Various oxide nanomaterials like TiO 2, NiO, WO 3 and Co 3 O 4 are synthesized by doctor blade technique. Structural investigation is performed with the aid of X-ray diffraction measurements. The results obtained from this method revealed that as-deposited films are crystalline nature. Using the Debye–Scherer’s equation, the average size of the crystallites is measured. Optical properties are determined by absorption measurements in the spectral range from 200 to 900 nm. The surface features are investigated by optical microscopic techniques such as scanning electron microscopy (SEM) and atomic force microscopy (AFM). The efficiency of the thin film Solar Cell is measured by Current density – Voltage (J-V) characteristics.
{"title":"Structural, optical and morphological study of oxide materials","authors":"A. Deepa, C. Gopinathan, P. Pandi","doi":"10.12988/AAP.2019.932","DOIUrl":"https://doi.org/10.12988/AAP.2019.932","url":null,"abstract":"Various oxide nanomaterials like TiO 2, NiO, WO 3 and Co 3 O 4 are synthesized by doctor blade technique. Structural investigation is performed with the aid of X-ray diffraction measurements. The results obtained from this method revealed that as-deposited films are crystalline nature. Using the Debye–Scherer’s equation, the average size of the crystallites is measured. Optical properties are determined by absorption measurements in the spectral range from 200 to 900 nm. The surface features are investigated by optical microscopic techniques such as scanning electron microscopy (SEM) and atomic force microscopy (AFM). The efficiency of the thin film Solar Cell is measured by Current density – Voltage (J-V) characteristics.","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130168095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is noted in experiments that a test-tube undergoing a transformation of phase under a mechanical loading, even lower than the elastic limit, present a residual deformation much more important than the simple change of volume associated with the transformation. This plastic deformation, added with that generated by the changes with volume, plasticity of transformation is called. It is as well observed at the time of diffusive transformations like for the martensitic transformations. At the time of a martensitic transformation, martensite slats are created, each one in a random direction and create a microscopic deformation according to this direction. From a macroscopic point of view, the deformation is isotropic and corresponds to the change of volume at the time of the transformation. If the same transformation is operated under loading, even very weak, the martensite slats tend to be directed in the direction of the request. Then, in addition to the change of volume, this preferential orientation creates a macroscopic deformation in the direction of request. In this work, one proposes a method of quantification of this deformation of the plasticity of transformation, which is induced by this structural change, by using the model of WEN. This model is a micromechanical model two-dimensional, with a grid with triangular basic elements. The grid of the cell breaks up into two zones: a central zone (of a size of 14x14) where the transformation occurs and a second zone, which represents the surrounding medium, in the objective to ensure the interactions with the close grains. The total size of the grid is of 22x22 bricks. This modelling takes into account the transformations anisothermes. The selection criterion of the plates is controlled not only by driving energies (i.e. the mechanical driving force and the chemical driving force), but also by a resistive
{"title":"Simulation in 2D of a martensitic transformation in a ferrous alloy","authors":"M. Gaci, S. Mezian, A. Fouathia","doi":"10.12988/aap.2021.367","DOIUrl":"https://doi.org/10.12988/aap.2021.367","url":null,"abstract":"It is noted in experiments that a test-tube undergoing a transformation of phase under a mechanical loading, even lower than the elastic limit, present a residual deformation much more important than the simple change of volume associated with the transformation. This plastic deformation, added with that generated by the changes with volume, plasticity of transformation is called. It is as well observed at the time of diffusive transformations like for the martensitic transformations. At the time of a martensitic transformation, martensite slats are created, each one in a random direction and create a microscopic deformation according to this direction. From a macroscopic point of view, the deformation is isotropic and corresponds to the change of volume at the time of the transformation. If the same transformation is operated under loading, even very weak, the martensite slats tend to be directed in the direction of the request. Then, in addition to the change of volume, this preferential orientation creates a macroscopic deformation in the direction of request. In this work, one proposes a method of quantification of this deformation of the plasticity of transformation, which is induced by this structural change, by using the model of WEN. This model is a micromechanical model two-dimensional, with a grid with triangular basic elements. The grid of the cell breaks up into two zones: a central zone (of a size of 14x14) where the transformation occurs and a second zone, which represents the surrounding medium, in the objective to ensure the interactions with the close grains. The total size of the grid is of 22x22 bricks. This modelling takes into account the transformations anisothermes. The selection criterion of the plates is controlled not only by driving energies (i.e. the mechanical driving force and the chemical driving force), but also by a resistive","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129997366","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51368/2307-4469-2021-9-2-164-171
Успехи прикладной физики, 2021, том 9, No 2165I. R. Gulakov, A. O. Zenevich, and O. V. KocherginaBelarusian State Academy of Communications8/2 F. Skorina st., Minsk, 220114, BelarusE-mail: o.kochergina@bsac.byReceived January 12, 2021Recently multipixel avalanche photodetectors, called silicon photomultipliers are of-ten used to record optical radiation. The influence of ambient temperature and sup-ply voltage on the spectral sensitivity and dynamic range of prototypes of silicon pho-tomultipliers manufactured by JSC "Integral" (Republic ofBelarus) and commercially available photomultipliers KetekRM 3325 and ON Semi FC 30035 has been investigated in this article. It was determined that the spectral sensitivity maxi-mum of silicon photomultipliers is shifted to the short-wavelength region andcorre-sponds to the wavelength of optical radiation of 470 nm. It is shown that an increase in the supply voltage leads to an increase in the sensitivity of the investigated photodetectors, and the dependence of the sensitivity on temperature manifests itself in different ways when exposed to optical radiation of different wavelengths.
Успехи прикладной физики， 2021， том 9, No . 2165I。R. Gulakov, A. O. Zenevich, O. V. kochergina，白俄罗斯国家通信学院，8/2 F。Skorina st.， Minsk, 220114, BelarusE-mail: o.kochergina@bsac.byReceived 2021年1月12日最近，被称为硅光电倍增管的多像素雪崩光电探测器通常用于记录光辐射。本文研究了环境温度和电源电压对白俄罗斯“Integral”公司生产的硅光电倍增管原型和市售的KetekRM 3325和on Semi FC 30035光电倍增管光谱灵敏度和动态范围的影响。结果表明，硅光电倍增管的光谱灵敏度最大值向短波区偏移，对应于470 nm的光辐射波长。结果表明，电源电压的增加会导致所研究的光电探测器灵敏度的增加，并且当暴露于不同波长的光辐射时，灵敏度对温度的依赖性以不同的方式表现出来。
{"title":"Investigation of the spectral characteristics of silicon photomultiplier tubes","authors":"","doi":"10.51368/2307-4469-2021-9-2-164-171","DOIUrl":"https://doi.org/10.51368/2307-4469-2021-9-2-164-171","url":null,"abstract":"Успехи прикладной физики, 2021, том 9, No 2165I. R. Gulakov, A. O. Zenevich, and O. V. KocherginaBelarusian State Academy of Communications8/2 F. Skorina st., Minsk, 220114, BelarusE-mail: o.kochergina@bsac.byReceived January 12, 2021Recently multipixel avalanche photodetectors, called silicon photomultipliers are of-ten used to record optical radiation. The influence of ambient temperature and sup-ply voltage on the spectral sensitivity and dynamic range of prototypes of silicon pho-tomultipliers manufactured by JSC \"Integral\" (Republic ofBelarus) and commercially available photomultipliers KetekRM 3325 and ON Semi FC 30035 has been investigated in this article. It was determined that the spectral sensitivity maxi-mum of silicon photomultipliers is shifted to the short-wavelength region andcorre-sponds to the wavelength of optical radiation of 470 nm. It is shown that an increase in the supply voltage leads to an increase in the sensitivity of the investigated photodetectors, and the dependence of the sensitivity on temperature manifests itself in different ways when exposed to optical radiation of different wavelengths.","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128900048","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.51368/2307-4469-2021-9-2-153-163
This paper is devoted to a comparative analysis of the methods for calibrating the Shack-Hartmann wavefront sensor: on the plane wavefront (calibration by turning the sensor) and spherical wavefront (absolute calibration). For comparison, a gen-eral analysis of the advantages and disadvantages of calibration methods was carried out, including the creation of a reference wavefront and the determination of the ex-act geometric parameters of the sensor. The geometric parameters of the Shack-Hartmann wavefront sensor are used in the reconstruction of the measured wave-front and determine such parameters of the Shack-Hartmann sensor as the dynamic range and sensitivity. Also, for numerical comparison, an analysis of the errors of the dynamic range, determined by aberrations such as tilt and defocus, was carried out, and the dependences of these errors on the error of the geometric parameters of the sensor were constructed.
{"title":"Comparative analysis of methods for calibration of aShack-Hartmann wavefront sensor","authors":"","doi":"10.51368/2307-4469-2021-9-2-153-163","DOIUrl":"https://doi.org/10.51368/2307-4469-2021-9-2-153-163","url":null,"abstract":"This paper is devoted to a comparative analysis of the methods for calibrating the Shack-Hartmann wavefront sensor: on the plane wavefront (calibration by turning the sensor) and spherical wavefront (absolute calibration). For comparison, a gen-eral analysis of the advantages and disadvantages of calibration methods was carried out, including the creation of a reference wavefront and the determination of the ex-act geometric parameters of the sensor. The geometric parameters of the Shack-Hartmann wavefront sensor are used in the reconstruction of the measured wave-front and determine such parameters of the Shack-Hartmann sensor as the dynamic range and sensitivity. Also, for numerical comparison, an analysis of the errors of the dynamic range, determined by aberrations such as tilt and defocus, was carried out, and the dependences of these errors on the error of the geometric parameters of the sensor were constructed.","PeriodicalId":228648,"journal":{"name":"ADVANCES IN APPLIED PHYSICS","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131715696","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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