Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748283
P. Dickinger, P. Lindorfer, G. Nanz, S. Selberherr
We have combined the network simulation program SPICE with the device simulator MINIMOS. The results of this new method in comparison with the SPICE level 3 MOS model are shown.
{"title":"Connection of Network and Device Simulation","authors":"P. Dickinger, P. Lindorfer, G. Nanz, S. Selberherr","doi":"10.1109/NUPAD.1990.748283","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748283","url":null,"abstract":"We have combined the network simulation program SPICE with the device simulator MINIMOS. The results of this new method in comparison with the SPICE level 3 MOS model are shown.","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"35 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123530468","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748281
S. Inohira, T. Shimni, H. Masuda, K. Iida
{"title":"Merged Bipolar Transistor Models Including Substrate Current","authors":"S. Inohira, T. Shimni, H. Masuda, K. Iida","doi":"10.1109/NUPAD.1990.748281","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748281","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"50 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123764095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748286
N. Konishi, M. Nakamura, H. Amakawa
{"title":"Diffusion Simulation Using Boundary-fitted Coordinate Transformation","authors":"N. Konishi, M. Nakamura, H. Amakawa","doi":"10.1109/NUPAD.1990.748286","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748286","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116551164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748278
N. Shigyo, H. Tanimoto, M. Norishima, S. Yasuda
{"title":"Modeling Of Minority Carrier Mobility And Dopant-dependent Bandgap Narrowing For Accurate Device Simulation","authors":"N. Shigyo, H. Tanimoto, M. Norishima, S. Yasuda","doi":"10.1109/NUPAD.1990.748278","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748278","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"22 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128396822","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748290
B. Baccus, D. Collard, E. Dubois
{"title":"Adaptive Mesh Refinement For Multilayer Process Simulation","authors":"B. Baccus, D. Collard, E. Dubois","doi":"10.1109/NUPAD.1990.748290","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748290","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"14 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121534938","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748287
J. Lloyd, J. Phillips, J. White
{"title":"A Boundary-Element/Multipole Algorithm for Self-Consistent Poisson Calculations in Monte-Carlo Simulation","authors":"J. Lloyd, J. Phillips, J. White","doi":"10.1109/NUPAD.1990.748287","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748287","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132401143","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748266
V. Agostinelli, H. Shin, A. Tasch
{"title":"A Comprehensive Model Of Inversion Layer Hole Mobility For Simulation Of Submicron Mosfets","authors":"V. Agostinelli, H. Shin, A. Tasch","doi":"10.1109/NUPAD.1990.748266","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748266","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"40 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133833555","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748289
W. M. Coughran
{"title":"Faster Device Modeling using Adaptive Spatial Meshes and Continuation","authors":"W. M. Coughran","doi":"10.1109/NUPAD.1990.748289","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748289","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117039381","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748253
G. Hobler, S. Halania, K. Wimmer, S. Selberherr, H. Potzl
{"title":"Rta-simulations With the 2-d Process Simulator Promis","authors":"G. Hobler, S. Halania, K. Wimmer, S. Selberherr, H. Potzl","doi":"10.1109/NUPAD.1990.748253","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748253","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"35 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116390851","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1990-06-03DOI: 10.1109/NUPAD.1990.748261
G. Heiser, C. Pommerell, J. Weis, M. Annaratone, W. Fichtner
{"title":"A Comparison of Algorithms for, Large-Scale Device Simulation","authors":"G. Heiser, C. Pommerell, J. Weis, M. Annaratone, W. Fichtner","doi":"10.1109/NUPAD.1990.748261","DOIUrl":"https://doi.org/10.1109/NUPAD.1990.748261","url":null,"abstract":"","PeriodicalId":348970,"journal":{"name":"Workshop on Numerical Modeling of Processes and Devices for Integrated Circuits","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-06-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126165343","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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