Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679336
Jacob Waskowic, D. Hiemstra, S. Shi, Li Chen
SEU cross-sections of certain functional blocks of the Microsemi PolarFire FPGA were tested under proton radiation. Suitability for a low earth radiation environment is considered.
{"title":"SEU Characterization of the Microsemi PolarFire Field Programmable Gate Array Functional Blocks using Proton Irradiation","authors":"Jacob Waskowic, D. Hiemstra, S. Shi, Li Chen","doi":"10.1109/NSREC45046.2021.9679336","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679336","url":null,"abstract":"SEU cross-sections of certain functional blocks of the Microsemi PolarFire FPGA were tested under proton radiation. Suitability for a low earth radiation environment is considered.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"519 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123439986","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679344
A. Coronetti, R. G. Alía, M. Letiche, C. Cazzaniga, M. Kastriotou, M. Cecchetto, K. Biłko, P. Martín-Holgado
Several commercial SRAMs have been tested by the CERN R2E project with neutrons of various energy. The test data are used to cross-compare facilities and to analyze variabilities within SRAMs from the same manufacturer. FIT for atmospheric and ground applications are provided as well as predictions for accelerator soft error rates.
{"title":"Thermal-to-high-energy neutron SEU characterization of commercial SRAMs","authors":"A. Coronetti, R. G. Alía, M. Letiche, C. Cazzaniga, M. Kastriotou, M. Cecchetto, K. Biłko, P. Martín-Holgado","doi":"10.1109/NSREC45046.2021.9679344","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679344","url":null,"abstract":"Several commercial SRAMs have been tested by the CERN R2E project with neutrons of various energy. The test data are used to cross-compare facilities and to analyze variabilities within SRAMs from the same manufacturer. FIT for atmospheric and ground applications are provided as well as predictions for accelerator soft error rates.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125571054","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679349
S. Guertin, Trevor Turchan, A. Daniel
ARM processors power a class of high-performance, lower power system on a chip devices. In the absence of radiation effects, these devices are highly desirable for space use. The processor core architecture for ARM devices is licensed to provide computing on multiple hardware platforms. The A5 processor is in a unique pioneering space for providing detailed radiation response data to explore the baseline performance of these devices. These data can help set options for ARM processors and possibly impact design choices for the next generation of ARM fault tolerance capabilities. The SAMA5D3 was tested to establish general SEE performance for a relatively simple implementation of the ARM A5 core. This testing observed SRAM sensitivity starting at an LET of about 3 MeV-cm2/mg, with a saturated cross section of about 2×10-8cm2/bit, and this was determined by both active write and read of the caches, in addition to the use of a debugger to provide test results. Crash/SEFI data was collected using both Linux and bare metal C-code. The onset LET for crashes was about LET 1.5 MeV-cm2/mg, with saturated cross sections of about 2×10-5cm2 for bare metal (low utilization), and 2×10-4cm2 for Linux (high utilization) tests.
{"title":"SEE Test Results for SAMA5D3","authors":"S. Guertin, Trevor Turchan, A. Daniel","doi":"10.1109/NSREC45046.2021.9679349","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679349","url":null,"abstract":"ARM processors power a class of high-performance, lower power system on a chip devices. In the absence of radiation effects, these devices are highly desirable for space use. The processor core architecture for ARM devices is licensed to provide computing on multiple hardware platforms. The A5 processor is in a unique pioneering space for providing detailed radiation response data to explore the baseline performance of these devices. These data can help set options for ARM processors and possibly impact design choices for the next generation of ARM fault tolerance capabilities. The SAMA5D3 was tested to establish general SEE performance for a relatively simple implementation of the ARM A5 core. This testing observed SRAM sensitivity starting at an LET of about 3 MeV-cm2/mg, with a saturated cross section of about 2×10-8cm2/bit, and this was determined by both active write and read of the caches, in addition to the use of a debugger to provide test results. Crash/SEFI data was collected using both Linux and bare metal C-code. The onset LET for crashes was about LET 1.5 MeV-cm2/mg, with saturated cross sections of about 2×10-5cm2 for bare metal (low utilization), and 2×10-4cm2 for Linux (high utilization) tests.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129254341","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679350
A. Benedetto, H. Barnaby, Cheyenne Cook, M. Campola, Anna Tender
Flight data on bipolar junction transistors (BJTs) are recorded and the effects of low dose rate space irradiation on BJTs are characterized, leading to results comparable to ground-based testing. Additionally, Gummel plots of mission data are compared for different experimental parameters.
{"title":"BJTs in Space: ELDRS Experiment on NASA Space Environment Testbed","authors":"A. Benedetto, H. Barnaby, Cheyenne Cook, M. Campola, Anna Tender","doi":"10.1109/NSREC45046.2021.9679350","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679350","url":null,"abstract":"Flight data on bipolar junction transistors (BJTs) are recorded and the effects of low dose rate space irradiation on BJTs are characterized, leading to results comparable to ground-based testing. Additionally, Gummel plots of mission data are compared for different experimental parameters.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122849810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679343
P. Maillard, Yanran P. Chen, Jeff Barton, M. Voogel
this paper examines the single-event latchup (SEL) and single event upset (SEU) response of the Xilinx 7nm XCVC1902 ES1 Versal ACAP Programmable Logic irradiated with neutrons and 64 MeV protons sources. No SEL was observed in the entire Xilinx 7nm XCVC1092 for worst case conditions. Furthermore, The SEU response for single-event upsets on configuration RAM (CRAM) cells, block RAM (BRAM) and block RAM (BRAM) cells are provided.
{"title":"Single Event Latchup (SEL) and Single Event Upset (SEU) Evaluation of Xilinx 7nm Versal™ ACAP programmable logic (PL)","authors":"P. Maillard, Yanran P. Chen, Jeff Barton, M. Voogel","doi":"10.1109/NSREC45046.2021.9679343","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679343","url":null,"abstract":"this paper examines the single-event latchup (SEL) and single event upset (SEU) response of the Xilinx 7nm XCVC1902 ES1 Versal ACAP Programmable Logic irradiated with neutrons and 64 MeV protons sources. No SEL was observed in the entire Xilinx 7nm XCVC1092 for worst case conditions. Furthermore, The SEU response for single-event upsets on configuration RAM (CRAM) cells, block RAM (BRAM) and block RAM (BRAM) cells are provided.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"21 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126945477","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679324
William Rice, Marlon Marquez, Tejinder Jaswal, Salvatore Caruso, Armando Rivera Gil
A custom-designed test chip built on Global Foundries 22FDX® technology was investigated for its response to TID and SEE environments. While measurements of the performance for the technology in a first design match well with some reported results from prior testing, the use of a second custom radiation-hardened design demonstrated a significant 6x improvement in the per-bit cross section for a shift register test structure.
{"title":"Response of a 22FDX® Radiation-Hardened-by-Design Test Chip to TID and SEE","authors":"William Rice, Marlon Marquez, Tejinder Jaswal, Salvatore Caruso, Armando Rivera Gil","doi":"10.1109/NSREC45046.2021.9679324","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679324","url":null,"abstract":"A custom-designed test chip built on Global Foundries 22FDX® technology was investigated for its response to TID and SEE environments. While measurements of the performance for the technology in a first design match well with some reported results from prior testing, the use of a second custom radiation-hardened design demonstrated a significant 6x improvement in the per-bit cross section for a shift register test structure.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"89 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123959210","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679354
L. Ryder, Thomas A. Carstens, A. Phan, C. Seidlick, M. Campola
Single event effects measurements were conducted on a ACPL-785E optocoupler at NASA Space Radiation Laboratory. Measurements with a periodic input signal show single event transients and a radiation-induced time delay of the output signal.
{"title":"Single Event Effects Testing of a Vertical Optocoupler with Unmodified Packaging","authors":"L. Ryder, Thomas A. Carstens, A. Phan, C. Seidlick, M. Campola","doi":"10.1109/NSREC45046.2021.9679354","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679354","url":null,"abstract":"Single event effects measurements were conducted on a ACPL-785E optocoupler at NASA Space Radiation Laboratory. Measurements with a periodic input signal show single event transients and a radiation-induced time delay of the output signal.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124084736","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679325
Alyson D. Topper, M. Casey, E. Wilcox, M. Campola, Donna J. Cochran, M. O’Bryan, J. Pellish, Peter J. Majewicz
Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, and bipolar devices.
{"title":"Compendium of Radiation Effects Test Results from NASA Goddard Space Flight Center","authors":"Alyson D. Topper, M. Casey, E. Wilcox, M. Campola, Donna J. Cochran, M. O’Bryan, J. Pellish, Peter J. Majewicz","doi":"10.1109/NSREC45046.2021.9679325","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679325","url":null,"abstract":"Total ionizing dose, displacement damage dose, and single event effects testing were performed to characterize and determine the suitability of candidate electronics for NASA space utilization. Devices tested include optoelectronics, digital, analog, and bipolar devices.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114436445","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679338
Yonghua Liu, Bob Spitzer, David Young, Mike Tsecouras, Bob Campanini
This paper reports radiation test results of Total Ionizing Dose (TID) at High Dose Rate (HDR) and Enhanced Low Dose Rate Sensitivity (ELDRS), as well as neutron displacement damage (NDD) for the Micropac JANSR4N49BU and JANSR4N49U optocouplers.
{"title":"Radiation Test Results of Total Ionizing Dose, Enhanced Low Dose Rate Sensitivity, and Neutron Displacement Damage for the Micropac JANSR4N49BU and JANSR4N49U Optocouplers","authors":"Yonghua Liu, Bob Spitzer, David Young, Mike Tsecouras, Bob Campanini","doi":"10.1109/NSREC45046.2021.9679338","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679338","url":null,"abstract":"This paper reports radiation test results of Total Ionizing Dose (TID) at High Dose Rate (HDR) and Enhanced Low Dose Rate Sensitivity (ELDRS), as well as neutron displacement damage (NDD) for the Micropac JANSR4N49BU and JANSR4N49U optocouplers.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123033534","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-07-01DOI: 10.1109/NSREC45046.2021.9679339
I. Troxel, Justin J. Schaefer, Matthew Gruber, Daniel Sabogal, David Ellis, J. Schaf, Gates West
Destructive SEE, proton-induced TID, and heavy ion and proton non-destructive SEE sensitivity characterization results are presented for recent-generation AMD and NVIDIA GPU SOCs.
{"title":"Heavy Ion and Proton Test Results for Recent-Generation GPUs","authors":"I. Troxel, Justin J. Schaefer, Matthew Gruber, Daniel Sabogal, David Ellis, J. Schaf, Gates West","doi":"10.1109/NSREC45046.2021.9679339","DOIUrl":"https://doi.org/10.1109/NSREC45046.2021.9679339","url":null,"abstract":"Destructive SEE, proton-induced TID, and heavy ion and proton non-destructive SEE sensitivity characterization results are presented for recent-generation AMD and NVIDIA GPU SOCs.","PeriodicalId":340911,"journal":{"name":"2021 IEEE Nuclear and Space Radiation Effects Conference (NSREC)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2021-07-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124969763","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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