Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984733
J. Semancik
Lifecycle management is the bane of existence for many test engineers. Opportunities to transition to that next new exciting project can be hampered by the need to keep deployed automatic test equipment (ATE) operational, especially as these systems continue to be pushed beyond their initial life projections. It is fair to assume that as the service life of these systems continues to be extended, hardware components will fail and replacement instrumentation and switching alternatives will not be readily available. This is further exacerbated by the lack of available legacy support from most OEM suppliers, compelling users to consider alternate approaches. A number of alternatives exist to address hardware replacement, but each can pose implementation challenges and drawbacks that must be considered. Inherent in any sustainment decision is the risk that unforeseen changes will occur that invalidate the current solution and impact previously qualified Test Program Sets (TPSs). Something as seemingly innocuous as substituting an instrument or switch card with an “exact” form, fit, function (FFF) replacement may require significantly more integration time than expected due to minor differences in hardware and software timing and execution speeds, settling times and propagation delays, or driver implementation and instrument setup/execution speed increases or delays, just to name a few. The economics of these sustainment activities must also be considered and weighed against the projected future loading requirements for the affected ATE system. For example, when does it make sense to simply procure last time buy quantities versus engaging in engineering activities to implement an alternate solution? This paper will delve into these and other sustainment challenges test engineers face when tasked with keeping legacy ATE operational. The discussion will include alternate approaches such as FFF drop in replacements, FPGA based equivalent instrumentation, architecture and software considerations, the impact these changes can have on existing TPSs, as well as the potential budget impact for the various approaches.
{"title":"Sustainment Challenges and Approaches for Legacy ATE Systems","authors":"J. Semancik","doi":"10.1109/AUTOTESTCON47462.2022.9984733","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984733","url":null,"abstract":"Lifecycle management is the bane of existence for many test engineers. Opportunities to transition to that next new exciting project can be hampered by the need to keep deployed automatic test equipment (ATE) operational, especially as these systems continue to be pushed beyond their initial life projections. It is fair to assume that as the service life of these systems continues to be extended, hardware components will fail and replacement instrumentation and switching alternatives will not be readily available. This is further exacerbated by the lack of available legacy support from most OEM suppliers, compelling users to consider alternate approaches. A number of alternatives exist to address hardware replacement, but each can pose implementation challenges and drawbacks that must be considered. Inherent in any sustainment decision is the risk that unforeseen changes will occur that invalidate the current solution and impact previously qualified Test Program Sets (TPSs). Something as seemingly innocuous as substituting an instrument or switch card with an “exact” form, fit, function (FFF) replacement may require significantly more integration time than expected due to minor differences in hardware and software timing and execution speeds, settling times and propagation delays, or driver implementation and instrument setup/execution speed increases or delays, just to name a few. The economics of these sustainment activities must also be considered and weighed against the projected future loading requirements for the affected ATE system. For example, when does it make sense to simply procure last time buy quantities versus engaging in engineering activities to implement an alternate solution? This paper will delve into these and other sustainment challenges test engineers face when tasked with keeping legacy ATE operational. The discussion will include alternate approaches such as FFF drop in replacements, FPGA based equivalent instrumentation, architecture and software considerations, the impact these changes can have on existing TPSs, as well as the potential budget impact for the various approaches.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"77 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126168215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984753
Marian Bulancea
Considering Murphy's law, “If anything can possibly go wrong, it will, and at the worst possible time”, there is a myriad of problems which need to be solved by “No single point of failure power supply systems” by designers, integrators and users. The paper covers factors to be considered in design, installation and maintenance in context of 30+years of experience and lesson learned approach to building redundant, fail-safe power supplies for mission critical applications. Aspects explored are output redundancy, input redundancy, programming and I/O fail safe and overcoming environment challenges. These environmental challenges include methods for deploying fault tolerant systems in high temperature, wet, dirty, corrosive and explosive applications.
{"title":"Approaches to Minimize Murphy's Law Impact On “No single point of failure power supply systems.”","authors":"Marian Bulancea","doi":"10.1109/AUTOTESTCON47462.2022.9984753","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984753","url":null,"abstract":"Considering Murphy's law, “If anything can possibly go wrong, it will, and at the worst possible time”, there is a myriad of problems which need to be solved by “No single point of failure power supply systems” by designers, integrators and users. The paper covers factors to be considered in design, installation and maintenance in context of 30+years of experience and lesson learned approach to building redundant, fail-safe power supplies for mission critical applications. Aspects explored are output redundancy, input redundancy, programming and I/O fail safe and overcoming environment challenges. These environmental challenges include methods for deploying fault tolerant systems in high temperature, wet, dirty, corrosive and explosive applications.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131965255","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984799
M. Don
Compressive sensing has emerged as powerful signal processing technique that has been applied to many dif-ferent types of measurement; enhancing systems in terms of power consumption, memory usage, resolution, and measurement speed. Although compressive sensing has experienced tremendous growth in theoretical research, successful commercial applications of compressive sensing have developed slowly. In many cases, alternative sensing strategies will outperform compressive sensing in real-world situations. In order to design a successful compressive sensing system, it is crucial to not only understand compressive sensing's strengths, but also its limitations. An intuitive introduction to compressive sensing is presented to describe how compressive sensing can be applied to practical measurement problems. The essential aspects of compressive sensing are explained, and common misunderstanding are addressed. Finally, compressive antenna pattern measurement is presented as case study, inspiring compressive sensing to be used in other applications in the automatic test community.
{"title":"Compressive Antenna Pattern Measurement: A Case Study in Practical Compressive Sensing","authors":"M. Don","doi":"10.1109/AUTOTESTCON47462.2022.9984799","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984799","url":null,"abstract":"Compressive sensing has emerged as powerful signal processing technique that has been applied to many dif-ferent types of measurement; enhancing systems in terms of power consumption, memory usage, resolution, and measurement speed. Although compressive sensing has experienced tremendous growth in theoretical research, successful commercial applications of compressive sensing have developed slowly. In many cases, alternative sensing strategies will outperform compressive sensing in real-world situations. In order to design a successful compressive sensing system, it is crucial to not only understand compressive sensing's strengths, but also its limitations. An intuitive introduction to compressive sensing is presented to describe how compressive sensing can be applied to practical measurement problems. The essential aspects of compressive sensing are explained, and common misunderstanding are addressed. Finally, compressive antenna pattern measurement is presented as case study, inspiring compressive sensing to be used in other applications in the automatic test community.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131247473","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984743
L. Ungar, N. Jacobson, T. M. Mak, Craig D. Stoldt
Military test activities aim to minimize the number of unique test and diagnostic equipment on hand in their facilities. With a multitude of bus standards, bus testing requires either a general test instrument approach or a variety of unique testers. The former complicates test program development, and the latter would result in the proliferation of unique automatic test systems. A synthetic instrument (SI) is a test instrument that can be realized (i.e., synthesized) within the fabric of a field programmable gate array (FPGA). This paper will discuss how use of SIs offers many benefits including lower test development cost, higher accuracy, higher speed and reconfigurability. Bus testing approaches are discussed and then shown to improve with the use of SIs. It highlights benefits of SIs in general and focuses on how SIs help to overcome many of the obstacles test engineers face in controlling buses. SIs also address the high-speed barrier in testing, since FPGAs that host these SIs incorporate multi-gigabit per second transceivers. Bus standards typically incorporate complex protocols. The test program developer needs to understand both the normal operation and failure modes to develop complete test suites. Since SIs can easily implement the bus controller logic and state machine, this frees the test engineer from descending to that level of detail. SIs can be created for many, if not all, serial and parallel, low-speed, and high-speed digital I/O buses. These strengths allow SIs to supply services that the test engineer can use to greatly reduce TPS development costs. With SIs used as a standard bus test instrument accessible to any ATE, the industry will gain a crucial resource for test development cost and time reduction.
{"title":"Effective use of Reconfigurable Synthetic Instruments in Automatic Testing of Input/Output (I/O) Buses","authors":"L. Ungar, N. Jacobson, T. M. Mak, Craig D. Stoldt","doi":"10.1109/AUTOTESTCON47462.2022.9984743","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984743","url":null,"abstract":"Military test activities aim to minimize the number of unique test and diagnostic equipment on hand in their facilities. With a multitude of bus standards, bus testing requires either a general test instrument approach or a variety of unique testers. The former complicates test program development, and the latter would result in the proliferation of unique automatic test systems. A synthetic instrument (SI) is a test instrument that can be realized (i.e., synthesized) within the fabric of a field programmable gate array (FPGA). This paper will discuss how use of SIs offers many benefits including lower test development cost, higher accuracy, higher speed and reconfigurability. Bus testing approaches are discussed and then shown to improve with the use of SIs. It highlights benefits of SIs in general and focuses on how SIs help to overcome many of the obstacles test engineers face in controlling buses. SIs also address the high-speed barrier in testing, since FPGAs that host these SIs incorporate multi-gigabit per second transceivers. Bus standards typically incorporate complex protocols. The test program developer needs to understand both the normal operation and failure modes to develop complete test suites. Since SIs can easily implement the bus controller logic and state machine, this frees the test engineer from descending to that level of detail. SIs can be created for many, if not all, serial and parallel, low-speed, and high-speed digital I/O buses. These strengths allow SIs to supply services that the test engineer can use to greatly reduce TPS development costs. With SIs used as a standard bus test instrument accessible to any ATE, the industry will gain a crucial resource for test development cost and time reduction.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"120 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122830196","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/autotestcon47462.2022.9984809
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Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984714
S. Ramlall, Lucerito Gutierrez, Miguel Cayetano, Sally McGehee
Common Data Link (CDL) is a communications waveform set for all Department of Defense (DoD) Services to transmit tactical data and intelligence information collected by Intelligence, Surveillance, and Reconnaissance (ISR) sensors to surface exploitation equipment. Bandwidth Efficient Common Data Link (BE-CDL) is an enhanced CDL waveform providing users with longer range and higher data rates between various platforms that include surface, airborne, subsurface, and man-portable platforms. The CDL waveform specification has clearly defined network performance metrics a terminal needs to satisfy in order to be compliant, but the government team at Naval Information Warfare Center (NIWC) Pacific has experienced firsthand that current vendors are not sufficiently testing their BE-CDL terminals before delivery to the government, partly because the required testing is time consuming and cost prohibitive for humans to manually perform. This results in CDL terminals not being fully compliant with the CDL specification and additional rework by the vendors, ultimately leading to schedule delays for fleet capability deliveries. This paper discusses a low-cost, automated test capability developed to measure the network performance of BE-CDL terminals as well as to analyze the results according to the waveform specification requirements. It leverages open-source software and inexpensive hardware in order to provide a low-cost test solution. One of the challenges with developing automation software for BE-CDL is that different terminals use different user and control interfaces. Some vendors are choosing not to support the use of the Simple Network Management Protocol (SNMP) despite it being a requirement in the BE-CDL specification, and are instead choosing to develop custom control interfaces which are not interoperable between different CDL terminals. It is shown in this paper how the modular design of the automation software allows it to accommodate these different control interfaces, including support for SNMP, thus making it suitable for use with any BE-CDL terminal. This is demonstrated through the use of two different terminals: a commercial off-the-shelf (COTS) CDL terminal as well as a low-cost and low-SWaP CDL terminal developed by the Air Force Research Laboratory (AFRL).
{"title":"A Modular Approach to the Automated Testing of Common Data Link Terminals","authors":"S. Ramlall, Lucerito Gutierrez, Miguel Cayetano, Sally McGehee","doi":"10.1109/AUTOTESTCON47462.2022.9984714","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984714","url":null,"abstract":"Common Data Link (CDL) is a communications waveform set for all Department of Defense (DoD) Services to transmit tactical data and intelligence information collected by Intelligence, Surveillance, and Reconnaissance (ISR) sensors to surface exploitation equipment. Bandwidth Efficient Common Data Link (BE-CDL) is an enhanced CDL waveform providing users with longer range and higher data rates between various platforms that include surface, airborne, subsurface, and man-portable platforms. The CDL waveform specification has clearly defined network performance metrics a terminal needs to satisfy in order to be compliant, but the government team at Naval Information Warfare Center (NIWC) Pacific has experienced firsthand that current vendors are not sufficiently testing their BE-CDL terminals before delivery to the government, partly because the required testing is time consuming and cost prohibitive for humans to manually perform. This results in CDL terminals not being fully compliant with the CDL specification and additional rework by the vendors, ultimately leading to schedule delays for fleet capability deliveries. This paper discusses a low-cost, automated test capability developed to measure the network performance of BE-CDL terminals as well as to analyze the results according to the waveform specification requirements. It leverages open-source software and inexpensive hardware in order to provide a low-cost test solution. One of the challenges with developing automation software for BE-CDL is that different terminals use different user and control interfaces. Some vendors are choosing not to support the use of the Simple Network Management Protocol (SNMP) despite it being a requirement in the BE-CDL specification, and are instead choosing to develop custom control interfaces which are not interoperable between different CDL terminals. It is shown in this paper how the modular design of the automation software allows it to accommodate these different control interfaces, including support for SNMP, thus making it suitable for use with any BE-CDL terminal. This is demonstrated through the use of two different terminals: a commercial off-the-shelf (COTS) CDL terminal as well as a low-cost and low-SWaP CDL terminal developed by the Air Force Research Laboratory (AFRL).","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131112138","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984739
D. Lowenstein, C. Mueth
Accuracy, repeatability, and utilization are used continually when we talk about a test and measurement strategy. These fundamentals allow the balance between the technical and business imperatives that test contributes to a product or program's life cycle. From a design point of view, test is the de facto tool to ensure the theory of design meets the reality of the product or production specifications. In manufacturing, test is a balance between ensuring quality and cost. For support, test is about insight with simplicity of operation. All of these play an integral part of the success of a business, but to make this all happen, there is a fundamental assumption that the test and measurement strategy is implemented and operated as it was designed. The fact is, not all tests are created equal when looking across an enterprise and/or workflow. Not everyone develops a test strategy and simulates its effectiveness and efficiency on the product the same way. The idea of a digital twin strategy has been around for years in the mechanical world and is starting to gain traction in the electrical world to minimize the gap between theory and reality. These same principals now can be applied to the test and measurement world. Such a strategy can lead to greater accuracy, repeatability, and utilization of test strategy. It will also allow test or design changes to be made before designs are frozen for technical and/or performance reasons. This Design and Test (DaT) process would not only change the way design and test flows work, but how overall programs change the way they do business from concept through support. This paper will explore the history of digital twins and show how digital twins can and will change the way we develop and implement test strategies in the future. It will detail how the workflow throughout a product/program's life cycle will change to reduce time, resources, and cost while dramatically increasing predictability and repeatability, and ensuring consistency of test strategies. This paper ultimately will give a foundation for a blueprint to develop a test and measurement DaT/digital twin strategy, share examples of use cases today, and outline the business and technical benefits for implementing such a strategy.
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Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984778
Robert C. Quinlan, Alex Brinister, Ted Macdonald, Amy White
Information systems are subject to serious threats that can have adverse impacts on organizational operations and assets, individuals, as well as third parties by compromising the confidentiality, integrity, or availability of information being processed, stored, or transmitted by those systems. Successful attacks on systems can result in grave damage to the economic and security interests of those organizations. In the defense space, the DoD Risk Management Framework (RMF) can provide a foundation for an organization's cybersecurity protection strategy. Securing information systems is a shared responsibility between test companies and their customers. ATE suppliers serving the defense industry can assist customers in securing their Automatic Test Equipment (ATE) by implementing the first four steps of the RMF process. ATE customers further increase the security of their systems by working with test companies to understand what additional security controls they could implement to successfully perform the last two steps of the RMF process. ATE suppliers can implement the following steps for the systems they are supplying: (1) Security categorization; (2) Security control selection; (3) Security control implementation; and (4) Security control assessment. Steps that should be performed by ATE customers are: (5) System authorization; and (6) Continuous monitoring. Early integration of the RMF into the product development life cycle is one of, according to NIST 800–37, “the most cost-effective and efficient methods for an organization to ensure that its protection strategy is implemented” [1]. Test companies can ease customer implementation of the RMF by integrating a specific set of security controls into their own product development life cycles. ATE suppliers can develop a more secure supply chain, harden manufacturing and development processes, and apply operating system (OS) security controls. Finally, they can help customers understand the remaining steps of the RMF that could be implemented to secure the confidentiality, integrity, and availability of their information systems.
{"title":"Securing ATE Using the DoD's Risk Management Framework","authors":"Robert C. Quinlan, Alex Brinister, Ted Macdonald, Amy White","doi":"10.1109/AUTOTESTCON47462.2022.9984778","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984778","url":null,"abstract":"Information systems are subject to serious threats that can have adverse impacts on organizational operations and assets, individuals, as well as third parties by compromising the confidentiality, integrity, or availability of information being processed, stored, or transmitted by those systems. Successful attacks on systems can result in grave damage to the economic and security interests of those organizations. In the defense space, the DoD Risk Management Framework (RMF) can provide a foundation for an organization's cybersecurity protection strategy. Securing information systems is a shared responsibility between test companies and their customers. ATE suppliers serving the defense industry can assist customers in securing their Automatic Test Equipment (ATE) by implementing the first four steps of the RMF process. ATE customers further increase the security of their systems by working with test companies to understand what additional security controls they could implement to successfully perform the last two steps of the RMF process. ATE suppliers can implement the following steps for the systems they are supplying: (1) Security categorization; (2) Security control selection; (3) Security control implementation; and (4) Security control assessment. Steps that should be performed by ATE customers are: (5) System authorization; and (6) Continuous monitoring. Early integration of the RMF into the product development life cycle is one of, according to NIST 800–37, “the most cost-effective and efficient methods for an organization to ensure that its protection strategy is implemented” [1]. Test companies can ease customer implementation of the RMF by integrating a specific set of security controls into their own product development life cycles. ATE suppliers can develop a more secure supply chain, harden manufacturing and development processes, and apply operating system (OS) security controls. Finally, they can help customers understand the remaining steps of the RMF that could be implemented to secure the confidentiality, integrity, and availability of their information systems.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"116 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115089090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984758
Jordan Schupbach, Elliott Pryor, Kyle Webster, John W. Sheppard
The problem of performing general prognostics and health management, especially in electronic systems, continues to present significant challenges. The low availability of failure data, makes learning generalized models difficult, and constructing generalized models during the design phase often requires a level of understanding of the failure mechanism that elude the designers. In this paper, we present a new, generalized approach to PHM based on two commonly available probabilistic models, Bayesian Networks and Continuous-Time Bayesian Networks, and pose the PHM problem from the perspective of risk mit-igation rather than failure prediction. We describe the tools and process for employing these tools in the hopes of motivating new ideas for investigating how best to advance PHM in the aerospace industry.
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Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984796
S. Yates
Modern Radio Frequency (RF) Automatic Test Stations employ switching to connect a multitude of measuring and stimulus instruments to the Unit Under Test (UUT). These switches add efficiency at the potential risk of increased measurement error due to switch repeatability. Switch match repeatability, a little-known performance characteristic, can add significant, unanticipated error to vector measurements. Electromechanical RF switches add to the overall measurement uncertainty due to their repeatability performance. In this paper, switch match repeatability is reviewed along with measurement data shown. Methods to address this repeatability issue is presented including process step ordering, in situ calibrations, and time domain techniques.
{"title":"RF Switch Considerations for Automatic Test Equipment Making Vector Measurements","authors":"S. Yates","doi":"10.1109/AUTOTESTCON47462.2022.9984796","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984796","url":null,"abstract":"Modern Radio Frequency (RF) Automatic Test Stations employ switching to connect a multitude of measuring and stimulus instruments to the Unit Under Test (UUT). These switches add efficiency at the potential risk of increased measurement error due to switch repeatability. Switch match repeatability, a little-known performance characteristic, can add significant, unanticipated error to vector measurements. Electromechanical RF switches add to the overall measurement uncertainty due to their repeatability performance. In this paper, switch match repeatability is reviewed along with measurement data shown. Methods to address this repeatability issue is presented including process step ordering, in situ calibrations, and time domain techniques.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131537177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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