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Fe2O3-WO3 and Fe2O3-CuO nanoheterostructures by XPS Fe2O3-WO3和Fe2O3-CuO纳米异质结构的XPS研究
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-10-18 DOI: 10.1116/6.0001252
C. Maccato, Lorenzo Bigiani, D. Barreca, A. Gasparotto
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引用次数: 2
Analysis of Co3O4-SnO2 and Co3O4-Fe2O3 nanosystems by x-ray photoelectron spectroscopy Co3O4-SnO2和Co3O4-Fe2O3纳米体系的x射线光电子能谱分析
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-09-16 DOI: 10.1116/6.0001146
C. Maccato, Lorenzo Bigiani, M. Klotzsche, D. Barreca, A. Gasparotto
In this work, x-ray photoelectron spectroscopy was employed to characterize the surface composition and elemental chemical states of supported Co3O4-SnO2 and Co3O4-Fe2O3 nanocomposites. The present materials were prepared on Si(100) substrates by the chemical vapor deposition of cobalt oxide under O2 + H2O atmospheres, followed by the tailored introduction of SnO2 or Fe2O3 by means of radio frequency-sputtering. Material structural and morphological characterization revealed the formation of nanocomposite heterostructures involving a conformal Co3O4 coverage by SnO2 or Fe2O3 overlayers. Survey spectra as well as detailed scans of C 1s, O 1s, Co 2p, Sn 3d, and Fe 2p regions are presented and critically discussed. The results provide evidence for the formation of pure and oxygen-deficient nanocomposites, and the occurrence of an electronic interplay between the single oxide constituents.
本文采用x射线光电子能谱对负载型Co3O4-SnO2和Co3O4-Fe2O3纳米复合材料的表面组成和元素化学状态进行了表征。该材料是在Si(100)衬底上,通过在O2 + H2O气氛下化学气相沉积氧化钴,然后通过射频溅射定向引入SnO2或Fe2O3制备的。材料结构和形态表征表明,形成了由SnO2或Fe2O3覆盖的Co3O4共形纳米复合异质结构。测量光谱以及详细扫描的c1s, O 1s, Co 2p, Sn 3d,和Fe 2p区域提出和批判性地讨论。该结果为纯和缺氧纳米复合材料的形成以及单一氧化物组分之间电子相互作用的发生提供了证据。
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引用次数: 2
1T′-MoTe2 and 2H-MoTe2 by XPS 用XPS测定了1T ' -MoTe2和2H-MoTe2
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-09-13 DOI: 10.1116/6.0001100
J. Shallenberger, Rebecca J. Katz, Z. Mao
Two different phases of the transition-metal dichalcogenide and molybdenum ditelluride (1T′-MoTe2 and 2H-MoTe2) were grown by chemical vapor transport. Oxygen-free surfaces were generated by exfoliation in air and then analyzed by x-ray photoelectron spectroscopy. High-resolution core and valence and Auger spectra were acquired for both materials including Te 3d, Te 4d, Te MNN, Mo 3d, and valence band spectra. Differences in Te 3d and Mo 3d peak positions that were previously reported were confirmed, and asymmetry on the metallic 1T′-phase was documented in the Te 3d, Te 4d, and Mo 3d spectra that could prove useful in identifying mixtures of these materials.
采用化学气相输运法制备了两种不同相的过渡金属二硫化物和二碲化钼(1T′-MoTe2和2H-MoTe2)。在空气中剥落产生无氧表面,然后用x射线光电子能谱分析。获得了两种材料的高分辨率核谱、价谱和俄歇谱,包括Te 3d、Te 4d、Te MNN、Mo 3d和价带谱。先前报道的Te 3d和Mo 3d峰位的差异得到了证实,并且在Te 3d, Te 4d和Mo 3d光谱中记录了金属1T '相的不对称性,这可以证明对识别这些材料的混合物有用。
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引用次数: 3
Hydrogen, H2(g), by near-ambient-pressure soft x-ray synchrotron-radiation photoelectron spectroscopy 氢,H2(g),通过近环境压力软x射线同步辐射光电子能谱
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-06-30 DOI: 10.1116/6.0001066
Christopher R. O’Connor, J. Boscoboinik, Mustafa Karatok, M. V. van Spronsen
In this article, we show the survey and H 1s spectra acquired with a photon energy of 400.02 eV and H2(g) electron-energy loss of Ag 3d5/2 spectra with a photon energy of 451.3 eV using high-resolution synchrotron-radiation NAP-XPS.
在这篇文章中,我们展示了用400.02光子能量获得的测量和H1s光谱 光子能量为451.3的Ag 3d5/2光谱的eV和H2(g)电子能量损失 eV。
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引用次数: 1
Zinc and copper, by high sensitivity-low energy ion scattering 锌和铜,通过高灵敏度低能量离子散射
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-06-29 DOI: 10.1116/6.0000953
Tahereh G. Avval, S. Průša, Sean C. Chapman, M. Linford, T. Šikola, H. Brongersma
Low energy ion scattering (LEIS) is an extremely surface sensitive technique that can quantitatively analyze the outermost atomic layer of a material. In LEIS and high sensitivity-low energy ion scattering (HS-LEIS), straightforward quantitation is available using reference and/or standard materials. Here, we present the HS-LEIS spectra of zinc obtained with 3 keV 4He+ and 4 keV 20Ne+ projectile ions. Zinc is an important material with a wide range of applications. Thus, these spectra should be useful standards/references for future applications. A high purity zinc foil was used for these measurements after the removal of the oxide layer. As a reference for the instrumental sensitivity, the spectra for Cu from a high purity foil are also included with this submission. Atomic sensitivity and relative sensitivity factors for Zn and Cu are reported.
低能离子散射(LEIS)是一种极表面敏感的技术,可以定量分析材料的最外层原子层。在LEIS和高灵敏度-低能量离子散射(HS-LEIS)中,可以使用参考和/或标准材料进行直接定量。本文给出了3 keV 4He+和4 keV 20Ne+抛射离子对锌的HS-LEIS光谱。锌是一种具有广泛用途的重要材料。因此,这些光谱应该为未来的应用提供有用的标准/参考。在去除氧化层后,使用高纯度锌箔进行这些测量。作为仪器灵敏度的参考,本文还包括了高纯度箔的铜光谱。报道了锌和铜的原子灵敏度和相对灵敏度因子。
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引用次数: 3
Core-level reference spectra for bulk graphitic carbon nitride (g-C3N4) 块状石墨氮化碳(g-C3N4)的核心能级参考光谱
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-06-17 DOI: 10.1116/6.0001083
D. Morgan
X-ray photoelectron spectroscopy (XPS) was used to characterize a graphitic carbon nitride (g-C3N4) sample synthesized by the high temperature treatment of urea. Core-level C(1s) and N(1s) spectra are presented to aid fitting of such materials and address inconsistencies noted within published research literature.
采用x射线光电子能谱(XPS)对尿素高温处理合成的石墨化氮化碳(g-C3N4)样品进行了表征。提出了核心级C(1s)和N(1s)光谱,以帮助拟合这些材料,并解决已发表的研究文献中注意到的不一致。
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引用次数: 6
HAXPES of GaN film on Si with Cr Kα photons 用Cr Kα光子研究硅上GaN薄膜的HAXPES
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-06-09 DOI: 10.1116/6.0000888
A. Vanleenhove, C. Zborowski, I. Vaesen, I. Hoflijk, T. Conard
Gallium nitride (GaN) grown on Si by metalorganic chemical vapor deposition was analyzed using high-resolution, high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of GaN obtained using monochromatic Cr Kα radiation at 5414.7 eV include a survey scan (Al Kα) and high-resolution spectra of Ga 3d, Ga 2p3/2, Ga 3p, Ga LMM, N 1s, C 1s, and O 1s.
利用高分辨率高能x射线光电子能谱(HAXPES)对金属有机化学气相沉积在硅上生长的氮化镓(GaN)进行了分析。5414.7下用单色Cr Kα辐射获得的GaN的HAXPES光谱 eV包括Ga3d、Ga2p3/2、Ga3p、Ga-LMM、N1s、C1s和O1s的测量扫描(Al Kα)和高分辨率光谱。
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引用次数: 1
Molybdenum and silver photoemission survey spectra from hard x-rays 硬x射线中钼和银的光发射测量光谱
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-05-17 DOI: 10.1116/6.0000939
T. Flanagan, M. Brumbach, R. Chow, D. Casalnuovo, J. Rubio‐Zuazo, G. Castro
Electron emission from thick polished samples of polycrystalline molybdenum (Mo) and single crystalline 〈111〉 silver (Ag) was measured with hard x-ray photoemission spectroscopy. Six different excitation x-ray energies were used, nominally 8.0, 11.0, 13.0, 15.0, 18.0, and 21.5 keV. Survey spectra were recorded with each excitation to a kinetic energy of at most 15 keV, often capturing the entire emission range. The Mo 1s core peak was measured. Detailed LMM Auger spectra of Mo show marked increases in intensity and altered shape when x-ray energy exceeds the Mo 1s binding energy. The Mo and Ag L-shell photoelectron peaks are measured at four x-ray energies up to 18 keV showing the transition from 2p3/2 to 2s photoionization dominance.
用硬x射线光谱学测量了厚抛光样品的多晶钼(Mo)和单晶< 111 >银(Ag)的电子发射。使用了6种不同的激发x射线能量,标称为8.0、11.0、13.0、15.0、18.0和21.5 keV。每次激发时,测量光谱被记录到最多15 keV的动能,通常捕获整个发射范围。测量了Mo - 1s核峰。Mo的LMM俄歇能谱显示,当x射线能量超过mo1s结合能时,Mo的强度显著增加,形状明显改变。Mo和Ag的l -壳层光电子峰在4个x射线能量高达18 keV时被测量,显示了从2p3/2到2s的光离优势转变。
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引用次数: 0
Ibuprofen tablet characterized by XPS 布洛芬片的XPS表征
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-05-13 DOI: 10.1116/6.0000638
J. Rodríguez-Pereira, Sergio A. Rincón-Ortiz, R. Ospina
An ibuprofen tablet was characterized by x-ray photoelectron spectroscopy. The sample was fixed to a stainless-steel sample holder with a copper double-sided adhesive tape. Survey spectra, C 1s, O 1s, N 1s, Si 2p, and Na 1s core level spectra were acquired. The results showed the presence of carbon and oxygen, elements that are part of the chemical structure of ibuprofen; however, these can also be part of the excipients. In addition, nitrogen, silicon, and sodium were detected, which are associated with excipients.
用x射线光电子能谱对布洛芬片进行了表征。用铜双面胶带将样品固定在不锈钢样品支架上。获得了测量光谱、C1s、O1s、N1s、Si2p和Na1s核能级光谱。结果表明,碳和氧的存在是布洛芬化学结构的一部分;然而,这些也可以是赋形剂的一部分。此外,还检测到与赋形剂有关的氮、硅和钠。
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引用次数: 0
Analysis of tin and tin oxide by x-ray photoelectron spectroscopy 锡和氧化锡的x射线光电子能谱分析
IF 1.3 Q3 PHYSICS, CONDENSED MATTER Pub Date : 2021-04-07 DOI: 10.1116/6.0000528
A. Chourasia, Allen E. Hillegas
Thin film of tin (about 15 nm) was deposited on a silicon ⟨ 100 ⟩ substrate by the e-beam evaporation technique. The sample was oxidized in an oxygen atmosphere. Both the elemental tin and the oxidized sample were characterized in situ by the technique of x-ray photoelectron spectroscopy. Magnesium Kα radiation (energy = 1253.6 eV) was used as the source of x-ray excitation. The data in the tin 3d, 3p, 4p, 4d, Auger MNN regions, and the oxygen 1s region were recorded with a pass energy of 35.75 eV. The oxidized tin was found to form the SnO2 phase. The data will serve as a comparison for the study in this field.
锡薄膜(约15 nm)通过电子束蒸发技术沉积在硅衬底上。样品在氧气气氛中被氧化。利用x射线光电子能谱技术对元素锡和氧化样品进行了原位表征。镁Kα辐射(能量 = 1253.6 eV)作为x射线激发源。锡3d、3p、4p、4d、Auger MNN区域和氧1s区域中的数据以35.75的通过能量记录 发现氧化的锡形成SnO2相。这些数据将作为该领域研究的比较。
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引用次数: 3
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Surface Science Spectra
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