Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984782
M. Obrecht
Measurement of small inductors is the trickiest compared to other component testing using typical LCR-meters providing test frequency of 100 kHz or lower. Inductance of 1 nH at 100 kHz only produces 6 mOhm impedance that is comparable to a contact resistance of the probes. Even at 1 MHz the impedance would only be 60 mOhms. We demonstrate a simple method of extraction of the two-wire probe parasitic inductance using HP4284A LCR-meter and HP16034E test fixture. The method effectively allows to measure sub nH inductors.
{"title":"Measurements of Extremely Small Inductance Values: Offset elimination technique for small inductance measurements using two-wire connection","authors":"M. Obrecht","doi":"10.1109/AUTOTESTCON47462.2022.9984782","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984782","url":null,"abstract":"Measurement of small inductors is the trickiest compared to other component testing using typical LCR-meters providing test frequency of 100 kHz or lower. Inductance of 1 nH at 100 kHz only produces 6 mOhm impedance that is comparable to a contact resistance of the probes. Even at 1 MHz the impedance would only be 60 mOhms. We demonstrate a simple method of extraction of the two-wire probe parasitic inductance using HP4284A LCR-meter and HP16034E test fixture. The method effectively allows to measure sub nH inductors.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126677713","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984773
Anthony P. Erwin
Intelligence, surveillance, target acquisition, and reconnaissance (ISTAR) weapons systems technologies are driving need for testing high bandwidth digital communication links up to 12.8 GB/s that stream data at speeds up to 10 Gb/s. Multiple bus types are used to interconnect sensor inputs and outputs (I/O) and weapon system assemblies. Both copper and fiber optics connections exist between multiple networked assemblies. Testing requirements are data intensive and drive the need for test systems capable of real-time, high bandwidth data capture, storage of Terabytes of data, and front-end switching to manage many I/O, Current ATE systems face a variety of problems achieving these capabilities because of PC bottlenecks due to limited host system computer backplane speed, and total number of shared interfaces to peripherals. These problems limit data transfer and storage speeds. Fiber-optic I/O are preferred for high speed, high bandwidth connections and drive the need for test instrumentation capable of optical conversion and controlled transmission to overcome optical losses through test cabling. These performance limitations degrade the reliability of data transfer resulting in lost or corrupted data. The next generation of test equipment for ISTAR's must include reconfigurable, software-defined bus test instruments that cover all high-speed communication types and high performance switching for managing mixed unit under test (UUT) I/O connections.
{"title":"Next Generation Streaming Data Test System for High Bandwidth Applications","authors":"Anthony P. Erwin","doi":"10.1109/AUTOTESTCON47462.2022.9984773","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984773","url":null,"abstract":"Intelligence, surveillance, target acquisition, and reconnaissance (ISTAR) weapons systems technologies are driving need for testing high bandwidth digital communication links up to 12.8 GB/s that stream data at speeds up to 10 Gb/s. Multiple bus types are used to interconnect sensor inputs and outputs (I/O) and weapon system assemblies. Both copper and fiber optics connections exist between multiple networked assemblies. Testing requirements are data intensive and drive the need for test systems capable of real-time, high bandwidth data capture, storage of Terabytes of data, and front-end switching to manage many I/O, Current ATE systems face a variety of problems achieving these capabilities because of PC bottlenecks due to limited host system computer backplane speed, and total number of shared interfaces to peripherals. These problems limit data transfer and storage speeds. Fiber-optic I/O are preferred for high speed, high bandwidth connections and drive the need for test instrumentation capable of optical conversion and controlled transmission to overcome optical losses through test cabling. These performance limitations degrade the reliability of data transfer resulting in lost or corrupted data. The next generation of test equipment for ISTAR's must include reconfigurable, software-defined bus test instruments that cover all high-speed communication types and high performance switching for managing mixed unit under test (UUT) I/O connections.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"45 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114019572","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984715
S. Sobolewski, W. L. Adams, R. Sankar
A convenient and well-performing Automatic Modulation Recognition technique for discrimination of numerous modern modulated waveforms found in commercial as well as military communication systems applicable to the new Air Force ABMS system as well as VDATS TPS development is presented. It involves generating complex feature vectors composed of high-order direct cumulant, cyclostationary and Fourier of wavelet transform features created with the help of Principal Component Analysis and variance data compression. Twelve modulated waveforms are used to evaluate the performance of the expanded feature vectors: eight commercial modulated waveforms [Quaternary Amplitude Shift Keying (QASK), Quaternary Frequency Shift Keying (QFSK), Quaternary Phase Shift Keying (QPSK), 16-Point Quadrature Amplitude Modulation (QAM-4,4), Gaussian Minimum Shift Keying (GMSK), Frequency Quadrature Amplitude Modulation (FQAM), Filter Bank Multi Carrier (FBMC) and Universal Filtered Multi Carrier (UFMC)], (Cosine) Binary Offset Carrier - BOC(1,1) - waveforms used in the European Galileo Navigation System and three waveforms utilized in defense military systems [Quaternary Linear Frequency Modulation (QLFM), Quaternary Pulse Width and Pulse Position Modulations (QPWM and QPPM)]. Generated complex feature vectors are categorized by a neural network to compare with corresponding library feature patterns.
{"title":"Recognition of Modern Modulated Waveforms with Applications to ABMS and VDATS Test Program Set Development","authors":"S. Sobolewski, W. L. Adams, R. Sankar","doi":"10.1109/AUTOTESTCON47462.2022.9984715","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984715","url":null,"abstract":"A convenient and well-performing Automatic Modulation Recognition technique for discrimination of numerous modern modulated waveforms found in commercial as well as military communication systems applicable to the new Air Force ABMS system as well as VDATS TPS development is presented. It involves generating complex feature vectors composed of high-order direct cumulant, cyclostationary and Fourier of wavelet transform features created with the help of Principal Component Analysis and variance data compression. Twelve modulated waveforms are used to evaluate the performance of the expanded feature vectors: eight commercial modulated waveforms [Quaternary Amplitude Shift Keying (QASK), Quaternary Frequency Shift Keying (QFSK), Quaternary Phase Shift Keying (QPSK), 16-Point Quadrature Amplitude Modulation (QAM-4,4), Gaussian Minimum Shift Keying (GMSK), Frequency Quadrature Amplitude Modulation (FQAM), Filter Bank Multi Carrier (FBMC) and Universal Filtered Multi Carrier (UFMC)], (Cosine) Binary Offset Carrier - BOC(1,1) - waveforms used in the European Galileo Navigation System and three waveforms utilized in defense military systems [Quaternary Linear Frequency Modulation (QLFM), Quaternary Pulse Width and Pulse Position Modulations (QPWM and QPPM)]. Generated complex feature vectors are categorized by a neural network to compare with corresponding library feature patterns.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134383043","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984786
R. Spinner, Wallace M Daniel, Josselyn Webb
The Program Manager, Supply and Maintenance Systems (PM SMS), along with the Electronics Software Calibration Test (ESCT) Division of Marine Depot Maintenance Command, execute the engineering support and development for the United States Marine Corps (USMC) General Purpose Automatic Test System (GPATS). The GPATS provides Intermediate and Depot level test capabilities for multiple communication and ground weapon systems. It utilizes commercial VXI analog instruments from several vendors; all are obsolete with no VXI replacements available. These include the digital multi-meter, counter/timer, digital storage oscilloscope, and arbitrary waveform generator. Most commercial vendors no longer produce or support the aforementioned VXI analog instruments. They only produce them utilizing PXI or PXIe bus architecture. PXI and PXIe instruments have the same physical form, and neither is directly compatible with a VXI chassis. There are three USMC GPATS configurations in use today. They are the Third Echelon Test System (TETS) and two variants of Virtual Instrument Portable Equipment Repair/Tester (VIPER/T). They incorporate Digital Test Systems (DTSs), Analog Instruments, High/Medium/Low Frequency Switching, and Programmable Power Supplies. All three GPATS have obsolete VXI analog instruments. The USMC GPATS DTS variant is also obsolete, but there are Commercial Off the Shelf (COTS) VXI DTS replacements available. There is still a need for VXI based DTSs, as moving to a PXI or PXIe DTS results in a 50% reduction of channels per card. Reducing total available channels or channels per card may result in a follow-on cost to rewrite the Test Program Sets that utilize them. Instead of an all-new PXI or PXIe based GPATS, PM SMS/ESCT explored combining the existing VXI DTS, the existing VXI High/Medium/Low Frequency Switching, and new PXIe analog instruments in the same VXI chassis. This approach utilizes a COTS PXIe Instrumentation Insertion Kit (PXIe Insert). The PXIe Insert acts as a VXI to PXIe chassis adapter, allowing PXIe instruments to fit and obtain power from a VXI chassis. The end goal of this effort is full functionality of PXIe bus architecture instruments in the existing VXI chassis. In addition to solving the GPATS analog instrument obsolescence problem, the PXI Insert has two benefits. First, the TETS and two VIPER/T can transform into a “Single” sustainable GPATS configuration; and in this particular case, it reduces the required GPATS VXI chassis from Two to “One.” This aligns with USMC concepts for lighter and smaller footprints, while remaining modular and scalable. The objectives of this initial USMC VXI/PXIe integration effort were finding fully suitable PXIe replacement instruments, and then demonstrating complete functionality for each, utilizing the GPATS system software. This was successful. Future testing involves regression testing of Application Program Set (APS) software. In summary, the PXIe Insert technology allows COTS PXIe inst
{"title":"GPATS PXIe Insert Kit for TETS and VIPER/T","authors":"R. Spinner, Wallace M Daniel, Josselyn Webb","doi":"10.1109/AUTOTESTCON47462.2022.9984786","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984786","url":null,"abstract":"The Program Manager, Supply and Maintenance Systems (PM SMS), along with the Electronics Software Calibration Test (ESCT) Division of Marine Depot Maintenance Command, execute the engineering support and development for the United States Marine Corps (USMC) General Purpose Automatic Test System (GPATS). The GPATS provides Intermediate and Depot level test capabilities for multiple communication and ground weapon systems. It utilizes commercial VXI analog instruments from several vendors; all are obsolete with no VXI replacements available. These include the digital multi-meter, counter/timer, digital storage oscilloscope, and arbitrary waveform generator. Most commercial vendors no longer produce or support the aforementioned VXI analog instruments. They only produce them utilizing PXI or PXIe bus architecture. PXI and PXIe instruments have the same physical form, and neither is directly compatible with a VXI chassis. There are three USMC GPATS configurations in use today. They are the Third Echelon Test System (TETS) and two variants of Virtual Instrument Portable Equipment Repair/Tester (VIPER/T). They incorporate Digital Test Systems (DTSs), Analog Instruments, High/Medium/Low Frequency Switching, and Programmable Power Supplies. All three GPATS have obsolete VXI analog instruments. The USMC GPATS DTS variant is also obsolete, but there are Commercial Off the Shelf (COTS) VXI DTS replacements available. There is still a need for VXI based DTSs, as moving to a PXI or PXIe DTS results in a 50% reduction of channels per card. Reducing total available channels or channels per card may result in a follow-on cost to rewrite the Test Program Sets that utilize them. Instead of an all-new PXI or PXIe based GPATS, PM SMS/ESCT explored combining the existing VXI DTS, the existing VXI High/Medium/Low Frequency Switching, and new PXIe analog instruments in the same VXI chassis. This approach utilizes a COTS PXIe Instrumentation Insertion Kit (PXIe Insert). The PXIe Insert acts as a VXI to PXIe chassis adapter, allowing PXIe instruments to fit and obtain power from a VXI chassis. The end goal of this effort is full functionality of PXIe bus architecture instruments in the existing VXI chassis. In addition to solving the GPATS analog instrument obsolescence problem, the PXI Insert has two benefits. First, the TETS and two VIPER/T can transform into a “Single” sustainable GPATS configuration; and in this particular case, it reduces the required GPATS VXI chassis from Two to “One.” This aligns with USMC concepts for lighter and smaller footprints, while remaining modular and scalable. The objectives of this initial USMC VXI/PXIe integration effort were finding fully suitable PXIe replacement instruments, and then demonstrating complete functionality for each, utilizing the GPATS system software. This was successful. Future testing involves regression testing of Application Program Set (APS) software. In summary, the PXIe Insert technology allows COTS PXIe inst","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"15 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133619977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984752
Şadiye Akdeniz Ağdere, Melih Karasubaşi, Hüseyin Sagirkaya
Hardware-in-the-Loop (HIL) simulation technique provides a solution to perform tests without risking damage to Line-Replaceable-Unit (LRU) and reduce costs via increasing the speed of continuous verification and validation. As an important part of verification and validation phase of a system, the Hardware-in-the-Loop simulation is one of the most effective techniques for an LRU system testing and makes a substantial contribution in avionics model integration process and realization of the system. Based on the Hardware-in-the-Loop simulation method, this paper designs the structure and parameters of a Hardware-in-the-Loop simulation test system for an indigenous flight control computer system test. This test system comprises of plant models, signal generation module, data acquisition module, record module, switching module for signal loss and error injection scenarios, and a graphical user interface. Test system includes a Peripheral Component Interconnect Extension for Instrumentation (PXI) chassis with a real-time operating system, hardware capable of converting the digital signals generated by an aircraft model into analog signals proper to LRU input signals and transmitting to LRU, also hardware capable of converting the digital signals generated by the flight control computer into analog signals to the control model and, moreover a recording unit in which all these signals are logged in parallel with data acquisition process.
{"title":"An Indigenous Flight Control System Test","authors":"Şadiye Akdeniz Ağdere, Melih Karasubaşi, Hüseyin Sagirkaya","doi":"10.1109/AUTOTESTCON47462.2022.9984752","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984752","url":null,"abstract":"Hardware-in-the-Loop (HIL) simulation technique provides a solution to perform tests without risking damage to Line-Replaceable-Unit (LRU) and reduce costs via increasing the speed of continuous verification and validation. As an important part of verification and validation phase of a system, the Hardware-in-the-Loop simulation is one of the most effective techniques for an LRU system testing and makes a substantial contribution in avionics model integration process and realization of the system. Based on the Hardware-in-the-Loop simulation method, this paper designs the structure and parameters of a Hardware-in-the-Loop simulation test system for an indigenous flight control computer system test. This test system comprises of plant models, signal generation module, data acquisition module, record module, switching module for signal loss and error injection scenarios, and a graphical user interface. Test system includes a Peripheral Component Interconnect Extension for Instrumentation (PXI) chassis with a real-time operating system, hardware capable of converting the digital signals generated by an aircraft model into analog signals proper to LRU input signals and transmitting to LRU, also hardware capable of converting the digital signals generated by the flight control computer into analog signals to the control model and, moreover a recording unit in which all these signals are logged in parallel with data acquisition process.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"55 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130927170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984728
Jerry Hopp
Current Manual and Automated Test Equipment that has been in service for many decades is experiencing support challenges like never before. Replacing multiple obsolete, outdated manual & automated testing architectures with modernized “open architecture standard topologies is a powerful, cost savings approach. Currently, multiple configured application approaches can be replaced with open architecture systems integrated to troubleshoot, repair and recommission vital aircraft components such as power supplies, inverters, and control systems at the Depot level. “ Available, state-of-the-art technology designs are equipped to solve these issues and will be supported for decades
{"title":"Modernize, then Standardize Legacy Power Conversion ATE Architectures","authors":"Jerry Hopp","doi":"10.1109/AUTOTESTCON47462.2022.9984728","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984728","url":null,"abstract":"Current Manual and Automated Test Equipment that has been in service for many decades is experiencing support challenges like never before. Replacing multiple obsolete, outdated manual & automated testing architectures with modernized “open architecture standard topologies is a powerful, cost savings approach. Currently, multiple configured application approaches can be replaced with open architecture systems integrated to troubleshoot, repair and recommission vital aircraft components such as power supplies, inverters, and control systems at the Depot level. “ Available, state-of-the-art technology designs are equipped to solve these issues and will be supported for decades","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131369789","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984804
W. J. Headrick
For modern Automatic Test Equipment (ATE), one of the most daunting tasks conducting Information Assurance (IA). In addition, there is a desire to Network ATE to allow for information sharing and deployment of software. This is complicated by the fact that typically ATE are “unmanaged” systems in that most are configured, deployed, and then mostly left alone. This results in systems that are not patched with the latest Operating System updates and in fact may be running on legacy Operating Systems which are no longer supported (like Windows XP or Windows 7 for instance). A lot of this has to do with the cost of keeping a system updated on a continuous basis and regression testing the Test Program Sets (TPS) that run on them. Given that an Automated Test System can have thousands of Test Programs running on it, the cost and time involved in doing complete regression testing on all the Test Programs can be extremely expensive. In addition to the Test Programs themselves some Test Programs rely on third party Software and / or custom developed software that is required for the Test Programs to run. Add to this the requirement to perform software steering through all the Test Program paths, the length of time required to validate a Test Program could be measured in months in some cases. If system updates are performed once a month like some Operating System updates this could consume all the available time of the Test Station or require a fleet of Test Stations to be dedicated just to do the required regression testing. On the other side of the coin, a Test System running an old unpatched Operating System is a prime target for any manner of virus or other IA issues. This paper will discuss some of the pro's and con's of a managed Test System and how it might be accomplished.
{"title":"Information Assurance in modern ATE","authors":"W. J. Headrick","doi":"10.1109/AUTOTESTCON47462.2022.9984804","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984804","url":null,"abstract":"For modern Automatic Test Equipment (ATE), one of the most daunting tasks conducting Information Assurance (IA). In addition, there is a desire to Network ATE to allow for information sharing and deployment of software. This is complicated by the fact that typically ATE are “unmanaged” systems in that most are configured, deployed, and then mostly left alone. This results in systems that are not patched with the latest Operating System updates and in fact may be running on legacy Operating Systems which are no longer supported (like Windows XP or Windows 7 for instance). A lot of this has to do with the cost of keeping a system updated on a continuous basis and regression testing the Test Program Sets (TPS) that run on them. Given that an Automated Test System can have thousands of Test Programs running on it, the cost and time involved in doing complete regression testing on all the Test Programs can be extremely expensive. In addition to the Test Programs themselves some Test Programs rely on third party Software and / or custom developed software that is required for the Test Programs to run. Add to this the requirement to perform software steering through all the Test Program paths, the length of time required to validate a Test Program could be measured in months in some cases. If system updates are performed once a month like some Operating System updates this could consume all the available time of the Test Station or require a fleet of Test Stations to be dedicated just to do the required regression testing. On the other side of the coin, a Test System running an old unpatched Operating System is a prime target for any manner of virus or other IA issues. This paper will discuss some of the pro's and con's of a managed Test System and how it might be accomplished.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114128661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984719
Ryan Griffin, Nancy Henson
Many software methodologies advanced by cloud computing can be applied to automatic test software to mitigate test system obsolescence challenges. Classical monolithic test, measurement, and automation systems have traditional challenges when test system components become out-of-date. Distributed computing technologies provide incremental and modular updates that can be applied proactively or reactively to handle equipment failures, shifts in hardware (HW) and software (SW) dependencies, and improved HW and SW components. Advances in cloud computing have driven software technologies that can unlock scaling across hardware systems, introduce service architectures, open new performance possibilities, and decouple historically interlocked components. This paper will address aerospace and defense software challenges, introduce cloud computing, both service-oriented architecture (SOA) and cloud-native microservices, explain underlying principles and tenets, and craft a practical path forward. The cloud will be brought down to earth by showing how some underlying principles and tenets can be used today. These include the single responsibility principle (SRP), DevOps, and gRPC, “a modern open-source high-performance Remote Procedure Call (RPC) framework that can run in any environment.” [1] These practices enable architectures that make obsolescence issues smaller and more approachable. For instance, test hardware and software evolve as available hardware, and the development team's skillsets change over the lifetime of the tester and Unit Under Test (UUT). Using SRP allows individual engineers to troubleshoot isolated portions of complex systems without understanding the entire technology stack. Additionally, partitioning measurement tasks into measurement and analysis subtasks can maximize CPU power by offloading analysis from point-of-use test stations to higher-performance computers. This enables cost savings by removing number crunching from expensive testers and leveraging optimized high-performance computing for analysis tasks. We also show how gRPC natively incorporates low latency, security, and cross-platform interoperability between services. While it is impossible to prevent software, parts, and skills from becoming obsolete, it is possible to mitigate the risks to production through planning, procurement, and system design, including system software design. By walking in the footsteps of cloud computing, we can apply various techniques and technologies from the cloud to automated systems.
云计算带来的许多软件方法可以应用于自动测试软件，以减轻测试系统过时的挑战。当测试系统组件过时时，经典的单片测试、测量和自动化系统会面临传统的挑战。分布式计算技术提供增量和模块化更新，可以主动或被动地应用于处理设备故障，硬件(HW)和软件(SW)依赖关系的变化，以及改进的HW和SW组件。云计算的进步推动了软件技术的发展，这些技术可以解锁跨硬件系统的扩展，引入服务架构，打开新的性能可能性，并解耦历史上互锁的组件。本文将讨论航空航天和国防软件面临的挑战，介绍云计算，包括面向服务的体系结构(SOA)和云原生微服务，解释基本原理和原则，并制定一条实用的前进道路。通过展示如何在今天使用一些基本原则和信条，将云带到现实中来。其中包括单一责任原则(SRP)、DevOps和gRPC, gRPC是一种可以在任何环境中运行的现代开源高性能远程过程调用(RPC)框架。[1]这些实践使架构使过时的问题变得更小，更容易接近。例如，测试硬件和软件随着可用硬件的发展而发展，开发团队的技能集随着测试人员和测试单元(Unit Under test, UUT)的生命周期而变化。使用SRP允许单个工程师在不了解整个技术堆栈的情况下对复杂系统的孤立部分进行故障排除。此外，将测量任务划分为测量和分析子任务可以通过将分析从使用点测试站卸载到性能更高的计算机来最大化CPU功率。这可以通过从昂贵的测试器中移除数字运算，并利用优化的高性能计算来进行分析任务，从而节省成本。我们还展示了gRPC如何在服务之间本地集成低延迟、安全性和跨平台互操作性。虽然不可能防止软件、部件和技能过时，但是可以通过计划、采购和系统设计(包括系统软件设计)来减轻生产的风险。通过跟随云计算的脚步，我们可以将各种技术和技术从云应用到自动化系统。
{"title":"Moving Toward the Obsolescence of Obsolescence: A Walk in the Clouds","authors":"Ryan Griffin, Nancy Henson","doi":"10.1109/AUTOTESTCON47462.2022.9984719","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984719","url":null,"abstract":"Many software methodologies advanced by cloud computing can be applied to automatic test software to mitigate test system obsolescence challenges. Classical monolithic test, measurement, and automation systems have traditional challenges when test system components become out-of-date. Distributed computing technologies provide incremental and modular updates that can be applied proactively or reactively to handle equipment failures, shifts in hardware (HW) and software (SW) dependencies, and improved HW and SW components. Advances in cloud computing have driven software technologies that can unlock scaling across hardware systems, introduce service architectures, open new performance possibilities, and decouple historically interlocked components. This paper will address aerospace and defense software challenges, introduce cloud computing, both service-oriented architecture (SOA) and cloud-native microservices, explain underlying principles and tenets, and craft a practical path forward. The cloud will be brought down to earth by showing how some underlying principles and tenets can be used today. These include the single responsibility principle (SRP), DevOps, and gRPC, “a modern open-source high-performance Remote Procedure Call (RPC) framework that can run in any environment.” [1] These practices enable architectures that make obsolescence issues smaller and more approachable. For instance, test hardware and software evolve as available hardware, and the development team's skillsets change over the lifetime of the tester and Unit Under Test (UUT). Using SRP allows individual engineers to troubleshoot isolated portions of complex systems without understanding the entire technology stack. Additionally, partitioning measurement tasks into measurement and analysis subtasks can maximize CPU power by offloading analysis from point-of-use test stations to higher-performance computers. This enables cost savings by removing number crunching from expensive testers and leveraging optimized high-performance computing for analysis tasks. We also show how gRPC natively incorporates low latency, security, and cross-platform interoperability between services. While it is impossible to prevent software, parts, and skills from becoming obsolete, it is possible to mitigate the risks to production through planning, procurement, and system design, including system software design. By walking in the footsteps of cloud computing, we can apply various techniques and technologies from the cloud to automated systems.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"100 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124738341","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984783
Tyler Cody, P. Beling, Laura Freeman
There is an increasing demand for operational uses of machine learning (ML), however, a lack of best practices for test and evaluation (T &E) of learning systems is a hindrance to supply. This manuscript proposes a new framework for best practices, described as T &E harnesses, that corresponds principally to the task of engineering a learning system-in contrast to the status quo task of solving a learning problem. The primary difference is a question of scope. This manuscript places T &E for ML into the broader scope of systems engineering processes. Importantly, two challenge problems, acquisition and operations, are used to motivate the use of T &E harnesses for learning systems. This manuscript draws from recent findings in experimental design for ML, combinatorial interaction testing of ML solutions, and the general systems modeling of ML. The concept of T &E harnesses is closely tied to existing models of systems engineering processes. We draw the conclusion that existing best practices for T &E form a subset of what is needed to rigorously test for system-level satisfaction of stakeholder needs.
{"title":"Test and Evaluation Harnesses for Learning Systems","authors":"Tyler Cody, P. Beling, Laura Freeman","doi":"10.1109/AUTOTESTCON47462.2022.9984783","DOIUrl":"https://doi.org/10.1109/AUTOTESTCON47462.2022.9984783","url":null,"abstract":"There is an increasing demand for operational uses of machine learning (ML), however, a lack of best practices for test and evaluation (T &E) of learning systems is a hindrance to supply. This manuscript proposes a new framework for best practices, described as T &E harnesses, that corresponds principally to the task of engineering a learning system-in contrast to the status quo task of solving a learning problem. The primary difference is a question of scope. This manuscript places T &E for ML into the broader scope of systems engineering processes. Importantly, two challenge problems, acquisition and operations, are used to motivate the use of T &E harnesses for learning systems. This manuscript draws from recent findings in experimental design for ML, combinatorial interaction testing of ML solutions, and the general systems modeling of ML. The concept of T &E harnesses is closely tied to existing models of systems engineering processes. We draw the conclusion that existing best practices for T &E form a subset of what is needed to rigorously test for system-level satisfaction of stakeholder needs.","PeriodicalId":298798,"journal":{"name":"2022 IEEE AUTOTESTCON","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2022-08-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125694188","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-08-29DOI: 10.1109/AUTOTESTCON47462.2022.9984776
Christopher J. Guerra, M. Darnell, Larry T. McDaniel, M. Wasiewicz, Patrick Saenz, Josh Anderson
Demand for satellite communication (SATCOM) infrastructure has led to the development of a geosynchronous spacecraft to enable communications between ground and mobile terminals for video data. When fully loaded, the ground support equipment (GSE) provides handling for payload data of 1.2 Gbps distributed across more than 100 continuous carrier terminals or 1000 time division multiple access (TDMA) terminals. This paper assesses the implementation of GSE to verify the hardware design of this multi-radio, multi-terminal avionics unit. The GSE contains a unique design based around a communications slice, each of which provides one of four L-band interfaces to the unit under test (UUT) for both transmit and receive data. The GSE uses a channel emulator to impose impairments on the radio frequency (RF) signals to include noise, propagation delay, and dynamic frequency offset. For adjacent channel loading, the GSE contains an arbitrary waveform generator (A WG) that can implement simulated terminals in a composite waveform. This function complements the slices that contain servers connected to software defined radios (SDRs). The GSE employs an Ethernet backbone for subsystem control and to move the payload data to and from the SDRs and to the A WG. Test software in the test controller implements ETSI Digital Video Broadcast (DVB) standards for the baseband and high layer data. The test software is based around a Ground Support Equipment Operating System (GSEOS) environment, which provides test logging and automation for a traceable, repeatable environmental test campaign. The test software maintains compatibility with an embedded test software (ETS) on the UUT, which provides customized interfaces for moving higher rate data to and from the UUT.
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