Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566919
Bingxin Liu
Material shields may be mechanically damaged, caus ing cracks or seams in the shield walls and changes in their magnetic shielding effectiveness. As a canonical three-dimensional model, the interaction of an exter nal, quasi-stationary, uniform magnetic field with a thick shield is investigated, which consists of two identical, thick semi-spherical shells in intimate con tact with each other. The problem is treated analyti cally using perturbational techniques and the complex shielding ratio calculated. The results obtained have potential applications in the design of various elec tromagnetic shields.
{"title":"Quasi-Stationary Magnetic Shielding Properties of Thick Spherical Shells with Equatorial Seams","authors":"Bingxin Liu","doi":"10.1109/ISEMC.1985.7566919","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566919","url":null,"abstract":"Material shields may be mechanically damaged, caus ing cracks or seams in the shield walls and changes in their magnetic shielding effectiveness. As a canonical three-dimensional model, the interaction of an exter nal, quasi-stationary, uniform magnetic field with a thick shield is investigated, which consists of two identical, thick semi-spherical shells in intimate con tact with each other. The problem is treated analyti cally using perturbational techniques and the complex shielding ratio calculated. The results obtained have potential applications in the design of various elec tromagnetic shields.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121136451","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566977
M. Maiuzzo
A mathematical model is presented that predicts intermodulation product levels in broadband power amplifiers amplifying communications signals of various modulation types.
提出了一种预测宽带功率放大器在放大各种调制类型的通信信号时互调积级的数学模型。
{"title":"Predicting Intermodulation Levels Due to Distortion in Linear Broadband Power Amplifiers","authors":"M. Maiuzzo","doi":"10.1109/ISEMC.1985.7566977","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566977","url":null,"abstract":"A mathematical model is presented that predicts intermodulation product levels in broadband power amplifiers amplifying communications signals of various modulation types.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"329 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114371884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566951
K. DeGraffenreid
This paper presents results of electron vacuum chamber testing of five mil perforated silverized Teflon tape and one mil carbon loaded Kapton spiral wrap thermal blanket materials. Characterization of the electrostatic charging and discharging behavior of the ungrounded materials in the simulated geosynchronous orbit substorm environment is presented. The relative effectiveness of various grounding techniques in mitigating charging effects is also discussed.
{"title":"Electrostatic Charging Characteristics of Silverized Teflon Tape and Carbon Loaded Kapton Spiral Wrap Thermal Blanket Materials","authors":"K. DeGraffenreid","doi":"10.1109/ISEMC.1985.7566951","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566951","url":null,"abstract":"This paper presents results of electron vacuum chamber testing of five mil perforated silverized Teflon tape and one mil carbon loaded Kapton spiral wrap thermal blanket materials. Characterization of the electrostatic charging and discharging behavior of the ungrounded materials in the simulated geosynchronous orbit substorm environment is presented. The relative effectiveness of various grounding techniques in mitigating charging effects is also discussed.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"90 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132848297","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7567008
J. Randa, M. Kanda
We r e p o r t th e r e s u l t s o f a s tu d y o f e l e c t r i c f i e l d m e t e r (EFM) e r r o r s i n complex e l e c t r o m a g n e t i c en v ir on m en ts . Two ty p e s o f e r r o r s a r e c o n s id e r e d e r r o r s i n t h e measured e l e c t r i c f i e l d f o r a common EFM d e s ig n , and e r r o r s in th e as sumpt ion o f equal e l e c t r i c and m agnetic energy d e n s i t i e s i n a m u l t i p l e p lan e -w av e en v ir o n m en t . T y p ic a l e r r o r s i n bo th cases a r e a p p r o x i m a t e ly o n e h a l f t o t h r e e dB, b u t i n some c ir c u m s ta n c e s th e y can exceed 10 dB.
We r和p或者r t th和r和s u l t或f s y你d或f和l和c t r i c f和l d m和t和r(的)和r r或s号综合体和l和c t r a g n和t i c t v ir on in ts。“ty p和s或f和r r或r s r和c或id号s和r和d和r r或r s t h和measured l和c t r i c f和l d f或通用的d和r s gl n和r, r或s平等th和as sumpt离子或f和l和c t r c和m agnetic能源d号和s t和p m u l t l和p和w av和局域网en v n或n m t。T y p ic a l和r r或r s号的bo th案例a和a p p r x或y m a 14.1或T和h l f T或T h r和dB, b u T n的m号s c和c或c s th和y can exceed 10分贝。
{"title":"High-Frequency Errors of an Electric-Field Meter in Complicated Environments","authors":"J. Randa, M. Kanda","doi":"10.1109/ISEMC.1985.7567008","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7567008","url":null,"abstract":"We r e p o r t th e r e s u l t s o f a s tu d y o f e l e c t r i c f i e l d m e t e r (EFM) e r r o r s i n complex e l e c t r o m a g n e t i c en v ir on m en ts . Two ty p e s o f e r r o r s a r e c o n s id e r e d e r r o r s i n t h e measured e l e c t r i c f i e l d f o r a common EFM d e s ig n , and e r r o r s in th e as sumpt ion o f equal e l e c t r i c and m agnetic energy d e n s i t i e s i n a m u l t i p l e p lan e -w av e en v ir o n m en t . T y p ic a l e r r o r s i n bo th cases a r e a p p r o x i m a t e ly o n e h a l f t o t h r e e dB, b u t i n some c ir c u m s ta n c e s th e y can exceed 10 dB.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130593901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566981
S. Al-Araji, Janan E. Allios, T. Al-Mahdawi, Ahmed S. Muhammad Ali
In the proposed system, two complemen tary delay Smear/Desmear (S/D) filters were used in the transmitter and receiver sides respectively. A complete analysis was carried out to show that for optimum reduction of impulsive noise, 32 taps tran sversal filters should be used. The S/D filters were designed using bucket brigade devices (BBD) type TAD-32. Laboratory tests were carried out on the system using random input data of 880 b/see., while the system is subjected to random impulsive noise, a model of which was designed. A reduction in the probability of error (Pe) by a factor of 25 was obtained over conventional system (without S/D filters) at (SNR) of 7 dB. This reduction factor is increased to 50 when clipper was used prior to the desmear filter at the receiver side. Also (SNR) im provement of about 14 dB was obtained at Pe = 10~^.
{"title":"Impulsive Noise Reduction in Data Communication Systems Employing Smear/Desmear Technique","authors":"S. Al-Araji, Janan E. Allios, T. Al-Mahdawi, Ahmed S. Muhammad Ali","doi":"10.1109/ISEMC.1985.7566981","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566981","url":null,"abstract":"In the proposed system, two complemen tary delay Smear/Desmear (S/D) filters were used in the transmitter and receiver sides respectively. A complete analysis was carried out to show that for optimum reduction of impulsive noise, 32 taps tran sversal filters should be used. The S/D filters were designed using bucket brigade devices (BBD) type TAD-32. Laboratory tests were carried out on the system using random input data of 880 b/see., while the system is subjected to random impulsive noise, a model of which was designed. A reduction in the probability of error (Pe) by a factor of 25 was obtained over conventional system (without S/D filters) at (SNR) of 7 dB. This reduction factor is increased to 50 when clipper was used prior to the desmear filter at the receiver side. Also (SNR) im provement of about 14 dB was obtained at Pe = 10~^.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126065142","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566932
N. K. Agarwal, P. Joseph, P. Kesavan Nair
{"title":"Evaluation of Shielded Anechoic Chamber for EMC Measurements","authors":"N. K. Agarwal, P. Joseph, P. Kesavan Nair","doi":"10.1109/ISEMC.1985.7566932","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566932","url":null,"abstract":"","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125212180","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566983
D. M. Hanttula, S. William Wong
A n E M I ra d ia t io n case s tudy o f a co m p u te r sys tem w hich inc ludes a CPU and an ex te rna l e lec tro m ech an ica l p e r ip h e ra l is pe rfo rm ed . An un u su a l ly h igh band f requency n o ise hum p is d e te c te d , b o th f r e q u e n c y ra n g e an d e n e rg y level are h igh and beyond the d riv ing force o f the fundcam en ta l c lock c ircuit . T he EM I noise s o u r c e is d i s c o v e r e d f r o m an i n s t a b i l i t y o sc i l la t io n o f t ra n s is to r b u ffe r am p lif ie rs . The c ircu it configura tion is analyzed, and a solution is p ro v id e d b a sed on the c ircu i t co n f ig u ra t io n m a th e m a t i c m o d e l , a n d th e c o n s t r a in t s o f m a n u fac tu rab i l i ty o f the produc t . I n t r o d u c t i o n are : (1) C ircu it design and layout. (2) S u b a sse m b ly in te rco n n ec t io n . (3) E nc lo su re design. (4) I/O cable and connector choices. O f th e se fou r item s, c ircu it des ign and layou t p la y the m o s t im p o r ta n t ro le to d e te rm in e w hether the final design will be a quie t or noisy E M I radiating produc t . T h e f u n c t i o n a l b lo c k d i a g r a m o f th e s e p e r ip h e ra l s c an be ty p ic a l ly r e p r e s e n te d as F igure 1. A m ong all these func tiona l b locks, B lock #1 and B lock #2 are always considered as m a jo r E M I em is s io n so u rc e s in the c r i t i c a l frequency range above 10 MHz. A co m p u te r can e x h ib i t re la tive ly low rad ia ted e m is s io n s w hen i t is n o t c o n n e c te d to an e x t e r n a l p e r i p h e r a l . In so m e i n s t a n c e s a p e r ip h e ra l dev ice w il l n o t ra d ia te s ign if ican t ly i f it is no t exerc ised by the com puter or stands alone. It is no t uncom m on that a low em ission co m p u te r and a low em iss ion pe riphe ra l , w hen they a re c o n n e c te d to g e th e r , and e x e rc ise d (sending da ta back and forth be tw een C PU and p e r ip h e ra l ) th a t th e w h o le s y s te m e x c e e d s regulatory limits. The I/O cable may becom e a r a d i a t i n g d e v ic e b e c a u s e o f n o n e x i s te n t or in a d e q u a te s h i e ld in g o r im p r o p e r s h i e ld in g te rm ina tion o r p rov ide a m ean to exerc ise the p e r ip h e ra l w h ic h now b eco m es E M I ra d ia te d so u rc e . T y p ic a l c o m p u te r e le c t ro m e c h a n ic a l p e r ip h e ra l dev ices are f loppy and h a rd d isk drives , tape drives , p r in te rs and p lo t te rs . E M I rad ia tion d e s i g n c o n s i d e r a t i o n s on th e c o m p u t e r e l e c t r o m e c h a n ic a l p e r ip h e r a l d e v ic e b a s ic a l ly CPU to /from Digital Analog and ElectroPeripheral Control Servo Mechanical I/O Interface _ Control and Electronics Assembly
A n和M、d ia t我n s tudy住房或你p u r 96 - tem w hich inc . ludes CPU and an ex o l和lees rna ech an l p和r ip h和l is pe rfo mri。An - l - 14.1分之一的u h igh乐队f requency n或ise hum p is a和c的d, b号或th f r和q u和y n g和c和d n和rg are y级别h igh and beyond the d警队rev .荷兰国际集团(ing)或f the fundcam a l c锁定c ircuit ta。T he EM noise s u r c和d is s c或v和r和d f或m an I s T b l I T y或sc我n或l T n s is to r b u ffe am p lif ie rs。The c ircu it, is analyzed, and is p ro v通id和d b的sed on The c ircu t f gl (u我n o th和米a t c或d和l, m d n th和p r s t或f r e m a no u msl你rab ty或f The produc t。(1)包括设计和布局。(2)在t上。(3)及合并名目编号。(4)有线电视和连接选择。或f th和培训如果r s, c ircu it项目des外来者and layou t p的y the m s t im e s p t ro的d和mri和w hether the final设计will be quie t or noisy和米radiating produc吨。T h和f u n c T或d i no a b c k g u g r a m或f th和s和p和r ip h和l s c an be ty p ic a l, r和p r和s和n d as f igure 1。m非政府组织all这些func tiona l b locks,锁定2 # 1和b实时are as m A jo r和m可能总是案例这些vc is s我知道u rc和s在the c r t c l 5.7高于10 MHz范围。在p m u r can和x h的ib吨低rad ia ted的14.1和m is s我n s w在于t is或t c n n和c你to an x和t和d n A l p和r p h l和r。在我m和n s t n c和s a p和r ip h和l dev ice w l号或t d ia的s外来者if ican i f it is no 14.1吨exerc ised由the计算机前的孤独。It is no t uncom m on that你低em议事p m u r和环境规划署低em iss离子riphe l,在于他们的c或n和c的d g和th x和r,和tr ise d(由come back and forth be sending tw een c PU和p和r ip h和l) th t th和w h或s x y m和s和c和d s监管限额。The I / O电缆may becom和r a t g d和d s u v ic及b和c和e或f n或n x discipline (t or in a d和q u你s h和g或r的ld或ld p r s h和g的mri ina整理或r p)外国直接投资a到m ean exerc etui主办p和r ip合资h和l w h h now b eco m es和m d ia rc和我d。T - l - c o m p y p ic u r和c T ro m和c h a no (p和r ip h和l dev ice are f loppy and h rd d isk非洲,中小型企业的非洲,p r s and p T in te rs。s和M的rad, d和g号c r E s I d和r t s或n th和c o M p u r l和c t r或M和c h a no (p和r ip h - l - d和r和v ic和b / s - l - 14.1 ic CPU到from数字模拟and ElectroPeripheral Control仆人机械I / o接口_ Control and Electronics议会
{"title":"Case Study - Effect of Analog Buffer Amplifier Instability on Radiated Emissions","authors":"D. M. Hanttula, S. William Wong","doi":"10.1109/ISEMC.1985.7566983","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566983","url":null,"abstract":"A n E M I ra d ia t io n case s tudy o f a co m p u te r sys tem w hich inc ludes a CPU and an ex te rna l e lec tro m ech an ica l p e r ip h e ra l is pe rfo rm ed . An un u su a l ly h igh band f requency n o ise hum p is d e te c te d , b o th f r e q u e n c y ra n g e an d e n e rg y level are h igh and beyond the d riv ing force o f the fundcam en ta l c lock c ircuit . T he EM I noise s o u r c e is d i s c o v e r e d f r o m an i n s t a b i l i t y o sc i l la t io n o f t ra n s is to r b u ffe r am p lif ie rs . The c ircu it configura tion is analyzed, and a solution is p ro v id e d b a sed on the c ircu i t co n f ig u ra t io n m a th e m a t i c m o d e l , a n d th e c o n s t r a in t s o f m a n u fac tu rab i l i ty o f the produc t . I n t r o d u c t i o n are : (1) C ircu it design and layout. (2) S u b a sse m b ly in te rco n n ec t io n . (3) E nc lo su re design. (4) I/O cable and connector choices. O f th e se fou r item s, c ircu it des ign and layou t p la y the m o s t im p o r ta n t ro le to d e te rm in e w hether the final design will be a quie t or noisy E M I radiating produc t . T h e f u n c t i o n a l b lo c k d i a g r a m o f th e s e p e r ip h e ra l s c an be ty p ic a l ly r e p r e s e n te d as F igure 1. A m ong all these func tiona l b locks, B lock #1 and B lock #2 are always considered as m a jo r E M I em is s io n so u rc e s in the c r i t i c a l frequency range above 10 MHz. A co m p u te r can e x h ib i t re la tive ly low rad ia ted e m is s io n s w hen i t is n o t c o n n e c te d to an e x t e r n a l p e r i p h e r a l . In so m e i n s t a n c e s a p e r ip h e ra l dev ice w il l n o t ra d ia te s ign if ican t ly i f it is no t exerc ised by the com puter or stands alone. It is no t uncom m on that a low em ission co m p u te r and a low em iss ion pe riphe ra l , w hen they a re c o n n e c te d to g e th e r , and e x e rc ise d (sending da ta back and forth be tw een C PU and p e r ip h e ra l ) th a t th e w h o le s y s te m e x c e e d s regulatory limits. The I/O cable may becom e a r a d i a t i n g d e v ic e b e c a u s e o f n o n e x i s te n t or in a d e q u a te s h i e ld in g o r im p r o p e r s h i e ld in g te rm ina tion o r p rov ide a m ean to exerc ise the p e r ip h e ra l w h ic h now b eco m es E M I ra d ia te d so u rc e . T y p ic a l c o m p u te r e le c t ro m e c h a n ic a l p e r ip h e ra l dev ices are f loppy and h a rd d isk drives , tape drives , p r in te rs and p lo t te rs . E M I rad ia tion d e s i g n c o n s i d e r a t i o n s on th e c o m p u t e r e l e c t r o m e c h a n ic a l p e r ip h e r a l d e v ic e b a s ic a l ly CPU to /from Digital Analog and ElectroPeripheral Control Servo Mechanical I/O Interface _ Control and Electronics Assembly","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"84 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124827955","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566989
Gene Lee, S. Ellersick
A MIL-E-6051 electromagnetic co m patib il ity (EMC) te s t includes the establishment of safety margins fo r selected mission c r i t i c a l c irc u its fo r v e r i f ic a t io n o f system co m p atib il ity . Those c irc u its with the lowest safety margins are instrumented fo r tes t in g . A method has been developed fo r the determination of safety margins fo r mission c r i t i c a l c irc u its of the B-1B Avionics and across the e le c tr ic a l interfaces with a l l elements of the B-1B subsystems. The electromagnetic energy coupled between c irc u its and c i r c u i t threshold levels are required fo r determining the safety margins. A coupling analysis computer program, t i t l e d Intrasystem Electromagnetic Com patib ility Analysis Program (IEMCAP) and supplied by the Rome A ir Development Center, was u t i l i z e d to predict the w ire -to -w ire coupling by deta iled modeling of the B-1B. The method of deriving c i r c u i t source and load resistances and threshold level fo r a typ ica l d i f fe re n t ia l l in e d r ive r and receiver c i r c u i t w i l l be demonstrated. The techniques developed fo r analyzing the B-1B Avionics would be useful in determining c i r c u i t safety margins fo r use as c r i t e r ia in selecting c irc u its fo r instrumentation and tes ting fo r other electron ic systems.
MIL-E-6051电磁兼容性(electromagnetic co - compatibility, EMC)标准包括为选定的任务单元建立安全裕度，并确定其安全裕度，以保证系统的电磁兼容性。那些具有最低安全边际的c - u - its被用于测试。已经开发了一种确定任务安全裕度的方法，该方法可用于确定B-1B航空电子设备的安全裕度，以及与B-1B子系统的所有元素的所有接口之间的安全裕度。在确定安全裕度时，需要计算c / c / c和c / c / c之间耦合的电磁能量。由罗马航空发展中心提供的耦合分析计算机程序，即系统内电磁兼容性分析程序(IEMCAP)，通过对B-1B的详细建模来预测线与线之间的耦合。本文将演示一种基于源电阻和负载电阻及阈值电平的计算方法，该方法可用于一种类型的光纤放大器的源电阻和负载电阻以及阈值电平，该方法可用于光纤放大器的源电阻和负载电阻以及接收电阻。为分析B-1B航空电子设备而开发的技术将有助于确定c - 1b的安全范围，而B-1B的安全范围将用于确定B-1B的安全范围。
{"title":"Methodology for Determination of Circuit Safety Margins for MIL-E-6051 EMC System Test","authors":"Gene Lee, S. Ellersick","doi":"10.1109/ISEMC.1985.7566989","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566989","url":null,"abstract":"A MIL-E-6051 electromagnetic co m patib il ity (EMC) te s t includes the establishment of safety margins fo r selected mission c r i t i c a l c irc u its fo r v e r i f ic a t io n o f system co m p atib il ity . Those c irc u its with the lowest safety margins are instrumented fo r tes t in g . A method has been developed fo r the determination of safety margins fo r mission c r i t i c a l c irc u its of the B-1B Avionics and across the e le c tr ic a l interfaces with a l l elements of the B-1B subsystems. The electromagnetic energy coupled between c irc u its and c i r c u i t threshold levels are required fo r determining the safety margins. A coupling analysis computer program, t i t l e d Intrasystem Electromagnetic Com patib ility Analysis Program (IEMCAP) and supplied by the Rome A ir Development Center, was u t i l i z e d to predict the w ire -to -w ire coupling by deta iled modeling of the B-1B. The method of deriving c i r c u i t source and load resistances and threshold level fo r a typ ica l d i f fe re n t ia l l in e d r ive r and receiver c i r c u i t w i l l be demonstrated. The techniques developed fo r analyzing the B-1B Avionics would be useful in determining c i r c u i t safety margins fo r use as c r i t e r ia in selecting c irc u its fo r instrumentation and tes ting fo r other electron ic systems.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125318334","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566979
P. Zahra, C. Kendall
With today's ever increasing demand for faster, larger, and more reliable computing systems, the main frame computer -is much more commonplace than any other time in history. The mainframe computer as described in this paper is one that requires more than 60 cubic feet of floor space and above. The speeds of today's mainframe ( 7 2 0 MIPS) are consistently increasing the demands on impedance control, cable shielding, and compartment shielding. The days of 100 MHz bandwidths are over and the problem areas we are now dealing with are in the areas of 200 500 MHz. The theories and procedures followed for small systems (home computers) are not always going to work on some of the larger systems. The typical radiated bandwidth of a small computing system has dropped off significantly after 100 MHz while the mainframe's radiated bandwidth has just started to fall off. The mainframe looked at as_a~radiation source is much more concentrated, that is, it has much more radiated power available per unit/volume, typical input power to the mainframe computer is in the area of 6 1 2 KVA. If not controlled, the interference potential is staggering. The typical mainframe installation is another area of concern, visiting a typical computer site at a company which uses mainframe usually finds one in a virtual maze of computing systems and their associated peripheral equipment. it is not difficult to find these types of installations either. Typically, they have one floor full of mainframe computers with the floors above and below dedicated to the associated support equipment. We are talking about acres of potential RFI sources to any nearby susceptor. Now that the system has been defined, the EMCad analysis can begin. EMCad stands for Electromagnetic Compatibility Analysis and Design. It was developed by Chris Kendall of CK Consultants, Inc. and Franz Gisin of Rolm Corp. This software predicts the conducted and radiated emissions of any given system along with the susceptibility characteristics, including crosstalk analysis. Frame by frame each signal's contribution to the radiated and conducted profile of the system can be calculated. These levels are then plotted and the maximum emission envelope will be shown, From this emission envelope the required shielding and filtering can be calculated. Typical Mainframe Configuration
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Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566950
Glen Dash
{"title":"Designing to Avoid Static - ESD Testing of Digital Devices","authors":"Glen Dash","doi":"10.1109/ISEMC.1985.7566950","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566950","url":null,"abstract":"","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128015153","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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