Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050142
Z. Ren, C. Teng, Yonghong Li, Yun Fu, Yun Wang, W. Ouyang
The reliability of electronic devices depends not only on the quality of components but also on the environmental condition, such as the humidity and the density of contaminants. For example, electrostatically enhanced dust deposition typically produces a dendritic deposit which induces a short circuit in adjacent conductors. In order to investigate contaminant deposition mechanisms on a printed circuit board (PCB), a Monte Carlo simulation is developed in the present paper to discover the dendrite growth features of contaminants under different conditions. It is found that, under the simulation parameters, the contaminant particles will diffuse, gather and grow up to form a dendrite configuration after they are deposited on the solid surface. The size of the dendrite increases as the number of contaminant particles increases. Finally, the dendrite connects the two conductors on both sides and this is why the dendrite induces a short circuit. These findings could shed light on the understanding of the dendrite growth mechanisms on printed circuit boards. It is helpful to design proper protection methods in order to reduce the malfunction of the devices as much as possible.
{"title":"Monte Carlo simulation of dendrite growth due to contaminant deposition on a printed circuit board","authors":"Z. Ren, C. Teng, Yonghong Li, Yun Fu, Yun Wang, W. Ouyang","doi":"10.1109/ICRMS.2016.8050142","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050142","url":null,"abstract":"The reliability of electronic devices depends not only on the quality of components but also on the environmental condition, such as the humidity and the density of contaminants. For example, electrostatically enhanced dust deposition typically produces a dendritic deposit which induces a short circuit in adjacent conductors. In order to investigate contaminant deposition mechanisms on a printed circuit board (PCB), a Monte Carlo simulation is developed in the present paper to discover the dendrite growth features of contaminants under different conditions. It is found that, under the simulation parameters, the contaminant particles will diffuse, gather and grow up to form a dendrite configuration after they are deposited on the solid surface. The size of the dendrite increases as the number of contaminant particles increases. Finally, the dendrite connects the two conductors on both sides and this is why the dendrite induces a short circuit. These findings could shed light on the understanding of the dendrite growth mechanisms on printed circuit boards. It is helpful to design proper protection methods in order to reduce the malfunction of the devices as much as possible.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121942152","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050034
N. Yang, Jing Feng, Quan Sun, Tianyu Liu, Dao Zhong
Usable capacity refers to the maximum capacity in theory that a fully charged battery can release, and is often used as an indicator in state of health (SOH) estimation for lithium ion batteries. The traditional method for measuring usable capacity is mainly based on voltage data in the discharge process with a constant current. However, the discharge current of a lithium ion battery in operation always fluctuates due to load changes, which makes the traditional method difficult for realizing online capacity measurement. To overcome the above problems, a novel approach is proposed in this paper to estimate the usable capacity and SOH of lithium ion batteries based on the charge curve. The time intervals between two voltages and currents during charging are used as the health factors to predict the usable capacity, which is then used to perform the SOH estimation. Experiments are implemented based on data provided by the NASA Ames Prognostics Center of Excellence. Results confirm that the proposed method performs well in online estimation of SOH.
{"title":"Online estimation of state-of-health for lithium ion batteries based on charge curves","authors":"N. Yang, Jing Feng, Quan Sun, Tianyu Liu, Dao Zhong","doi":"10.1109/ICRMS.2016.8050034","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050034","url":null,"abstract":"Usable capacity refers to the maximum capacity in theory that a fully charged battery can release, and is often used as an indicator in state of health (SOH) estimation for lithium ion batteries. The traditional method for measuring usable capacity is mainly based on voltage data in the discharge process with a constant current. However, the discharge current of a lithium ion battery in operation always fluctuates due to load changes, which makes the traditional method difficult for realizing online capacity measurement. To overcome the above problems, a novel approach is proposed in this paper to estimate the usable capacity and SOH of lithium ion batteries based on the charge curve. The time intervals between two voltages and currents during charging are used as the health factors to predict the usable capacity, which is then used to perform the SOH estimation. Experiments are implemented based on data provided by the NASA Ames Prognostics Center of Excellence. Results confirm that the proposed method performs well in online estimation of SOH.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123841484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050089
Zicheng Wang, Jin Guo, Yadong Zhang, Rong Luo
For enhancing the troubleshooting efficiency of a track circuit, a fault diagnosis method for the track circuit is proposed in this paper. First, a locomotive signal induced voltage model is established based on the transmission-line theory. Then, cases of the induced voltage envelope signals, when the track circuits are in the normal and fault conditions, respectively, are simulated. Next, a three-layer wavelet packet is adopted to decompose the induced voltage envelope signals and power spectrum analysis for the detail signal is realized. 16 time-domain indices of the β power spectrum including the standard deviation, variance, kurtosis value, and the variable coefficient are used as the failure features. Then, the information fusion of the time domain features is implemented using the principal component analysis (PCA) technology. Finally, the fusion features are input to an extreme learning machine (ELM) model to identify the failures. Case analyses show that the fault diagnosis method proposed in this paper can obtain a high accuracy and provide a scientific basis for the on-site maintenance of the track circuit.
{"title":"Fault diagnosis for railway track circuit based on wavelet packet power spectrum and ELM","authors":"Zicheng Wang, Jin Guo, Yadong Zhang, Rong Luo","doi":"10.1109/ICRMS.2016.8050089","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050089","url":null,"abstract":"For enhancing the troubleshooting efficiency of a track circuit, a fault diagnosis method for the track circuit is proposed in this paper. First, a locomotive signal induced voltage model is established based on the transmission-line theory. Then, cases of the induced voltage envelope signals, when the track circuits are in the normal and fault conditions, respectively, are simulated. Next, a three-layer wavelet packet is adopted to decompose the induced voltage envelope signals and power spectrum analysis for the detail signal is realized. 16 time-domain indices of the β power spectrum including the standard deviation, variance, kurtosis value, and the variable coefficient are used as the failure features. Then, the information fusion of the time domain features is implemented using the principal component analysis (PCA) technology. Finally, the fusion features are input to an extreme learning machine (ELM) model to identify the failures. Case analyses show that the fault diagnosis method proposed in this paper can obtain a high accuracy and provide a scientific basis for the on-site maintenance of the track circuit.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129480285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050159
Xiujie Zhao, M. Xie, Qiang Feng
This paper proposes a reliability and performance analysis and modeling methodology for mission-oriented k-out-of-n systems. The system is assumed to suffer both independent internal failures and external common cause shocks, of which arrivals are both modeled by Poisson processes. Periodic missions are assigned to the system due to a fixed schedule. A performance measure is introduced based on the mission workload and number of components working in the system. By modeling the failure modes on such systems with a Markov chain model, the defined reliability and performance is given in analytical forms. In a following numerical example, we illustrate the reliability and performance for such systems by the proposed approach.
{"title":"Reliability and performance modeling for mission-oriented k-out-of-n system under common cause failures","authors":"Xiujie Zhao, M. Xie, Qiang Feng","doi":"10.1109/ICRMS.2016.8050159","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050159","url":null,"abstract":"This paper proposes a reliability and performance analysis and modeling methodology for mission-oriented k-out-of-n systems. The system is assumed to suffer both independent internal failures and external common cause shocks, of which arrivals are both modeled by Poisson processes. Periodic missions are assigned to the system due to a fixed schedule. A performance measure is introduced based on the mission workload and number of components working in the system. By modeling the failure modes on such systems with a Markov chain model, the defined reliability and performance is given in analytical forms. In a following numerical example, we illustrate the reliability and performance for such systems by the proposed approach.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130572752","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050041
Lin Deng, Zegui Huang, Zhongyi Cai, Yunxiang Chen
Aiming at nonlinear degradation data in step-stress accelerated degradation test (SSADT), the reliability assessment method is put forward based on Wiener process. the process and degradation data model of SSADT is analyzed. The time scale model is used to convert nonlinear data into linear data. Draft coefficient of Wiener process is regarded as a random variable. Reliability model for nonlinear degradation data is built in consideration of individual variation. The two-step maximum likelihood estimation method (TSMLE) is used to derive the unknown parameters. An example is analyzed to show that presented model is correct.
{"title":"Step-stress accelerated degradation modeling based on nonlinear Wiener process","authors":"Lin Deng, Zegui Huang, Zhongyi Cai, Yunxiang Chen","doi":"10.1109/ICRMS.2016.8050041","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050041","url":null,"abstract":"Aiming at nonlinear degradation data in step-stress accelerated degradation test (SSADT), the reliability assessment method is put forward based on Wiener process. the process and degradation data model of SSADT is analyzed. The time scale model is used to convert nonlinear data into linear data. Draft coefficient of Wiener process is regarded as a random variable. Reliability model for nonlinear degradation data is built in consideration of individual variation. The two-step maximum likelihood estimation method (TSMLE) is used to derive the unknown parameters. An example is analyzed to show that presented model is correct.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131347956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050155
Mengmeng Liu, Zhaoyang Zeng, F. Su, Jueping Cai
Fault injection is an effective method for PHM and testability validation. However, with the increasing complexity of structures and functions, and with the promotion of integration levels for airborne prognostics and health management (PHM) and integrated modular avionics (IMA) systems, fault injection is often difficult to use in conventional “plug,” “probe,” or “adaptor plate” methods. Fault injection based on software also presents a bottleneck for engineering applications in terms of controllability and operability. Seeking to solve the problem of applying software fault injection to testability validation, a fault injection technique based on the Joint Test Action Group (JTAG) interface is proposed in this study. The proposed technique is based on the demands of testability validation, takes into account the development trend in avionics of modularization and integration, and adopts aspects of the JTAG boundary-scan technique. Through use of the boundary-scan technique and chip debugging functions, noncontacted hardware fault injection can be realized. Accurate and controllable fault injection of embedded chip pins/functions can then be achieved that satisfies the requirements of fault simulation and injection effect/time. The problems of fault injection implementations for equipment-oriented IMA architecture can thus be overcome, and a new direction for implementing testability validation of airborne PHM and integrated avionics equipment, thereby effectively promoting and ensuring the achievement of testability indices and PHM functions.
故障注入是一种有效的PHM和可测试性验证方法。然而，随着结构和功能的日益复杂，以及机载预测和健康管理(PHM)和集成模块化航空电子设备(IMA)系统集成水平的提高，故障注入通常难以在传统的“插头”、“探头”或“适配器板”方法中使用。基于软件的故障注入在可控性和可操作性方面也成为工程应用的瓶颈。针对软件故障注入应用于可测试性验证的问题，提出了一种基于JTAG (Joint Test Action Group)接口的故障注入技术。该技术从可测试性验证的需求出发，考虑到航空电子技术模块化和集成化的发展趋势，采用了JTAG边界扫描技术的一些方面。利用边界扫描技术和芯片调试功能，可以实现非接触式硬件故障注入。从而实现嵌入式芯片引脚/功能的精确可控故障注入，满足故障仿真和注入效果/时间的要求。从而克服面向设备的IMA体系结构的故障注入实现问题，为机载PHM和集成航电设备的可测试性验证实现提供了新的方向，从而有效地促进和保证了可测试性指标和PHM功能的实现。
{"title":"Research on fault injection technology for embedded software based on JTAG interface","authors":"Mengmeng Liu, Zhaoyang Zeng, F. Su, Jueping Cai","doi":"10.1109/ICRMS.2016.8050155","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050155","url":null,"abstract":"Fault injection is an effective method for PHM and testability validation. However, with the increasing complexity of structures and functions, and with the promotion of integration levels for airborne prognostics and health management (PHM) and integrated modular avionics (IMA) systems, fault injection is often difficult to use in conventional “plug,” “probe,” or “adaptor plate” methods. Fault injection based on software also presents a bottleneck for engineering applications in terms of controllability and operability. Seeking to solve the problem of applying software fault injection to testability validation, a fault injection technique based on the Joint Test Action Group (JTAG) interface is proposed in this study. The proposed technique is based on the demands of testability validation, takes into account the development trend in avionics of modularization and integration, and adopts aspects of the JTAG boundary-scan technique. Through use of the boundary-scan technique and chip debugging functions, noncontacted hardware fault injection can be realized. Accurate and controllable fault injection of embedded chip pins/functions can then be achieved that satisfies the requirements of fault simulation and injection effect/time. The problems of fault injection implementations for equipment-oriented IMA architecture can thus be overcome, and a new direction for implementing testability validation of airborne PHM and integrated avionics equipment, thereby effectively promoting and ensuring the achievement of testability indices and PHM functions.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116447661","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050168
Qingfeng Du, J. Qiu, Kanglin Yin, Huan Li, Kun Shi, Yue Tian, Tiandi Xie
The phenomenon of high availability (HA) is of vital importance in cloud architecture. This paper proposes an HA verification framework, called HAVerifier, for OpenStack, a popular open source cloud platform. Fault injection technology has been adopted to verify the system's reliability by determining its health status after injecting faults. The framework proposed in this paper verifies the availability of services by injecting faults into the different components of OpenStack. Service indicators (for example, downtime) are monitored after the faults are injected. The collected metrics are compared with the provided service level agreement to verify whether the platform's availability meets the requirements. The fault injection steps can be implemented dynamically using the proposed framework, and the faults injected into the platform can be restored without manual intervention. Finally, a prototype for this framework is implemented to prove its applicability to verifying the HA of the OpenStack platform.
{"title":"High availability verification framework for OpenStack based on fault injection","authors":"Qingfeng Du, J. Qiu, Kanglin Yin, Huan Li, Kun Shi, Yue Tian, Tiandi Xie","doi":"10.1109/ICRMS.2016.8050168","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050168","url":null,"abstract":"The phenomenon of high availability (HA) is of vital importance in cloud architecture. This paper proposes an HA verification framework, called HAVerifier, for OpenStack, a popular open source cloud platform. Fault injection technology has been adopted to verify the system's reliability by determining its health status after injecting faults. The framework proposed in this paper verifies the availability of services by injecting faults into the different components of OpenStack. Service indicators (for example, downtime) are monitored after the faults are injected. The collected metrics are compared with the provided service level agreement to verify whether the platform's availability meets the requirements. The fault injection steps can be implemented dynamically using the proposed framework, and the faults injected into the platform can be restored without manual intervention. Finally, a prototype for this framework is implemented to prove its applicability to verifying the HA of the OpenStack platform.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116458233","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050134
Hongbo Ma, Xianguang Kong, Yiping Zhong, Changqi Yang, Zhongquan Li, Yang Fu
Large and complex equipment reliability evaluation is extremely dependent on equipment reliability experiment data, maintenance records, and failure data. With the informationalization and intellectualization of equipment (such as CNC machine tools, shield machines, and weaponry), large amounts of data (big data) will be produced during the equipment's operation. Abundant data provide a strong support for equipment operational reliability analysis in the industrial big data age, but also pose a huge challenge for reliability analysis. This paper first explores the opportunities provided by big data to promote the reliability analysis and assessment of complex equipment. Then, we mainly focus on the remaining challenges of equipment operational reliability assessment using the industrial big data method, such as the fact that most of the data reflect an intermediate state (incomplete failure state) of the equipment. We also consider a way to analyze the multiple-states of the equipment operation and correlate the multiple failure modes of the equipment operation using the big data. Moreover, a big data analysis method for calculating the reliability and predicting the residual life of gradual systems is discussed, along with a method for combining the traditional reliability calculation theory with the big data theory. All of these issues provide a significant challenge for the reliability analysis of complex equipment in the big data age.
{"title":"Challenges and opportunities of complex equipment operational reliability technology in industrial big data age","authors":"Hongbo Ma, Xianguang Kong, Yiping Zhong, Changqi Yang, Zhongquan Li, Yang Fu","doi":"10.1109/ICRMS.2016.8050134","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050134","url":null,"abstract":"Large and complex equipment reliability evaluation is extremely dependent on equipment reliability experiment data, maintenance records, and failure data. With the informationalization and intellectualization of equipment (such as CNC machine tools, shield machines, and weaponry), large amounts of data (big data) will be produced during the equipment's operation. Abundant data provide a strong support for equipment operational reliability analysis in the industrial big data age, but also pose a huge challenge for reliability analysis. This paper first explores the opportunities provided by big data to promote the reliability analysis and assessment of complex equipment. Then, we mainly focus on the remaining challenges of equipment operational reliability assessment using the industrial big data method, such as the fact that most of the data reflect an intermediate state (incomplete failure state) of the equipment. We also consider a way to analyze the multiple-states of the equipment operation and correlate the multiple failure modes of the equipment operation using the big data. Moreover, a big data analysis method for calculating the reliability and predicting the residual life of gradual systems is discussed, along with a method for combining the traditional reliability calculation theory with the big data theory. All of these issues provide a significant challenge for the reliability analysis of complex equipment in the big data age.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126894632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A safety evaluation method based on an entropy weight method is proposed that is aimed at the features of heavy-duty computer numerical control (CNC) machine tools, such as long-life cycle, complex structure, high cost and many hidden safety risks. According to the risk sources of each phase of the total life cycle, the expert-scoring table is formulated and the process of experts' scoring is developed from the perspective of a “man-machine-environment-workpiece” system. Considering the differences in the experts' scoring, an entropy weight method is used to calculate the weight of each expert at each phase of the total life cycle. The proposed method is applied to the XKA28 heavy-duty CNC gantry milling machine, and the safety evaluation is implemented. The results indicate that the proposed method is feasible.
{"title":"A safety evaluation method for heavy-duty CNC machine tools for the total life cycle based on an entropy weight method","authors":"Guofa Li, Yongchao Huo, Jialong He, Zhaojun Yang, Jian Wang, Guofei Liu","doi":"10.1109/ICRMS.2016.8050055","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050055","url":null,"abstract":"A safety evaluation method based on an entropy weight method is proposed that is aimed at the features of heavy-duty computer numerical control (CNC) machine tools, such as long-life cycle, complex structure, high cost and many hidden safety risks. According to the risk sources of each phase of the total life cycle, the expert-scoring table is formulated and the process of experts' scoring is developed from the perspective of a “man-machine-environment-workpiece” system. Considering the differences in the experts' scoring, an entropy weight method is used to calculate the weight of each expert at each phase of the total life cycle. The proposed method is applied to the XKA28 heavy-duty CNC gantry milling machine, and the safety evaluation is implemented. The results indicate that the proposed method is feasible.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127113947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050094
Xin Guo, Lizi Chen, N. Zhao
Based on MCGS (Monitor and Control Generated System) software a training diagnosis system for a certain kind of equipment is designed and developed. Through analysis of the structure of the equipment composition and working principles of the process a two-dimensional simulation model is established. The model can achieve simple operation training. Using common equipment for fault modeling, a fault tree model is adopted to realize the phenomenon, the reasons for fault diagnosis, and the screening simulation training process. The study shows that the fault diagnosis system based on MCGS software has a short development cycle, low cost and scalability.
基于MCGS (Monitor and Control Generated System)软件，设计并开发了某型设备培训诊断系统。通过对设备组成结构和工艺过程工作原理的分析，建立了二维仿真模型。该模型可以实现简单的操作训练。利用常用的故障建模设备，采用故障树模型实现故障现象、故障诊断原因、筛选仿真训练过程。研究表明，基于MCGS软件的故障诊断系统具有开发周期短、成本低、可扩展性强的特点。
{"title":"Research on fault diagnosis training simulation technology based on MCGS","authors":"Xin Guo, Lizi Chen, N. Zhao","doi":"10.1109/ICRMS.2016.8050094","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050094","url":null,"abstract":"Based on MCGS (Monitor and Control Generated System) software a training diagnosis system for a certain kind of equipment is designed and developed. Through analysis of the structure of the equipment composition and working principles of the process a two-dimensional simulation model is established. The model can achieve simple operation training. Using common equipment for fault modeling, a fault tree model is adopted to realize the phenomenon, the reasons for fault diagnosis, and the screening simulation training process. The study shows that the fault diagnosis system based on MCGS software has a short development cycle, low cost and scalability.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128000549","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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