, SiN, SiC, and poly(dimethyl siloxane) with Cr Kα excitation","authors":"Dong Zheng, C. N. Young, W. Stickle","doi":"10.1116/6.0002660","DOIUrl":"https://doi.org/10.1116/6.0002660","url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on silicon, silicon dioxide, silicon nitride, silicon carbide, and poly(dimethyl siloxane) samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47855331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered Ta and Ta2O5 samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
{"title":"HAXPES reference spectra of Ta and Ta2O5 with Cr Kα excitation","authors":"Dong Zheng, C. N. Young, W. Stickle","doi":"10.1116/6.0002551","DOIUrl":"https://doi.org/10.1116/6.0002551","url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered Ta and Ta2O5 samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-07-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41288750","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Dong Zheng, Christopher N. Young, William F. Stickle
Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Pd sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
{"title":"HAXPES reference spectra of Pd with Cr Kα excitation","authors":"Dong Zheng, Christopher N. Young, William F. Stickle","doi":"10.1116/6.0002527","DOIUrl":"https://doi.org/10.1116/6.0002527","url":null,"abstract":"Monochromatic Cr Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on a sputtered Pd sample. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"136170504","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Rodríguez-Pereira, David Alejandro Miranda Mercado, R. Ospina
Indium acetate was analyzed using x-ray photoelectron spectroscopy. The specimen is a powder purchased from Sigma Aldrich. The sample was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra, In 3d, O 1s, C 1s, In 3p, In MNN, and Cl 2p core levels spectra were acquired. Results showed how the elements in the structure of indium acetate are related.
{"title":"Indium acetate analyzed by XPS","authors":"J. Rodríguez-Pereira, David Alejandro Miranda Mercado, R. Ospina","doi":"10.1116/6.0002596","DOIUrl":"https://doi.org/10.1116/6.0002596","url":null,"abstract":"Indium acetate was analyzed using x-ray photoelectron spectroscopy. The specimen is a powder purchased from Sigma Aldrich. The sample was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra, In 3d, O 1s, C 1s, In 3p, In MNN, and Cl 2p core levels spectra were acquired. Results showed how the elements in the structure of indium acetate are related.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47371112","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：