Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984780
Koray Ozdal Ozkan
A test system designed and developed to perform Factory Acceptance Testing (FAT) and Commissioning and Acceptance Testing (CAT) of the dynamic positioning system developed by Aselsan Inc., is presented in this paper. The test system uses physical signals and is able to perform automated testing, real-time data analysis, monitoring and logging. Details of the system are given within the paper.
{"title":"Test System For Dynamic Positioning Systems in Marine Platforms","authors":"Koray Ozdal Ozkan","doi":"10.1109/AUTOTESTCON47462.2022.9984780","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984780","url":null,"abstract":"A test system designed and developed to perform Factory Acceptance Testing (FAT) and Commissioning and Acceptance Testing (CAT) of the dynamic positioning system developed by Aselsan Inc., is presented in this paper. The test system uses physical signals and is able to perform automated testing, real-time data analysis, monitoring and logging. Details of the system are given within the paper.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131453310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984767
Eric Jauregui, Juan E Ramos
The demand for accelerated product development and integration is continuing to grow in the marketplace. To achieve an efficient integration schedule, it is necessary to have a fully defined and implemented test system engineering methodology prior to the start of product integration and test. A well-disciplined methodology results in improved levels of preparation at the start of integration. Too often, integration teams are developing and detailing test methodology after product delivery. This leads to long integration times and significant impacts to project schedules. By implementing a disciplined test system engineering methodology that develops testability artifacts early in the development cycle, integration schedule pitfalls can be avoided. Testability artifacts that decompose test capabilities into detailed test requirements allows for concurrent resource development, ensuring mature product delivery to a given test event. This paper defines a process that achieves these goals and provides detailed recommendations to achieve efficiencies when integrating a product. Additionally, the paper provides the necessary artifacts required to align all design activities needed to achieve a successful integration outcome. Test methods and detailed implementation requirements are documented and provided as part of the Process. Implementing a disciplined test system engineering methodology achieves significantly reduced product integration and verification schedules.
{"title":"Test Equipment and Product Efficiency at the Start of Product Integration","authors":"Eric Jauregui, Juan E Ramos","doi":"10.1109/AUTOTESTCON47462.2022.9984767","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984767","url":null,"abstract":"The demand for accelerated product development and integration is continuing to grow in the marketplace. To achieve an efficient integration schedule, it is necessary to have a fully defined and implemented test system engineering methodology prior to the start of product integration and test. A well-disciplined methodology results in improved levels of preparation at the start of integration. Too often, integration teams are developing and detailing test methodology after product delivery. This leads to long integration times and significant impacts to project schedules. By implementing a disciplined test system engineering methodology that develops testability artifacts early in the development cycle, integration schedule pitfalls can be avoided. Testability artifacts that decompose test capabilities into detailed test requirements allows for concurrent resource development, ensuring mature product delivery to a given test event. This paper defines a process that achieves these goals and provides detailed recommendations to achieve efficiencies when integrating a product. Additionally, the paper provides the necessary artifacts required to align all design activities needed to achieve a successful integration outcome. Test methods and detailed implementation requirements are documented and provided as part of the Process. Implementing a disciplined test system engineering methodology achieves significantly reduced product integration and verification schedules.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"124 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133684939","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984768
Yarkin Yigit, O. Suvak
The method of tuning a cavity filter and multiplexer is a stringent process since material and manufacturing tolerances. The post-production process is not only time consuming but also expensive, especially for high-order narrowband complex filters which include coupling and cross-coupling parts. In addition to manual tuning of these filters limits precise tuning and production volumes and it increases manufacturing costs. In this scope, it is inevitable to replace this traditional manual tuning task with some more advanced and automatic methods. In order to overcome these problems, software controlled robotic tuning system is implemented. This paper introduces robotic control architecture for cavity filter and multiplexer tuning based on intelligence computer-aided tuning. The system is specially designed for miniaturized tuning screw filters. It works fully autonomously and its members are COBOT, single and multi-axis robotic arms, and a cartesian platform. Also, it includes a pattern recognition system and force-torque sensors to sense and measure all relevant data during the operation process. Rf tuning and control algorithms architectures are built on data driven model which fed and learned from data derived during the test with optimization approaches. The system works with soft locking principle to prevent damage to tuning screws. In the end, experimental automated tuned filter performance and improvement of tuning iteration times are given.
{"title":"Control Architecture for Autonomous RF Cavity Filter and Multiplexer Tuning","authors":"Yarkin Yigit, O. Suvak","doi":"10.1109/AUTOTESTCON47462.2022.9984768","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984768","url":null,"abstract":"The method of tuning a cavity filter and multiplexer is a stringent process since material and manufacturing tolerances. The post-production process is not only time consuming but also expensive, especially for high-order narrowband complex filters which include coupling and cross-coupling parts. In addition to manual tuning of these filters limits precise tuning and production volumes and it increases manufacturing costs. In this scope, it is inevitable to replace this traditional manual tuning task with some more advanced and automatic methods. In order to overcome these problems, software controlled robotic tuning system is implemented. This paper introduces robotic control architecture for cavity filter and multiplexer tuning based on intelligence computer-aided tuning. The system is specially designed for miniaturized tuning screw filters. It works fully autonomously and its members are COBOT, single and multi-axis robotic arms, and a cartesian platform. Also, it includes a pattern recognition system and force-torque sensors to sense and measure all relevant data during the operation process. Rf tuning and control algorithms architectures are built on data driven model which fed and learned from data derived during the test with optimization approaches. The system works with soft locking principle to prevent damage to tuning screws. In the end, experimental automated tuned filter performance and improvement of tuning iteration times are given.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130262018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984763
D. Kaushansky, Michelle Renda, Michael Drolette, Eric Murphy
When gathering requirements for a new O-level tester, there are many reference sources to use as examples to help design a total solution. The first step is to start with what is being tested, that typically has most of the IO needed and will help in creating a test strategy. Next, one should look to examples of Military Depot ATE for field repair. Many strategies from Depots can be reused for flight Line. Most users would prefer if the O-level testers had the same look and feel as a Depot tester. Commonality is typically appreciated by the end-user and this comes in many different forms, with instrument and software commonality typically offering the highest return on investment. While striving for commonality, one place that cannot be common is the form factor. Having instrument and software commonality is in direct odds with meeting the needs for an O-level tester. A typical O-level tester requirement is to be either 1 or 2-person portable and must meet stringent environmental requirements. The dichotomy of commonality versus form factor causes an ATE vendor to spend a staggering amount of energy innovating towards a solution. This comes as there is a push within the industry for common support equipment that can be used across any number of platforms. There is an inherent advantage in providing a tester foundation that can be configured for a wide variety of UUTs while offering a similar software environment to the solutions provided at the depot level. An ATE vendor should aim to leverage their experience at the depot level to provide the highest quality O-level test solutions. This paper will explore strategies of how to maintain commonality for instruments and software while still being able to innovate on the tester configuration, form factor and environmental requirements.
{"title":"The Dichotomy of Commonality versus Form Factor for O-level ATE","authors":"D. Kaushansky, Michelle Renda, Michael Drolette, Eric Murphy","doi":"10.1109/AUTOTESTCON47462.2022.9984763","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984763","url":null,"abstract":"When gathering requirements for a new O-level tester, there are many reference sources to use as examples to help design a total solution. The first step is to start with what is being tested, that typically has most of the IO needed and will help in creating a test strategy. Next, one should look to examples of Military Depot ATE for field repair. Many strategies from Depots can be reused for flight Line. Most users would prefer if the O-level testers had the same look and feel as a Depot tester. Commonality is typically appreciated by the end-user and this comes in many different forms, with instrument and software commonality typically offering the highest return on investment. While striving for commonality, one place that cannot be common is the form factor. Having instrument and software commonality is in direct odds with meeting the needs for an O-level tester. A typical O-level tester requirement is to be either 1 or 2-person portable and must meet stringent environmental requirements. The dichotomy of commonality versus form factor causes an ATE vendor to spend a staggering amount of energy innovating towards a solution. This comes as there is a push within the industry for common support equipment that can be used across any number of platforms. There is an inherent advantage in providing a tester foundation that can be configured for a wide variety of UUTs while offering a similar software environment to the solutions provided at the depot level. An ATE vendor should aim to leverage their experience at the depot level to provide the highest quality O-level test solutions. This paper will explore strategies of how to maintain commonality for instruments and software while still being able to innovate on the tester configuration, form factor and environmental requirements.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114901659","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984771
J. Kroculick
This paper presents an agile Model-Based Testing (aMBT) strategy to guide the rapid acquisition and implemen-tation of modernized Positioning, Navigation, and Timing (PNT) capabilities. Next-generation PNT services need to be secure and assured to support of Multi-Domain Operations (MDO). With aMBT the systems that use PNT can become more responsive to mission requirements. Positioning, Navigation, and Timing (PNT) services are deliv-ered by System of Systems (SoSs) that support Multi-Domain Operations. Because, PNT services span many constituent systems and components, a holistic strategy is needed to select technology options to support end-to-end capabilities by integrating system resources. To implement Assured PNT services, a strategy is needed to determine how to ensure that PNT data is available during military operations.
本文提出了一种敏捷的基于模型的测试(aMBT)策略，以指导现代化定位、导航和授时(PNT)能力的快速获取和实现。下一代PNT业务需要安全可靠地支持多域作战(MDO)。使用aMBT，使用PNT的系统可以更好地响应任务需求。定位、导航和授时(PNT)服务由支持多域作战的系统之系统(System of Systems, SoSs)提供。由于PNT服务跨越许多组成系统和组件，因此需要一个整体策略来选择技术选项，通过集成系统资源来支持端到端功能。为了实现有保障的PNT服务，需要制定一项战略来确定如何确保PNT数据在军事行动期间可用。
{"title":"An Agile Model-Based Test Strategy for Assured PNT Implementation","authors":"J. Kroculick","doi":"10.1109/AUTOTESTCON47462.2022.9984771","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984771","url":null,"abstract":"This paper presents an agile Model-Based Testing (aMBT) strategy to guide the rapid acquisition and implemen-tation of modernized Positioning, Navigation, and Timing (PNT) capabilities. Next-generation PNT services need to be secure and assured to support of Multi-Domain Operations (MDO). With aMBT the systems that use PNT can become more responsive to mission requirements. Positioning, Navigation, and Timing (PNT) services are deliv-ered by System of Systems (SoSs) that support Multi-Domain Operations. Because, PNT services span many constituent systems and components, a holistic strategy is needed to select technology options to support end-to-end capabilities by integrating system resources. To implement Assured PNT services, a strategy is needed to determine how to ensure that PNT data is available during military operations.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"214 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115503486","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984741
David Dunn
The United States Armed Forces and many of our military allies, still must rely on decades-old computer systems to accomplish crucial tasks. These “legacy” computers were used in many early military test stands. A significant number of these ATE stations remain in use today, providing testing capability for early versions of military aircraft and weapons systems. These legacy military ATE's often cannot be affordably rehosted to newer computer platforms, so they must be kept running - some for many years to come. The primary weakness of these legacy computers are the data storage peripherals, which are a leading cause of aging ATE downtime.
{"title":"ATE Life Extension Using Emulated Peripherals","authors":"David Dunn","doi":"10.1109/AUTOTESTCON47462.2022.9984741","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984741","url":null,"abstract":"The United States Armed Forces and many of our military allies, still must rely on decades-old computer systems to accomplish crucial tasks. These “legacy” computers were used in many early military test stands. A significant number of these ATE stations remain in use today, providing testing capability for early versions of military aircraft and weapons systems. These legacy military ATE's often cannot be affordably rehosted to newer computer platforms, so they must be kept running - some for many years to come. The primary weakness of these legacy computers are the data storage peripherals, which are a leading cause of aging ATE downtime.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131301968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984766
Wenhao Zhao, Shulin Tian, Hongliang Chen, Yindong Xiao, Qiong Wu, Ke Liu
Arbitrary waveform generator (AWG) can generate various excitation signals flexibly and is widely used in the automatic testing system (ATS). With the continuous evolution of electronic science and technology, higher demand for the AWG's sampling rate and output bandwidth has been put forward. Frequency-interleaved Digital-to-analog converter (FI-DAC) can improve those parameters quite effectively. However, the phase deviation between sub-band paths in the FI-DAC will cause a severe error in the overlapping band when the sub-band signals are combined. Therefore, we set up the error model for the FI-DAC overlapping band, analyzed the impact of the phase deviation of the output signal, and proposed a phase compensation method based on all-pass filter. The all-pass filter coefficient solution for phase compensation is a non-linear least square (NLS) problem and is usually solved using meta-heuristics. Yet the traditional genetic algorithm (GA) has a slow convergence speed, and the particle swarm optimization (PSO) tends to fall into local optimal when solving for high-order filter coefficient. Hence, we analyzed the parametric characteristics of all-pass filter and proposed a modified GA (MGA) to solve filter coefficients, compensate for the phase deviation between the sub-bands, and guarantee the quality of the final synthesized signals. The experiment result shows that, under the same number of iterations, the root mean square (RMS) error of the traditional GA is 0.1736 rad, PSO is 0.7725 rad, while the error of our MGA is only 0.0387rad, which is significantly better than the conventional method.
{"title":"Design of An All-Pass Phase Compensation Filter Based on Modified Genetic algorithm in FI-DAC","authors":"Wenhao Zhao, Shulin Tian, Hongliang Chen, Yindong Xiao, Qiong Wu, Ke Liu","doi":"10.1109/AUTOTESTCON47462.2022.9984766","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984766","url":null,"abstract":"Arbitrary waveform generator (AWG) can generate various excitation signals flexibly and is widely used in the automatic testing system (ATS). With the continuous evolution of electronic science and technology, higher demand for the AWG's sampling rate and output bandwidth has been put forward. Frequency-interleaved Digital-to-analog converter (FI-DAC) can improve those parameters quite effectively. However, the phase deviation between sub-band paths in the FI-DAC will cause a severe error in the overlapping band when the sub-band signals are combined. Therefore, we set up the error model for the FI-DAC overlapping band, analyzed the impact of the phase deviation of the output signal, and proposed a phase compensation method based on all-pass filter. The all-pass filter coefficient solution for phase compensation is a non-linear least square (NLS) problem and is usually solved using meta-heuristics. Yet the traditional genetic algorithm (GA) has a slow convergence speed, and the particle swarm optimization (PSO) tends to fall into local optimal when solving for high-order filter coefficient. Hence, we analyzed the parametric characteristics of all-pass filter and proposed a modified GA (MGA) to solve filter coefficients, compensate for the phase deviation between the sub-bands, and guarantee the quality of the final synthesized signals. The experiment result shows that, under the same number of iterations, the root mean square (RMS) error of the traditional GA is 0.1736 rad, PSO is 0.7725 rad, while the error of our MGA is only 0.0387rad, which is significantly better than the conventional method.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122903701","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984737
Eric Jauregui, J. Valfre
It is not uncommon to find that test development companies have unique approaches to developing their test equipment. This can stem from ad-hoc to a very detailed and rigorous approach. Often the former can lead to inconsistent and costly design methodologies. The following paper contains an approach to developing modular test equipment for space products and can be analogous to other product types. Creating a common approach in a business can yield benefits to cost, schedule, and technical execution. A standard approach from decomposing test requirements from a product requirements specification and applying these requirements to the test equipment needs will be illustrated. The benefits of a well-defined strategy including manufacturing and testability will be discussed. The test equipment requirements will be implemented and, thus, verified and validated for factory acceptance testing of a product. A use case will be walked through in this paper to provide the reader with an example.
{"title":"Developing Modular Factory Test Equipment Used For Space Based Products","authors":"Eric Jauregui, J. Valfre","doi":"10.1109/AUTOTESTCON47462.2022.9984737","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984737","url":null,"abstract":"It is not uncommon to find that test development companies have unique approaches to developing their test equipment. This can stem from ad-hoc to a very detailed and rigorous approach. Often the former can lead to inconsistent and costly design methodologies. The following paper contains an approach to developing modular test equipment for space products and can be analogous to other product types. Creating a common approach in a business can yield benefits to cost, schedule, and technical execution. A standard approach from decomposing test requirements from a product requirements specification and applying these requirements to the test equipment needs will be illustrated. The benefits of a well-defined strategy including manufacturing and testability will be discussed. The test equipment requirements will be implemented and, thus, verified and validated for factory acceptance testing of a product. A use case will be walked through in this paper to provide the reader with an example.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130017642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984712
Melih Karasubaşi, Yunus Köktaş, Hüseyin Sagirkaya
Validation and verification of systems integrated in an aircraft is one of the most challenging step in design and testing. There are various systems in the aircraft such as air vehicle systems; power plant system, fuel system, hydraulic system, environmental control systems, flight control systems, fire protection system, ice detection systems, landing gears, avionics, mission and electrical systems. All systems include various sensors and interfaces to provide the flight. Aircraft includes various sensors such as temperature, pressure, force, position, level and electrical sensors providing voltage, current or resistance electrical signal outputs. In integrated architecture of the aircraft, a remote input output unit, RID manages all these interfaces and converts the data to digital format via a digital bus such as MIL STD 1553 and ARINC 429 in order to provide all the information to provide deterministic system response for a safe flight. In this paper new approaches, models and tools to test RIU integrated in HURJET aircraft will be defined. Outputs of the tests will be evaluated. Required test solution in the test design are sensor models, sensors, RIU, avionics controller and test equipment and software. Sensor simulation environment provides modeling of the avionics and helps to test the system evaluating the integration before the aircraft ground and flight tests. Test system converts the sensor models into analog signals and sends the converted electrical signals to the RIU inputs. Digital signals including MIL STD 1553 and ARINC 429 interfaces are modelled and send to RIU and RIU outputs are monitored and evaluated in a test scenario.
{"title":"Model Based Testing of Aircraft Interfaces","authors":"Melih Karasubaşi, Yunus Köktaş, Hüseyin Sagirkaya","doi":"10.1109/AUTOTESTCON47462.2022.9984712","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984712","url":null,"abstract":"Validation and verification of systems integrated in an aircraft is one of the most challenging step in design and testing. There are various systems in the aircraft such as air vehicle systems; power plant system, fuel system, hydraulic system, environmental control systems, flight control systems, fire protection system, ice detection systems, landing gears, avionics, mission and electrical systems. All systems include various sensors and interfaces to provide the flight. Aircraft includes various sensors such as temperature, pressure, force, position, level and electrical sensors providing voltage, current or resistance electrical signal outputs. In integrated architecture of the aircraft, a remote input output unit, RID manages all these interfaces and converts the data to digital format via a digital bus such as MIL STD 1553 and ARINC 429 in order to provide all the information to provide deterministic system response for a safe flight. In this paper new approaches, models and tools to test RIU integrated in HURJET aircraft will be defined. Outputs of the tests will be evaluated. Required test solution in the test design are sensor models, sensors, RIU, avionics controller and test equipment and software. Sensor simulation environment provides modeling of the avionics and helps to test the system evaluating the integration before the aircraft ground and flight tests. Test system converts the sensor models into analog signals and sends the converted electrical signals to the RIU inputs. Digital signals including MIL STD 1553 and ARINC 429 interfaces are modelled and send to RIU and RIU outputs are monitored and evaluated in a test scenario.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124647069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984716
Laura Fox, Usman Anwar, Jesse Gora, Timothy Weaver
Two significant issues facing Naval Aviation avionics support are “No Fault Found” conditions and Original Equipment Manufacturers (OEMs) ceasing support of avionics systems. With older avionics requiring more labor hours for troubleshooting and OEMs no longer providing support to repair older avionics, the increase in turnaround time has depleted supply stock of UUTs. As a result, Naval Program Management Air (PMAs) and Fleet Support Teams (FSTs) have to endure negative cost and schedule impacts. In order to support troubleshooting and repair at the Intermediate (I)-level for the H-1 Wiring Integration Assemblies (WIAs), the Cherry Point Development Team developed a solution using a universal cable design to support testing of 43 WIAs. The design utilizes thirty-seven (37) Test Adapter Cables (TACs) to interface between the WIA and the A WTS-02 whereas the OEM design required 500 TACs. Using the universal design solution lead to a 90% reduction in the number of cables, 83% reduction in cost, and a 57% reduction in schedule. This design provides Fleet users the capability to repair and declare Ready for Issue (RFI) WIAs directly in the field. Additionally, there is no testing or troubleshooting support available for the AV-8 Air Data Computer (ADC) Chassis. Currently, the I-level utilizes a process of elimination to identify if the fault is in the ADC chassis or the Circuit Card Assemblies (CCAs). In comparison, the depot maintainers rely on a Digital Multi Meter (DMM) to perform continuity checks and perform visual checks for isolation. The maintainers follow the process until the ADC passes; otherwise, the asset is deemed non-repairable and thrown away. To reduce the hours spent on testing the ADC Chassis, the Cherry Point Development Team designed a Test Program Set (TPS) utilizing the high density circuit switching offered by Eclypse International. Instead of having fourteen (14) cables connecting the ADC Chassis to the A WTS-02, the design utilizes fourteen (14) mock CCAs, four (4) ribbon cables, and two (2) Test Adapter Cables (TACs). This innovative TPS design reduces hookup time, physical footprint and cost for the AV-8 team.
{"title":"Innovative TPS Development Solutions to Reduce the Time, Cost, and Physical Footprint of Supporting Avionics","authors":"Laura Fox, Usman Anwar, Jesse Gora, Timothy Weaver","doi":"10.1109/AUTOTESTCON47462.2022.9984716","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984716","url":null,"abstract":"Two significant issues facing Naval Aviation avionics support are “No Fault Found” conditions and Original Equipment Manufacturers (OEMs) ceasing support of avionics systems. With older avionics requiring more labor hours for troubleshooting and OEMs no longer providing support to repair older avionics, the increase in turnaround time has depleted supply stock of UUTs. As a result, Naval Program Management Air (PMAs) and Fleet Support Teams (FSTs) have to endure negative cost and schedule impacts. In order to support troubleshooting and repair at the Intermediate (I)-level for the H-1 Wiring Integration Assemblies (WIAs), the Cherry Point Development Team developed a solution using a universal cable design to support testing of 43 WIAs. The design utilizes thirty-seven (37) Test Adapter Cables (TACs) to interface between the WIA and the A WTS-02 whereas the OEM design required 500 TACs. Using the universal design solution lead to a 90% reduction in the number of cables, 83% reduction in cost, and a 57% reduction in schedule. This design provides Fleet users the capability to repair and declare Ready for Issue (RFI) WIAs directly in the field. Additionally, there is no testing or troubleshooting support available for the AV-8 Air Data Computer (ADC) Chassis. Currently, the I-level utilizes a process of elimination to identify if the fault is in the ADC chassis or the Circuit Card Assemblies (CCAs). In comparison, the depot maintainers rely on a Digital Multi Meter (DMM) to perform continuity checks and perform visual checks for isolation. The maintainers follow the process until the ADC passes; otherwise, the asset is deemed non-repairable and thrown away. To reduce the hours spent on testing the ADC Chassis, the Cherry Point Development Team designed a Test Program Set (TPS) utilizing the high density circuit switching offered by Eclypse International. Instead of having fourteen (14) cables connecting the ADC Chassis to the A WTS-02, the design utilizes fourteen (14) mock CCAs, four (4) ribbon cables, and two (2) Test Adapter Cables (TACs). This innovative TPS design reduces hookup time, physical footprint and cost for the AV-8 team.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"225 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116769389","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：