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2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)最新文献

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Radiation Evaluation of the Texas Instruments TPS7H4001-SP 18 Amps Buck Converter 德州仪器TPS7H4001-SP 18安培降压变换器的辐射评估
Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679345
J. Colon, T. Lew, N. Cunningham
Heavy-ions single event effects on RHA Units with $mathbf{LET}_{mathbf{EFF}}$ of 49 to $75 mathbf{MeV}cdot mathbf{cm}^{2}/mathbf{mg}$, Total Ionizing Dose including LDR and HDR up to 100 krad(Si) and Neutron Displacement Damage (NDD) up to $1 mathrm{x}10^{13}mathbf{n}/mathbf{cm}^{2}$ are presented and discussed.
讨论了$mathbf{LET}_{mathbf{EFF}}$为49 ~ 75 mathbf{MeV}cdot mathbf{cm}^{2}/mathbf{mg}$,总电离剂量包括LDR和HDR高达100 krad(Si),中子位移损伤(NDD)高达$1 mathbf{x}10^{13}mathbf{n}/mathbf{cm}^{2}$的重离子单事件对RHA单元的影响。
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引用次数: 0
Single Event Effects Characterization of the ST-DDR4 Spin-transfer Torque Magnetoresistive Random Access Memory (STT-MRAM) ST-DDR4自旋转移转矩磁阻随机存取存储器(STT-MRAM)的单事件效应表征
Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679326
Sergeh Vartanian, J. Yang-Scharlotta, G. Allen, A. Daniel, F. Mancoff, D. Symalla, Andy Olsen
We present single event effects (SEE) evaluation of the Everspin Technologies 1Gb non-volatile ST-DDR4 spin-transfer torque MRAM.
我们提出了Everspin Technologies 1Gb非易失性ST-DDR4自旋传递扭矩MRAM的单事件效应(SEE)评估。
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引用次数: 1
Single Event Effects and Total Dose Performance at High and Low Dose Rate of a Switching Regulator 开关调节器在高、低剂量率下的单事件效应和总剂量性能
Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679356
Z. Yang, D. Hiemstra, S. Shi, L. Chen
Results of proton and low dose rate Cobalt-60 irradiation of a switching regulator are presented. Performance in the space radiation environment is discussed.
介绍了质子和低剂量率钴-60辐照开关调节器的结果。讨论了在空间辐射环境下的性能。
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引用次数: 0
The Aerospace Corporation's Compendium of Recent Radiation Testing Results 航空航天公司最近的辐射测试结果汇编
Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679347
S. Davis, A. Yarbrough, R. Koga, A. Wright, J. Taggart, B. N. Davis
Radiation testing was performed on several commercial components to determine the response of these components to the space radiation environment. Testing was performed mostly using low and high energy protons.
对若干商业组件进行了辐射测试,以确定这些组件对空间辐射环境的反应。测试主要使用低能和高能质子进行。
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引用次数: 2
Radiation Test Results for DWDM Optical Transceiver for Aerospace Free-Space-Optical Datalinks 航空航天自由空间光数据链DWDM光收发器辐射试验结果
Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679346
R. Logan, Sean Zargari, Einar Chua, Arturo Chua, Ba Cao, Justin J. Schaefer, Matthew Gruber, I. Troxel
We present an evaluation of the effects of protons and heavy ions on high-speed hybrid dense wavelength-division-multiplexing (DWDM) optical transceiver modules designed for harsh aerospace environments. Heavy ion and proton results include SEFI and rare SEU events as well as proton-induced failures, at the module level, after ~18 krad(Si) of proton total dose. Failure analysis results and subsequent design modifications based on the proton test results are discussed, as well as path forward for future DWDM transceiver testing.
我们评估了质子和重离子对高速混合密集波分复用(DWDM)光收发模块的影响,该模块设计用于恶劣的航空航天环境。重离子和质子的结果包括SEFI和罕见的SEU事件以及质子诱导的失效,在模块水平上,质子总剂量为~18 krad(Si)。讨论了失效分析结果和基于质子测试结果的后续设计修改,以及未来DWDM收发器测试的前进方向。
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引用次数: 0
Single-Event Effects Test Methodology for Precision SAR ADCs 高精度SAR adc的单事件效应测试方法
Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679355
J. Harris, L. Pearce, N. V. van Vonno, E. Thomson
We describe a test methodology to adequately identify single event effects (SEE), namely single event transients (SET) and single event functional interrupts (SEFI) in precision SAR ADCs without user configurable registers.
我们描述了一种测试方法,以充分识别无用户可配置寄存器的精密SAR adc中的单事件效应(SEE),即单事件瞬态(SET)和单事件功能中断(SEFI)。
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引用次数: 0
Guide to the 2020 IEEE Radiation Effects Data Workshop Record 2020年IEEE辐射效应数据研讨会记录指南
Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679342
D. Hiemstra
The 2020 Workshop Record has been reviewed and a table prepared to facilitate the search for radiation response data by part number, type, or effect.
已经审查了2020年车间记录,并准备了一个表格,以方便按部件号、类型或影响搜索辐射响应数据。
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引用次数: 2
SEE and Total Dose Results of the ISL73033SLHM Dri-GaN Power Stage with 100V GaN FET 带有100V GaN场效应管的ISL73033SLHM Dri-GaN功率级的SEE和总剂量结果
Pub Date : 2021-07-01 DOI: 10.1109/NSREC45046.2021.9679332
W. H. Newman, N. V. van Vonno, D. Wackley, L. Pearce, E. Thomson
We report the single event performance and low dose rate results of the radiation-hardened ISL73033SLHM gate driver power stage with a 100V enhancement mode GaN FET in single package.
本文报道了具有100V增强模式GaN场效应晶体管的单封装辐照强化ISL73033SLHM栅极驱动功率级的单事件性能和低剂量率结果。
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引用次数: 0
期刊
2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)
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