Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7567009
L. Farber
In determ ining com pliance with the radiated em ission limits for com puting devices in Part 15 subpart J o f the FCC rules, a site other than an open area test site may be used if the results obtained at the alternative site are correlatable to open area test site results. This docum ent describes a statistical procedure for calculating the relationship betw een field strength m easurem ents perform ed in an absorber-lined shielded enclosure and those m ade at an open area test site. T he rationale for using a statistical approach is g iven.
{"title":"Statistical Correlation Between Field Strengths at an Open Area Site and in an Absorber-Lined Chamber","authors":"L. Farber","doi":"10.1109/ISEMC.1985.7567009","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7567009","url":null,"abstract":"In determ ining com pliance with the radiated em ission limits for com puting devices in Part 15 subpart J o f the FCC rules, a site other than an open area test site may be used if the results obtained at the alternative site are correlatable to open area test site results. This docum ent describes a statistical procedure for calculating the relationship betw een field strength m easurem ents perform ed in an absorber-lined shielded enclosure and those m ade at an open area test site. T he rationale for using a statistical approach is g iven.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"22 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131894165","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566973
V. Jain, T. McClellan, D. Kenneally
Stable compensation of intermodulation effects is crucial for high throughput communication systems 3 such as those typified by C I communication systems. In this paper a versatile technique for compensation of broadband intermodulation effects is presented. Clever parametrization of the block transfer functions guarantees the stability of the complete compensator over the entire parameter space. Examples in the paper demonstrate both the simplicity and the high degree of effectiveness achievable through this new methodology. 1 . INTRODUCTION Modern avionic communication systems are enormously complex, often involving multiple transmitters and receivers. Extreme care is needed not only in the design of the individual transmitter-receiver link, but also in the minimization of electromagnetic cross-couplings between the multiple paths. Failing this, collocated transmitters can cause in-band interference and on the other hand, the channel nonlinearities can cause out-of-band intermodulation interference. In such channels many sources for nonlinear distortion may exist, from nonlinear discrete devices in amplifiers to the distributed metal-tometal oxide junctions in aircraft skins, antenna structures, etc. The susceptibility to interference in these systems can be especially pronounced when transmitter-receiver pairs are located on an electronically dense command platform in a profusion of collocated RF emitters and receptors. For example, when multiple carriers are amplified simultaneously by one transmitter, Intermodulation (IM) products are generated due to the nonlinearities in the power amplifier (TWT or Klystron). Similarly, a strong (locally) transmitted signal leaking into a receptor can, when it is processed simultaneously with a weak but desired received carrier in a nonlinear element, produce degrading intermodulation effects in the receptors. Reduction of the intermodulation effects, when these are otherwise unavoidable, is possible through suitable post compensation as demonstrated in this paper. This work was done under Research Contract No. F30602-82-C-0135 from Rome Air Development Center, Griffiss Air Force Base. D. J. Kenneally Reliability & Compat. Div. Rome Air Development Center Griffiss Air Force Base NY 13441-5700 A new design approach to reduce the effects of nonlinear distortion in communication channels is developed here. Using the known (linear and nonlinear) characteristics of the channel, and an appropriately selected post-compensator structure, optimum parameter values are found for the compensator. The resulting design achieves a significant reduction of nonlinear effects [1]. It features: 0 reduction of intermodulation distortion by 15 to 50 dB 0 guaranteed stability of the compensation network, and 0 a minimum specified damping ratio (of the transfer functions of the linear blocks of the compensator). Thus, not only does the procedure result in a reduction of the intermodulation distortion but it also produces a compe
{"title":"Stable Compensation of Nonlinear Communication Systems","authors":"V. Jain, T. McClellan, D. Kenneally","doi":"10.1109/ISEMC.1985.7566973","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566973","url":null,"abstract":"Stable compensation of intermodulation effects is crucial for high throughput communication systems 3 such as those typified by C I communication systems. In this paper a versatile technique for compensation of broadband intermodulation effects is presented. Clever parametrization of the block transfer functions guarantees the stability of the complete compensator over the entire parameter space. Examples in the paper demonstrate both the simplicity and the high degree of effectiveness achievable through this new methodology. 1 . INTRODUCTION Modern avionic communication systems are enormously complex, often involving multiple transmitters and receivers. Extreme care is needed not only in the design of the individual transmitter-receiver link, but also in the minimization of electromagnetic cross-couplings between the multiple paths. Failing this, collocated transmitters can cause in-band interference and on the other hand, the channel nonlinearities can cause out-of-band intermodulation interference. In such channels many sources for nonlinear distortion may exist, from nonlinear discrete devices in amplifiers to the distributed metal-tometal oxide junctions in aircraft skins, antenna structures, etc. The susceptibility to interference in these systems can be especially pronounced when transmitter-receiver pairs are located on an electronically dense command platform in a profusion of collocated RF emitters and receptors. For example, when multiple carriers are amplified simultaneously by one transmitter, Intermodulation (IM) products are generated due to the nonlinearities in the power amplifier (TWT or Klystron). Similarly, a strong (locally) transmitted signal leaking into a receptor can, when it is processed simultaneously with a weak but desired received carrier in a nonlinear element, produce degrading intermodulation effects in the receptors. Reduction of the intermodulation effects, when these are otherwise unavoidable, is possible through suitable post compensation as demonstrated in this paper. This work was done under Research Contract No. F30602-82-C-0135 from Rome Air Development Center, Griffiss Air Force Base. D. J. Kenneally Reliability & Compat. Div. Rome Air Development Center Griffiss Air Force Base NY 13441-5700 A new design approach to reduce the effects of nonlinear distortion in communication channels is developed here. Using the known (linear and nonlinear) characteristics of the channel, and an appropriately selected post-compensator structure, optimum parameter values are found for the compensator. The resulting design achieves a significant reduction of nonlinear effects [1]. It features: 0 reduction of intermodulation distortion by 15 to 50 dB 0 guaranteed stability of the compensation network, and 0 a minimum specified damping ratio (of the transfer functions of the linear blocks of the compensator). Thus, not only does the procedure result in a reduction of the intermodulation distortion but it also produces a compe","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128824940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566960
Shaw-Yueh Lin, R. M. Showers
Using the filtered Poisson impulse model and taking into account (1) the spatial distribution of disturbance sources, (2) variation of pulse amplitude at the source, (3) propagation, and (4) the front-end filtering, we have been able to derive new Ist-order statistics for narrow-band impulsive disturbances, which are applicable to a wide class of physical phenomena and are shown to correspond to empirical data accurately in many cases.
{"title":"Statistical Modeling of Impulsive Interference to Communications Systems","authors":"Shaw-Yueh Lin, R. M. Showers","doi":"10.1109/ISEMC.1985.7566960","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566960","url":null,"abstract":"Using the filtered Poisson impulse model and taking into account (1) the spatial distribution of disturbance sources, (2) variation of pulse amplitude at the source, (3) propagation, and (4) the front-end filtering, we have been able to derive new Ist-order statistics for narrow-band impulsive disturbances, which are applicable to a wide class of physical phenomena and are shown to correspond to empirical data accurately in many cases.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"46 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117068611","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566933
M. Costa, I. Chih-Lin
T he problem of electrom agnetic rad iation and scattering from a perfectly conducting system of arb itrarily-shaped intercon nected com puter equipm ent is considered. The method of mo m ents is used to solve the frequency dom ain electric field integral equation (EFIE). Two electrom agnetic interference E M I C A D tools are presented for the analysis of c o u p l in g and c ro s s ta lk th rough arrays of arb itrarily shaped apertures in such a sys tem . T he system , placed in an anechoic cham ber, is excited by in ternal sources produced by arb itrary P C boards circuitry. Two cases are discussed: a free-space case and a half-space case. For the la tte r, th e presence of an infinite perfectly conducting ground plane, which models the effect of the anechoic cham ber, is incorporated in the formulation. In bo th instances, the bod ies are modeled by the sam e planar tr iangular patches and the wires by the sam e series of straight-w ire segments. For the free space case we use free space vector functions. For the half space case, a new set of vector functions are introduced to account for the presence of the ground plane, yet keeping the same num ber of unknowns as if the system were in free space. Body expan sion functions are used on the bodies surfaces, wire expansion functions a t the wires and each of the body-wire junctions there is one junc tion expansion function. One program calculates the electric fields in s id e the system and the leaking fields a t the arrays of apertures. The o ther com putes the electric fields ra d ia ted to the o u ts id e environm ent. The coupling of the inside solution w ith the outside one effectively dictates w hat the op tim um configuration and shape of the array of apertures ought to be to m in im iz e rad ia tion to the outside environment. IN T R O D U C T IO N C om puter an d o ther electronic equipm ent is, in general, con ta ined in conducting cabinets which have apertures for inputo u tp u t connections and cooling purposes. It is desirable to keep electrom agnetic transm ission through these holes as sm all as possible or a t least small enough to meet the FCC requirem ents. To investigate th e effect of such apertures, m easurem ents are m ade either a t open field test sites or in anechoic cham bers w here th e system s are placed on a ground plane. T he work in th is paper deals prim arily w ith the modeling of such systems to eventually come up w ith a general purpose electromagnetic CAD tool. For electronic equipm ent modeling purposes, a coax ial cable a ttached to a com puter box can be viewed as a wire m ounted and possibly driven against a conducting body. T here fore, the body plus the wire may be regarded as a rad ia to r of electrom agnetic fields produced by the current flowing on the surface of the composite system. A similar point of view holds if a system of several bodies interconnected by wires is consid ered. We view the system as a rad ia to r if the sources are
研究了由异形互连计算机设备组成的完美导电系统的电磁辐射和散射问题。采用矩量法求解频域电场积分方程(EFIE)。本文提出了两种电磁干扰分析工具,用于分析在这种系统中任意形状的孔的粗糙阵列中的C - o - o - p和C - o - s。该系统放置在消声室中,由任意pc板电路产生的外部源激发。讨论了两种情况:自由空间情况和半空间情况。对于小r,存在一个无限完美导电地平面,它模拟消声室的影响,被纳入公式。在这两种情况下,身体是由相同的平面三角形补丁和电线是由相同的系列直线线段。对于自由空间的情况,我们使用自由空间向量函数。对于半空间的情况,引入了一组新的矢量函数来解释地平面的存在,同时保持系统在自由空间中的相同数量的未知数。体的膨胀函数用在体的表面,导线的膨胀函数用在导线上,每一个体-导线的连接处都有一个连接处的膨胀函数。其中一个程序计算了系统内部的电场和孔阵列上的泄漏场。另一个计算电场的大小,并将其与周围的环境联系起来。内部溶液w与外部溶液w的耦合有效地决定了在入射到外部环境时,孔径阵列的最佳配置和形状应该是什么。一般来说,计算机和其他电子设备都装在导电柜中,这些导电柜中有用于输入、连接和冷却的孔。希望通过这些孔保持电磁传输尽可能小,或者至少足够小,以满足FCC的要求。为了研究这种孔径的影响,可以在开放的现场试验场或将系统放置在地平面上的消声室中进行测量。本文的工作主要是处理这些系统的建模,最终提出一个通用的电磁CAD工具。为了电子设备建模的目的,连接在计算机盒上的同轴电缆可以看作是安装在导电体上的导线。这里的T,因此,物体加上导线可以看作是由流过复合系统表面的电流所产生的电磁场的半径到r。如果考虑由电线连接的若干物体组成的系统,也会有类似的观点。如果源在系统上,我们把系统看作是一个到r的通道;相反,如果源是来自系统的d = t,我们把它看作是一个散射体。因此,通过在一个非均匀压场中分析系统,我们有效地考虑了这两种情况[1],之前的研究人员从a albertsen等人开始研究了线与表面的连接问题[2],他们分析了垂直于由四边形补丁模拟的表面的sm光滑部分的线。它们的形式是一种混合形式,即导线采用E - FIE形式,封闭表面采用m - FIE磁场积分方程。之后,Glisson[3]单独使用E - FIE形式公式将a - t与任意方向的导线a连接在p - t的平坦部分(但不靠近边缘或弯曲处),或直接位于p - t的弯曲处(但不靠近p - t的边缘或顶点)。Newm an和Pozar[4]使用类似的程序处理了同样的问题,并且该模拟最近已扩展到处理连接到金属线或靠近刀口[5]或靠近顶点或弯曲处[6]的金属线。然而,ir过程排除了连接到双曲面或顶点的导线。最近,Shaeffer和medgyesimitschang[7,8]已经处理了附着在旋转体上的导线问题(b.o R ' s)。然而,上述程序不适用于安装在表面w上的导线m,表面w具有边缘,楔形或二维或三维顶点在其连接区域。除[7,8]外,上述步骤也不适用于弯曲的结点区域。这是因为ir方法需要事先知道附点附近的电流t的形式[9,10],因为对于一端附着在正则曲面的连接点上的丝状电流源w,存在其产生的电流t的解析解。
{"title":"Minimization of Radiation from a System of Interconnected Computer Equipment Inside an Anechoic Chamber","authors":"M. Costa, I. Chih-Lin","doi":"10.1109/ISEMC.1985.7566933","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566933","url":null,"abstract":"T he problem of electrom agnetic rad iation and scattering from a perfectly conducting system of arb itrarily-shaped intercon nected com puter equipm ent is considered. The method of mo m ents is used to solve the frequency dom ain electric field integral equation (EFIE). Two electrom agnetic interference E M I C A D tools are presented for the analysis of c o u p l in g and c ro s s ta lk th rough arrays of arb itrarily shaped apertures in such a sys tem . T he system , placed in an anechoic cham ber, is excited by in ternal sources produced by arb itrary P C boards circuitry. Two cases are discussed: a free-space case and a half-space case. For the la tte r, th e presence of an infinite perfectly conducting ground plane, which models the effect of the anechoic cham ber, is incorporated in the formulation. In bo th instances, the bod ies are modeled by the sam e planar tr iangular patches and the wires by the sam e series of straight-w ire segments. For the free space case we use free space vector functions. For the half space case, a new set of vector functions are introduced to account for the presence of the ground plane, yet keeping the same num ber of unknowns as if the system were in free space. Body expan sion functions are used on the bodies surfaces, wire expansion functions a t the wires and each of the body-wire junctions there is one junc tion expansion function. One program calculates the electric fields in s id e the system and the leaking fields a t the arrays of apertures. The o ther com putes the electric fields ra d ia ted to the o u ts id e environm ent. The coupling of the inside solution w ith the outside one effectively dictates w hat the op tim um configuration and shape of the array of apertures ought to be to m in im iz e rad ia tion to the outside environment. IN T R O D U C T IO N C om puter an d o ther electronic equipm ent is, in general, con ta ined in conducting cabinets which have apertures for inputo u tp u t connections and cooling purposes. It is desirable to keep electrom agnetic transm ission through these holes as sm all as possible or a t least small enough to meet the FCC requirem ents. To investigate th e effect of such apertures, m easurem ents are m ade either a t open field test sites or in anechoic cham bers w here th e system s are placed on a ground plane. T he work in th is paper deals prim arily w ith the modeling of such systems to eventually come up w ith a general purpose electromagnetic CAD tool. For electronic equipm ent modeling purposes, a coax ial cable a ttached to a com puter box can be viewed as a wire m ounted and possibly driven against a conducting body. T here fore, the body plus the wire may be regarded as a rad ia to r of electrom agnetic fields produced by the current flowing on the surface of the composite system. A similar point of view holds if a system of several bodies interconnected by wires is consid ered. We view the system as a rad ia to r if the sources are ","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114203733","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566912
T. Passin
This paper presents surface current data measured on cylinders exposed to unipolar electromagnetic fields. The fields were incident perpendicular to the axis of the cylinders. The paper also presents data measured when a long wire was attached to a cylinder, simulating a trailing wire antenna. Changes in the attachment point of the wire only caused small changes in the current except when the wire was attached close to the sensor.
{"title":"Measured Response of a Metallic Cylinder with Trailing Wire to Broadside Electromagnetic Fields","authors":"T. Passin","doi":"10.1109/ISEMC.1985.7566912","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566912","url":null,"abstract":"This paper presents surface current data measured on cylinders exposed to unipolar electromagnetic fields. The fields were incident perpendicular to the axis of the cylinders. The paper also presents data measured when a long wire was attached to a cylinder, simulating a trailing wire antenna. Changes in the attachment point of the wire only caused small changes in the current except when the wire was attached close to the sensor.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127419853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566947
P. Richman
It has recently been recognized that capaci tance of the hand and forearm to free space can cause a potentially damaging, 1 to < ns Initial spike, with
{"title":"Computer Modeling the Effects of Oscilloscope Bandwidth on ESD Waveforms, Including Arc Oscillations","authors":"P. Richman","doi":"10.1109/ISEMC.1985.7566947","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566947","url":null,"abstract":"It has recently been recognized that capaci tance of the hand and forearm to free space can cause a potentially damaging, 1 to < ns Initial spike, with <lns risetime, in ESD cur rent discharge waveforms. ESD simulators can now replicate the spike. Oscilloscopes in general use can often barely recognize this wave characteristic however, due to bandwidth limitations. It is the purpose of this paper quantitatively to predict what will be dis played as a result of this ESD spike Input, on oscilloscopes with bandwidths ranging from 60 MHz to 1000 MHz. Also presented are computer printouts including arc oscillations at dif ferent phase angles, showing the large influ ence both the oscillations and their relative phasing have on the character of the ESD wave.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127549114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566916
M. Ehrich, G. Mrozynski
In the literature the magnetic shielding effect of a screen has been u s u a l ly treated in a simplified manner. In this paper, however, we show that the problem is more complicated. The object of investiga tion consists of a perturbing and a pertur bed line, both separated by a conducting screen, where the perturbing line carries an impressed current while the perturbed line is used to connect a load with a source of impressed voltage. The eddy currents in duced by the two lines in the screen as well as in the perturbed line depend on the load and on the geometry of the shielding system. For the description of the transient shield ing problem we use an integral equation, where the domain of integration extends over the cross-sections of the screen and of the perturbed line. The investigation of the system's shielding properties requires a solution to the eigenvalue problem of the integral equation which leads to a non-line ar matrix eigenvalue problem. In the case of alternating currents we replace the shielding system by an equivalent network model having frequency-dependent components. The paper contains the derivation of the general theory. Its results can be directly applied to the. treatment of special screens.
{"title":"Transient Shielding of Conducting Screens","authors":"M. Ehrich, G. Mrozynski","doi":"10.1109/ISEMC.1985.7566916","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566916","url":null,"abstract":"In the literature the magnetic shielding effect of a screen has been u s u a l ly treated in a simplified manner. In this paper, however, we show that the problem is more complicated. The object of investiga tion consists of a perturbing and a pertur bed line, both separated by a conducting screen, where the perturbing line carries an impressed current while the perturbed line is used to connect a load with a source of impressed voltage. The eddy currents in duced by the two lines in the screen as well as in the perturbed line depend on the load and on the geometry of the shielding system. For the description of the transient shield ing problem we use an integral equation, where the domain of integration extends over the cross-sections of the screen and of the perturbed line. The investigation of the system's shielding properties requires a solution to the eigenvalue problem of the integral equation which leads to a non-line ar matrix eigenvalue problem. In the case of alternating currents we replace the shielding system by an equivalent network model having frequency-dependent components. The paper contains the derivation of the general theory. Its results can be directly applied to the. treatment of special screens.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"103 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124729802","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566925
Cleveland F. Watkins
The equivalent plane-wave power density in the near-field can be expressed in terms of the power density as determined by the far-field equation and the relative slopes of the NF curves and the FF curve from their respective points of intersection. For the NF1 and the FF curve, that intersection is chosen to occur at one (1) wavelength — the basic reference point for these analyses. Accordingly, and using log notation:
{"title":"Appendix: A Technique for Determining Safe Separation Distances for Personnel and Electronic Equipment in the Near-Field of Short Dipole Antennas A Graphical Method - Its Development and Use: Appendix: Mathematical Development of Near-Field Distance Nomograms","authors":"Cleveland F. Watkins","doi":"10.1109/ISEMC.1985.7566925","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566925","url":null,"abstract":"The equivalent plane-wave power density in the near-field can be expressed in terms of the power density as determined by the far-field equation and the relative slopes of the NF curves and the FF curve from their respective points of intersection. For the NF1 and the FF curve, that intersection is chosen to occur at one (1) wavelength — the basic reference point for these analyses. Accordingly, and using log notation:","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125876133","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566949
D. Kenneally, Gary Head, S. C. Anderson
This paper presents the results of an effort to determine the changes in the EMI noise susceptibility of selected MOS integrated circuits due to the presence of Electrostatic Discharge protection networks integral to the host chip. The approach taken combines laboratory measurements with computer aided circuit simulations. EMI noise stimuli are laboratory generated and applied as Continuous Wave (CW), AM CW, and impulse waveforms, in the frequency range from 3 to 300 MHz. These extraneous noise signals (EMI) are capacitively coupled into MSI and LSI CMOS and NM0S devices under test, while appropriate functional signals are applied. Our results indicated that select input protect circuitry diminishes the effect of pulsed EMI with a fast rise time and an exponentially decaying fall time. However, the protect circuitry appears in some cases to enhance the effect of 100% square wave modulated EMI from 20 MHz to 200 MHz.
{"title":"EMI Noise Susceptibility of ESD Protect Buffers in Selected MOS Devices","authors":"D. Kenneally, Gary Head, S. C. Anderson","doi":"10.1109/ISEMC.1985.7566949","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566949","url":null,"abstract":"This paper presents the results of an effort to determine the changes in the EMI noise susceptibility of selected MOS integrated circuits due to the presence of Electrostatic Discharge protection networks integral to the host chip. The approach taken combines laboratory measurements with computer aided circuit simulations. EMI noise stimuli are laboratory generated and applied as Continuous Wave (CW), AM CW, and impulse waveforms, in the frequency range from 3 to 300 MHz. These extraneous noise signals (EMI) are capacitively coupled into MSI and LSI CMOS and NM0S devices under test, while appropriate functional signals are applied. Our results indicated that select input protect circuitry diminishes the effect of pulsed EMI with a fast rise time and an exponentially decaying fall time. However, the protect circuitry appears in some cases to enhance the effect of 100% square wave modulated EMI from 20 MHz to 200 MHz.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125111368","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1985-08-01DOI: 10.1109/ISEMC.1985.7566966
M. Terrien
The m o d e l l i n g of radiation from e l e c tronic equipment is investigated. Several radiation mechanisms for conductive enclosures are identified, physically model led and empir ically characterized from far-field (10 m) measurements. This information is used to generate computer models that relate closefield to far-field radiation. Comparisons between measured far-field amplitude data and computer-modelled field estimations generated from measured c l o s e-field data are shown for various sources. Finally, measurement errors are discussed.
{"title":"Far-Field Amplitude Estimation of General Electromagnetic Radiators from Close-Field Measurements","authors":"M. Terrien","doi":"10.1109/ISEMC.1985.7566966","DOIUrl":"https://doi.org/10.1109/ISEMC.1985.7566966","url":null,"abstract":"The m o d e l l i n g of radiation from e l e c tronic equipment is investigated. Several radiation mechanisms for conductive enclosures are identified, physically model led and empir ically characterized from far-field (10 m) measurements. This information is used to generate computer models that relate closefield to far-field radiation. Comparisons between measured far-field amplitude data and computer-modelled field estimations generated from measured c l o s e-field data are shown for various sources. Finally, measurement errors are discussed.","PeriodicalId":256770,"journal":{"name":"1985 IEEE International Symposium on Electromagnetic Compatibility","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1985-08-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130554094","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}