Pub Date : 1900-01-01DOI: 10.1109/hldvt.2007.4392791
{"title":"Session 5: Test generation","authors":"","doi":"10.1109/hldvt.2007.4392791","DOIUrl":"https://doi.org/10.1109/hldvt.2007.4392791","url":null,"abstract":"","PeriodicalId":339324,"journal":{"name":"2007 IEEE International High Level Design Validation and Test Workshop","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117209256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/hldvt.2007.4392803
{"title":"Session 8: coverage directed validation","authors":"","doi":"10.1109/hldvt.2007.4392803","DOIUrl":"https://doi.org/10.1109/hldvt.2007.4392803","url":null,"abstract":"","PeriodicalId":339324,"journal":{"name":"2007 IEEE International High Level Design Validation and Test Workshop","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133945096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/hldvt.2007.4392776
{"title":"Session 1: Multiprocessors I","authors":"","doi":"10.1109/hldvt.2007.4392776","DOIUrl":"https://doi.org/10.1109/hldvt.2007.4392776","url":null,"abstract":"","PeriodicalId":339324,"journal":{"name":"2007 IEEE International High Level Design Validation and Test Workshop","volume":"3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122174352","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/hldvt.2007.4392795
{"title":"Session 6: Formal verification","authors":"","doi":"10.1109/hldvt.2007.4392795","DOIUrl":"https://doi.org/10.1109/hldvt.2007.4392795","url":null,"abstract":"","PeriodicalId":339324,"journal":{"name":"2007 IEEE International High Level Design Validation and Test Workshop","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128026354","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/hldvt.2007.4392809
{"title":"Session 10: Embedded Systems","authors":"","doi":"10.1109/hldvt.2007.4392809","DOIUrl":"https://doi.org/10.1109/hldvt.2007.4392809","url":null,"abstract":"","PeriodicalId":339324,"journal":{"name":"2007 IEEE International High Level Design Validation and Test Workshop","volume":"69 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125943833","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/hldvt.2007.4392807
{"title":"Session 9 panel: unified approach leading to a seamlessly evolving test bench for all phases of a multi-core design, validation and production test","authors":"","doi":"10.1109/hldvt.2007.4392807","DOIUrl":"https://doi.org/10.1109/hldvt.2007.4392807","url":null,"abstract":"","PeriodicalId":339324,"journal":{"name":"2007 IEEE International High Level Design Validation and Test Workshop","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121643411","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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