Pub Date : 1987-06-01DOI: 10.1109/ARFTG.1987.323859
Michael J. Pervere, John T. Barr
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Pub Date : 1900-01-01DOI: 10.1109/ARFTG.1987.323853
R. Kerczewski, Elaine S. Daugherty, I. Kramarchuk
The performance of microwave systems and components for digital data transmission can be characterized by a plot of the bit-error rate as a function of the signal-to-noise ratio (or Eb/No). Methods for the efficient automated measurement of bit-error rates and signal-to-noise ratios, developed at NASA Lewis Research Center, are described. Noise measurement considerations and time requirements for measurement accuracy, as well as computer control and data processing methods, are discussed.
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