The optical functions of uniaxial ZnO are determined from 200 to 850 nm (6.2–1.46 eV) using three different ellipsometric techniques: (1) standard spectroscopic two-modulator generalized ellipsometry (2-MGE), (2) transmission two-modulator generalized ellipsometry, and (3) near-normal incidence two modulator generalized ellipsometry microscopy (2-MGEM). The 2-MGE results in very accurate values of the dielectric functions and error estimates from 1.46 to 6.2 eV, while the transmission 2-MGE results in more accurate values of the birefringence and associated errors below the band edge where ZnO is transparent. The 2-MGEM also measures the diattenuation (which is related to the birefringence) and other parameters, but at near-normal incidence at a single wavelength (577 nm). The 2-MGEM is designed as a scanning instrument resulting in these parameters being measured over a surface.
{"title":"Optical functions of uniaxial zinc oxide (ZnO) revisited","authors":"G. Jellison","doi":"10.1116/6.0002859","DOIUrl":"https://doi.org/10.1116/6.0002859","url":null,"abstract":"The optical functions of uniaxial ZnO are determined from 200 to 850 nm (6.2–1.46 eV) using three different ellipsometric techniques: (1) standard spectroscopic two-modulator generalized ellipsometry (2-MGE), (2) transmission two-modulator generalized ellipsometry, and (3) near-normal incidence two modulator generalized ellipsometry microscopy (2-MGEM). The 2-MGE results in very accurate values of the dielectric functions and error estimates from 1.46 to 6.2 eV, while the transmission 2-MGE results in more accurate values of the birefringence and associated errors below the band edge where ZnO is transparent. The 2-MGEM also measures the diattenuation (which is related to the birefringence) and other parameters, but at near-normal incidence at a single wavelength (577 nm). The 2-MGEM is designed as a scanning instrument resulting in these parameters being measured over a surface.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46977257","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The core-level spectra for the lanthanide metal, dysprosium, are presented. The spectra exhibit significant multiplet splitting, which must be included for accurate quantification of the metallic state. Within the paper, modified relative sensitivity factors are presented for some regions, together with recommended backgrounds integration limits and types.
{"title":"Core-level spectra of metallic lanthanides: Dysprosium (Dy)","authors":"David J. Morgan","doi":"10.1116/6.0002917","DOIUrl":"https://doi.org/10.1116/6.0002917","url":null,"abstract":"The core-level spectra for the lanthanide metal, dysprosium, are presented. The spectra exhibit significant multiplet splitting, which must be included for accurate quantification of the metallic state. Within the paper, modified relative sensitivity factors are presented for some regions, together with recommended backgrounds integration limits and types.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49646060","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Zborowski, I. Hoflijk, I. Vaesen, A. Vanleenhove, K. Artyushkova, T. Conard
A bismuth foil was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of bismuth obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Bi 2p3/2, Bi 3d5/2, Bi 4s, Bi 4p3/2, Bi 4d5/2, and Bi 4f.
{"title":"High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk bismuth","authors":"C. Zborowski, I. Hoflijk, I. Vaesen, A. Vanleenhove, K. Artyushkova, T. Conard","doi":"10.1116/6.0002703","DOIUrl":"https://doi.org/10.1116/6.0002703","url":null,"abstract":"A bismuth foil was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of bismuth obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Bi 2p3/2, Bi 3d5/2, Bi 4s, Bi 4p3/2, Bi 4d5/2, and Bi 4f.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42056145","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
Bulk gold was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of gold obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Au 5p, Au 5s, Au 4f, Au 4d, Au 4p3/2, Au 4s, Au 3d5/2, and Au 3p3/2.
{"title":"High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk gold","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002699","DOIUrl":"https://doi.org/10.1116/6.0002699","url":null,"abstract":"Bulk gold was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of gold obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Au 5p, Au 5s, Au 4f, Au 4d, Au 4p3/2, Au 4s, Au 3d5/2, and Au 3p3/2.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46824790","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina
Silicon dioxide powder was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.2 eV) excitation source. The sample was fixed to a stainless-steel sample holder with copper double-sided adhesive tape. Survey spectrum, C 1s, O 1s, Si 1s, Si KLL, Si 2s, and Si 2p core levels spectra were acquired.
{"title":"Silicon dioxide by Ag Lα, hard x-ray photoelectron spectroscopy","authors":"Sergio A. Rincón-Ortiz, J. H. Quintero‐Orozco, R. Ospina","doi":"10.1116/6.0002801","DOIUrl":"https://doi.org/10.1116/6.0002801","url":null,"abstract":"Silicon dioxide powder was characterized by hard x-ray photoelectron spectroscopy (HAXPES) with an Ag Lα (2984.2 eV) excitation source. The sample was fixed to a stainless-steel sample holder with copper double-sided adhesive tape. Survey spectrum, C 1s, O 1s, Si 1s, Si KLL, Si 2s, and Si 2p core levels spectra were acquired.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41517491","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Zirconium oxychloride was characterized by x-ray photoelectron spectroscopy. The specimen is a powder purchased from Sigma Aldrich. The sample was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra, Zr 3d, O 1s, C 1s, Cl 2p, Zr 3p, Zr 4p, and Cl 2s core levels spectra were acquired. Results showed how the elements in the structure of zirconium oxychloride interact.
{"title":"Zirconium oxychloride assessment by XPS","authors":"M. Botero, F. Mesa, R. Ospina","doi":"10.1116/6.0002666","DOIUrl":"https://doi.org/10.1116/6.0002666","url":null,"abstract":"Zirconium oxychloride was characterized by x-ray photoelectron spectroscopy. The specimen is a powder purchased from Sigma Aldrich. The sample was fixed to a stainless-steel sample holder with copper 3MTM double-sided adhesive tape. Survey spectra, Zr 3d, O 1s, C 1s, Cl 2p, Zr 3p, Zr 4p, and Cl 2s core levels spectra were acquired. Results showed how the elements in the structure of zirconium oxychloride interact.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43456231","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
Dysprosium was analyzed using high-resolution high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of dysprosium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Dy 3s, Dy 3p3/2, Dy 3d5/2, Dy 4s, Dy 4p3/2, Dy 4d, and Dy 5p.
{"title":"High-energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk dysprosium","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002813","DOIUrl":"https://doi.org/10.1116/6.0002813","url":null,"abstract":"Dysprosium was analyzed using high-resolution high-energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of dysprosium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Dy 3s, Dy 3p3/2, Dy 3d5/2, Dy 4s, Dy 4p3/2, Dy 4d, and Dy 5p.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42435128","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of boron obtained using monochromatic Al Kα radiation include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, and Ar 2p. The Cr Kα spectra with radiation at 5414.8 eV include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, Ar 2p, and Ar 1s.
{"title":"XPS Al Kα and high energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk boron","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002765","DOIUrl":"https://doi.org/10.1116/6.0002765","url":null,"abstract":"Bulk boron was analyzed using both XPS and high-resolution high energy x-ray photoelectron spectroscopy. The spectra of boron obtained using monochromatic Al Kα radiation include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, and Ar 2p. The Cr Kα spectra with radiation at 5414.8 eV include survey scan and high-resolution spectra of B 1s, O 1s, N 1s, C 1s, Ar 2p, and Ar 1s.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42455501","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
Iron was analyzed using high-resolution high-energy x-ray photoelectron Spectroscopy (HAXPES). The HAXPES spectra of iron obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Fe 2s, Fe 2p, Fe 3s, and Fe 3p.
{"title":"High-energy x-ray photoelectron spectroscopy Cr Kα measurement of bulk iron","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002815","DOIUrl":"https://doi.org/10.1116/6.0002815","url":null,"abstract":"Iron was analyzed using high-resolution high-energy x-ray photoelectron Spectroscopy (HAXPES). The HAXPES spectra of iron obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Fe 2s, Fe 2p, Fe 3s, and Fe 3p.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49013258","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard
Chromium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of chromium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Cr 2s, Cr 2p, Cr 3s, and Cr 3p.
{"title":"High energy x-ray photoelectron spectroscopy (HAXPES) Cr Kα measurement of bulk chromium","authors":"C. Zborowski, A. Vanleenhove, I. Hoflijk, I. Vaesen, K. Artyushkova, T. Conard","doi":"10.1116/6.0002770","DOIUrl":"https://doi.org/10.1116/6.0002770","url":null,"abstract":"Chromium was analyzed using high-resolution high energy x-ray photoelectron spectroscopy (HAXPES). The HAXPES spectra of chromium obtained using monochromatic Cr Kα radiation at 5414.8 eV include survey scan and high-resolution spectra of Cr 2s, Cr 2p, Cr 3s, and Cr 3p.","PeriodicalId":22006,"journal":{"name":"Surface Science Spectra","volume":null,"pages":null},"PeriodicalIF":1.3,"publicationDate":"2023-08-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44220618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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