Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050142
Z. Ren, C. Teng, Yonghong Li, Yun Fu, Yun Wang, W. Ouyang
The reliability of electronic devices depends not only on the quality of components but also on the environmental condition, such as the humidity and the density of contaminants. For example, electrostatically enhanced dust deposition typically produces a dendritic deposit which induces a short circuit in adjacent conductors. In order to investigate contaminant deposition mechanisms on a printed circuit board (PCB), a Monte Carlo simulation is developed in the present paper to discover the dendrite growth features of contaminants under different conditions. It is found that, under the simulation parameters, the contaminant particles will diffuse, gather and grow up to form a dendrite configuration after they are deposited on the solid surface. The size of the dendrite increases as the number of contaminant particles increases. Finally, the dendrite connects the two conductors on both sides and this is why the dendrite induces a short circuit. These findings could shed light on the understanding of the dendrite growth mechanisms on printed circuit boards. It is helpful to design proper protection methods in order to reduce the malfunction of the devices as much as possible.
{"title":"Monte Carlo simulation of dendrite growth due to contaminant deposition on a printed circuit board","authors":"Z. Ren, C. Teng, Yonghong Li, Yun Fu, Yun Wang, W. Ouyang","doi":"10.1109/ICRMS.2016.8050142","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050142","url":null,"abstract":"The reliability of electronic devices depends not only on the quality of components but also on the environmental condition, such as the humidity and the density of contaminants. For example, electrostatically enhanced dust deposition typically produces a dendritic deposit which induces a short circuit in adjacent conductors. In order to investigate contaminant deposition mechanisms on a printed circuit board (PCB), a Monte Carlo simulation is developed in the present paper to discover the dendrite growth features of contaminants under different conditions. It is found that, under the simulation parameters, the contaminant particles will diffuse, gather and grow up to form a dendrite configuration after they are deposited on the solid surface. The size of the dendrite increases as the number of contaminant particles increases. Finally, the dendrite connects the two conductors on both sides and this is why the dendrite induces a short circuit. These findings could shed light on the understanding of the dendrite growth mechanisms on printed circuit boards. It is helpful to design proper protection methods in order to reduce the malfunction of the devices as much as possible.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121942152","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050134
Hongbo Ma, Xianguang Kong, Yiping Zhong, Changqi Yang, Zhongquan Li, Yang Fu
Large and complex equipment reliability evaluation is extremely dependent on equipment reliability experiment data, maintenance records, and failure data. With the informationalization and intellectualization of equipment (such as CNC machine tools, shield machines, and weaponry), large amounts of data (big data) will be produced during the equipment's operation. Abundant data provide a strong support for equipment operational reliability analysis in the industrial big data age, but also pose a huge challenge for reliability analysis. This paper first explores the opportunities provided by big data to promote the reliability analysis and assessment of complex equipment. Then, we mainly focus on the remaining challenges of equipment operational reliability assessment using the industrial big data method, such as the fact that most of the data reflect an intermediate state (incomplete failure state) of the equipment. We also consider a way to analyze the multiple-states of the equipment operation and correlate the multiple failure modes of the equipment operation using the big data. Moreover, a big data analysis method for calculating the reliability and predicting the residual life of gradual systems is discussed, along with a method for combining the traditional reliability calculation theory with the big data theory. All of these issues provide a significant challenge for the reliability analysis of complex equipment in the big data age.
{"title":"Challenges and opportunities of complex equipment operational reliability technology in industrial big data age","authors":"Hongbo Ma, Xianguang Kong, Yiping Zhong, Changqi Yang, Zhongquan Li, Yang Fu","doi":"10.1109/ICRMS.2016.8050134","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050134","url":null,"abstract":"Large and complex equipment reliability evaluation is extremely dependent on equipment reliability experiment data, maintenance records, and failure data. With the informationalization and intellectualization of equipment (such as CNC machine tools, shield machines, and weaponry), large amounts of data (big data) will be produced during the equipment's operation. Abundant data provide a strong support for equipment operational reliability analysis in the industrial big data age, but also pose a huge challenge for reliability analysis. This paper first explores the opportunities provided by big data to promote the reliability analysis and assessment of complex equipment. Then, we mainly focus on the remaining challenges of equipment operational reliability assessment using the industrial big data method, such as the fact that most of the data reflect an intermediate state (incomplete failure state) of the equipment. We also consider a way to analyze the multiple-states of the equipment operation and correlate the multiple failure modes of the equipment operation using the big data. Moreover, a big data analysis method for calculating the reliability and predicting the residual life of gradual systems is discussed, along with a method for combining the traditional reliability calculation theory with the big data theory. All of these issues provide a significant challenge for the reliability analysis of complex equipment in the big data age.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126894632","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050041
Lin Deng, Zegui Huang, Zhongyi Cai, Yunxiang Chen
Aiming at nonlinear degradation data in step-stress accelerated degradation test (SSADT), the reliability assessment method is put forward based on Wiener process. the process and degradation data model of SSADT is analyzed. The time scale model is used to convert nonlinear data into linear data. Draft coefficient of Wiener process is regarded as a random variable. Reliability model for nonlinear degradation data is built in consideration of individual variation. The two-step maximum likelihood estimation method (TSMLE) is used to derive the unknown parameters. An example is analyzed to show that presented model is correct.
{"title":"Step-stress accelerated degradation modeling based on nonlinear Wiener process","authors":"Lin Deng, Zegui Huang, Zhongyi Cai, Yunxiang Chen","doi":"10.1109/ICRMS.2016.8050041","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050041","url":null,"abstract":"Aiming at nonlinear degradation data in step-stress accelerated degradation test (SSADT), the reliability assessment method is put forward based on Wiener process. the process and degradation data model of SSADT is analyzed. The time scale model is used to convert nonlinear data into linear data. Draft coefficient of Wiener process is regarded as a random variable. Reliability model for nonlinear degradation data is built in consideration of individual variation. The two-step maximum likelihood estimation method (TSMLE) is used to derive the unknown parameters. An example is analyzed to show that presented model is correct.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131347956","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050147
Lingqiang Liang, Yanjun Shen, Quan Cai, Yingkui Gu
In order to solve the problem of the uncertainty of multi-source reliability data, a reliability data fusion method based on improved D-S evidence theory was presented. The confidence level was calculated by using the angle cosine similarity coefficient and its similarity matrix which is as the weight of the data. After the weights are assigned again, they are fused together with the information. By using this method, the causes of the faults can be determined. A major problem that the fusion results are inconsistent with the intuition when the multi-source data information conflicts each other was solved. A case of reliability analysis of a certain diesel engine was presented as an example to illustrate the proposed method. The results showed that the interference of conflicting evidence can be reduced by introducing a similarity coefficient. Furthermore, the fusion efficiency and precision of the model are increased. Not only can the real reasons for the diesel engine faults be identified accurately, but also the identification efficiency of the whole system can be improved.
{"title":"A reliability data fusion method based on improved D-S evidence theory","authors":"Lingqiang Liang, Yanjun Shen, Quan Cai, Yingkui Gu","doi":"10.1109/ICRMS.2016.8050147","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050147","url":null,"abstract":"In order to solve the problem of the uncertainty of multi-source reliability data, a reliability data fusion method based on improved D-S evidence theory was presented. The confidence level was calculated by using the angle cosine similarity coefficient and its similarity matrix which is as the weight of the data. After the weights are assigned again, they are fused together with the information. By using this method, the causes of the faults can be determined. A major problem that the fusion results are inconsistent with the intuition when the multi-source data information conflicts each other was solved. A case of reliability analysis of a certain diesel engine was presented as an example to illustrate the proposed method. The results showed that the interference of conflicting evidence can be reduced by introducing a similarity coefficient. Furthermore, the fusion efficiency and precision of the model are increased. Not only can the real reasons for the diesel engine faults be identified accurately, but also the identification efficiency of the whole system can be improved.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133435888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050169
Jun Gao, Daoping Huang, Xiaobing Li
Environmental stress screening is an effective method to eliminate the potential defects of electronic products. In order to improve the efficiency and effectiveness of environmental stress screening, the acceleration effect was derived and analyzed based on the quantitative environmental stress screening mathematical principles of GJB/Z34. Then the high-temperature aging, temperature cycling, and random vibration acceleration effect evaluation model was proposed, and the test times under conventional stress and accelerated stress were obtained respectively. Finally, the stress acceleration factor was calculated according to the test time between conventional stress and accelerated stress and an example given which proved that the screening was effective.
{"title":"Accelerative effect analysis of quantitative environmental stress screening","authors":"Jun Gao, Daoping Huang, Xiaobing Li","doi":"10.1109/ICRMS.2016.8050169","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050169","url":null,"abstract":"Environmental stress screening is an effective method to eliminate the potential defects of electronic products. In order to improve the efficiency and effectiveness of environmental stress screening, the acceleration effect was derived and analyzed based on the quantitative environmental stress screening mathematical principles of GJB/Z34. Then the high-temperature aging, temperature cycling, and random vibration acceleration effect evaluation model was proposed, and the test times under conventional stress and accelerated stress were obtained respectively. Finally, the stress acceleration factor was calculated according to the test time between conventional stress and accelerated stress and an example given which proved that the screening was effective.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128793260","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050126
Chang Hao, Weijing Zhou, Xing Jin, Dapeng Wang
The micro thrust measurement device based on the cantilever beam can provide the evaluation platform for the mechanical properties of satellite micro thrusters, thus improving the reliability of satellites. With the principle of dividing methods of measurement into direct bearing and plume measuring, this thesis introduces several kinds of typical measuring devices based on the cantilever beam structure. The thesis also introduces the current reference force, such as weights, electromagnetic force and electrostatic force, and further introduces the relevant calibration methods. Displacement sensor calibration methods are introduced as well. It is concluded that further study of dip angle, non-axial alignment and other factors should be taken into consideration in order to improve measurement accuracy.
{"title":"Development status of the micro thrust measurement technology based on cantilever beam structure","authors":"Chang Hao, Weijing Zhou, Xing Jin, Dapeng Wang","doi":"10.1109/ICRMS.2016.8050126","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050126","url":null,"abstract":"The micro thrust measurement device based on the cantilever beam can provide the evaluation platform for the mechanical properties of satellite micro thrusters, thus improving the reliability of satellites. With the principle of dividing methods of measurement into direct bearing and plume measuring, this thesis introduces several kinds of typical measuring devices based on the cantilever beam structure. The thesis also introduces the current reference force, such as weights, electromagnetic force and electrostatic force, and further introduces the relevant calibration methods. Displacement sensor calibration methods are introduced as well. It is concluded that further study of dip angle, non-axial alignment and other factors should be taken into consideration in order to improve measurement accuracy.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"72 5 Pt 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116396365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050062
H. Mu, Yao Zhang, X. Yi, Li Li, Xiaoyu Yang, Yuan-Yuan Yang
The expanded GO method for multi-functional repairable systems is proposed in this paper. The expanded method was used to analyze the electro-hydraulic control system of an automatic transmission which has the characteristics of multi-function and repairability, and the minimal cut-sets and availability are obtained by the qualitative and quantitative analysis of the method. Finally, the qualitative and quantitative analysis results of the expanded GO method are compared with the qualitative analysis results of FTA and the quantitative analysis results of Monte Carlo to verify its accuracy and applicability.
{"title":"Reliability analysis for an EHCS of automatic transmission based on GO method","authors":"H. Mu, Yao Zhang, X. Yi, Li Li, Xiaoyu Yang, Yuan-Yuan Yang","doi":"10.1109/ICRMS.2016.8050062","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050062","url":null,"abstract":"The expanded GO method for multi-functional repairable systems is proposed in this paper. The expanded method was used to analyze the electro-hydraulic control system of an automatic transmission which has the characteristics of multi-function and repairability, and the minimal cut-sets and availability are obtained by the qualitative and quantitative analysis of the method. Finally, the qualitative and quantitative analysis results of the expanded GO method are compared with the qualitative analysis results of FTA and the quantitative analysis results of Monte Carlo to verify its accuracy and applicability.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"151 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117341490","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050051
Richa Sharma
This research deals with machine interference problem with additional repairman and warm standby under Bernoulli vacation schedule. Moreover, threshold N-policy is considered for controlling the vacation period of repairman. The first repairman opt a vacation with probability ‘q’ whereas with probability ‘p=1-q’ he would like to stay in the system and continue repair to the next failed machine. On the other hand, the second repairman takes the vacation when the number of failed machine is less than ‘N’. After completion of vacation, if second repairman finds ‘N’ or more failed machine available in the system he instantly stops his vacation and repair the failed machines otherwise he may go for another vacation. Various performance measures are determined using Runge-Kutta (RK) method. Sensitivity analysis is also performed.
{"title":"Threshold N-policy for machine interference problem with additional repairman and spares under Bernoulli vacation schedule","authors":"Richa Sharma","doi":"10.1109/ICRMS.2016.8050051","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050051","url":null,"abstract":"This research deals with machine interference problem with additional repairman and warm standby under Bernoulli vacation schedule. Moreover, threshold N-policy is considered for controlling the vacation period of repairman. The first repairman opt a vacation with probability ‘q’ whereas with probability ‘p=1-q’ he would like to stay in the system and continue repair to the next failed machine. On the other hand, the second repairman takes the vacation when the number of failed machine is less than ‘N’. After completion of vacation, if second repairman finds ‘N’ or more failed machine available in the system he instantly stops his vacation and repair the failed machines otherwise he may go for another vacation. Various performance measures are determined using Runge-Kutta (RK) method. Sensitivity analysis is also performed.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125326651","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050046
Junyan Zhang, B. Cai, Yiliu Liu, M. Xie
The accidents occurred in chemical plants often regard as low frequency and high consequence. It is necessary to raise the risk analysis for the petrochemical system to help people to find the weakest process in the whole system thus people can strength the process to improve the safety. In this paper, a methodology by using Bayesian Networks (BNs) to give a model for a chemical plant has been raised. According to the harm extend, the methodology classifies the events into three layers, cause, incident, and accident. Then the application of the methodology is illustrated by analyzing an atmospheric and vacuum distillation unit. The model identifies the most possible cause when an accident happened. After that, mutual information and variety of beliefs are calculated in order to find the most sensitive event of an accident. The study gives suggestions to people of identification the most relevant and weakest point in the plant.
{"title":"Risk analysis of atmospheric and vacuum distillation unit using Bayesian networks","authors":"Junyan Zhang, B. Cai, Yiliu Liu, M. Xie","doi":"10.1109/ICRMS.2016.8050046","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050046","url":null,"abstract":"The accidents occurred in chemical plants often regard as low frequency and high consequence. It is necessary to raise the risk analysis for the petrochemical system to help people to find the weakest process in the whole system thus people can strength the process to improve the safety. In this paper, a methodology by using Bayesian Networks (BNs) to give a model for a chemical plant has been raised. According to the harm extend, the methodology classifies the events into three layers, cause, incident, and accident. Then the application of the methodology is illustrated by analyzing an atmospheric and vacuum distillation unit. The model identifies the most possible cause when an accident happened. After that, mutual information and variety of beliefs are calculated in order to find the most sensitive event of an accident. The study gives suggestions to people of identification the most relevant and weakest point in the plant.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125695895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2016-10-01DOI: 10.1109/ICRMS.2016.8050045
Jianghua Shen, Chao-Kun Hu, Xiao He
Wave soldering is one of the most widely used soldering methods in the electronics industry. However there are many influences that caused to soldering failure. This article presents a typical case about poor vertical fill failure analysis during wave soldering. Base on a series analysis, such as surface element detected, vertical cross section, thickness of inter-metallic compound (IMC) measurement, energy dispersive spectroscopy (EDS) analysis etc, the poor vertical fill failure is primarily attribute to that the soldering heat is not enough. The contaminated surface and the Ni corroded intensify the failure.
{"title":"Failure analysis for poor vertical fill of ENIG holes","authors":"Jianghua Shen, Chao-Kun Hu, Xiao He","doi":"10.1109/ICRMS.2016.8050045","DOIUrl":"https://doi.org/10.1109/ICRMS.2016.8050045","url":null,"abstract":"Wave soldering is one of the most widely used soldering methods in the electronics industry. However there are many influences that caused to soldering failure. This article presents a typical case about poor vertical fill failure analysis during wave soldering. Base on a series analysis, such as surface element detected, vertical cross section, thickness of inter-metallic compound (IMC) measurement, energy dispersive spectroscopy (EDS) analysis etc, the poor vertical fill failure is primarily attribute to that the soldering heat is not enough. The contaminated surface and the Ni corroded intensify the failure.","PeriodicalId":347031,"journal":{"name":"2016 11th International Conference on Reliability, Maintainability and Safety (ICRMS)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2016-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128161521","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：